The Experts below are selected from a list of 3966 Experts worldwide ranked by ideXlab platform
Fumio Koyama - One of the best experts on this subject based on the ideXlab platform.
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transverse mode control by Etch Depth tuning in 1120 nm gainas gaas photonic crystal vertical cavity surface emitting lasers
Optics Express, 2004Co-Authors: Jonghwa Baek, Daesung Song, Inkag Hwang, Humhee Lee, Yonghee Lee, Takashi Kondo, Tomoyuki Miyamoto, Fumio KoyamaAbstract:Robust and tolerant single-transverse-mode photonic crystal GaInAs vertical-cavity surface-emitting lasers are fabricated and investigated. Triangular lattice patterns of rectangular air holes of various Etch-Depths are introduced in the top mirror. The stable single-transverse-mode operation is observed with a large margin of allowance in the Etch Depth (t=2.5±0.6 µm). This stable mode selection mechanism is explained by the mode competition between the two lowest photonic crystal guided modes that are influenced by both the index guiding effect and the Etch-Depth dependent modal losses.
Kent D Choquette - One of the best experts on this subject based on the ideXlab platform.
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loss induced confinement in photonic crystal vertical cavity surface emitting lasers
Lasers and Electro-Optics Society Meeting, 2007Co-Authors: Dominic F. Siriani, Paul O Leisher, Kent D ChoquetteAbstract:It was demonstrated in this paper that loss can have a significant role in the modal characteristics of Etched photonic crystal vertical cavity surface-emitting lasers (VCSELs) and, in fact, can be a primary mechanism of maintaining single-mode operation. Comparisons of calculated modal losses with mode splitting, Etch Depth, slope efficiency, and single- or multi-mode operation serve to verify the model. This work demonstrates that loss is a non-negligible effect in analyzing photonic crystal VCSELs, and this theory can serve to aid in the design of single-mode photonic crystal VCSELs.
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loss induced confinement in photonic crystal vertical cavity surface emitting lasers
Lasers and Electro-Optics Society Meeting, 2007Co-Authors: Dominic F. Siriani, Paul O Leisher, Kent D ChoquetteAbstract:It was demonstrated in this paper that loss can have a significant role in the modal characteristics of Etched photonic crystal vertical cavity surface-emitting lasers (VCSELs) and, in fact, can be a primary mechanism of maintaining single-mode operation. Comparisons of calculated modal losses with mode splitting, Etch Depth, slope efficiency, and single- or multi-mode operation serve to verify the model. This work demonstrates that loss is a non-negligible effect in analyzing photonic crystal VCSELs, and this theory can serve to aid in the design of single-mode photonic crystal VCSELs.
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single mode photonic crystal vertical cavity lasers incorporating Etch Depth dependence
Conference on Lasers and Electro-Optics, 2003Co-Authors: Aaron J Danner, Noriyuki Yokouchi, Kent D ChoquetteAbstract:Triangular lattice photonic crystal designs incorporating the Etch Depth dependence on mode properties were created within vertical cavity lasers for the first time. Fabricated lasers show operation in the fundamental photonic crystal defect mode.
Dominic F. Siriani - One of the best experts on this subject based on the ideXlab platform.
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Etch Depth dependence of differential quantum efficiency in single mode photonic crystal vertical cavity surface emitting lasers
LEOS 2008 - 21st Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2008Co-Authors: Meng Peun Tan, Ansas Matthias Kasten, Dominic F. SirianiAbstract:The Etch Depth dependence of differential quantum efficiency in single mode photonic crystal vertical cavity surface emitting lasers is investigated. Optical loss and thermal effects are shown to influence the Etch Depth dependence.
