The Experts below are selected from a list of 546 Experts worldwide ranked by ideXlab platform
Yiping Zhao - One of the best experts on this subject based on the ideXlab platform.
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effect of surface roughness on magnetic domain wall thickness domain size and coercivity
Journal of Applied Physics, 2001Co-Authors: Yiping Zhao, R M Gamache, G C Wang, T M Lu, G Palasantzas, Th J M De HossonAbstract:We study the effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity of thin magnetic films. We show that the roughness increases (decreases) the domain wall thickness and domain size for Bloch walls (Neel walls). The surface roughness affects the domain wall movement and causes the increase of coercivity for Neel walls. The coercivity due to domain rotation for Bloch walls decreases with the increase of roughness. The domain wall thickness, domain size, and coercivity are each related to the Demagnetizing Factor, which depends on the roughness and type of wall (Bloch wall or Neel wall). The calculated coercivity versus thickness is compared with experimental data of ultrathin Co films, where the thickness dependent roughness parameters are available.
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surface interface roughness induced Demagnetizing effect in thin magnetic films
Physical Review B, 1999Co-Authors: Yiping Zhao, G C Wang, G Palasantzas, De Jeff HossonAbstract:We study the influence of surface/interface roughness on the Demagnetizing Factor of a thin magnetic film with a single or a double boundary of self-affine, mound or anisotropic roughness. For a film with a single self-affine rough boundary, the in-plane Demagnetizing Factor ${N}_{\mathrm{xx}(\mathrm{yy})}$ is proportional to the interface width w square and to the leading order is inversely proportional to the lateral correlation length \ensuremath{\xi}. The roughness exponent \ensuremath{\alpha} is also shown to greatly affect ${N}_{\mathrm{xx}(\mathrm{yy})}.$ For a film with a single mound boundary, ${N}_{\mathrm{xx}(\mathrm{yy})}$ is inversely proportional to the apparent correlation length, and also depends on the ratio of the two different lateral lengths: the average mound separation \ensuremath{\lambda} and the randomness correlation length \ensuremath{\zeta}. It is also shown that an anisotropic surface morphology can induce anisotropic in-plane Demagnetizing Factors. The Demagnetizing anisotropy can be magnified by a morphological anisotropy. Furthermore, we consider films with two rough boundaries. Besides a general formalism derived for the Demagnetizing Factor, we investigate how the cross correlation of the two rough boundaries affects the in-plane Demagnetizing Factors. Connections between the Demagnetizing Factor and thin-film growth mechanisms are also discussed.
Th J M De Hosson - One of the best experts on this subject based on the ideXlab platform.
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effect of surface roughness on magnetic domain wall thickness domain size and coercivity
Journal of Applied Physics, 2001Co-Authors: Yiping Zhao, R M Gamache, G C Wang, T M Lu, G Palasantzas, Th J M De HossonAbstract:We study the effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity of thin magnetic films. We show that the roughness increases (decreases) the domain wall thickness and domain size for Bloch walls (Neel walls). The surface roughness affects the domain wall movement and causes the increase of coercivity for Neel walls. The coercivity due to domain rotation for Bloch walls decreases with the increase of roughness. The domain wall thickness, domain size, and coercivity are each related to the Demagnetizing Factor, which depends on the roughness and type of wall (Bloch wall or Neel wall). The calculated coercivity versus thickness is compared with experimental data of ultrathin Co films, where the thickness dependent roughness parameters are available.
G C Wang - One of the best experts on this subject based on the ideXlab platform.
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effect of surface roughness on magnetic domain wall thickness domain size and coercivity
Journal of Applied Physics, 2001Co-Authors: Yiping Zhao, R M Gamache, G C Wang, T M Lu, G Palasantzas, Th J M De HossonAbstract:We study the effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity of thin magnetic films. We show that the roughness increases (decreases) the domain wall thickness and domain size for Bloch walls (Neel walls). The surface roughness affects the domain wall movement and causes the increase of coercivity for Neel walls. The coercivity due to domain rotation for Bloch walls decreases with the increase of roughness. The domain wall thickness, domain size, and coercivity are each related to the Demagnetizing Factor, which depends on the roughness and type of wall (Bloch wall or Neel wall). The calculated coercivity versus thickness is compared with experimental data of ultrathin Co films, where the thickness dependent roughness parameters are available.
