The Experts below are selected from a list of 282 Experts worldwide ranked by ideXlab platform
William Trattler - One of the best experts on this subject based on the ideXlab platform.
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comparison of prediction error labeled versus unlabeled intraocular lens Manufacturing Tolerance
Journal of Cataract and Refractive Surgery, 2012Co-Authors: Valdis J Zudans, Neel R. Desai, William TrattlerAbstract:Purpose To compare the prediction error between intraocular lenses (IOLs) available in 0.25 diopter (D) increments with a labeled Manufacturing Tolerance and IOLs available in 0.50 D increments without a labeled Manufacturing Tolerance. Setting Community-based multidisciplinary outpatient ophthalmic practices. Design Comparative case series. Methods Eyes with cataract had implantation of an IOL available in 0.25 D increments and labeled with a Manufacturing Tolerance of ±0.11 D (labeled group) or an IOL available in 0.50 D increments without a labeled Manufacturing Tolerance (unlabeled group). Postoperatively, the prediction error was calculated and compared between groups. Results By the SRK/T formula, the mean error of prediction after optimization was −0.03 D ± 0.35 (SD) in the labeled group and −0.05 ± 0.46 D in the unlabeled group (P=.64). The mean absolute error of prediction was statistically significantly smaller in the labeled group (0.26 ± 0.23 D) than in the unlabeled group (0.37 ± 0.28 D) (P=.04). The mean and absolute errors were not statistically significantly different with the Holladay 1 or Hoffer Q formula. Sixty-three percent of patients in the labeled group and 43% in the unlabeled group (P=.03) were within ±0.25 D of the prediction error; 84% and 69%, respectively, were within ±0.50 D (P=.06). Conclusion The IOLs available in 0.25 D increments with a labeled Manufacturing Tolerance of ±0.11 D increased the percentage of patients within ±0.25 D of the targeted refraction to a statistically significant and clinically meaningful level compared with unlabeled IOLs available in 0.50 D increments. Financial Disclosure No author has a financial or proprietary interest in any material or method mentioned.
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Comparison of prediction error: labeled versus unlabeled intraocular lens Manufacturing Tolerance.
Journal of cataract and refractive surgery, 2012Co-Authors: J. Valdis Zudans, Neel R. Desai, William TrattlerAbstract:To compare the prediction error between intraocular lenses (IOLs) available in 0.25 diopter (D) increments with a labeled Manufacturing Tolerance and IOLs available in 0.50 D increments without a labeled Manufacturing Tolerance. Community-based multidisciplinary outpatient ophthalmic practices. Comparative case series. Eyes with cataract had implantation of an IOL available in 0.25 D increments and labeled with a Manufacturing Tolerance of ± 0.11 D (labeled group) or an IOL available in 0.50 D increments without a labeled Manufacturing Tolerance (unlabeled group). Postoperatively, the prediction error was calculated and compared between groups. By the SRK/T formula, the mean error of prediction after optimization was -0.03 D ± 0.35 (SD) in the labeled group and -0.05 ± 0.46 D in the unlabeled group (P=.64). The mean absolute error of prediction was statistically significantly smaller in the labeled group (0.26 ± 0.23 D) than in the unlabeled group (0.37 ± 0.28 D) (P=.04). The mean and absolute errors were not statistically significantly different with the Holladay 1 or Hoffer Q formula. Sixty-three percent of patients in the labeled group and 43% in the unlabeled group (P=.03) were within ± 0.25 D of the prediction error; 84% and 69%, respectively, were within ± 0.50 D (P=.06). The IOLs available in 0.25 D increments with a labeled Manufacturing Tolerance of ± 0.11 D increased the percentage of patients within ± 0.25 D of the targeted refraction to a statistically significant and clinically meaningful level compared with unlabeled IOLs available in 0.50 D increments. No author has a financial or proprietary interest in any material or method mentioned. Copyright © 2012. Published by Elsevier Inc.
Ken Morito - One of the best experts on this subject based on the ideXlab platform.
