The Experts below are selected from a list of 8415 Experts worldwide ranked by ideXlab platform

J Mutus - One of the best experts on this subject based on the ideXlab platform.

  • low energy electron point projection microscopy of suspended graphene the ultimate Microscope Slide
    New Journal of Physics, 2011
    Co-Authors: J Mutus, L Livadaru, Jeremy T Robinson, R Urban, Mark Salomons, Martin Cloutier
    Abstract:

    Point projection microscopy (PPM) is used to image suspended graphene by using low-energy electrons (100–205 eV). Because of the low energies used, the graphene is neither damaged nor contaminated by the electron beam for doses of the order of 107 electrons per nm2. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet twice as thick as the covalent radius of sp2-bonded carbon. Also observed is rippling in the structure of the suspended graphene, with a wavelength of approximately 26 nm. The interference of the electron beam due to diffraction off the edge of a graphene knife edge is observed and is used to calculate a virtual source size of 4.7±0.6 A for the electron emitter. It is demonstrated that graphene can serve as both the anode and the substrate in PPM, thereby avoiding distortions due to strong field gradients around nanoscale objects. Graphene can be used to image objects suspended on the sheet using PPM and, in the future, electron holography.

  • low energy electron point projection microscopy of suspended graphene the ultimate Microscope Slide
    arXiv: Mesoscale and Nanoscale Physics, 2011
    Co-Authors: J Mutus, L Livadaru, Jeremy T Robinson, R Urban, Mark Salomons, Martin Cloutier, Paul E Sheehan, Robert A Wolkow
    Abstract:

    Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet as thick as twice the covalent radius of sp^2-bonded carbon. Also observed is rippling in the structure of the suspended graphene, with a wavelength of approximately 26 nm. The interference of the electron beam due to the diffraction off the edge of a graphene knife edge is observed and used to calculate a virtual source size of 4.7 +/- 0.6 Angstroms for the electron emitter. It is demonstrated that graphene can be used as both anode and substrate in PPM in order to avoid distortions due to strong field gradients around nano-scale objects. Graphene can be used to image objects suspended on the sheet using PPM, and in the future, electron holography.

Pietro Ferraro - One of the best experts on this subject based on the ideXlab platform.

  • field deployable cost effective holographic Slide Microscope a 3d printed prototype
    Imaging and Applied Optics Congress (2020) paper HW3C.2, 2020
    Co-Authors: Vittorio Bianco, Biagio Mandracchia, Melania Paturzo, Teresa Cacace, Vito Pagliarulo, Emilia Oleandro, Pietro Ferraro
    Abstract:

    Here we design a compact, portable and cost-effective holographic Microscope based on the concept of holographic Microscope Slide. We developed a wavefront division holographic interferometer deployable for in-situ environmental monitoring and point-of care diagnostics.

  • endowing a plain fluidic chip with micro optics a holographic Microscope Slide
    Light-Science & Applications, 2017
    Co-Authors: Vittorio Bianco, Biagio Mandracchia, Melania Paturzo, Vito Pagliarulo, Valentina Marchesano, Federico Olivieri, Sara Coppola, Pietro Ferraro
    Abstract:

    Lab-on-a-Chip (LoC) devices are extremely promising in that they enable diagnostic functions at the point-of-care. Within this scope, an important goal is to design imaging schemes that can be used out of the laboratory. In this paper, we introduce and test a pocket holographic Slide that allows digital holography microscopy to be performed without an interferometer setup. Instead, a commercial off-the-shelf plastic chip is engineered and functionalized with this aim. The microfluidic chip is endowed with micro-optics, that is, a diffraction grating and polymeric lenses, to build an interferometer directly on the chip, avoiding the need for a reference arm and external bulky optical components. Thanks to the single-beam scheme, the system is completely integrated and robust against vibrations, sharing the useful features of any common path interferometer. Hence, it becomes possible to bring holographic functionalities out of the lab, moving complexity from the external optical apparatus to the chip itself. Label-free imaging and quantitative phase contrast mapping of live samples are demonstrated, along with flexible refocusing capabilities. Thus, a liquid volume can be analyzed in one single shot with no need for mechanical scanning systems.

