The Experts below are selected from a list of 2496 Experts worldwide ranked by ideXlab platform

Ficorella F. - One of the best experts on this subject based on the ideXlab platform.

  • Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
    2018
    Co-Authors: Evangelista Y., Ambrosino F., Feroci M., Bellutti P., Bertuccio G., Borghi G., Campana R., Caselle M., Cirrincione D., Ficorella F.
    Abstract:

    Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as Focal Plane Devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughputX-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5–15 keV with nearly Fano-limited energy resolution (≤150 eV FWHM @ 6 keV) at room temperature or with moderate cooling (~0°C to +20°C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (44) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments

  • Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
    'IOP Publishing', 2018
    Co-Authors: Evangelista Y., Ambrosino F., Feroci M., Bellutti P., Bertuccio G., Borghi G., Campana R., Caselle M., Cirrincione D., Ficorella F.
    Abstract:

    Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as Focal Plane Devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughput X-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5-15 keV with nearly Fano-limited energy resolution ($\leq$150 eV FWHM @ 6 keV) at room temperature or with moderate cooling ($\sim$0 {\deg}C to +20 {\deg}C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (4$\times$4) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments.Comment: Accepted for publication in Journal of Instrumentation (JINST) on 29th August 201

Evangelista Y. - One of the best experts on this subject based on the ideXlab platform.

  • Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
    2018
    Co-Authors: Evangelista Y., Ambrosino F., Feroci M., Bellutti P., Bertuccio G., Borghi G., Campana R., Caselle M., Cirrincione D., Ficorella F.
    Abstract:

    Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as Focal Plane Devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughputX-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5–15 keV with nearly Fano-limited energy resolution (≤150 eV FWHM @ 6 keV) at room temperature or with moderate cooling (~0°C to +20°C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (44) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments

  • Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
    'IOP Publishing', 2018
    Co-Authors: Evangelista Y., Ambrosino F., Feroci M., Bellutti P., Bertuccio G., Borghi G., Campana R., Caselle M., Cirrincione D., Ficorella F.
    Abstract:

    Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as Focal Plane Devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughput X-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5-15 keV with nearly Fano-limited energy resolution ($\leq$150 eV FWHM @ 6 keV) at room temperature or with moderate cooling ($\sim$0 {\deg}C to +20 {\deg}C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (4$\times$4) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments.Comment: Accepted for publication in Journal of Instrumentation (JINST) on 29th August 201

Soman M. - One of the best experts on this subject based on the ideXlab platform.

  • Effects of temperature anneal cycling on a cryogenically proton irradiated CCD
    'IOP Publishing', 2021
    Co-Authors: Parsons S., Buggey T., Holland A., Sembay S., Randall G., Hetherington O., Yeoman D., Hall D., Verhoeve P., Soman M.
    Abstract:

    Throughout a typical Earth orbit a satellite is constantly bombarded by radiation with trapped and solar protons being of particular concern as they gradually damage the Focal Plane Devices throughout the mission and degrade their performance. To understand the impact the damage has on CCDs and how it varies with their thermal history a proton radiation campaign has been carried out using a CCD280. The CCD is irradiated at 153 K and gradually warmed to 188 K in 5 K increments with Fe55 X-ray, dark current and trap pumping images taken at 153 K after each anneal step. The results show that despite the trap landscape changing throughout the anneal it has little impact on parallel charge transfer inefficiency. This is thought to be because most traps are unaffected and a lot of those that do anneal only move from the continuum between distinct trap species and into a nearby divacancy trap “peak” whose emission time constant is similar enough to still impact the CTI. In terms of using a CCD280 or similar Devices in a mission the CTI being unaffected by thermal annealing up to 188 K means that any CTI correction needed as the radiation damage builds up does not have to take into account the thermal history of the Focal Plane. However, it is possible that a significant amount of annealing will occur at temperatures greater than 188 K and care should be taken when a mission is operating in this range to gather accurate pre-flight data

  • Effects of Temperature Anneal Cycling on a Cryogenically Proton Irradiated CCD
    2021
    Co-Authors: Parsons S., Buggey T., Holland A., Sembay S., Randall G., Hetherington O., Yeoman D., Hall D., Verhoeve P., Soman M.
    Abstract:

