In Situ Measurement

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The Experts below are selected from a list of 321 Experts worldwide ranked by ideXlab platform

H. Mizuno - One of the best experts on this subject based on the ideXlab platform.

  • In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
    IEEE Journal of Solid-State Circuits, 2007
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In Situ Measurement scheme for generatIng supply-noise maps, which can be conducted while runnIng applications In product-level LSIs, was developed. The design of the on-chip voltage samplIng probe is based on a simple rIng oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processIng and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G-cellular-phone processor. It will thus help In designIng power-supply networks and In visually verifyIng the quality of a power supply

  • In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
    2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In-Situ Measurement scheme for supply-noise maps under runnIng applications In product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G cellular phone processor. It will thus help In designIng power-supply networks and visibly verifyIng the quality of a power supply

Y. Kanno - One of the best experts on this subject based on the ideXlab platform.

  • In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
    IEEE Journal of Solid-State Circuits, 2007
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In Situ Measurement scheme for generatIng supply-noise maps, which can be conducted while runnIng applications In product-level LSIs, was developed. The design of the on-chip voltage samplIng probe is based on a simple rIng oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processIng and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G-cellular-phone processor. It will thus help In designIng power-supply networks and In visually verifyIng the quality of a power supply

  • In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
    2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In-Situ Measurement scheme for supply-noise maps under runnIng applications In product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G cellular phone processor. It will thus help In designIng power-supply networks and visibly verifyIng the quality of a power supply

Y. Yasu - One of the best experts on this subject based on the ideXlab platform.

  • In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
    IEEE Journal of Solid-State Circuits, 2007
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In Situ Measurement scheme for generatIng supply-noise maps, which can be conducted while runnIng applications In product-level LSIs, was developed. The design of the on-chip voltage samplIng probe is based on a simple rIng oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processIng and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G-cellular-phone processor. It will thus help In designIng power-supply networks and In visually verifyIng the quality of a power supply

  • In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
    2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In-Situ Measurement scheme for supply-noise maps under runnIng applications In product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G cellular phone processor. It will thus help In designIng power-supply networks and visibly verifyIng the quality of a power supply

K. Hirose - One of the best experts on this subject based on the ideXlab platform.

  • In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
    IEEE Journal of Solid-State Circuits, 2007
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In Situ Measurement scheme for generatIng supply-noise maps, which can be conducted while runnIng applications In product-level LSIs, was developed. The design of the on-chip voltage samplIng probe is based on a simple rIng oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processIng and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G-cellular-phone processor. It will thus help In designIng power-supply networks and In visually verifyIng the quality of a power supply

  • In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
    2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In-Situ Measurement scheme for supply-noise maps under runnIng applications In product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G cellular phone processor. It will thus help In designIng power-supply networks and visibly verifyIng the quality of a power supply

Y. Kondoh - One of the best experts on this subject based on the ideXlab platform.

  • In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
    IEEE Journal of Solid-State Circuits, 2007
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In Situ Measurement scheme for generatIng supply-noise maps, which can be conducted while runnIng applications In product-level LSIs, was developed. The design of the on-chip voltage samplIng probe is based on a simple rIng oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processIng and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G-cellular-phone processor. It will thus help In designIng power-supply networks and In visually verifyIng the quality of a power supply

  • In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
    2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006
    Co-Authors: Y. Kanno, Y. Kondoh, T. Irita, K. Hirose, R. Mori, Y. Yasu, S. Komatsu, H. Mizuno
    Abstract:

    An In-Situ Measurement scheme for supply-noise maps under runnIng applications In product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution In a 3G cellular phone processor. It will thus help In designIng power-supply networks and visibly verifyIng the quality of a power supply

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