The Experts below are selected from a list of 156 Experts worldwide ranked by ideXlab platform

Tamotsu Magome - One of the best experts on this subject based on the ideXlab platform.

  • Precise method of compensating radiation-induced errors in a hot-cathode-ionization Gauge with correcting electrode
    2014
    Co-Authors: Hiroshi Saeki, Tamotsu Magome
    Abstract:

    To compensate pressure-measurement errors caused by a synchrotron radiation environment, a precise method using a hot-cathode-ionization-Gauge Head with correcting electrode, was developed and tested in a simulation experiment with excess electrons in the SPring-8 storage ring. This precise method to improve the measurement accuracy, can correctly reduce the pressure-measurement errors caused by electrons originating from the external environment, and originating from the primary Gauge filament influenced by spatial conditions of the installed vacuum-Gauge Head. As the result of the simulation experiment to confirm the performance reducing the errors caused by the external environment, the pressure-measurement error using this method was approximately less than several percent in the pressure range from 10−5 Pa to 10−8 Pa. After the experiment, to confirm the performance reducing the error caused by spatial conditions, an additional experiment was carried out using a sleeve and showed that the improved fu...

  • residual currents detected with a correcting electrode in a modified bayard alpert hot cathode ionization Gauge
    Review of Scientific Instruments, 2008
    Co-Authors: Hiroshi Saeki, Tamotsu Magome
    Abstract:

    A nude-type hot-cathode-ionization-Gauge Head with correcting electrode and shield tube, succeeded in reducing practical pressure-measurement errors caused by an influx of photoelectrons in a synchrotron radiation environment. In the development of this modified Bayard–Alpert hot-cathode-ionization Gauge, experimental results showed that a basic ion current generated around the correcting electrode by emission from the Gauge filament, was proportional to an emission current (less than 10% of the normal emission current) detected with a grid of correcting electrode, and that differences between estimated and measured basic ion currents in a pressure range of higher than 10−8Pa order meant pressure-independent residual currents detected with the correcting electrode. By using calculated forward x-ray currents, these results also showed that the estimated residual currents with the correcting electrode were mainly caused by x rays from the grid of the hot-cathode-ionization-Gauge Head and the grid of correct...

  • Residual currents detected with a correcting electrode in a modified Bayard–Alpert hot-cathode-ionization Gauge
    Review of Scientific Instruments, 2008
    Co-Authors: Hiroshi Saeki, Tamotsu Magome
    Abstract:

    A nude-type hot-cathode-ionization-Gauge Head with correcting electrode and shield tube, succeeded in reducing practical pressure-measurement errors caused by an influx of photoelectrons in a synchrotron radiation environment. In the development of this modified Bayard–Alpert hot-cathode-ionization Gauge, experimental results showed that a basic ion current generated around the correcting electrode by emission from the Gauge filament, was proportional to an emission current (less than 10% of the normal emission current) detected with a grid of correcting electrode, and that differences between estimated and measured basic ion currents in a pressure range of higher than 10−8Pa order meant pressure-independent residual currents detected with the correcting electrode. By using calculated forward x-ray currents, these results also showed that the estimated residual currents with the correcting electrode were mainly caused by x rays from the grid of the hot-cathode-ionization-Gauge Head and the grid of correct...

  • performance of a hot cathode ionization Gauge Head with correcting electrode and shield tube operated with an automated pressure compensating circuit in a synchrotron radiation environment
    Journal of Vacuum Science and Technology, 2006
    Co-Authors: Hiroshi Saeki, Tamotsu Magome, Yoshihiko Shoji
    Abstract:

    Related Articles Long-term stability of metal-envelope enclosed Bayard–Alpert ionization Gauges J. Vac. Sci. Technol. A 30, 061601 (2012) Method to compensate radiation-induced errors in a hot-cathode-ionization Gauge with correcting electrode J. Vac. Sci. Technol. A 29, 061601 (2011) Microelectromechanical system-based vacuum Gauge for measuring pressure and outgassing rates in miniaturized vacuum microelectronic devices J. Vac. Sci. Technol. B 29, 02B114 (2011) On the stability of capacitance-diaphragm Gauges with ceramic membranes J. Vac. Sci. Technol. A 29, 011011 (2011) Radioisotope-powered ion Gauge with super high stability, long life, and large sensitivity range from ultrahigh vacuum to high pressure J. Vac. Sci. Technol. B 28, L52 (2010)

  • hot cathode ionization Gauge system with a self compensating circuit for errors caused by an external electron source
    Review of Scientific Instruments, 2004
    Co-Authors: Hiroshi Saeki, Tamotsu Magome, Nobuaki Gotoh, T Aoki, Takashi Momose
    Abstract:

