The Experts below are selected from a list of 78 Experts worldwide ranked by ideXlab platform

Kathy Lu - One of the best experts on this subject based on the ideXlab platform.

  • Thermal stability of a new solid oxide fuel/electrolyzer cell seal glass
    Journal of Power Sources, 2010
    Co-Authors: Tongan Jin, Kathy Lu
    Abstract:

    Abstract Long-term thermal stability of sealing glass is critical for Hermetic Seals of solid oxide fuel and electrolyzer cell stacks. In this work, a SrO–La 2 O 3 –Al 2 O 3 –SiO 2 glass (SABS-0 glass) has been evaluated as a high temperature sealant by thermal treatment. Powder and bulk SABS-0 glasses are studied in both air and H 2 /H 2 O atmospheres at 800 °C for up to 1000 h. Weight measurements show negligible SABS-0 glass vaporization during the thermal treatment. Both SABS-0 powder and bulk samples show some surface devitrification but the SABS-0 glass bulk remains amorphous at all the thermal treatment conditions. On the polished bulk SABS-0 surface, needle-shaped crystals are observed for both the air and the H 2 /H 2 O thermal treatment conditions. Polishing is believed to be the initiator for the SABS-0 glass surface devitrification. The crystalline phases, indentified as silicates and aluminates, increase with the thermal treatment time. However, the crystalline phases on the polished SABS-0 glass surface are very limited and only exist on the very surface of both the air and the H 2 /H 2 O atmosphere treated samples. The SABS-0 glass has excellent thermal stability in solid oxide fuel/electrolyzer operating environments and is a promising sealant material for such applications.

  • thermal stability of a new solid oxide fuel electrolyzer cell seal glass
    Journal of Power Sources, 2010
    Co-Authors: Tongan Jin, Kathy Lu
    Abstract:

    Abstract Long-term thermal stability of sealing glass is critical for Hermetic Seals of solid oxide fuel and electrolyzer cell stacks. In this work, a SrO–La 2 O 3 –Al 2 O 3 –SiO 2 glass (SABS-0 glass) has been evaluated as a high temperature sealant by thermal treatment. Powder and bulk SABS-0 glasses are studied in both air and H 2 /H 2 O atmospheres at 800 °C for up to 1000 h. Weight measurements show negligible SABS-0 glass vaporization during the thermal treatment. Both SABS-0 powder and bulk samples show some surface devitrification but the SABS-0 glass bulk remains amorphous at all the thermal treatment conditions. On the polished bulk SABS-0 surface, needle-shaped crystals are observed for both the air and the H 2 /H 2 O thermal treatment conditions. Polishing is believed to be the initiator for the SABS-0 glass surface devitrification. The crystalline phases, indentified as silicates and aluminates, increase with the thermal treatment time. However, the crystalline phases on the polished SABS-0 glass surface are very limited and only exist on the very surface of both the air and the H 2 /H 2 O atmosphere treated samples. The SABS-0 glass has excellent thermal stability in solid oxide fuel/electrolyzer operating environments and is a promising sealant material for such applications.

Tongan Jin - One of the best experts on this subject based on the ideXlab platform.

  • Thermal stability of a new solid oxide fuel/electrolyzer cell seal glass
    Journal of Power Sources, 2010
    Co-Authors: Tongan Jin, Kathy Lu
    Abstract:

