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E Koppensteiner - One of the best experts on this subject based on the ideXlab platform.
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x ray double and triple crystal Diffractometry of mosaic structure in heteroepitaxial layers
Journal of Applied Physics, 1993Co-Authors: V. Holy, E. Abramof, A. Pesek, Josef Kuběna, K. Lischka, E KoppensteinerAbstract:X‐ray diffraction in thin layers containing small randomly placed defects is described by means of the kinematical diffraction theory and optical coherence formalism. The method enables us to calculate both the diffracted intensity and its angular distribution, so that it can be used for simulating double crystal and triple crystal x‐ray Diffractometry experiments. The theory has been applied to experimental data obtained from Diffractometry measurements of an epitaxial ZnTe layer with mosaic structure after several steps of chemical thinning. A good agreement of the theory with experiments has been achieved.
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X-ray Diffractometry of small defects in layered systems
Journal of Physics D: Applied Physics, 1993Co-Authors: V. Holy, J Kubena, E. Abramof, A. Pesek, E KoppensteinerAbstract:X-ray diffraction in thin layers and layered systems is described using the optical coherence approach and the semi-kinematical diffraction theory. Two defect models in thin layers are considered-the mosaic structure model and the model of interface roughness. For both defect models the reflection curves of a thin layer and a superlattice have been calculated and compared with double-crystal X-ray Diffractometry results on superlattices and epitaxial layers. The distribution of the diffusely scattered intensity near a reciprocal lattice point has been calculated theoretically for both models and it has been proved experimentally by double- and triple-crystal Diffractometry of epitaxial layers with mosaic structure. It has been demonstrated that the theory yields a tool for estimating the predominant defect type in a layered structure.
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X‐ray double and triple crystal Diffractometry of mosaic structure in heteroepitaxial layers
Journal of Applied Physics, 1993Co-Authors: Václav Holý, E. Abramof, A. Pesek, Josef Kuběna, K. Lischka, E KoppensteinerAbstract:X‐ray diffraction in thin layers containing small randomly placed defects is described by means of the kinematical diffraction theory and optical coherence formalism. The method enables us to calculate both the diffracted intensity and its angular distribution, so that it can be used for simulating double crystal and triple crystal x‐ray Diffractometry experiments. The theory has been applied to experimental data obtained from Diffractometry measurements of an epitaxial ZnTe layer with mosaic structure after several steps of chemical thinning. A good agreement of the theory with experiments has been achieved.
L. W. Finger - One of the best experts on this subject based on the ideXlab platform.
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High-Temperature–High- Pressure Diffractometry
Reviews in Mineralogy & Geochemistry, 2000Co-Authors: Ross J. Angel, Robert T. Downs, L. W. FingerAbstract:Effective techniques for conducting high-pressure and high-temperature single-crystal X-ray diffraction experiments were developed in the 1970s. By the end of that decade a number of papers had been published that defined optimal methods for operating diffractometers, especially for high-pressure experiments. The following decade saw the spread of the techniques from the institutions involved in the original developments into many other, mostly mineralogical, crystallography laboratories around the world. The state of the art of high-pressure Diffractometry as it stood in the early 1980s was summarized in Comparative Crystal Chemistry (Hazen and Finger 1982). Since that time, advances in computing capacity and in the mechanical quality of diffractometers have been combined to increase the precision of high-pressure measurements by an order of magnitude. This chapter, while building on the work summarized in Hazen and Finger (1982), extends it on the basis of the experience gained by the authors and others in the intervening years. The aim of this chapter is to provide a crystallographer with no previous experience in high-pressure or high-temperature crystallography with the information to set up, or to convert, a diffractometer for such work as well as a detailed guide as to how such experiments should be carried out. We hope thereby to answer the questions “How do I modify my diffractometer for high-P,T experiments?” in the next section, and “How do I do the experiment?” in the following one. The last section of this chapter describes the modifications to data reduction procedures that must be made for handling data collected from crystals in diamond-anvil cells (DAC). Issues relating to DAC design and furnace design are addressed in Miletich et al. (this volume) and Yang and Peterson (this volume) respectively. Some basic familiarity with the operation of single-crystal diffractometers for conventional measurements at room conditions is assumed, although …