  • holographic Microscope Slide in a spatio temporal imaging modality for reliable 3d cell counting
    Lab on a Chip, 2017
    Co-Authors: Biagio Mandracchia, Vittorio Bianco, Zhe Wang, Martina Mugnano, Alessia Bramanti, Melania Paturzo, Pietro Ferraro
    Abstract:

    In the current trend of miniaturization and simplification of imaging flow cytometry, Lab-on-a-Chip (LoC) microfluidic devices represent an innovative and cost-effective solution. In this framework, we propose for the first time a novel platform based on the compactness of a holographic Microscope Slide (HMS) in combination with the new computational features of space-time digital holography (STDH) that uses a 1D linear sensor array (LSA) instead of 2D CCD or CMOS cameras to respond to real diagnostic needs. In this LoC platform, computational methods, holography, and microfluidics are intertwined in order to provide an imaging system with a reduced amount of optical components and capability to achieve reliable cell counting even in the absence of very accurate flow control. STDH exploits the sample motion into the microfluidic channel to obtain an unlimited field-of-view along the flow direction, independent of the magnification factor. Furthermore, numerical refocusing typical of a holographic modality allows imaging and visualization of the entire volume of the channel, thus avoiding loss of information due to the limited depth of focus of standard Microscopes. Consequently, we believe that this platform could open new perspectives for enhancing the throughput by 3D volumetric imaging.

Andrew P Bradley - One of the best experts on this subject based on the ideXlab platform.

  • performance analysis of three Microscope Slide scanning techniques
    Digital Image Computing: Techniques and Applications, 2013
    Co-Authors: Yilun Fan, Yaniv Gal, Andrew P Bradley
    Abstract:

    The demands for digital pathology systems have increased dramatically in the last decade as Virtual Microscopy (VM) has gained increasing popularity. Many digital Slide acquisition systems have been developed to meet this demand, utilising a variety of image scan techniques. However, the requirements for, and performance of, these scan techniques are largely undocumented. Therefore, in this paper we evaluate the three primary approaches to digital Slide scanning in light field microscopy: field-of-view (FOV) scan, line scan and slanted specimen scan. Initially, we develop equations for each technique that estimates their theoretical scan times in terms data throughput rates. Next, we compare each system's performance based on the relationships between illumination, camera frame rates, data transfer rates and Microscope stage speed. We conclude that slanted scan system capable of acquiring multiple focal planes in one pass have the potential to obtain the shortest scan times within current constraints on stage and camera hardware.

  • an evaluation of multi resolution Microscope Slide scanning algorithms
    Digital Image Computing: Techniques and Applications, 2011
    Co-Authors: Doreen Altinay, Andrew P Bradley
    Abstract:

    In this paper we develop and compare several multi-resolution Microscope Slide scanning algorithms of increasing complexity. The algorithms utilise a low-resolution image of the whole sample to optimise the high-resolution scan in terms of decreasing the number of field-of-view (FOV) images required. This approach, while commonly applied in microscopy, has never been fully evaluated to quantify expected improvements in scan time when the high-resolution scans are optimised on each sample. In addition, the methods have potential to improve image quality by reducing both image stitching and focus tracking artefacts.

  • towards optimal image stitching for virtual microscopy
    Digital Image Computing: Techniques and Applications, 2005
    Co-Authors: Ben Appleton, Andrew P Bradley, Michael Wildermoth
    Abstract:

    In this paper we present an image stitching method based on dynamic programming and describe its application to automated Slide acquisition for Virtual Microscopy (VM). Given a large number of fields of view (FOVs) acquired from a single Microscope Slide, we composite these images into a single large ‘virtual Slide’ image. The location of each FOV is determined using a new algorithm based on dynamic programming. We compare the performance of the proposed algorithm to an existing greedy algorithm. In a visual trial it is shown that the new algorithm provides a significant improvement in perceived image quality at image boundaries compared to the existing algorithm.

Martin Cloutier - One of the best experts on this subject based on the ideXlab platform.

