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Y Nakamura – One of the best experts on this subject based on the ideXlab platform.

  • switching field distribution of coptcr sio _2 perpendicular recording media obtained by subtracting thermal Agitation of magnetization
    IEEE International Magnetics Conference, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr-SiO2 perpendicular media was investigated, and the “intrinsic” SFD caused by variations in the grain-to-grain switching field was determined. DC demagnetizing (DCD) magnetization curves and minor DCD (M-DCD) magnetization curves were measured at applied field-sweep rates of ~10 Oe/s and ~108 Oe/s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as DeltaHr/Hr (at ~10 Oe/s) and DeltaHr P/Hr P (at ~108 Oe/s). The values of DeltaHr/Hr were much larger than those of DeltaHr P/Hr P. Moreover, DeltaHr/Hr increased faster than DeltaHr P/Hr P as the thickness decreased, suggesting that the SFD measured at vibrating sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation. The intrinsic SFD estimated using a series of media with various film thicknesses was about 0.14, which was 55%-75% of DeltaHr/Hr for 8-16-nm-thick media. An analysis of the temperature dependence of DeltaHr/Hr supported this conclusion. It is concluded that the SFD measured at VSM time scales is significantly influenced by thermal Agitation of the magnetization, and the intrinsic SFD is likely to be nearly half that measured at VSM time scales

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  • Switching Field Distribution of CoPtCr-SiO $_2$ Perpendicular Recording Media Obtained by Subtracting Thermal Agitation of Magnetization
    INTERMAG 2006 – IEEE International Magnetics Conference, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr-SiO2 perpendicular media was investigated, and the “intrinsic” SFD caused by variations in the grain-to-grain switching field was determined. DC demagnetizing (DCD) magnetization curves and minor DCD (M-DCD) magnetization curves were measured at applied field-sweep rates of ~10 Oe/s and ~108 Oe/s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as DeltaHr/Hr (at ~10 Oe/s) and DeltaHr P/Hr P (at ~108 Oe/s). The values of DeltaHr/Hr were much larger than those of DeltaHr P/Hr P. Moreover, DeltaHr/Hr increased faster than DeltaHr P/Hr P as the thickness decreased, suggesting that the SFD measured at vibrating sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation. The intrinsic SFD estimated using a series of media with various film thicknesses was about 0.14, which was 55%-75% of DeltaHr/Hr for 8-16-nm-thick media. An analysis of the temperature dependence of DeltaHr/Hr supported this conclusion. It is concluded that the SFD measured at VSM time scales is significantly influenced by thermal Agitation of the magnetization, and the intrinsic SFD is likely to be nearly half that measured at VSM time scales

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  • effect of thermal Agitation on the switching field distributions of coptcr sio2 perpendicular recording media
    Journal of Applied Physics, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr–SiO2 perpendicular media was investigated. Dc demagnetizing (DCD) magnetization curves and minor dc demagnetizing (M-DCD) magnetization curves were measured at applied field sweep rates of ∼10 and ∼108Oe∕s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as ΔHr∕Hr (at ∼10Oe∕s) and ΔHrP∕HrP (at ∼108Oe∕s). The values of ΔHrP∕HrP were found to be 60%–70% of ΔHr∕Hr. The difference between ΔHrP∕HrP and ΔHr∕Hr should be caused by thermal Agitation of the magnetization. The influence of the distribution of the thermal Agitation on SFD was calculated using the distribution of the grain volumes. It is concluded that the SFD measured at vibrating-sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation of the magnetization, and reduction of the grain size distribution is the most effective way to reduce the SFD at VSM time scales.

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Tomohiko Shimatsu – One of the best experts on this subject based on the ideXlab platform.

  • switching field distribution of coptcr sio _2 perpendicular recording media obtained by subtracting thermal Agitation of magnetization
    IEEE International Magnetics Conference, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr-SiO2 perpendicular media was investigated, and the “intrinsic” SFD caused by variations in the grain-to-grain switching field was determined. DC demagnetizing (DCD) magnetization curves and minor DCD (M-DCD) magnetization curves were measured at applied field-sweep rates of ~10 Oe/s and ~108 Oe/s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as DeltaHr/Hr (at ~10 Oe/s) and DeltaHr P/Hr P (at ~108 Oe/s). The values of DeltaHr/Hr were much larger than those of DeltaHr P/Hr P. Moreover, DeltaHr/Hr increased faster than DeltaHr P/Hr P as the thickness decreased, suggesting that the SFD measured at vibrating sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation. The intrinsic SFD estimated using a series of media with various film thicknesses was about 0.14, which was 55%-75% of DeltaHr/Hr for 8-16-nm-thick media. An analysis of the temperature dependence of DeltaHr/Hr supported this conclusion. It is concluded that the SFD measured at VSM time scales is significantly influenced by thermal Agitation of the magnetization, and the intrinsic SFD is likely to be nearly half that measured at VSM time scales

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  • Switching Field Distribution of CoPtCr-SiO $_2$ Perpendicular Recording Media Obtained by Subtracting Thermal Agitation of Magnetization
    INTERMAG 2006 – IEEE International Magnetics Conference, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr-SiO2 perpendicular media was investigated, and the “intrinsic” SFD caused by variations in the grain-to-grain switching field was determined. DC demagnetizing (DCD) magnetization curves and minor DCD (M-DCD) magnetization curves were measured at applied field-sweep rates of ~10 Oe/s and ~108 Oe/s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as DeltaHr/Hr (at ~10 Oe/s) and DeltaHr P/Hr P (at ~108 Oe/s). The values of DeltaHr/Hr were much larger than those of DeltaHr P/Hr P. Moreover, DeltaHr/Hr increased faster than DeltaHr P/Hr P as the thickness decreased, suggesting that the SFD measured at vibrating sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation. The intrinsic SFD estimated using a series of media with various film thicknesses was about 0.14, which was 55%-75% of DeltaHr/Hr for 8-16-nm-thick media. An analysis of the temperature dependence of DeltaHr/Hr supported this conclusion. It is concluded that the SFD measured at VSM time scales is significantly influenced by thermal Agitation of the magnetization, and the intrinsic SFD is likely to be nearly half that measured at VSM time scales