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surface interface roughness induced Demagnetizing effect in thin magnetic films
Physical Review B, 1999Co-Authors: Yiping Zhao, G C Wang, G Palasantzas, De Jeff HossonAbstract:We study the influence of surface/interface roughness on the Demagnetizing Factor of a thin magnetic film with a single or a double boundary of self-affine, mound or anisotropic roughness. For a film with a single self-affine rough boundary, the in-plane Demagnetizing Factor ${N}_{\mathrm{xx}(\mathrm{yy})}$ is proportional to the interface width w square and to the leading order is inversely proportional to the lateral correlation length \ensuremath{\xi}. The roughness exponent \ensuremath{\alpha} is also shown to greatly affect ${N}_{\mathrm{xx}(\mathrm{yy})}.$ For a film with a single mound boundary, ${N}_{\mathrm{xx}(\mathrm{yy})}$ is inversely proportional to the apparent correlation length, and also depends on the ratio of the two different lateral lengths: the average mound separation \ensuremath{\lambda} and the randomness correlation length \ensuremath{\zeta}. It is also shown that an anisotropic surface morphology can induce anisotropic in-plane Demagnetizing Factors. The Demagnetizing anisotropy can be magnified by a morphological anisotropy. Furthermore, we consider films with two rough boundaries. Besides a general formalism derived for the Demagnetizing Factor, we investigate how the cross correlation of the two rough boundaries affects the in-plane Demagnetizing Factors. Connections between the Demagnetizing Factor and thin-film growth mechanisms are also discussed.
G Palasantzas - One of the best experts on this subject based on the ideXlab platform.
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effect of surface roughness on magnetic domain wall thickness domain size and coercivity
Journal of Applied Physics, 2001Co-Authors: Yiping Zhao, R M Gamache, G C Wang, T M Lu, G Palasantzas, Th J M De HossonAbstract:We study the effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity of thin magnetic films. We show that the roughness increases (decreases) the domain wall thickness and domain size for Bloch walls (Neel walls). The surface roughness affects the domain wall movement and causes the increase of coercivity for Neel walls. The coercivity due to domain rotation for Bloch walls decreases with the increase of roughness. The domain wall thickness, domain size, and coercivity are each related to the Demagnetizing Factor, which depends on the roughness and type of wall (Bloch wall or Neel wall). The calculated coercivity versus thickness is compared with experimental data of ultrathin Co films, where the thickness dependent roughness parameters are available.
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surface interface roughness induced Demagnetizing effect in thin magnetic films
Physical Review B, 1999Co-Authors: Yiping Zhao, G C Wang, G Palasantzas, De Jeff HossonAbstract:We study the influence of surface/interface roughness on the Demagnetizing Factor of a thin magnetic film with a single or a double boundary of self-affine, mound or anisotropic roughness. For a film with a single self-affine rough boundary, the in-plane Demagnetizing Factor ${N}_{\mathrm{xx}(\mathrm{yy})}$ is proportional to the interface width w square and to the leading order is inversely proportional to the lateral correlation length \ensuremath{\xi}. The roughness exponent \ensuremath{\alpha} is also shown to greatly affect ${N}_{\mathrm{xx}(\mathrm{yy})}.$ For a film with a single mound boundary, ${N}_{\mathrm{xx}(\mathrm{yy})}$ is inversely proportional to the apparent correlation length, and also depends on the ratio of the two different lateral lengths: the average mound separation \ensuremath{\lambda} and the randomness correlation length \ensuremath{\zeta}. It is also shown that an anisotropic surface morphology can induce anisotropic in-plane Demagnetizing Factors. The Demagnetizing anisotropy can be magnified by a morphological anisotropy. Furthermore, we consider films with two rough boundaries. Besides a general formalism derived for the Demagnetizing Factor, we investigate how the cross correlation of the two rough boundaries affects the in-plane Demagnetizing Factors. Connections between the Demagnetizing Factor and thin-film growth mechanisms are also discussed.
T M Lu - One of the best experts on this subject based on the ideXlab platform.
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effect of surface roughness on magnetic domain wall thickness domain size and coercivity
Journal of Applied Physics, 2001Co-Authors: Yiping Zhao, R M Gamache, G C Wang, T M Lu, G Palasantzas, Th J M De HossonAbstract:We study the effect of surface roughness on magnetic domain wall thickness, domain size, and coercivity of thin magnetic films. We show that the roughness increases (decreases) the domain wall thickness and domain size for Bloch walls (Neel walls). The surface roughness affects the domain wall movement and causes the increase of coercivity for Neel walls. The coercivity due to domain rotation for Bloch walls decreases with the increase of roughness. The domain wall thickness, domain size, and coercivity are each related to the Demagnetizing Factor, which depends on the roughness and type of wall (Bloch wall or Neel wall). The calculated coercivity versus thickness is compared with experimental data of ultrathin Co films, where the thickness dependent roughness parameters are available.