The Experts below are selected from a list of 4311 Experts worldwide ranked by ideXlab platform
Christian Le Bas - One of the best experts on this subject based on the ideXlab platform.
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collective knowledge prolific inventors and the Value of inventions an empirical study of french german and british patents in the us 1975 1999
Economics of Innovation and New Technology, 2008Co-Authors: William R Latham, Christian Le BasAbstract:Abstract The objective of this paper is to test two related hypotheses: The first is that the involvement of both prolific and foreign inventors in the production of knowledge has a direct, positive impact on the collective dimension of this knowledge production as measured by the size of the inventive team. The second is that the involvement of both prolific and foreign inventors has a direct, positive impact on the Value of the new knowledge produced. We use detailed information from nearly 300,000 patents granted by the US Patent Office to French, German, and British inventors over the period from 1975 to 1999. From the data available from each patent regarding citations of prior patents and the numbers and identities of the inventors listed in the patent application, we are able to construct measures of collective knowledge, the presence of prolific and foreign inventors, and the Imputed Value of patents. In a novel approach in this literature, we estimate negative binomial multiple regression models ...
William R Latham - One of the best experts on this subject based on the ideXlab platform.
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collective knowledge prolific inventors and the Value of inventions an empirical study of french german and british patents in the us 1975 1999
Economics of Innovation and New Technology, 2008Co-Authors: William R Latham, Christian Le BasAbstract:Abstract The objective of this paper is to test two related hypotheses: The first is that the involvement of both prolific and foreign inventors in the production of knowledge has a direct, positive impact on the collective dimension of this knowledge production as measured by the size of the inventive team. The second is that the involvement of both prolific and foreign inventors has a direct, positive impact on the Value of the new knowledge produced. We use detailed information from nearly 300,000 patents granted by the US Patent Office to French, German, and British inventors over the period from 1975 to 1999. From the data available from each patent regarding citations of prior patents and the numbers and identities of the inventors listed in the patent application, we are able to construct measures of collective knowledge, the presence of prolific and foreign inventors, and the Imputed Value of patents. In a novel approach in this literature, we estimate negative binomial multiple regression models ...
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collective knowledge prolific inventors and the Value of inventions an empirical study of french german and british owned u s patents 1975 1998
Research Papers in Economics, 2005Co-Authors: William R Latham, Christian LebasAbstract:The aim of this paper is to test two related propositions: (1) that there is a direct, positive relationship between the involvement of a prolific inventor in the production of knowledge and the magnitudes in the collective dimension of this knowledge production, as measured by the presence of foreign inventors and the size of the inventive team; and (2) that there is a direct, positive relationship between the involvement of a prolific (or foreign) inventor and the Value of the new knowledge produced. We use detailed information from nearly 300,000 patents granted by the US Patent Office to French, German and British inventors over the period from 1975 to 1999. From data available from each patent regarding citations of prior patents and the numbers and identities of the inventors listed in the patent application, we are able to construct measures of collective knowledge, the presence of prolific inventors, and the Imputed Value of patents. In a novel approach in this literature, we estimate negative binomial multiple regression models for determining measures of both collective knowledge and the Value of the patents. We find strong support, after controlling for technological field effects, for hypotheses that both prolific and foreign inventors tend to be parts of larger teams of inventors and that both prolific and foreign inventors tend to produce inventions having more Value. In the conclusion, we draw some implications of these results for knowledge governance.
Christian Lebas - One of the best experts on this subject based on the ideXlab platform.
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collective knowledge prolific inventors and the Value of inventions an empirical study of french german and british owned u s patents 1975 1998
Research Papers in Economics, 2005Co-Authors: William R Latham, Christian LebasAbstract:The aim of this paper is to test two related propositions: (1) that there is a direct, positive relationship between the involvement of a prolific inventor in the production of knowledge and the magnitudes in the collective dimension of this knowledge production, as measured by the presence of foreign inventors and the size of the inventive team; and (2) that there is a direct, positive relationship between the involvement of a prolific (or foreign) inventor and the Value of the new knowledge produced. We use detailed information from nearly 300,000 patents granted by the US Patent Office to French, German and British inventors over the period from 1975 to 1999. From data available from each patent regarding citations of prior patents and the numbers and identities of the inventors listed in the patent application, we are able to construct measures of collective knowledge, the presence of prolific inventors, and the Imputed Value of patents. In a novel approach in this literature, we estimate negative binomial multiple regression models for determining measures of both collective knowledge and the Value of the patents. We find strong support, after controlling for technological field effects, for hypotheses that both prolific and foreign inventors tend to be parts of larger teams of inventors and that both prolific and foreign inventors tend to produce inventions having more Value. In the conclusion, we draw some implications of these results for knowledge governance.
David L Streiner - One of the best experts on this subject based on the ideXlab platform.
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the case of the missing data methods of dealing with dropouts and other research vagaries
The Canadian Journal of Psychiatry, 2002Co-Authors: David L StreinerAbstract:Missing data are common in most studies, especially when subjects are followed over time. This can jeopardize the validity of a study because of reduced power to detect differences, and especially because subjects who are lost to follow-up rarely represent the group as a whole. There are several approaches to handling missing data, but some may result in biased estimates of the treatment effect, and others may overestimate the significance of the statistical tests. When cross-sectional data (for example, demographic and background information and a single outcome measurement time) are missing, replacement with the group mean leads to an underestimate of the standard deviation (SD) and inflation of the Type I error rate. Using regression estimates, especially with error built into the Imputed Value, lessens but does not eliminate this problem. Multiple imputation preserves the estimates of both the mean and the SD, even when a significant proportion of the data are missing. With longitudinal studies, the last observation carried forward (LOCF) approach preserves the sample size, but may make unwarranted assumptions about the missing data, resulting in either underestimating or overestimating the treatment effects. Growth curve analysis makes maximal use of the existing data and makes fewer assumptions.
Xiaohui Liu - One of the best experts on this subject based on the ideXlab platform.
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empirical likelihood for censored partial linear model based on Imputed Value
Communications in Statistics-theory and Methods, 2013Co-Authors: Guannan Wang, Zhizhong Wang, Xiaohui LiuAbstract:This article aims at proposing a new type of empirical likelihood testing procedure based on the Wilks theorem and Imputed Value in censored partial linear model. The present study is mainly designed to use empirical likelihood (EL) method based on synthetic dependent data, and the result can not be applied directly due to the weights in it. In this article, a censored empirical log-likelihood ratio is introduced to tackle this problem. Particularly, we demonstrate that its limiting distribution is a standard chi-squared distribution with freedom of one. This method is used to calculate the p-Value and construct the confidence interval. Some simulation studies are conducted to highlight the performance of the proposed EL method, and the results show that it performs well. Finally, an illustration is given using the Stanford Heart Transplant data.