    A hot-cathode-ionization-Gauge system, consisting of a Gauge Head with a correcting electrode, an automated-pressure-compensating circuit, and a shield tube, succeeded in overcoming two kinds of erroneous pressure indications with hot-cathode-ionization Gauges. Several tens of hot-cathode-ionization Gauges in the SPring-8 storage ring have indicated abnormally low pressures (of the order from 10−8 to 10−9 Pa) at stored-electron-beam conditions due to an influx of photoelectrons. Some of these Gauges, located near photon absorbers, have indicated negative pressures (from −2×10−9 to −2×10−7 Pa). To investigate these pressure-measurement errors, simulated experiments to reproduce the phenomena were carried out using an external-electron source which was located near a hot-cathode-ionization-Gauge Head. The kinetic energy of incident electrons to the Gauge Head from the external-electron source was varied from 10 to 90 eV. The maximum total-electron-beam current from the external-electron source at the positi...

Hiroshi Saeki - One of the best experts on this subject based on the ideXlab platform.

  • Precise method of compensating radiation-induced errors in a hot-cathode-ionization Gauge with correcting electrode
    2014
    Co-Authors: Hiroshi Saeki, Tamotsu Magome
    Abstract:

    To compensate pressure-measurement errors caused by a synchrotron radiation environment, a precise method using a hot-cathode-ionization-Gauge Head with correcting electrode, was developed and tested in a simulation experiment with excess electrons in the SPring-8 storage ring. This precise method to improve the measurement accuracy, can correctly reduce the pressure-measurement errors caused by electrons originating from the external environment, and originating from the primary Gauge filament influenced by spatial conditions of the installed vacuum-Gauge Head. As the result of the simulation experiment to confirm the performance reducing the errors caused by the external environment, the pressure-measurement error using this method was approximately less than several percent in the pressure range from 10−5 Pa to 10−8 Pa. After the experiment, to confirm the performance reducing the error caused by spatial conditions, an additional experiment was carried out using a sleeve and showed that the improved fu...

  • residual currents detected with a correcting electrode in a modified bayard alpert hot cathode ionization Gauge
    Review of Scientific Instruments, 2008
    Co-Authors: Hiroshi Saeki, Tamotsu Magome
    Abstract:

    A nude-type hot-cathode-ionization-Gauge Head with correcting electrode and shield tube, succeeded in reducing practical pressure-measurement errors caused by an influx of photoelectrons in a synchrotron radiation environment. In the development of this modified Bayard–Alpert hot-cathode-ionization Gauge, experimental results showed that a basic ion current generated around the correcting electrode by emission from the Gauge filament, was proportional to an emission current (less than 10% of the normal emission current) detected with a grid of correcting electrode, and that differences between estimated and measured basic ion currents in a pressure range of higher than 10−8Pa order meant pressure-independent residual currents detected with the correcting electrode. By using calculated forward x-ray currents, these results also showed that the estimated residual currents with the correcting electrode were mainly caused by x rays from the grid of the hot-cathode-ionization-Gauge Head and the grid of correct...

  • Residual currents detected with a correcting electrode in a modified Bayard–Alpert hot-cathode-ionization Gauge
    Review of Scientific Instruments, 2008
    Co-Authors: Hiroshi Saeki, Tamotsu Magome
    Abstract:

    A nude-type hot-cathode-ionization-Gauge Head with correcting electrode and shield tube, succeeded in reducing practical pressure-measurement errors caused by an influx of photoelectrons in a synchrotron radiation environment. In the development of this modified Bayard–Alpert hot-cathode-ionization Gauge, experimental results showed that a basic ion current generated around the correcting electrode by emission from the Gauge filament, was proportional to an emission current (less than 10% of the normal emission current) detected with a grid of correcting electrode, and that differences between estimated and measured basic ion currents in a pressure range of higher than 10−8Pa order meant pressure-independent residual currents detected with the correcting electrode. By using calculated forward x-ray currents, these results also showed that the estimated residual currents with the correcting electrode were mainly caused by x rays from the grid of the hot-cathode-ionization-Gauge Head and the grid of correct...

  • performance of a hot cathode ionization Gauge Head with correcting electrode and shield tube operated with an automated pressure compensating circuit in a synchrotron radiation environment
    Journal of Vacuum Science and Technology, 2006
    Co-Authors: Hiroshi Saeki, Tamotsu Magome, Yoshihiko Shoji
    Abstract:

    Related Articles Long-term stability of metal-envelope enclosed Bayard–Alpert ionization Gauges J. Vac. Sci. Technol. A 30, 061601 (2012) Method to compensate radiation-induced errors in a hot-cathode-ionization Gauge with correcting electrode J. Vac. Sci. Technol. A 29, 061601 (2011) Microelectromechanical system-based vacuum Gauge for measuring pressure and outgassing rates in miniaturized vacuum microelectronic devices J. Vac. Sci. Technol. B 29, 02B114 (2011) On the stability of capacitance-diaphragm Gauges with ceramic membranes J. Vac. Sci. Technol. A 29, 011011 (2011) Radioisotope-powered ion Gauge with super high stability, long life, and large sensitivity range from ultrahigh vacuum to high pressure J. Vac. Sci. Technol. B 28, L52 (2010)