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high temperature high pressure Diffractometry
Reviews in Mineralogy & Geochemistry, 2000Co-Authors: Ross J. Angel, Robert T. Downs, L. W. FingerAbstract:Effective techniques for conducting high-pressure and high-temperature single-crystal X-ray diffraction experiments were developed in the 1970s. By the end of that decade a number of papers had been published that defined optimal methods for operating diffractometers, especially for high-pressure experiments. The following decade saw the spread of the techniques from the institutions involved in the original developments into many other, mostly mineralogical, crystallography laboratories around the world. The state of the art of high-pressure Diffractometry as it stood in the early 1980s was summarized in Comparative Crystal Chemistry (Hazen and Finger 1982). Since that time, advances in computing capacity and in the mechanical quality of diffractometers have been combined to increase the precision of high-pressure measurements by an order of magnitude. This chapter, while building on the work summarized in Hazen and Finger (1982), extends it on the basis of the experience gained by the authors and others in the intervening years. The aim of this chapter is to provide a crystallographer with no previous experience in high-pressure or high-temperature crystallography with the information to set up, or to convert, a diffractometer for such work as well as a detailed guide as to how such experiments should be carried out. We hope thereby to answer the questions “How do I modify my diffractometer for high-P,T experiments?” in the next section, and “How do I do the experiment?” in the following one. The last section of this chapter describes the modifications to data reduction procedures that must be made for handling data collected from crystals in diamond-anvil cells (DAC). Issues relating to DAC design and furnace design are addressed in Miletich et al. (this volume) and Yang and Peterson (this volume) respectively. Some basic familiarity with the operation of single-crystal diffractometers for conventional measurements at room conditions is assumed, although …
M.r. Sharafutdinov - One of the best experts on this subject based on the ideXlab platform.
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effect of post heat treatment on the phase composition and strength of laser welded joints of an al mg li alloy
Materials Science and Engineering A-structural Materials Properties Microstructure and Processing, 2019Co-Authors: A G Malikov, M.r. Sharafutdinov, Anatoliy Orishich, Natalia V Bulina, E V KarpovAbstract:Abstract In the present work, the effects of laser beam welding and post-weld heat treatment on the phase composition and mechanical properties of the 1424 alloy (Al–Mg–Li) joints were investigated. Holding the joints at a certain temperature was followed by quenching and artificial aging. The structural studies were carried out using electron microscopy, conventional X-ray Diffractometry, and synchrotron radiation Diffractometry. The heat treatment conditions were optimized to favor the formation of strengthening phases in the welds, the presence of which imparted mechanical strength to the joints. For the first time, 1424 Al alloy joints with a weld strength of σuts = 500 MPa have been obtained; this value of strength was achieved by applying post-weld annealing followed by quenching and artificial aging.
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In situ time-resolved Diffractometry at SSTRC
Nuclear Instruments and Methods in Physics Research Section A: Accelerators Spectrometers Detectors and Associated Equipment, 2009Co-Authors: O.v. Evdokov, V.m. Titov, B.p. Tolochko, M.r. SharafutdinovAbstract:The article describes the station of the time-resolved X-ray Diffractometry for investigation of chemical reaction and phase transformations with high time and angular resolution. There is also information about its current state, equipment and carried out experiments.
Ross J. Angel - One of the best experts on this subject based on the ideXlab platform.