    Free Register to Access Article

  • effect of thermal Agitation on the switching field distributions of coptcr sio2 perpendicular recording media
    Journal of Applied Physics, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr–SiO2 perpendicular media was investigated. Dc demagnetizing (DCD) magnetization curves and minor dc demagnetizing (M-DCD) magnetization curves were measured at applied field sweep rates of ∼10 and ∼108Oe∕s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as ΔHr∕Hr (at ∼10Oe∕s) and ΔHrP∕HrP (at ∼108Oe∕s). The values of ΔHrP∕HrP were found to be 60%–70% of ΔHr∕Hr. The difference between ΔHrP∕HrP and ΔHr∕Hr should be caused by thermal Agitation of the magnetization. The influence of the distribution of the thermal Agitation on SFD was calculated using the distribution of the grain volumes. It is concluded that the SFD measured at vibrating-sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation of the magnetization, and reduction of the grain size distribution is the most effective way to reduce the SFD at VSM time scales.

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Koji Mitsuzuka – One of the best experts on this subject based on the ideXlab platform.

  • switching field distribution of coptcr sio _2 perpendicular recording media obtained by subtracting thermal Agitation of magnetization
    IEEE International Magnetics Conference, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr-SiO2 perpendicular media was investigated, and the “intrinsic” SFD caused by variations in the grain-to-grain switching field was determined. DC demagnetizing (DCD) magnetization curves and minor DCD (M-DCD) magnetization curves were measured at applied field-sweep rates of ~10 Oe/s and ~108 Oe/s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as DeltaHr/Hr (at ~10 Oe/s) and DeltaHr P/Hr P (at ~108 Oe/s). The values of DeltaHr/Hr were much larger than those of DeltaHr P/Hr P. Moreover, DeltaHr/Hr increased faster than DeltaHr P/Hr P as the thickness decreased, suggesting that the SFD measured at vibrating sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation. The intrinsic SFD estimated using a series of media with various film thicknesses was about 0.14, which was 55%-75% of DeltaHr/Hr for 8-16-nm-thick media. An analysis of the temperature dependence of DeltaHr/Hr supported this conclusion. It is concluded that the SFD measured at VSM time scales is significantly influenced by thermal Agitation of the magnetization, and the intrinsic SFD is likely to be nearly half that measured at VSM time scales

    Free Register to Access Article

  • Switching Field Distribution of CoPtCr-SiO $_2$ Perpendicular Recording Media Obtained by Subtracting Thermal Agitation of Magnetization
    INTERMAG 2006 – IEEE International Magnetics Conference, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr-SiO2 perpendicular media was investigated, and the “intrinsic” SFD caused by variations in the grain-to-grain switching field was determined. DC demagnetizing (DCD) magnetization curves and minor DCD (M-DCD) magnetization curves were measured at applied field-sweep rates of ~10 Oe/s and ~108 Oe/s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as DeltaHr/Hr (at ~10 Oe/s) and DeltaHr P/Hr P (at ~108 Oe/s). The values of DeltaHr/Hr were much larger than those of DeltaHr P/Hr P. Moreover, DeltaHr/Hr increased faster than DeltaHr P/Hr P as the thickness decreased, suggesting that the SFD measured at vibrating sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation. The intrinsic SFD estimated using a series of media with various film thicknesses was about 0.14, which was 55%-75% of DeltaHr/Hr for 8-16-nm-thick media. An analysis of the temperature dependence of DeltaHr/Hr supported this conclusion. It is concluded that the SFD measured at VSM time scales is significantly influenced by thermal Agitation of the magnetization, and the intrinsic SFD is likely to be nearly half that measured at VSM time scales

    Free Register to Access Article

  • effect of thermal Agitation on the switching field distributions of coptcr sio2 perpendicular recording media
    Journal of Applied Physics, 2006
    Co-Authors: Tomohiko Shimatsu, T. Kondo, Koji Mitsuzuka, S. Watanabe, Hideaki Muraoka, Y Nakamura

    Abstract:

    The effect of thermal Agitations on the switching field distribution (SFD) of CoPtCr–SiO2 perpendicular media was investigated. Dc demagnetizing (DCD) magnetization curves and minor dc demagnetizing (M-DCD) magnetization curves were measured at applied field sweep rates of ∼10 and ∼108Oe∕s. We estimated the SFD from the difference between the DCD and M-DCD curves, and defined them as ΔHr∕Hr (at ∼10Oe∕s) and ΔHrP∕HrP (at ∼108Oe∕s). The values of ΔHrP∕HrP were found to be 60%–70% of ΔHr∕Hr. The difference between ΔHrP∕HrP and ΔHr∕Hr should be caused by thermal Agitation of the magnetization. The influence of the distribution of the thermal Agitation on SFD was calculated using the distribution of the grain volumes. It is concluded that the SFD measured at vibrating-sample magnetometer (VSM) time scales is significantly influenced by thermal Agitation of the magnetization, and reduction of the grain size distribution is the most effective way to reduce the SFD at VSM time scales.

    Free Register to Access Article