    Abstract Long-term thermal stability of sealing glass is critical for Hermetic Seals of solid oxide fuel and electrolyzer cell stacks. In this work, a SrO–La 2 O 3 –Al 2 O 3 –SiO 2 glass (SABS-0 glass) has been evaluated as a high temperature sealant by thermal treatment. Powder and bulk SABS-0 glasses are studied in both air and H 2 /H 2 O atmospheres at 800 °C for up to 1000 h. Weight measurements show negligible SABS-0 glass vaporization during the thermal treatment. Both SABS-0 powder and bulk samples show some surface devitrification but the SABS-0 glass bulk remains amorphous at all the thermal treatment conditions. On the polished bulk SABS-0 surface, needle-shaped crystals are observed for both the air and the H 2 /H 2 O thermal treatment conditions. Polishing is believed to be the initiator for the SABS-0 glass surface devitrification. The crystalline phases, indentified as silicates and aluminates, increase with the thermal treatment time. However, the crystalline phases on the polished SABS-0 glass surface are very limited and only exist on the very surface of both the air and the H 2 /H 2 O atmosphere treated samples. The SABS-0 glass has excellent thermal stability in solid oxide fuel/electrolyzer operating environments and is a promising sealant material for such applications.

  • thermal stability of a new solid oxide fuel electrolyzer cell seal glass
    Journal of Power Sources, 2010
    Co-Authors: Tongan Jin, Kathy Lu
    Abstract:

    Abstract Long-term thermal stability of sealing glass is critical for Hermetic Seals of solid oxide fuel and electrolyzer cell stacks. In this work, a SrO–La 2 O 3 –Al 2 O 3 –SiO 2 glass (SABS-0 glass) has been evaluated as a high temperature sealant by thermal treatment. Powder and bulk SABS-0 glasses are studied in both air and H 2 /H 2 O atmospheres at 800 °C for up to 1000 h. Weight measurements show negligible SABS-0 glass vaporization during the thermal treatment. Both SABS-0 powder and bulk samples show some surface devitrification but the SABS-0 glass bulk remains amorphous at all the thermal treatment conditions. On the polished bulk SABS-0 surface, needle-shaped crystals are observed for both the air and the H 2 /H 2 O thermal treatment conditions. Polishing is believed to be the initiator for the SABS-0 glass surface devitrification. The crystalline phases, indentified as silicates and aluminates, increase with the thermal treatment time. However, the crystalline phases on the polished SABS-0 glass surface are very limited and only exist on the very surface of both the air and the H 2 /H 2 O atmosphere treated samples. The SABS-0 glass has excellent thermal stability in solid oxide fuel/electrolyzer operating environments and is a promising sealant material for such applications.

Mo-sci Corporation - One of the best experts on this subject based on the ideXlab platform.

  • Sealing Glasses
    SCHOTT North America Inc, 2016
    Co-Authors: Richard K. Brow, Mo-sci Corporation
    Abstract:

    To manufacture Hermetic and highly insulating electrical Seals between different materials such as metal or ceramics, the use of sealing glasses is wide spread in the electronics industry. Sealing glasses typically have a processing temperature of 800–1000°C.\r\n\r\nSealing glasses mostly belong to the borosilicate and aluminosilicate glass families.\r\n\r\nTo manufacture reliable Hermetic Seals, the correct choice of coefficient of thermal expansion (CTE) is a key factor. The applied glass composition depends on the materials which should be joined, the required temperature profile as well as their CTE. For matched Seals, the CTE of the glass is matched as closely as possible to those of the sealing partners. In case of compression Seals, a well-defined mismatch of the CTE is used intentionally to compress the sealing materials

Xiaosong Zhou - One of the best experts on this subject based on the ideXlab platform.

  • nano layered structure interface between sn ti alloy and quartz glass for Hermetic Seals
    Materials Letters, 2019
    Co-Authors: Fangzhi Li, Weiguang Zhang, Xiaosong Zhou
    Abstract:

    Abstract The interface structure between Sn-Ti alloy and quartz glass was investigated by transmission electron microscope. The results show that the interface is continuous and dense and has a nano-layered-structure with thickness of several tens of nanometer without holes and cracks. The interface is divided into two layers. One is the TiO2 layer with a thickness of about 2 nm locates near Sn-Ti alloy, and the other is a multiphase structure layer near the quartz glass composed of nanocrystalline TiSi2, Ti5Si3 and TiO2.

Y Y Hung - One of the best experts on this subject based on the ideXlab platform.