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wdm interconnect targeted si wire optical demultiplexers for large Manufacturing Tolerance low voltage tunability and polarization diversified operability
Optical Fiber Communication Conference, 2016Co-Authors: Seokhwan Jeong, Yohei Sobu, Shinsuke Tanaka, T Simoyama, Yu Tanaka, Ken MoritoAbstract:We report novel Si-wire optical DeMUX technologies required for large Manufacturing Tolerance, low-voltage wavelength tunability and polarization diversified operability. These technologies could be practical building blocks for WDM integrated transceivers.
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OFC - WDM interconnect targeted Si-wire optical demultiplexers for large Manufacturing Tolerance, low voltage tunability and polarization diversified operability
Optical Fiber Communication Conference, 2016Co-Authors: Seokhwan Jeong, Yohei Sobu, Shinsuke Tanaka, T Simoyama, Yu Tanaka, Ken MoritoAbstract:We report novel Si-wire optical DeMUX technologies required for large Manufacturing Tolerance, low-voltage wavelength tunability and polarization diversified operability. These technologies could be practical building blocks for WDM integrated transceivers.
Neel R. Desai - One of the best experts on this subject based on the ideXlab platform.
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comparison of prediction error labeled versus unlabeled intraocular lens Manufacturing Tolerance
Journal of Cataract and Refractive Surgery, 2012Co-Authors: Valdis J Zudans, Neel R. Desai, William TrattlerAbstract:Purpose To compare the prediction error between intraocular lenses (IOLs) available in 0.25 diopter (D) increments with a labeled Manufacturing Tolerance and IOLs available in 0.50 D increments without a labeled Manufacturing Tolerance. Setting Community-based multidisciplinary outpatient ophthalmic practices. Design Comparative case series. Methods Eyes with cataract had implantation of an IOL available in 0.25 D increments and labeled with a Manufacturing Tolerance of ±0.11 D (labeled group) or an IOL available in 0.50 D increments without a labeled Manufacturing Tolerance (unlabeled group). Postoperatively, the prediction error was calculated and compared between groups. Results By the SRK/T formula, the mean error of prediction after optimization was −0.03 D ± 0.35 (SD) in the labeled group and −0.05 ± 0.46 D in the unlabeled group (P=.64). The mean absolute error of prediction was statistically significantly smaller in the labeled group (0.26 ± 0.23 D) than in the unlabeled group (0.37 ± 0.28 D) (P=.04). The mean and absolute errors were not statistically significantly different with the Holladay 1 or Hoffer Q formula. Sixty-three percent of patients in the labeled group and 43% in the unlabeled group (P=.03) were within ±0.25 D of the prediction error; 84% and 69%, respectively, were within ±0.50 D (P=.06). Conclusion The IOLs available in 0.25 D increments with a labeled Manufacturing Tolerance of ±0.11 D increased the percentage of patients within ±0.25 D of the targeted refraction to a statistically significant and clinically meaningful level compared with unlabeled IOLs available in 0.50 D increments. Financial Disclosure No author has a financial or proprietary interest in any material or method mentioned.
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Comparison of prediction error: labeled versus unlabeled intraocular lens Manufacturing Tolerance.
Journal of cataract and refractive surgery, 2012Co-Authors: J. Valdis Zudans, Neel R. Desai, William TrattlerAbstract:To compare the prediction error between intraocular lenses (IOLs) available in 0.25 diopter (D) increments with a labeled Manufacturing Tolerance and IOLs available in 0.50 D increments without a labeled Manufacturing Tolerance. Community-based multidisciplinary outpatient ophthalmic practices. Comparative case series. Eyes with cataract had implantation of an IOL available in 0.25 D increments and labeled with a Manufacturing Tolerance of ± 0.11 D (labeled group) or an IOL available in 0.50 D increments without a labeled Manufacturing Tolerance (unlabeled group). Postoperatively, the prediction error was calculated and compared between groups. By the SRK/T formula, the mean error of prediction after optimization was -0.03 D ± 0.35 (SD) in the labeled group and -0.05 ± 0.46 D in the unlabeled group (P=.64). The mean absolute error of prediction was statistically significantly smaller in the labeled group (0.26 ± 0.23 D) than in the unlabeled group (0.37 ± 0.28 D) (P=.04). The mean and absolute errors were not statistically significantly different with the Holladay 1 or Hoffer Q formula. Sixty-three percent of patients in the labeled group and 43% in the unlabeled group (P=.03) were within ± 0.25 D of the prediction error; 84% and 69%, respectively, were within ± 0.50 D (P=.06). The IOLs available in 0.25 D increments with a labeled Manufacturing Tolerance of ± 0.11 D increased the percentage of patients within ± 0.25 D of the targeted refraction to a statistically significant and clinically meaningful level compared with unlabeled IOLs available in 0.50 D increments. No author has a financial or proprietary interest in any material or method mentioned. Copyright © 2012. Published by Elsevier Inc.
