The Experts below are selected from a list of 4335 Experts worldwide ranked by ideXlab platform
Mayumi Hori - One of the best experts on this subject based on the ideXlab platform.
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On the study of trusted information exchange services based on Authentication Policy extension
2010Co-Authors: Masakazu Ohashi, Natsuhiko Sakimur, Mayumi HoriAbstract:The substantiate experimental study of private information box project of Japanese e-Government proved the effectiveness of the New Authentication Extension Technology to combine different social infrastructures to create new Secure services between Public Sector and Private Sector(Citizen). Though there are still issues to cope with outside of the realm of technology including accountability of each participants and the level of the service, OpenID and SAML are key federated identity protocols. Both SAML and OpenID define mechanisms in support of expressing assurance information on protocol messages, respectively Authentication Context and the Provider Authentication Policy Extension (PAPE). In deployment scenarios that require proxying from one of the protocols to the other, it becomes necessary to map to and from the corresponding assurance mechanisms. This paper provides theoretical and experimental study on this mapping and related issues.
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On the Substantiative Experiment Study of Proxing Assurance between OpenID and SAML: Technical Perspective for Private Information Box Project of Japanese e-Government
ENTERprise Information Systems, 2010Co-Authors: Masakazu Ohashi, Tatsuki Sakushima, Nat Sakimura, Mayumi HoriAbstract:The substantiative experimental study of private information box project of Japanese e-Government proved the effectiveness of the New Authentication Extension Technology to combine different social infrastructures to create new Secure services between Public Sector and Private Sector(Citizen). Though there are still issues to cope with outside of the realm of technology including accountability of each participants and the level of the service, OpenID and SAML are key federated identity protocols. Both SAML and OpenID define mechanisms in support of expressing assurance information on protocol messages, respectively Authentication Context and the Provider Authentication Policy Extension (PAPE). In deployment scenarios that require proxying from one of the protocols to the other, it becomes necessary to map to and from the corresponding assurance mechanisms. This paper provides theoretical and experimental study on this mapping and related issues.
Masakazu Ohashi - One of the best experts on this subject based on the ideXlab platform.
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On the study of trusted information exchange services based on Authentication Policy extension
2010Co-Authors: Masakazu Ohashi, Natsuhiko Sakimur, Mayumi HoriAbstract:The substantiate experimental study of private information box project of Japanese e-Government proved the effectiveness of the New Authentication Extension Technology to combine different social infrastructures to create new Secure services between Public Sector and Private Sector(Citizen). Though there are still issues to cope with outside of the realm of technology including accountability of each participants and the level of the service, OpenID and SAML are key federated identity protocols. Both SAML and OpenID define mechanisms in support of expressing assurance information on protocol messages, respectively Authentication Context and the Provider Authentication Policy Extension (PAPE). In deployment scenarios that require proxying from one of the protocols to the other, it becomes necessary to map to and from the corresponding assurance mechanisms. This paper provides theoretical and experimental study on this mapping and related issues.
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On the Substantiative Experiment Study of Proxing Assurance between OpenID and SAML: Technical Perspective for Private Information Box Project of Japanese e-Government
ENTERprise Information Systems, 2010Co-Authors: Masakazu Ohashi, Tatsuki Sakushima, Nat Sakimura, Mayumi HoriAbstract:The substantiative experimental study of private information box project of Japanese e-Government proved the effectiveness of the New Authentication Extension Technology to combine different social infrastructures to create new Secure services between Public Sector and Private Sector(Citizen). Though there are still issues to cope with outside of the realm of technology including accountability of each participants and the level of the service, OpenID and SAML are key federated identity protocols. Both SAML and OpenID define mechanisms in support of expressing assurance information on protocol messages, respectively Authentication Context and the Provider Authentication Policy Extension (PAPE). In deployment scenarios that require proxying from one of the protocols to the other, it becomes necessary to map to and from the corresponding assurance mechanisms. This paper provides theoretical and experimental study on this mapping and related issues.
Bhupesh Rawat - One of the best experts on this subject based on the ideXlab platform.
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a hybrid Authentication Policy for digital image processing in big data platform
Social Science Research Network, 2021Co-Authors: Ankur Singh Bist, Jitendra Kumar Samriya, Bhupesh RawatAbstract:Big data term includes all types of structured and unstructured data in its database. The extraction of data from big data can be done through Map-Reduce, Hadoop and many more. Now a days, Digital image processing is needing its data security due to its use in widespread firms e.g. (institutions, corporate companies, marketing, streaming etc.) in the form of fingerprint, palmprint, face- recognition etc. The matching and compression process of images is not enough today to secure it. This paper proposes a hybrid Authentication framework used in Big data for various types of image data. This framework also used a cryptographic approach with Local Binary Patterns Technique (LBP) image data to ensure better security.
Sheldon X D Tan - One of the best experts on this subject based on the ideXlab platform.
