The Experts below are selected from a list of 7284372 Experts worldwide ranked by ideXlab platform
Yann Dijoux - One of the best experts on this subject based on the ideXlab platform.
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Classes of Virtual Age Models Adapted to Systems With a Burn-in Period
IEEE Transactions on Reliability, 2013Co-Authors: Yann Dijoux, Edwige IdeeAbstract:This paper proposes a new class of imperfect maintenance models for repairable systems subject to a Burn-in Period. Corrective maintenance and planned preventive maintenance are carried out over the course of the system's life. Bathtub shaped intensities are adapted to characterize the reliability of systems developing a Burn-in Period. Imperfect maintenance models, such as virtual age models, allow us to describe maintenance efficiency. A previous study has pointed out that classical virtual age models can only be applied to continuously degrading systems, and not to systems with a Burn-in Period. A first attempt to adapt virtual age models with bathtub shaped intensity has then been proposed considering one specific virtual age, a particular intensity, and one kind of maintenance. In this paper, a general framework for adapting virtual age models to bathtub shaped intensities is presented. In particular, the concept of optimal maintenance supersedes the notion of perfect maintenance. The models can be suitable to every bathtub shaped intensity, and can consider multiple kinds of maintenance. Finally, an application to real data sets is presented.
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A virtual age model based on a bathtub shaped initial intensity
Reliability Engineering & System Safety, 2009Co-Authors: Yann DijouxAbstract:This paper presents a new reliability model for complex repairable systems, which combines a bathtub shaped ageing and imperfect maintenance. A bathtub shaped initial intensity function allows to take into account the Burn-in Period, the useful life and wear out of the systems. Repair effect is expressed by a reduction of the system virtual age, which depends on the ageing of the system. The main characteristics of the model are derived. The most important one is that the maintenance efficiency allows an extension of the system useful life duration. A statistical analysis of the model and an application to real failure data are presented.
William P. King - One of the best experts on this subject based on the ideXlab platform.
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Thermal Calibration of Heated Silicon Atomic Force Microscope Cantilevers
TRANSDUCERS 2007 - 2007 International Solid-State Sensors Actuators and Microsystems Conference, 2007Co-Authors: Brent A. Nelson, William P. KingAbstract:This paper analyzes the accuracy and stability of calibration methodologies for heated silicon atomic force microscope cantilevers. The calibration techniques include Raman thermometry, comparison of the cantilever electrical characteristics with theory, and isothermal calibration on a hotplate. The various techniques offer tradeoffs between calibration time and calibration accuracy, where the best accuracy possible is with Raman thermometry, which calibrates the heater temperature to within 3-10% of the temperature rise, depending upon the temperature. The temperature calibrations are stable with storage time and cantilever usage, although a 'Burn-in' Period is usually required to stabilize the cantilever resistance.
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Temperature calibration of heated silicon atomic force microscope cantilevers
Sensors and Actuators A: Physical, 2007Co-Authors: Brent A. Nelson, William P. KingAbstract:Abstract This article presents calibration techniques for heated silicon atomic force microscope cantilevers and analyzes the accuracy of these techniques. A calibration methodology using Raman thermometry is presented and validated with heat transfer simulations and experimental measurements. Raman thermometry generates a calibration standard against which other techniques can be compared. Theoretical predictions of the cantilever temperature-dependent electrical properties do not by themselves provide accurate cantilever temperature calibration. Isothermal calibration is also insufficient. The temperature calibrations are stable with storage time and number of heating cycles, although an electrical ‘Burn-in’ Period is required to stabilize the cantilever response. These techniques for precise temperature calibration of heatable silicon cantilevers are required for applications where temperature must be carefully controlled, including surface science measurements and nano-manufacturing.
Edwige Idee - One of the best experts on this subject based on the ideXlab platform.
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Classes of Virtual Age Models Adapted to Systems With a Burn-in Period
IEEE Transactions on Reliability, 2013Co-Authors: Yann Dijoux, Edwige IdeeAbstract:This paper proposes a new class of imperfect maintenance models for repairable systems subject to a Burn-in Period. Corrective maintenance and planned preventive maintenance are carried out over the course of the system's life. Bathtub shaped intensities are adapted to characterize the reliability of systems developing a Burn-in Period. Imperfect maintenance models, such as virtual age models, allow us to describe maintenance efficiency. A previous study has pointed out that classical virtual age models can only be applied to continuously degrading systems, and not to systems with a Burn-in Period. A first attempt to adapt virtual age models with bathtub shaped intensity has then been proposed considering one specific virtual age, a particular intensity, and one kind of maintenance. In this paper, a general framework for adapting virtual age models to bathtub shaped intensities is presented. In particular, the concept of optimal maintenance supersedes the notion of perfect maintenance. The models can be suitable to every bathtub shaped intensity, and can consider multiple kinds of maintenance. Finally, an application to real data sets is presented.
Way Kuo - One of the best experts on this subject based on the ideXlab platform.
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Some considerations on system Burn-in
IEEE Transactions on Reliability, 2005Co-Authors: Kyungmee O. Kim, Way KuoAbstract:The questions of whether or not to perform system Burn-in, and how long the Burn-in Period should be, can be answered by developing a probabilistic model of the system lifetime. Previously, such a model was obtained to relate component Burn-in information & assembly quality to the system lifetime, assuming that the assembly defects introduced in various locations of a system are capable of connection failures represented by an exponential distribution. This paper extends the exponential-based results to a general distribution so as to study the dependence of system Burn-in on the defect occurrence distribution. In particular, a method of determining an optimal Burn-in Period that maximizes system reliability is developed based on the system lifetime model, assuming that systems are repaired at Burn-in failures.
Brent A. Nelson - One of the best experts on this subject based on the ideXlab platform.
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Thermal Calibration of Heated Silicon Atomic Force Microscope Cantilevers
TRANSDUCERS 2007 - 2007 International Solid-State Sensors Actuators and Microsystems Conference, 2007Co-Authors: Brent A. Nelson, William P. KingAbstract:This paper analyzes the accuracy and stability of calibration methodologies for heated silicon atomic force microscope cantilevers. The calibration techniques include Raman thermometry, comparison of the cantilever electrical characteristics with theory, and isothermal calibration on a hotplate. The various techniques offer tradeoffs between calibration time and calibration accuracy, where the best accuracy possible is with Raman thermometry, which calibrates the heater temperature to within 3-10% of the temperature rise, depending upon the temperature. The temperature calibrations are stable with storage time and cantilever usage, although a 'Burn-in' Period is usually required to stabilize the cantilever resistance.
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Temperature calibration of heated silicon atomic force microscope cantilevers
Sensors and Actuators A: Physical, 2007Co-Authors: Brent A. Nelson, William P. KingAbstract:Abstract This article presents calibration techniques for heated silicon atomic force microscope cantilevers and analyzes the accuracy of these techniques. A calibration methodology using Raman thermometry is presented and validated with heat transfer simulations and experimental measurements. Raman thermometry generates a calibration standard against which other techniques can be compared. Theoretical predictions of the cantilever temperature-dependent electrical properties do not by themselves provide accurate cantilever temperature calibration. Isothermal calibration is also insufficient. The temperature calibrations are stable with storage time and number of heating cycles, although an electrical ‘Burn-in’ Period is required to stabilize the cantilever response. These techniques for precise temperature calibration of heatable silicon cantilevers are required for applications where temperature must be carefully controlled, including surface science measurements and nano-manufacturing.