  • low energy electron point projection microscopy of suspended graphene the ultimate Microscope Slide
    New Journal of Physics, 2011
    Co-Authors: J Mutus, L Livadaru, Jeremy T Robinson, R Urban, Mark Salomons, Martin Cloutier
    Abstract:

    Point projection microscopy (PPM) is used to image suspended graphene by using low-energy electrons (100–205 eV). Because of the low energies used, the graphene is neither damaged nor contaminated by the electron beam for doses of the order of 107 electrons per nm2. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet twice as thick as the covalent radius of sp2-bonded carbon. Also observed is rippling in the structure of the suspended graphene, with a wavelength of approximately 26 nm. The interference of the electron beam due to diffraction off the edge of a graphene knife edge is observed and is used to calculate a virtual source size of 4.7±0.6 A for the electron emitter. It is demonstrated that graphene can serve as both the anode and the substrate in PPM, thereby avoiding distortions due to strong field gradients around nanoscale objects. Graphene can be used to image objects suspended on the sheet using PPM and, in the future, electron holography.

  • low energy electron point projection microscopy of suspended graphene the ultimate Microscope Slide
    arXiv: Mesoscale and Nanoscale Physics, 2011
    Co-Authors: J Mutus, L Livadaru, Jeremy T Robinson, R Urban, Mark Salomons, Martin Cloutier, Paul E Sheehan, Robert A Wolkow
    Abstract:

    Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet as thick as twice the covalent radius of sp^2-bonded carbon. Also observed is rippling in the structure of the suspended graphene, with a wavelength of approximately 26 nm. The interference of the electron beam due to the diffraction off the edge of a graphene knife edge is observed and used to calculate a virtual source size of 4.7 +/- 0.6 Angstroms for the electron emitter. It is demonstrated that graphene can be used as both anode and substrate in PPM in order to avoid distortions due to strong field gradients around nano-scale objects. Graphene can be used to image objects suspended on the sheet using PPM, and in the future, electron holography.

L Livadaru - One of the best experts on this subject based on the ideXlab platform.

  • low energy electron point projection microscopy of suspended graphene the ultimate Microscope Slide
    New Journal of Physics, 2011
    Co-Authors: J Mutus, L Livadaru, Jeremy T Robinson, R Urban, Mark Salomons, Martin Cloutier
    Abstract:

    Point projection microscopy (PPM) is used to image suspended graphene by using low-energy electrons (100–205 eV). Because of the low energies used, the graphene is neither damaged nor contaminated by the electron beam for doses of the order of 107 electrons per nm2. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet twice as thick as the covalent radius of sp2-bonded carbon. Also observed is rippling in the structure of the suspended graphene, with a wavelength of approximately 26 nm. The interference of the electron beam due to diffraction off the edge of a graphene knife edge is observed and is used to calculate a virtual source size of 4.7±0.6 A for the electron emitter. It is demonstrated that graphene can serve as both the anode and the substrate in PPM, thereby avoiding distortions due to strong field gradients around nanoscale objects. Graphene can be used to image objects suspended on the sheet using PPM and, in the future, electron holography.

  • low energy electron point projection microscopy of suspended graphene the ultimate Microscope Slide
    arXiv: Mesoscale and Nanoscale Physics, 2011
    Co-Authors: J Mutus, L Livadaru, Jeremy T Robinson, R Urban, Mark Salomons, Martin Cloutier, Paul E Sheehan, Robert A Wolkow
    Abstract:

    Point Projection Microscopy (PPM) is used to image suspended graphene using low-energy electrons (100-200eV). Because of the low energies used, the graphene is neither damaged or contaminated by the electron beam. The transparency of graphene is measured to be 74%, equivalent to electron transmission through a sheet as thick as twice the covalent radius of sp^2-bonded carbon. Also observed is rippling in the structure of the suspended graphene, with a wavelength of approximately 26 nm. The interference of the electron beam due to the diffraction off the edge of a graphene knife edge is observed and used to calculate a virtual source size of 4.7 +/- 0.6 Angstroms for the electron emitter. It is demonstrated that graphene can be used as both anode and substrate in PPM in order to avoid distortions due to strong field gradients around nano-scale objects. Graphene can be used to image objects suspended on the sheet using PPM, and in the future, electron holography.