  • hot cathode ionization Gauge system with a self compensating circuit for errors caused by an external electron source
    Review of Scientific Instruments, 2004
    Co-Authors: Hiroshi Saeki, Tamotsu Magome, Nobuaki Gotoh, T Aoki, Takashi Momose
    Abstract:

    A hot-cathode-ionization-Gauge system, consisting of a Gauge Head with a correcting electrode, an automated-pressure-compensating circuit, and a shield tube, succeeded in overcoming two kinds of erroneous pressure indications with hot-cathode-ionization Gauges. Several tens of hot-cathode-ionization Gauges in the SPring-8 storage ring have indicated abnormally low pressures (of the order from 10−8 to 10−9 Pa) at stored-electron-beam conditions due to an influx of photoelectrons. Some of these Gauges, located near photon absorbers, have indicated negative pressures (from −2×10−9 to −2×10−7 Pa). To investigate these pressure-measurement errors, simulated experiments to reproduce the phenomena were carried out using an external-electron source which was located near a hot-cathode-ionization-Gauge Head. The kinetic energy of incident electrons to the Gauge Head from the external-electron source was varied from 10 to 90 eV. The maximum total-electron-beam current from the external-electron source at the positi...

Huang Chunying - One of the best experts on this subject based on the ideXlab platform.

  • One kind of water level monitor recording instrument
    2008 3rd IEEE Conference on Industrial Electronics and Applications, 2008
    Co-Authors: Peng Xuange, Li Peipei, Huang Chunying
    Abstract:

    The record way of most existing water level monitors is to use the float type, cannot satisfy the request of digitized output.Therefore studied one kind of water level monitor recording instrument composed by the microprocessor, drive circuit, stepper motor, the electric conduction metal measured linc.thc volume line drum,the water level supervised Gauge Head. Its characteristic one is actual measure water level rise, the drop and the invariable three conditions by two IC comparator and the microprocessor interrupt function; Two,uses a long screw rod installment to realize the axes stable motion on the volume line drum, arranges the electric conduction metal measure line smoothly. lt can supervise the water level change automatically, record the value and time each water level change.This instrument may substitute for the present water level recording method. Has attained the Chinese patent, ZL:200420057999.5.

Guoxiong Zhang - One of the best experts on this subject based on the ideXlab platform.

  • An online measuring system for large screw threads
    Fourth International Symposium on Precision Mechanical Measurements, 2008
    Co-Authors: Hongyan Zhang, Guoxiong Zhang
    Abstract:

    An online measuring system can automatically detect large screw threads by using the neotype Gauge Head of threads, which includes a TESA inductance type transducer and a probe pin chosen according to the tooth-type of the screw thread. The contact measurement method was adopted on the basis of the synthetic measurement principle. The functional diameter of thread has experimentally been investigated and analyzed. The method of data processing is not only based on the principle of a precision measurement, but also on the principle of a dynamic test. The dynamic error is analyzed in this paper by spectrum analysis. The dynamic error is taken out and data of the functional diameter of the thread will be obtained. The analysis and the results of an actual measurement mentioned above show that the neotype Gauge Head of thread is capable to get the error and relative changes of the functional diameter of the screw thread. So the compatibility of saw-tooth thread can be evaluated. The system is not only suited for the test of saw-tooth thread, but also for that of other large threads with different tooth forms by using different types of probes. External threads as well as internal threads can be tested. Because the measurement strength of the neotype Gauge Head is much smaller than that of regular screw Gauges, thus diminishing the measurement error resulting from the contact stress, the measurement precision of the gauging Head can reach 1 μm.

Zhang Guo-xiong - One of the best experts on this subject based on the ideXlab platform.

  • Online test system of large screw thread
    Chinese Journal of Mechanical Engineering, 2008
    Co-Authors: Zhang Hongyan, Zhang Guo-xiong
    Abstract:

    A new method for automatically detecting the large screw thread is discussed by using the neotype Gauge Head of thread which includes TESA inductance type transducer and survey probe chosen according to the tooth-type of thread.The way of contact measurement is adopted on the basis of the synthetically measuring principle for thread.The functional diameter of thread is investigated and analyzed experimentally.Through spectrum analysis,the dynamic error is picked out while data of functional diameter of thread will be obtained.Because the measurement strength of the neotype Gauge Head is much smaller than that of the regular screw Gauge so as to diminish the most measurement error resulted from the contact stress.Experimental results show that the neotype Gauge Head of thread can improve measuring accuracy and the measuring accuracy reaches l~tm after data processing.