Seokhwan Jeong - One of the best experts on this subject based on the ideXlab platform.
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wdm interconnect targeted si wire optical demultiplexers for large Manufacturing Tolerance low voltage tunability and polarization diversified operability
Optical Fiber Communication Conference, 2016Co-Authors: Seokhwan Jeong, Yohei Sobu, Shinsuke Tanaka, T Simoyama, Yu Tanaka, Ken MoritoAbstract:We report novel Si-wire optical DeMUX technologies required for large Manufacturing Tolerance, low-voltage wavelength tunability and polarization diversified operability. These technologies could be practical building blocks for WDM integrated transceivers.
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OFC - WDM interconnect targeted Si-wire optical demultiplexers for large Manufacturing Tolerance, low voltage tunability and polarization diversified operability
Optical Fiber Communication Conference, 2016Co-Authors: Seokhwan Jeong, Yohei Sobu, Shinsuke Tanaka, T Simoyama, Yu Tanaka, Ken MoritoAbstract:We report novel Si-wire optical DeMUX technologies required for large Manufacturing Tolerance, low-voltage wavelength tunability and polarization diversified operability. These technologies could be practical building blocks for WDM integrated transceivers.
Jin Hur - One of the best experts on this subject based on the ideXlab platform.
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Stochastic Analysis for Influence of Manufacturing Tolerance of Permanent Magnet on Performance of IPMSM
2019 IEEE Energy Conversion Congress and Exposition (ECCE), 2019Co-Authors: Deok-jae Kwon, Seung-tae Lee, Jin HurAbstract:Permanent magnet synchronous motors are ideal in design and analysis processes, but they have inevitably imperfect magnetic properties owing to the Manufacturing Tolerances. Imperfect magnetic properties due to Manufacturing Tolerances may result in changes in performance such as cogging torque and torque ripple that are ideally designed. Thus, Manufacturing Tolerances must be carefully managed for satisfying target performance. Among the Manufacturing Tolerances, in this study, the Tolerances of permanent magnets are examined in accordance with stator winding connection, and stochastic analysis is used for evaluating the extent of the performance degradation. Consequently, this study provides the criterion of Tolerances for satisfying the target performance.
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Torque characteristic analysis considering the Manufacturing Tolerance for electric machine by stochastic response surface method
IEEE Transactions on Industry Applications, 2003Co-Authors: Young-kyoun Kim, Jung-pyo Hong, Jin HurAbstract:Manufacturing Tolerances as well as measuring errors have a great influence on products designed by optimization technique, etc., to improve their characteristics and reduce the production cost. Therefore, Tolerance analysis technique is required to find the Tolerance band of design variables for minimizing the effect and estimating the characteristic distribution of the products. This paper represents the torque characteristics considering the Manufacturing Tolerance of an electric machine. In order to analyze the Tolerance of the brushless DC (BLDC) motor, stochastic response surface methodology (SRSM), which treats input data as stochastic variables, is introduced. It can analyze the Tolerances from the electrical point of view and find a robust optimal solution that has insensitive performance on its change of the design variables by applying the optimization technique. A surface permanent-magnet BLDC motor is used to confirm the validity of this method. It must be noted that the statistical torque characteristics analyzed by SRSM has a great advantage in the design and manufacture stage over conventional method.
