The Experts below are selected from a list of 82146 Experts worldwide ranked by ideXlab platform
Q.j. Zhang - One of the best experts on this subject based on the ideXlab platform.
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a generalized space mapping tableau approach to Device modeling
IEEE Transactions on Microwave Theory and Techniques, 2001Co-Authors: John W. Bandler, N. Georgieva, M.a. Ismail, Jose E Rayassanchez, Q.j. ZhangAbstract:A comprehensive framework to Engineering Device modeling, which we call generalized space mapping (GSM) is introduced in this paper. GSM permits many different practical implementations. As a result, the accuracy of available empirical models of microwave Devices can be significantly enhanced. We present three fundamental illustrations: a basic space-mapping super model (SMSM), frequency-space-mapping super model (FSMSM) and multiple space mapping (MSM). Two variations of MSM are presented: MSM for Device responses and MSM for frequency intervals. We also present novel criteria to discriminate between coarse models of the same Device. The SMSM, FSMSM, and MSM concepts have been verified on several modeling problems, typically utilizing a few relevant full-wave electromagnetic simulations. This paper presents four examples: a microstrip line, a microstrip right-angle bend, a microstrip step junction, and a microstrip shaped T-junction, yielding remarkable improvement within regions of interest.
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A Generalized Space Mapping Tableau Approach to Device Modeling
1999 29th European Microwave Conference, 1999Co-Authors: John W. Bandler, N. Georgieva, M.a. Ismail, J.e. Rayas-sanchez, Q.j. ZhangAbstract:A novel, comprehensive framework to Engineering Device modeling called Generalized Space Mapping (GSM) is introduced. The accuracy of available empirical models of microwave Devices can be significantly enhanced by exploiting GSM. We present three fundamental illustrations: a basic Space Mapping Super Model (SMSM), a basic Frequency-Space Mapping Super Model (FSMSM) and Multiple Space Mapping (MSM). The new concept is verified on several Device modeling problems, typically utilizing very few full-wave EM simulations, yielding remarkable improvement in accuracy.
John W. Bandler - One of the best experts on this subject based on the ideXlab platform.
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a generalized space mapping tableau approach to Device modeling
IEEE Transactions on Microwave Theory and Techniques, 2001Co-Authors: John W. Bandler, N. Georgieva, M.a. Ismail, Jose E Rayassanchez, Q.j. ZhangAbstract:A comprehensive framework to Engineering Device modeling, which we call generalized space mapping (GSM) is introduced in this paper. GSM permits many different practical implementations. As a result, the accuracy of available empirical models of microwave Devices can be significantly enhanced. We present three fundamental illustrations: a basic space-mapping super model (SMSM), frequency-space-mapping super model (FSMSM) and multiple space mapping (MSM). Two variations of MSM are presented: MSM for Device responses and MSM for frequency intervals. We also present novel criteria to discriminate between coarse models of the same Device. The SMSM, FSMSM, and MSM concepts have been verified on several modeling problems, typically utilizing a few relevant full-wave electromagnetic simulations. This paper presents four examples: a microstrip line, a microstrip right-angle bend, a microstrip step junction, and a microstrip shaped T-junction, yielding remarkable improvement within regions of interest.
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A Generalized Space Mapping Tableau Approach to Device Modeling
1999 29th European Microwave Conference, 1999Co-Authors: John W. Bandler, N. Georgieva, M.a. Ismail, J.e. Rayas-sanchez, Q.j. ZhangAbstract:A novel, comprehensive framework to Engineering Device modeling called Generalized Space Mapping (GSM) is introduced. The accuracy of available empirical models of microwave Devices can be significantly enhanced by exploiting GSM. We present three fundamental illustrations: a basic Space Mapping Super Model (SMSM), a basic Frequency-Space Mapping Super Model (FSMSM) and Multiple Space Mapping (MSM). The new concept is verified on several Device modeling problems, typically utilizing very few full-wave EM simulations, yielding remarkable improvement in accuracy.
Ayse Yagci - One of the best experts on this subject based on the ideXlab platform.
