The Experts below are selected from a list of 327 Experts worldwide ranked by ideXlab platform
Mariko Takayanagi - One of the best experts on this subject based on the ideXlab platform.
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Breakdown Voltage Prediction of Ultra-Thin Gate Insulator in Electrostatic Discharge (ESD) Based on Anode Hole Injection Model
2006 IEEE International Reliability Physics Symposium Proceedings, 2006Co-Authors: Atsuhiro Kinoshita, Y. Mitani, Kazuya Matsuzawa, H. Kawashima, C. Sutoh, J. Kurihara, T. Hiraoka, Izumi Hirano, M. Muta, Mariko TakayanagiAbstract:A prediction Model for the breakdown voltage of ultra-thin gate insulator in electrostatic discharge (ESD) is proposed. The time-dependent-dielectric-breakdown characteristics under DC stress successfully predicts ESD oriented dielectric breakdown on the basis of the modified anode hole Injection Model. The proposed Model redistributes experimental breakdown voltages and number of pulses to breakdown in extensive gate voltages and gate insulator thicknesses. In conclusion, the present Model is quite effective for the prediction of ESD reliability in highly scaled ULSI devices.
Bruce A. Mcclane - One of the best experts on this subject based on the ideXlab platform.
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Dissecting the contributions of Clostridium perfringens type C toxins to lethality in the mouse intravenous Injection Model.
Infection and immunity, 2006Co-Authors: Derek J. Fisher, Mariano E. Fernandez-miyakawa, Sameera Sayeed, Rachael Poon, Victoria Michelle Adams, Julian I. Rood, Francisco A. Uzal, Bruce A. McclaneAbstract:The gram-positive anaerobe Clostridium perfringens produces a large arsenal of toxins that are responsible for histotoxic and enteric infections, including enterotoxemias, in humans and domestic animals. C. perfringens type C isolates, which cause rapidly fatal diseases in domestic animals and enteritis necroticans in humans, contain the genes for alpha toxin (plc), perfringolysin O (pfoA), beta toxin (cpb), and sometimes beta2 toxin (cpb2) and/or enterotoxin (cpe). Due to the economic impact of type C-induced diseases, domestic animals are commonly vaccinated with crude type C toxoid (prepared from inactivated culture supernatants) or bacterin/toxoid vaccines, and it is not clear which toxin(s) present in these vaccines actually elicits the protective immune response. To improve type C vaccines, it would be helpful to assess the contribution of each toxin present in type C supernatants to lethality. To address this issue, we surveyed a large collection of type C isolates to determine their toxin-producing abilities. When late-log-phase vegetative culture supernatants were analyzed by quantitative Western blotting or activity assays, most type C isolates produced at least three lethal toxins, alpha toxin, beta toxin, and perfringolysin O, and several isolates also produced beta2 toxin. In the mouse intravenous Injection Model, beta toxin was identified as the main lethal factor present in type C late-log-phase culture supernatants. This conclusion was based on monoclonal antibody neutralization studies and regression analyses in which the levels of alpha toxin, beta toxin, perfringolysin O, and beta2 toxin production were compared with lethality. Collectively, our results highlight the importance of beta toxin for type C-induced toxemia.
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Epsilon-toxin Is required for most Clostridium perfringens type D vegetative culture supernatants to cause lethality in the mouse intravenous Injection Model
Infection and immunity, 2005Co-Authors: Sameera Sayeed, Derek J. Fisher, Mariano E. Fernandez-miyakawa, Rachael Poon, Victoria Michelle Adams, Julian I. Rood, Francisco A. Uzal, Bruce A. McclaneAbstract:Clostridium perfringens type D enterotoxemias have significant economic impact by causing rapid death of several domestic animal species. Consequently, domestic animals are commonly vaccinated, at varying efficacy, with inactivated type D vegetative supernatants. Improved type D vaccines might become possible if the lethal toxins produced by type D isolates were characterized and the contributions of those toxins to supernatant-induced lethality were established. Therefore, the current study evaluated the presence of lethal toxins in supernatants prepared from late-log-phase vegetative cultures of a large collection of genotype D isolates. Under this growth condition, most genotype D isolates produced variable levels of at least three different lethal toxins, including epsilon-toxin (ETX). To Model the rapid lethality of type D enterotoxemias, studies were conducted involving intravenous (i.v.) Injection of genotype D vegetative supernatants into mice, which were then observed for neurotoxic distress. Those experiments demonstrated a correlation between ETX (but not alpha-toxin or perfringolysin O) levels in late-log-phase genotype D supernatants and lethality. Consistent with the known proteolytic activation requirement for ETX toxicity, trypsin pretreatment was required for, or substantially increased, the lethality of nearly all of the tested genotype D vegetative supernatants. Finally, the lethality of these trypsin-pretreated genotype D supernatants could be completely neutralized by an ETX-specific monoclonal antibody but not by an alpha-toxin-specific monoclonal antibody. Collectively, these results indicate that, under the experimental conditions used in the present study, ETX is necessary for the lethal properties of most genotype D vegetative supernatants in the mouse i.v. Injection Model.