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detection of counterfeited ics via on chip sensor and post fabrication Authentication Policy
Integration, 2018Co-Authors: Taeyoung Kim, Sheldon X D Tan, Chase Cook, Zeyu SunAbstract:Abstract Counterfeiting of integrated circuits (ICs) has become an increasingly vital concern for the security of commercial and mission-critical systems. Moreover, they pose an immense economic, security, and safety threat. We propose a comprehensive detection and prevention framework consisting of a multi-functional on-chip aging sensor, and post-fabrication Authentication methodology. This framework targets several classes of counterfeit ICs, such as recycled, remarked, out-of-spec, cloned, and over-produced ICs. First, the new sensor consists of both antifuse memory and aging sensors. To reduce reference-circuit related area-overhead, the initial electronic properties of sensor circuits are stored in a global database, accessed by unique chip via challenge-response pairs. Second, this work consists of a two aging-sensor approach, based on IC wear-out effects, using a recently proposed electromigration (EM) aging sensor and a ring oscillator aging sensor. This method can be effective for chip usage estimation of both short and long time periods. Hence, it can serve as a more accurate timer for the chip to meter the long term usage, which can allow for timed services of some functionality of a chip, in addition to detection of the recycled/remark ICs. Third, on top of the new sensor, we propose a new post-fabrication Authentication methodology to detect and prevent non-defective counterfeit ICs. All fabricated ICs will be registered in a global database and activated with a unique chip ID, which is written into the antifuse memory. Simulation results show that the combined aging sensors have a high degree of accuracy when compared to traditional on-chip sensors.
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comprehensive detection of counterfeit ics via on chip sensor and post fabrication Authentication Policy
International Conference on Synthesis Modeling Analysis and Simulation Methods and Applications to Circuit Design, 2017Co-Authors: Taeyoung Kim, Haibao Chen, Hai Wang, Esteban Tlelocuautle, Sheldon X D TanAbstract:Counterfeit integrated circuits (ICs) have posed a major security and safety threat on commercial and mission-critical systems. In this paper, we propose to develop a comprehensive counterfeit ICs detection and prevention strategy, consisting of an innovative multi-functional on-chip sensor and a related post-fabrication Authentication methodology. We target at many counterfeit ICs including the recycled/remarked/out-of-spec ICs, as well as cloned and over-produced ICs. First, the new sensor consists of antifuse memory and aging sensors to reduce reference circuit related area overhead of those sensor circuits. Second, the new sensor combines both the ring-oscillator based aging sensor with recently proposed electromigration(EM)-based aging sensor so that it can be effective for estimation of both short and long period time of chip usage. Third, on top of the new sensor, we propose a new post-fabrication Authentication methodology to detect and prevent non-defective counterfeit ICs. Simulation results show the advantage of the proposed multi-functional sensor against existing on-chip sensors in terms of functionality, detection coverage and usage time estimation range and accuracy.
Taeyoung Kim - One of the best experts on this subject based on the ideXlab platform.
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detection of counterfeited ics via on chip sensor and post fabrication Authentication Policy
Integration, 2018Co-Authors: Taeyoung Kim, Sheldon X D Tan, Chase Cook, Zeyu SunAbstract:Abstract Counterfeiting of integrated circuits (ICs) has become an increasingly vital concern for the security of commercial and mission-critical systems. Moreover, they pose an immense economic, security, and safety threat. We propose a comprehensive detection and prevention framework consisting of a multi-functional on-chip aging sensor, and post-fabrication Authentication methodology. This framework targets several classes of counterfeit ICs, such as recycled, remarked, out-of-spec, cloned, and over-produced ICs. First, the new sensor consists of both antifuse memory and aging sensors. To reduce reference-circuit related area-overhead, the initial electronic properties of sensor circuits are stored in a global database, accessed by unique chip via challenge-response pairs. Second, this work consists of a two aging-sensor approach, based on IC wear-out effects, using a recently proposed electromigration (EM) aging sensor and a ring oscillator aging sensor. This method can be effective for chip usage estimation of both short and long time periods. Hence, it can serve as a more accurate timer for the chip to meter the long term usage, which can allow for timed services of some functionality of a chip, in addition to detection of the recycled/remark ICs. Third, on top of the new sensor, we propose a new post-fabrication Authentication methodology to detect and prevent non-defective counterfeit ICs. All fabricated ICs will be registered in a global database and activated with a unique chip ID, which is written into the antifuse memory. Simulation results show that the combined aging sensors have a high degree of accuracy when compared to traditional on-chip sensors.
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comprehensive detection of counterfeit ics via on chip sensor and post fabrication Authentication Policy
International Conference on Synthesis Modeling Analysis and Simulation Methods and Applications to Circuit Design, 2017Co-Authors: Taeyoung Kim, Haibao Chen, Hai Wang, Esteban Tlelocuautle, Sheldon X D TanAbstract:Counterfeit integrated circuits (ICs) have posed a major security and safety threat on commercial and mission-critical systems. In this paper, we propose to develop a comprehensive counterfeit ICs detection and prevention strategy, consisting of an innovative multi-functional on-chip sensor and a related post-fabrication Authentication methodology. We target at many counterfeit ICs including the recycled/remarked/out-of-spec ICs, as well as cloned and over-produced ICs. First, the new sensor consists of antifuse memory and aging sensors to reduce reference circuit related area overhead of those sensor circuits. Second, the new sensor combines both the ring-oscillator based aging sensor with recently proposed electromigration(EM)-based aging sensor so that it can be effective for estimation of both short and long period time of chip usage. Third, on top of the new sensor, we propose a new post-fabrication Authentication methodology to detect and prevent non-defective counterfeit ICs. Simulation results show the advantage of the proposed multi-functional sensor against existing on-chip sensors in terms of functionality, detection coverage and usage time estimation range and accuracy.
