The Experts below are selected from a list of 12828 Experts worldwide ranked by ideXlab platform
Raynald Gauvin - One of the best experts on this subject based on the ideXlab platform.
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acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold field emission scanning electron microscope for Nanomaterials Characterization
Scanning, 2013Co-Authors: Nicolas Brodusch, Hendrix Demers, M L Trudeau, Raynald GauvinAbstract:Summary Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from −20° to −40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science Characterization was illustrated through three examples of phase identification and orientation mapping. SCANNING 35:375–386, 2013. © 2013 Wiley Periodicals, Inc.
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acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold field emission scanning electron microscope for Nanomaterials Characterization
Scanning, 2013Co-Authors: Nicolas Brodusch, Hendrix Demers, M L Trudeau, Raynald GauvinAbstract:Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from -20° to -40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science Characterization was illustrated through three examples of phase identification and orientation mapping.
Nicolas Brodusch - One of the best experts on this subject based on the ideXlab platform.
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acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold field emission scanning electron microscope for Nanomaterials Characterization
Scanning, 2013Co-Authors: Nicolas Brodusch, Hendrix Demers, M L Trudeau, Raynald GauvinAbstract:Summary Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from −20° to −40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science Characterization was illustrated through three examples of phase identification and orientation mapping. SCANNING 35:375–386, 2013. © 2013 Wiley Periodicals, Inc.
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acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold field emission scanning electron microscope for Nanomaterials Characterization
Scanning, 2013Co-Authors: Nicolas Brodusch, Hendrix Demers, M L Trudeau, Raynald GauvinAbstract:Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from -20° to -40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science Characterization was illustrated through three examples of phase identification and orientation mapping.
M L Trudeau - One of the best experts on this subject based on the ideXlab platform.
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acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold field emission scanning electron microscope for Nanomaterials Characterization
Scanning, 2013Co-Authors: Nicolas Brodusch, Hendrix Demers, M L Trudeau, Raynald GauvinAbstract:Summary Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from −20° to −40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science Characterization was illustrated through three examples of phase identification and orientation mapping. SCANNING 35:375–386, 2013. © 2013 Wiley Periodicals, Inc.
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acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold field emission scanning electron microscope for Nanomaterials Characterization
Scanning, 2013Co-Authors: Nicolas Brodusch, Hendrix Demers, M L Trudeau, Raynald GauvinAbstract:Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from -20° to -40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science Characterization was illustrated through three examples of phase identification and orientation mapping.
Hendrix Demers - One of the best experts on this subject based on the ideXlab platform.
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acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold field emission scanning electron microscope for Nanomaterials Characterization
Scanning, 2013Co-Authors: Nicolas Brodusch, Hendrix Demers, M L Trudeau, Raynald GauvinAbstract:Summary Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from −20° to −40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science Characterization was illustrated through three examples of phase identification and orientation mapping. SCANNING 35:375–386, 2013. © 2013 Wiley Periodicals, Inc.
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acquisition parameters optimization of a transmission electron forward scatter diffraction system in a cold field emission scanning electron microscope for Nanomaterials Characterization
Scanning, 2013Co-Authors: Nicolas Brodusch, Hendrix Demers, M L Trudeau, Raynald GauvinAbstract:Transmission electron forward scatter diffraction (t-EFSD) is a new technique providing crystallographic information with high resolution on thin specimens by using a conventional electron backscatter diffraction (EBSD) system in a scanning electron microscope. In this study, the impact of tilt angle, working distance, and detector distance on the Kikuchi pattern quality were investigated in a cold-field emission scanning electron microscope (CFE-SEM). We demonstrated that t-EFSD is applicable for tilt angles ranging from -20° to -40°. Working distance (WD) should be optimized for each material by choosing the WD for which the EBSD camera screen illumination is the highest, as the number of detected electrons on the screen is directly dependent on the scattering angle. To take advantage of the best performances of the CFE-SEM, the EBSD camera should be close to the sample and oriented towards the bottom to increase forward scattered electron collection efficiency. However, specimen chamber cluttering and beam/mechanical drift are important limitations in the CFE-SEM used in this work. Finally, the importance of t-EFSD in materials science Characterization was illustrated through three examples of phase identification and orientation mapping.
William L Wilson - One of the best experts on this subject based on the ideXlab platform.
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scanning probe microwave reflectivity of aligned single walled carbon nanotubes imaging of electronic structure and quantum behavior at the nanoscale
ACS Nano, 2016Co-Authors: Eric Seabron, Scott Maclaren, Xu Xie, Slava V Rotkin, John A Rogers, William L WilsonAbstract:Single-walled carbon nanotubes (SWNTs) are 1-dimensional Nanomaterials with unique electronic properties that make them excellent candidates for next-generation device technologies. While nanotube growth and processing methods have progressed steadily, significant opportunities remain in advanced methods for their Characterization, inspection, and metrology. Microwave near-field imaging offers an extremely versatile “nondestructive” tool for Nanomaterials Characterization. Herein, we report the application of nanoscale microwave reflectivity to study SWNT electronic properties. Using microwave impedance microscopy (MIM) combined with microwave impedance modulation microscopy (MIM2), we imaged horizontal SWNT arrays, showing the microwave reflectivity from individual nanotubes is extremely sensitive to their electronic properties and dependent on the nanotube quantum capacitance under proper experimental conditions. It is shown experimentally that MIM can be a direct probe of the nanotube-free carrier dens...