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evaluation of dry eye and meibomian gland dysfunction with meibography in patients with rosacea
Cornea, 2015Co-Authors: Melis Palamar, Ilgen Ertam, Cumali Degirmenci, Ayse YagciAbstract:PURPOSE: To evaluate the dry eye tests and meibography of patients with ocular rosacea. METHODS: Thirty-six eyes of 18 patients with ocular rosacea (group 1) and 38 eyes of 19 healthy individuals (group 2) were enrolled. Besides full-eye examination, corneal and conjunctival fluorescein staining and Oxford scoring, tear film break-up time, Schirmer 1 test, ocular surface disease index score assessment, and evaluation of upper and lower eyelid meibomian glands using infrared captures of an optical coherence tomography (OCT) (Spectralis HRA+OCT; Heidelberg Engineering) Device were performed (grade 0: no loss of meibomian glands, grade 1: gland dropout area 2/3 of the total meibomian glands). RESULTS: The mean ages of group 1 and group 2 were 50.2 ± 9.5 (range, 32-65), and 46.3 ± 14.1 years (range, 25-70), respectively (P = 0.225). No significant difference in best-corrected visual acuity and meiboscores of upper eyelids were detected in between groups. Schirmer 1 and tear film break-up time in group 1 were significantly lower than in group 2 (P = 0.005, P < 0.001, respectively). Ocular surface disease index and Oxford scale scores and meiboscores of lower and total (upper + lower) eyelids were significantly higher in group 1 than in group 2 (P = 0.04, P = 0.018, P < 0.001, P = 0.03, respectively). CONCLUSIONS: Ocular rosacea causes dry eye and significant meibomian gland loss that can objectively be demonstrated with meibography. The infrared camera of OCT-that is widely found in many ophthalmology departments-might be used to evaluate meibomian gland dysfunction in these individuals.
M.a. Ismail - One of the best experts on this subject based on the ideXlab platform.
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a generalized space mapping tableau approach to Device modeling
IEEE Transactions on Microwave Theory and Techniques, 2001Co-Authors: John W. Bandler, N. Georgieva, M.a. Ismail, Jose E Rayassanchez, Q.j. ZhangAbstract:A comprehensive framework to Engineering Device modeling, which we call generalized space mapping (GSM) is introduced in this paper. GSM permits many different practical implementations. As a result, the accuracy of available empirical models of microwave Devices can be significantly enhanced. We present three fundamental illustrations: a basic space-mapping super model (SMSM), frequency-space-mapping super model (FSMSM) and multiple space mapping (MSM). Two variations of MSM are presented: MSM for Device responses and MSM for frequency intervals. We also present novel criteria to discriminate between coarse models of the same Device. The SMSM, FSMSM, and MSM concepts have been verified on several modeling problems, typically utilizing a few relevant full-wave electromagnetic simulations. This paper presents four examples: a microstrip line, a microstrip right-angle bend, a microstrip step junction, and a microstrip shaped T-junction, yielding remarkable improvement within regions of interest.
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A Generalized Space Mapping Tableau Approach to Device Modeling
1999 29th European Microwave Conference, 1999Co-Authors: John W. Bandler, N. Georgieva, M.a. Ismail, J.e. Rayas-sanchez, Q.j. ZhangAbstract:A novel, comprehensive framework to Engineering Device modeling called Generalized Space Mapping (GSM) is introduced. The accuracy of available empirical models of microwave Devices can be significantly enhanced by exploiting GSM. We present three fundamental illustrations: a basic Space Mapping Super Model (SMSM), a basic Frequency-Space Mapping Super Model (FSMSM) and Multiple Space Mapping (MSM). The new concept is verified on several Device modeling problems, typically utilizing very few full-wave EM simulations, yielding remarkable improvement in accuracy.
N. Georgieva - One of the best experts on this subject based on the ideXlab platform.
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a generalized space mapping tableau approach to Device modeling
IEEE Transactions on Microwave Theory and Techniques, 2001Co-Authors: John W. Bandler, N. Georgieva, M.a. Ismail, Jose E Rayassanchez, Q.j. ZhangAbstract:A comprehensive framework to Engineering Device modeling, which we call generalized space mapping (GSM) is introduced in this paper. GSM permits many different practical implementations. As a result, the accuracy of available empirical models of microwave Devices can be significantly enhanced. We present three fundamental illustrations: a basic space-mapping super model (SMSM), frequency-space-mapping super model (FSMSM) and multiple space mapping (MSM). Two variations of MSM are presented: MSM for Device responses and MSM for frequency intervals. We also present novel criteria to discriminate between coarse models of the same Device. The SMSM, FSMSM, and MSM concepts have been verified on several modeling problems, typically utilizing a few relevant full-wave electromagnetic simulations. This paper presents four examples: a microstrip line, a microstrip right-angle bend, a microstrip step junction, and a microstrip shaped T-junction, yielding remarkable improvement within regions of interest.
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A Generalized Space Mapping Tableau Approach to Device Modeling
1999 29th European Microwave Conference, 1999Co-Authors: John W. Bandler, N. Georgieva, M.a. Ismail, J.e. Rayas-sanchez, Q.j. ZhangAbstract:A novel, comprehensive framework to Engineering Device modeling called Generalized Space Mapping (GSM) is introduced. The accuracy of available empirical models of microwave Devices can be significantly enhanced by exploiting GSM. We present three fundamental illustrations: a basic Space Mapping Super Model (SMSM), a basic Frequency-Space Mapping Super Model (FSMSM) and Multiple Space Mapping (MSM). The new concept is verified on several Device modeling problems, typically utilizing very few full-wave EM simulations, yielding remarkable improvement in accuracy.