    Throughout a typical Earth orbit a satellite is constantly bombarded by radiation with trapped and solar protons being of particular concern as they gradually damage the Focal Plane Devices throughout the mission and degrade their performance. To understand the impact the damage has on CCDs and how it varies with their thermal history a proton radiation campaign has been carried out using a CCD280. The CCD is irradiated at 153 K and gradually warmed to 188 K in 5 K increments with Fe55 X-ray, dark current and trap pumping images taken at 153 K after each anneal step. The results show that despite the trap landscape changing throughout the anneal it has little impact on parallel charge transfer inefficiency. This is thought to be because most traps are unaffected and a lot of those that do anneal only move from the continuum between distinct trap species and into a nearby divacancy trap 'peak' whose emission time constant is similar enough to still impact the CTI. In terms of using a CCD280 or similar Devices in a mission the CTI being unaffected by thermal annealing up to 188 K means that any CTI correction needed as the radiation damage builds up does not have to take into account the thermal history of the Focal Plane. However, it is possible that a significant amount of annealing will occur at temperatures greater than 188 K and care should be taken when a mission is operating in this range to gather accurate pre-flight data.Comment: 17 pages, 12 Figure

Bellutti P. - One of the best experts on this subject based on the ideXlab platform.

  • Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
    2018
    Co-Authors: Evangelista Y., Ambrosino F., Feroci M., Bellutti P., Bertuccio G., Borghi G., Campana R., Caselle M., Cirrincione D., Ficorella F.
    Abstract:

    Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as Focal Plane Devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughputX-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5–15 keV with nearly Fano-limited energy resolution (≤150 eV FWHM @ 6 keV) at room temperature or with moderate cooling (~0°C to +20°C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (44) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments

  • Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
    'IOP Publishing', 2018
    Co-Authors: Evangelista Y., Ambrosino F., Feroci M., Bellutti P., Bertuccio G., Borghi G., Campana R., Caselle M., Cirrincione D., Ficorella F.
    Abstract:

    Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as Focal Plane Devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughput X-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5-15 keV with nearly Fano-limited energy resolution ($\leq$150 eV FWHM @ 6 keV) at room temperature or with moderate cooling ($\sim$0 {\deg}C to +20 {\deg}C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (4$\times$4) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments.Comment: Accepted for publication in Journal of Instrumentation (JINST) on 29th August 201

Bertuccio G. - One of the best experts on this subject based on the ideXlab platform.

  • Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
    2018
    Co-Authors: Evangelista Y., Ambrosino F., Feroci M., Bellutti P., Bertuccio G., Borghi G., Campana R., Caselle M., Cirrincione D., Ficorella F.
    Abstract:

    Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as Focal Plane Devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughputX-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5–15 keV with nearly Fano-limited energy resolution (≤150 eV FWHM @ 6 keV) at room temperature or with moderate cooling (~0°C to +20°C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (44) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments

  • Characterization of a novel pixelated Silicon Drift Detector (PixDD) for high-throughput X-ray astrophysics
    'IOP Publishing', 2018
    Co-Authors: Evangelista Y., Ambrosino F., Feroci M., Bellutti P., Bertuccio G., Borghi G., Campana R., Caselle M., Cirrincione D., Ficorella F.
    Abstract:

    Multi-pixel fast silicon detectors represent the enabling technology for the next generation of space-borne experiments devoted to high-resolution spectral-timing studies of low-flux compact cosmic sources. Several imaging detectors based on frame-integration have been developed as Focal Plane Devices for X-ray space-borne missions but, when coupled to large-area concentrator X-ray optics, these detectors are affected by strong pile-up and dead-time effects, thus limiting the time and energy resolution as well as the overall system sensitivity. The current technological gap in the capability to realize pixelated silicon detectors for soft X-rays with fast, photon-by-photon response and nearly Fano-limited energy resolution therefore translates into the unavailability of sparse read-out sensors suitable for high throughput X-ray astronomy applications. In the framework of the ReDSoX Italian collaboration, we developed a new, sparse read-out, pixelated silicon drift detector which operates in the energy range 0.5-15 keV with nearly Fano-limited energy resolution ($\leq$150 eV FWHM @ 6 keV) at room temperature or with moderate cooling ($\sim$0 {\deg}C to +20 {\deg}C). In this paper, we present the design and the laboratory characterization of the first 16-pixel (4$\times$4) drift detector prototype (PixDD), read-out by individual ultra low-noise charge sensitive preamplifiers (SIRIO) and we discuss the future PixDD prototype developments.Comment: Accepted for publication in Journal of Instrumentation (JINST) on 29th August 201