Atsuhiro Kinoshita - One of the best experts on this subject based on the ideXlab platform.
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Breakdown Voltage Prediction of Ultra-Thin Gate Insulator in Electrostatic Discharge (ESD) Based on Anode Hole Injection Model
2006 IEEE International Reliability Physics Symposium Proceedings, 2006Co-Authors: Atsuhiro Kinoshita, Y. Mitani, Kazuya Matsuzawa, H. Kawashima, C. Sutoh, J. Kurihara, T. Hiraoka, Izumi Hirano, M. Muta, Mariko TakayanagiAbstract:A prediction Model for the breakdown voltage of ultra-thin gate insulator in electrostatic discharge (ESD) is proposed. The time-dependent-dielectric-breakdown characteristics under DC stress successfully predicts ESD oriented dielectric breakdown on the basis of the modified anode hole Injection Model. The proposed Model redistributes experimental breakdown voltages and number of pulses to breakdown in extensive gate voltages and gate insulator thicknesses. In conclusion, the present Model is quite effective for the prediction of ESD reliability in highly scaled ULSI devices.
Mariesa L. Crow - One of the best experts on this subject based on the ideXlab platform.
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The Existence of Multiple Equilibria in the UPFC Power Injection Model
IEEE Transactions on Power Systems, 2007Co-Authors: Mahyar Zarghami, Mariesa L. CrowAbstract:This letter shows the existence of multiple equilibria that arise from the use of the state Model of the unified power flow controller (UPFC). These multiple equilibria can arise from a common power Injection Model for the same terminal conditions of shunt bus voltage and series active and reactive power Injections. The multiple equilibria result in two or more sets of eigenvalues, some of which may indicate an unstable operating condition. Therefore, the use of the UPFC power Injection Model must be used with caution to ensure stable operation of the UPFC.
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Power Engineering Letters The Existence of Multiple Equilibria in the UPFC Power Injection Model
2007Co-Authors: Mahyar Zarghami, Mariesa L. CrowAbstract:This letter shows the existence of multiple equilibria that arise from the use of the state Model of the unified power flow controller (UPFC). These multiple equilibria can arise from a common power Injection Model for the same terminal conditions of shunt bus voltage and series active and reactive power injec- tions. The multiple equilibria result in two or more sets of eigen- values, some of which may indicate an unstable operating condi- tion. Therefore, the use of the UPFC power Injection Model must be used with caution to ensure stable operation of the UPFC. Index Terms—Oscillation damping, power system stability, uni- fied power flow controller (UPFC).
T. Hiraoka - One of the best experts on this subject based on the ideXlab platform.
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Breakdown Voltage Prediction of Ultra-Thin Gate Insulator in Electrostatic Discharge (ESD) Based on Anode Hole Injection Model
2006 IEEE International Reliability Physics Symposium Proceedings, 2006Co-Authors: Atsuhiro Kinoshita, Y. Mitani, Kazuya Matsuzawa, H. Kawashima, C. Sutoh, J. Kurihara, T. Hiraoka, Izumi Hirano, M. Muta, Mariko TakayanagiAbstract:A prediction Model for the breakdown voltage of ultra-thin gate insulator in electrostatic discharge (ESD) is proposed. The time-dependent-dielectric-breakdown characteristics under DC stress successfully predicts ESD oriented dielectric breakdown on the basis of the modified anode hole Injection Model. The proposed Model redistributes experimental breakdown voltages and number of pulses to breakdown in extensive gate voltages and gate insulator thicknesses. In conclusion, the present Model is quite effective for the prediction of ESD reliability in highly scaled ULSI devices.