The Experts below are selected from a list of 303 Experts worldwide ranked by ideXlab platform

Tetsuya Ishikawa - One of the best experts on this subject based on the ideXlab platform.

  • Determination of the dynamic deformation tensor by time‐resolved triple‐crystal diffractometry
    Journal of Synchrotron Radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    : Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

  • Determination of the dynamic deformation tensor by time-resolved triple-crystal diffractometry.
    Journal of synchrotron radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

Yujiro Hayashi - One of the best experts on this subject based on the ideXlab platform.

  • Determination of the dynamic deformation tensor by time‐resolved triple‐crystal diffractometry
    Journal of Synchrotron Radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    : Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

  • Determination of the dynamic deformation tensor by time-resolved triple-crystal diffractometry.
    Journal of synchrotron radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

Yoshihito Tanaka - One of the best experts on this subject based on the ideXlab platform.

  • Determination of the dynamic deformation tensor by time‐resolved triple‐crystal diffractometry
    Journal of Synchrotron Radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    : Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

  • Determination of the dynamic deformation tensor by time-resolved triple-crystal diffractometry.
    Journal of synchrotron radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

Eiichi Kuramoto - One of the best experts on this subject based on the ideXlab platform.

  • Determination of the dynamic deformation tensor by time‐resolved triple‐crystal diffractometry
    Journal of Synchrotron Radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    : Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

  • Determination of the dynamic deformation tensor by time-resolved triple-crystal diffractometry.
    Journal of synchrotron radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

Noboru Tsukuda - One of the best experts on this subject based on the ideXlab platform.

  • Determination of the dynamic deformation tensor by time‐resolved triple‐crystal diffractometry
    Journal of Synchrotron Radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    : Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.

  • Determination of the dynamic deformation tensor by time-resolved triple-crystal diffractometry.
    Journal of synchrotron radiation, 2005
    Co-Authors: Yujiro Hayashi, Noboru Tsukuda, Eiichi Kuramoto, Yoshihito Tanaka, Tetsuya Ishikawa
    Abstract:

    Triple-crystal X-ray diffractometry has been combined with time-resolved measurement techniques. A simple time-resolved technique was employed by using a digital storage oscilloscope and a fast X-ray detector. The time dependence of the deformation tensor was determined for a gallium arsenide wafer after a flash of a 130 fs laser pulse. The laser pulse produced instantaneous expansion resulting in a localized Convex Surface. Time-resolved measurements showed that a flexural standing wave, explained well by the classical elasticity theory for thin plates, appeared in the relaxation process.