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High-Temperature–High- Pressure Diffractometry
Reviews in Mineralogy & Geochemistry, 2000Co-Authors: Ross J. Angel, Robert T. Downs, L. W. FingerAbstract:Effective techniques for conducting high-pressure and high-temperature single-crystal X-ray diffraction experiments were developed in the 1970s. By the end of that decade a number of papers had been published that defined optimal methods for operating diffractometers, especially for high-pressure experiments. The following decade saw the spread of the techniques from the institutions involved in the original developments into many other, mostly mineralogical, crystallography laboratories around the world. The state of the art of high-pressure Diffractometry as it stood in the early 1980s was summarized in Comparative Crystal Chemistry (Hazen and Finger 1982). Since that time, advances in computing capacity and in the mechanical quality of diffractometers have been combined to increase the precision of high-pressure measurements by an order of magnitude. This chapter, while building on the work summarized in Hazen and Finger (1982), extends it on the basis of the experience gained by the authors and others in the intervening years. The aim of this chapter is to provide a crystallographer with no previous experience in high-pressure or high-temperature crystallography with the information to set up, or to convert, a diffractometer for such work as well as a detailed guide as to how such experiments should be carried out. We hope thereby to answer the questions “How do I modify my diffractometer for high-P,T experiments?” in the next section, and “How do I do the experiment?” in the following one. The last section of this chapter describes the modifications to data reduction procedures that must be made for handling data collected from crystals in diamond-anvil cells (DAC). Issues relating to DAC design and furnace design are addressed in Miletich et al. (this volume) and Yang and Peterson (this volume) respectively. Some basic familiarity with the operation of single-crystal diffractometers for conventional measurements at room conditions is assumed, although …
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high temperature high pressure Diffractometry
Reviews in Mineralogy & Geochemistry, 2000Co-Authors: Ross J. Angel, Robert T. Downs, L. W. FingerAbstract:Effective techniques for conducting high-pressure and high-temperature single-crystal X-ray diffraction experiments were developed in the 1970s. By the end of that decade a number of papers had been published that defined optimal methods for operating diffractometers, especially for high-pressure experiments. The following decade saw the spread of the techniques from the institutions involved in the original developments into many other, mostly mineralogical, crystallography laboratories around the world. The state of the art of high-pressure Diffractometry as it stood in the early 1980s was summarized in Comparative Crystal Chemistry (Hazen and Finger 1982). Since that time, advances in computing capacity and in the mechanical quality of diffractometers have been combined to increase the precision of high-pressure measurements by an order of magnitude. This chapter, while building on the work summarized in Hazen and Finger (1982), extends it on the basis of the experience gained by the authors and others in the intervening years. The aim of this chapter is to provide a crystallographer with no previous experience in high-pressure or high-temperature crystallography with the information to set up, or to convert, a diffractometer for such work as well as a detailed guide as to how such experiments should be carried out. We hope thereby to answer the questions “How do I modify my diffractometer for high-P,T experiments?” in the next section, and “How do I do the experiment?” in the following one. The last section of this chapter describes the modifications to data reduction procedures that must be made for handling data collected from crystals in diamond-anvil cells (DAC). Issues relating to DAC design and furnace design are addressed in Miletich et al. (this volume) and Yang and Peterson (this volume) respectively. Some basic familiarity with the operation of single-crystal diffractometers for conventional measurements at room conditions is assumed, although …
T. S. Argunova - One of the best experts on this subject based on the ideXlab platform.
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X-ray Triple-Crystal Diffractometry and Transmission Electron Microscopy Characterization of Defects in Lattice-Mismatched Epitaxic Structures
Journal of Applied Crystallography, 1995Co-Authors: R.n. Kyutt, S.s. Ruvimov, T. S. ArgunovaAbstract:X-ray triple-crystal Diffractometry has been applied to heterostructures with a misfit of lattice parameters in the interfaces. Si1 − xGex/Si compositions as well as GaSb layers strongly mismatched to GaAs substrates have been studied. By use of various scans in both the Bragg and Laue geometries, the data are presented either as two-dimensional maps in the scattering plane or as the intensity distribution along the diffraction vector. The structural parameters of the layers were determined from a detailed analysis of the diffraction patterns. The X-ray Diffractometry results are supported by a transmission electron microscopy study.