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loss induced confinement in photonic crystal vertical cavity surface emitting lasers
Lasers and Electro-Optics Society Meeting, 2007Co-Authors: Dominic F. Siriani, Paul O Leisher, Kent D ChoquetteAbstract:It was demonstrated in this paper that loss can have a significant role in the modal characteristics of Etched photonic crystal vertical cavity surface-emitting lasers (VCSELs) and, in fact, can be a primary mechanism of maintaining single-mode operation. Comparisons of calculated modal losses with mode splitting, Etch Depth, slope efficiency, and single- or multi-mode operation serve to verify the model. This work demonstrates that loss is a non-negligible effect in analyzing photonic crystal VCSELs, and this theory can serve to aid in the design of single-mode photonic crystal VCSELs.
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loss induced confinement in photonic crystal vertical cavity surface emitting lasers
Lasers and Electro-Optics Society Meeting, 2007Co-Authors: Dominic F. Siriani, Paul O Leisher, Kent D ChoquetteAbstract:It was demonstrated in this paper that loss can have a significant role in the modal characteristics of Etched photonic crystal vertical cavity surface-emitting lasers (VCSELs) and, in fact, can be a primary mechanism of maintaining single-mode operation. Comparisons of calculated modal losses with mode splitting, Etch Depth, slope efficiency, and single- or multi-mode operation serve to verify the model. This work demonstrates that loss is a non-negligible effect in analyzing photonic crystal VCSELs, and this theory can serve to aid in the design of single-mode photonic crystal VCSELs.
Jonghwa Baek - One of the best experts on this subject based on the ideXlab platform.
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transverse mode control by Etch Depth tuning in 1120 nm gainas gaas photonic crystal vertical cavity surface emitting lasers
Optics Express, 2004Co-Authors: Jonghwa Baek, Daesung Song, Inkag Hwang, Humhee Lee, Yonghee Lee, Takashi Kondo, Tomoyuki Miyamoto, Fumio KoyamaAbstract:Robust and tolerant single-transverse-mode photonic crystal GaInAs vertical-cavity surface-emitting lasers are fabricated and investigated. Triangular lattice patterns of rectangular air holes of various Etch-Depths are introduced in the top mirror. The stable single-transverse-mode operation is observed with a large margin of allowance in the Etch Depth (t=2.5±0.6 µm). This stable mode selection mechanism is explained by the mode competition between the two lowest photonic crystal guided modes that are influenced by both the index guiding effect and the Etch-Depth dependent modal losses.
Yaoju Zhang - One of the best experts on this subject based on the ideXlab platform.
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diffraction theory of high numerical aperture subwavelength circular binary phase fresnel zone plate
Optics Express, 2014Co-Authors: Yaoju Zhang, Dong Zhang, Guihua Cui, Xiukai RuanAbstract:An analytical model of vector formalism is proposed to investigate the diffraction of high numerical aperture subwavelength circular binary phase Fresnel zone plate (FZP). In the proposed model, the scattering on the FZP’s surface, reflection and refraction within groove zones are considered and diffraction fields are calculated using the vector Rayleigh–Sommerfeld integral. The numerical results obtained by the proposed phase thick FZP (TFZP) model show a good agreement with those obtained by the finite-difference time-domain (FDTD) method within the effective extent of Etch Depth. The optimal Etch Depths predicted by both methods are approximately equal. The analytical TFZP model is very useful for designing a phase and hybrid amplitude-phase FZP with high-NA and short focal length.
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effect of the shadowing in high numerical aperture binary phase fresnel zone plates
Optics Communications, 2014Co-Authors: Yaoju Zhang, Chongwei Zheng, Youyi ZhuangAbstract:Abstract Shadowing occurs for the groove zone plate when radiation origin from one zone of the zone plate must pass through another before reaching the focus point. Using the vector diffraction theory, we study the influence of the shadowing on the focusing properties of binary phase Fresnel zone plates (FZPs). The results show that a low-numerical-aperture (NA) FZP can be treated as an ideal in-plane FZP and the shadowing effect can be neglected. For a high-NA FZP, however, the shadowing effect from the Etch Depth has to be considered. Owing to the shadowing, the intensity of focusing spot decreases markedly and the size of focusing spot increases slightly in a high-NA FZP. The optimal Etching Depth of an actual FZP is smaller than that of an ideal FZP.