  • technique for rapid inspection of Hermetic Seals of microelectronic packages using shearography
    Optical Engineering, 1998
    Co-Authors: Y Y Hung
    Abstract:

    One possible failure of microelectronic devices is due to leakage resulting from an imperfect Hermetical seal in microelectronic packages such as microchips. This malfunction is often experienced in automobiles in which the electronic devices are exposed to hostile environments. Traditional leak-testing methods are very time consuming. A shearographic technique for rapid evaluation of Hermetic Seals is presented. The package under test is stressed by an external pressure change. With the pressure change maintained, the lid of a perfectly sealed package will remain deformed while a leaky package will not hold the deformation, which can be monitored by shearography. This leak testing is fast and practical and can be extended to testing pharmaceutical packages, food packages, etc. © 1998 Society of Photo-Optical Instrumentation Engineers.

  • rapid evaluation of Hermetic Seals in microelectronic packages using shearography
    International Conference on Experimental Mechanics: Advances and Applications, 1997
    Co-Authors: Y Y Hung
    Abstract:

    One possible failure of microelectronic devices is due to leakage resulted from imperfect Hermetical seal in microchips and microelectronic packages. This paper presents an optical technique for rapid evaluation of Hermetics Seals. It is based on measuring package deformation with shearography. The package under test is stressed by an external pressure change and the deformation of the test package's lid is measured with shearography. With the pressure change maintained, the lid of a perfectly sealed package will remain deformed while a leaky package will not hold the deformation that can be monitored by shearography. The proposed process of leaking testing is very fast and practical.© (1997) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.

  • rapid evaluation of Hermetic Seals using digital shearography
    SPIE's 1995 International Symposium on Optical Science Engineering and Instrumentation, 1995
    Co-Authors: Y Y Hung
    Abstract:

    Packages such as microelectronic packages require Hermetic Seals, as the reliability of such devices is extremely important. One possible failure is due to leakage resulting from imperfect Hermetical Seals in microchips and microelectronic packages. Imperfect sealing may allow moisture and other impurities to migrate into the packages and cause the devices to malfunction. Current methods of testing Hermetics are very slow and cumbersome and thus they cannot be used for mass inspection in production. This paper presents a novel technique based on digital shearography, which allows Hermetic Seals to be rapidly tested. This method employs a technique of digital shearography for measuring time-dependent deformation. In this paper, a figure is shown of the technique whereby the object to be studied is illuminated with a point source of coherent light and it is imaged by an image-shearing video camera which produces a pair of laterally sheared images on the image sensor of the camera. In other words, two object points are brought to meet in the image plane; they interfere producing a speckle pattern. When the object is deformed, a phase change is induced in the speckle pattern which measures the relative displacement between the interfering points. In the study of a time-dependent deformation of a test object, the speckle patterns received by the image- shearing video camera are continuously digitized at a predetermined rate depending on the deformation rate via a frame grabber into a micro-computer such as a PC, and stored in the memory of the computer. After recording, the displacement derivative versus time for any point of interest can be extracted by plotting the phase change of the speckle pattern at the point versus time from the computer memory. The total phase change can be obtained by integrating the phase curve. The evaluation of Hermetic Seals in microelectronic packages is based on measuring the time-deformation of the package's lid. The package to be tested is placed in an enclosure inside which the pressure can be varied. A change of pressure in the chamber is applied and held constant; the package surface will be deformed. If the package is perfectly sealed, the deformation will remain constant. Whereas, if the package leaks, the deformation of package surface will gradually recover cuasing a time-dependent deformation. Hence by measuring the deformation of the package's surface as a function of time with digital shearography, leaky packages can be revealed. Figures in this paper show a typical test result of a perfectly sealed package, and a typical result for a slow leaker, and a fast leaker. In the data, each cycle in the curve represents a deformation of $w/x of about 100 X 10-6. This process of detecting leaks in microelectronic packages is extremely fast, typically a couple of seconds. The conventional methods would probably require a couple of hours.© (1995) COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.