The Experts below are selected from a list of 246 Experts worldwide ranked by ideXlab platform

Shin-ichi Ohya - One of the best experts on this subject based on the ideXlab platform.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

Muneyuki Imafuku - One of the best experts on this subject based on the ideXlab platform.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

Koichi Akita - One of the best experts on this subject based on the ideXlab platform.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

Hiroshi Suzuki - One of the best experts on this subject based on the ideXlab platform.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

Kazuyuki Sueyoshi - One of the best experts on this subject based on the ideXlab platform.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.

  • Advanced x-ray stress analysis method for a single crystal using different Diffraction plane families
    Applied Physics Letters, 2008
    Co-Authors: Muneyuki Imafuku, Hiroshi Suzuki, Kazuyuki Sueyoshi, Koichi Akita, Shin-ichi Ohya
    Abstract:

    Generalized formula of the x-ray stress analysis for a single crystal with unknown stress-free lattice parameter was proposed. This method enables us to evaluate the plane stress states with any combination of Diffraction planes. We can choose and combine the appropriate x-ray sources and Diffraction plane families, depending on the sample orientation and the apparatus, whenever Diffraction Condition is satisfied. The analysis of plane stress distributions in an iron single crystal was demonstrated combining with the Diffraction data for Fe{211} and Fe{310} plane families.