The Experts below are selected from a list of 27 Experts worldwide ranked by ideXlab platform

Mitsuru Ishizuka - One of the best experts on this subject based on the ideXlab platform.

Zhenglu Yang - One of the best experts on this subject based on the ideXlab platform.

Paul H. Siegel - One of the best experts on this subject based on the ideXlab platform.

  • Adaptive Read Thresholds for NAND Flash
    IEEE Transactions on Communications, 2015
    Co-Authors: Borja Peleato, Rajiv Agarwal, John M. Cioffi, Minghai Qin, Paul H. Siegel
    Abstract:

    A primary source of increased read time on nand Flash comes from the fact that, in the presence of noise, the Flash Medium must be read several times using different read threshold voltages for the decoder to succeed. This paper proposes an algorithm that uses a limited number of rereads to characterize the noise distribution and recover the stored information. Both hard and soft decoding are considered. For hard decoding, this paper attempts to find a read threshold minimizing bit error rate (BER) and derives an expression for the resulting codeword error rate. For soft decoding, it shows that minimizing BER and minimizing codeword error rate are competing objectives in the presence of a limited number of allowed rereads, and proposes a tradeoff between the two. The proposed method does not require any prior knowledge about the noise distribution but can take advantage of such information when it is available. Each read threshold is chosen based on the results of previous reads, following an optimal policy derived through a dynamic programming backward recursion. The method and results are studied from the perspective of an SLC Flash memory with Gaussian noise, but this paper explains how the method could be extended to other scenarios.

  • GLOBECOM - Towards minimizing read time for NAND Flash
    2012 IEEE Global Communications Conference (GLOBECOM), 2012
    Co-Authors: Borja Peleato, Rajiv Agarwal, John M. Cioffi, Minghai Qin, Paul H. Siegel
    Abstract:

    On NAND Flash, a primary source of increased read time comes from the fact that in the presence of noise, the Flash Medium must be read several times using different read threshold voltages to find the optimal read location, which minimizes bit-error-rate. This paper proposes an algorithm to estimate the optimal read threshold in a fast manner using a limited number of re-reads. Then it derives an expression for the resulting BER in terms of the minimum possible BER. It is also shown that minimizing BER and minimizing codeword-error-rate are competing objectives in the presence of a limited number of allowed re-reads, and a tradeoff between the two is proposed.

Borja Peleato - One of the best experts on this subject based on the ideXlab platform.

  • Adaptive Read Thresholds for NAND Flash
    IEEE Transactions on Communications, 2015
    Co-Authors: Borja Peleato, Rajiv Agarwal, John M. Cioffi, Minghai Qin, Paul H. Siegel
    Abstract:

    A primary source of increased read time on nand Flash comes from the fact that, in the presence of noise, the Flash Medium must be read several times using different read threshold voltages for the decoder to succeed. This paper proposes an algorithm that uses a limited number of rereads to characterize the noise distribution and recover the stored information. Both hard and soft decoding are considered. For hard decoding, this paper attempts to find a read threshold minimizing bit error rate (BER) and derives an expression for the resulting codeword error rate. For soft decoding, it shows that minimizing BER and minimizing codeword error rate are competing objectives in the presence of a limited number of allowed rereads, and proposes a tradeoff between the two. The proposed method does not require any prior knowledge about the noise distribution but can take advantage of such information when it is available. Each read threshold is chosen based on the results of previous reads, following an optimal policy derived through a dynamic programming backward recursion. The method and results are studied from the perspective of an SLC Flash memory with Gaussian noise, but this paper explains how the method could be extended to other scenarios.

  • GLOBECOM - Towards minimizing read time for NAND Flash
    2012 IEEE Global Communications Conference (GLOBECOM), 2012
    Co-Authors: Borja Peleato, Rajiv Agarwal, John M. Cioffi, Minghai Qin, Paul H. Siegel
    Abstract:

    On NAND Flash, a primary source of increased read time comes from the fact that in the presence of noise, the Flash Medium must be read several times using different read threshold voltages to find the optimal read location, which minimizes bit-error-rate. This paper proposes an algorithm to estimate the optimal read threshold in a fast manner using a limited number of re-reads. Then it derives an expression for the resulting BER in terms of the minimum possible BER. It is also shown that minimizing BER and minimizing codeword-error-rate are competing objectives in the presence of a limited number of allowed re-reads, and a tradeoff between the two is proposed.

Rajiv Agarwal - One of the best experts on this subject based on the ideXlab platform.

  • Adaptive Read Thresholds for NAND Flash
    IEEE Transactions on Communications, 2015
    Co-Authors: Borja Peleato, Rajiv Agarwal, John M. Cioffi, Minghai Qin, Paul H. Siegel
    Abstract:

    A primary source of increased read time on nand Flash comes from the fact that, in the presence of noise, the Flash Medium must be read several times using different read threshold voltages for the decoder to succeed. This paper proposes an algorithm that uses a limited number of rereads to characterize the noise distribution and recover the stored information. Both hard and soft decoding are considered. For hard decoding, this paper attempts to find a read threshold minimizing bit error rate (BER) and derives an expression for the resulting codeword error rate. For soft decoding, it shows that minimizing BER and minimizing codeword error rate are competing objectives in the presence of a limited number of allowed rereads, and proposes a tradeoff between the two. The proposed method does not require any prior knowledge about the noise distribution but can take advantage of such information when it is available. Each read threshold is chosen based on the results of previous reads, following an optimal policy derived through a dynamic programming backward recursion. The method and results are studied from the perspective of an SLC Flash memory with Gaussian noise, but this paper explains how the method could be extended to other scenarios.

  • GLOBECOM - Towards minimizing read time for NAND Flash
    2012 IEEE Global Communications Conference (GLOBECOM), 2012
    Co-Authors: Borja Peleato, Rajiv Agarwal, John M. Cioffi, Minghai Qin, Paul H. Siegel
    Abstract:

    On NAND Flash, a primary source of increased read time comes from the fact that in the presence of noise, the Flash Medium must be read several times using different read threshold voltages to find the optimal read location, which minimizes bit-error-rate. This paper proposes an algorithm to estimate the optimal read threshold in a fast manner using a limited number of re-reads. Then it derives an expression for the resulting BER in terms of the minimum possible BER. It is also shown that minimizing BER and minimizing codeword-error-rate are competing objectives in the presence of a limited number of allowed re-reads, and a tradeoff between the two is proposed.