The Experts below are selected from a list of 81876 Experts worldwide ranked by ideXlab platform
Yahsin Yang - One of the best experts on this subject based on the ideXlab platform.
-
full field transmission type angle deviation Optical Microscope with reflectivity height transformation
Biomedical Optics Express, 2015Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:This full-field transmission-type three-dimensional (3D) Optical Microscope is constructed based on the angle deviation method (ADM) and the algorithm of reflectivity-height transformation (RHT). The surface height is proportional to the deviation angle of light passing through the object. The angle deviation and surface height can be measured based on the reflectivity closed to the critical angle using a parallelogram prism and two CCDs.
-
full field transmission type angle deviation Optical Microscope with reflectivity height transformation
Optics in the Life Sciences (2015) paper JT3A.8, 2015Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:;This full-field three-dimensional (3D) Optical Microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.
-
full field angle deviation Optical Microscope with reflectivity height transformation
Digital Holography and Three-Dimensional Imaging, 2014Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:This full-field three-dimensional (3D) Optical Microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.
Minghung Chiu - One of the best experts on this subject based on the ideXlab platform.
-
full field transmission type angle deviation Optical Microscope with reflectivity height transformation
Biomedical Optics Express, 2015Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:This full-field transmission-type three-dimensional (3D) Optical Microscope is constructed based on the angle deviation method (ADM) and the algorithm of reflectivity-height transformation (RHT). The surface height is proportional to the deviation angle of light passing through the object. The angle deviation and surface height can be measured based on the reflectivity closed to the critical angle using a parallelogram prism and two CCDs.
-
full field transmission type angle deviation Optical Microscope with reflectivity height transformation
Optics in the Life Sciences (2015) paper JT3A.8, 2015Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:;This full-field three-dimensional (3D) Optical Microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.
-
full field angle deviation Optical Microscope with reflectivity height transformation
Digital Holography and Three-Dimensional Imaging, 2014Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:This full-field three-dimensional (3D) Optical Microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.
Minghung Tsai - One of the best experts on this subject based on the ideXlab platform.
-
full field transmission type angle deviation Optical Microscope with reflectivity height transformation
Biomedical Optics Express, 2015Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:This full-field transmission-type three-dimensional (3D) Optical Microscope is constructed based on the angle deviation method (ADM) and the algorithm of reflectivity-height transformation (RHT). The surface height is proportional to the deviation angle of light passing through the object. The angle deviation and surface height can be measured based on the reflectivity closed to the critical angle using a parallelogram prism and two CCDs.
-
full field transmission type angle deviation Optical Microscope with reflectivity height transformation
Optics in the Life Sciences (2015) paper JT3A.8, 2015Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:;This full-field three-dimensional (3D) Optical Microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.
-
full field angle deviation Optical Microscope with reflectivity height transformation
Digital Holography and Three-Dimensional Imaging, 2014Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:This full-field three-dimensional (3D) Optical Microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.
Chentai Tan - One of the best experts on this subject based on the ideXlab platform.
-
full field transmission type angle deviation Optical Microscope with reflectivity height transformation
Biomedical Optics Express, 2015Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:This full-field transmission-type three-dimensional (3D) Optical Microscope is constructed based on the angle deviation method (ADM) and the algorithm of reflectivity-height transformation (RHT). The surface height is proportional to the deviation angle of light passing through the object. The angle deviation and surface height can be measured based on the reflectivity closed to the critical angle using a parallelogram prism and two CCDs.
-
full field transmission type angle deviation Optical Microscope with reflectivity height transformation
Optics in the Life Sciences (2015) paper JT3A.8, 2015Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:;This full-field three-dimensional (3D) Optical Microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.
-
full field angle deviation Optical Microscope with reflectivity height transformation
Digital Holography and Three-Dimensional Imaging, 2014Co-Authors: Minghung Chiu, Chentai Tan, Minghung Tsai, Yahsin YangAbstract:This full-field three-dimensional (3D) Optical Microscope is based on the reflectivity-height transformation. Using a parallelogram prism and two CCDs to detect the reflectivity at the critical angle nearby can achieve the angle deviation and surface height.
Satoshi Kawata - One of the best experts on this subject based on the ideXlab platform.
-
near field raman imaging of organic molecules by an apertureless metallic probe scanning Optical Microscope
Journal of Chemical Physics, 2002Co-Authors: Norikiko Hayazawa, Yasushi Inouye, Zouheir Sekkat, Satoshi KawataAbstract:Near-field Raman imaging of organic molecules is demonstrated by an apertureless near-field scanning Optical Microscope, the tip of which is a silver-layer-coated cantilever of an atomic force Microscope (AFM). The virtue of the enhanced electric field at the tip apex due to the surface plasmon polariton excitations enhances the Raman scattering cross sections. This phenomenon allows us to reveal from near-field Raman images the molecular vibrational distributions of Rhodamine6G and Crystal Violet molecules beyond the diffraction limit of a light. These molecular vibrations cannot be distinguished by AFM topographic images.
-
evanescent field excitation and measurement of dye fluorescence in a metallic probe near field scanning Optical Microscope
Journal of Microscopy, 1999Co-Authors: Norikiko Hayazawa, Yasushi Inouye, Satoshi KawataAbstract:We introduce a method of dye fluorescence excitation and measurement that utilizes a near-field scanning Optical Microscope (NSOM). This NSOM uses an apertureless metallic probe, and an Optical system that contains a high numerical aperture (NA) objective lens (NA = 1.4). When the area which satisfies NA < 1 is masked, the objective lens allows for the rejection of possible transmitted light (NA < 1) through the sample. In such conditions, the focused spot consists of only the evanescent field. We found that this NSOM system strongly reduces the background of the dye fluorescence and allows for the measurement of the fluorescence intensity below the diffraction limit of the excitation source.
-
gold bead scanning near field Optical Microscope with laser force position control
Optics Letters, 1997Co-Authors: Tadao Sugiura, Yasushi Inouye, Takao Okada, Osamu Nakamura, Satoshi KawataAbstract:We have developed a scanning near-field Optical Microscope with an Optically trapped metallic particle that has a small diameter compared to the wavelength of visible light. In this Microscope we employed spot illumination to enhance the intensity of light scattered from a probe particle so we could reduce the diameter of the probe particle to 40 nm. We detected slight irregularities of the surface of the cover glass near 10-nm depth. Also, we observed gold colloidal particles on the surface of the cover glass.
-
near field scanning Optical Microscope with a laser trapped probe
Japanese Journal of Applied Physics, 1994Co-Authors: Satoshi Kawata, Yasushi Inouye, Tadao SugiuraAbstract:We made an experiment of near-field microscopic imaging using a laser-beam trapped probe. Differently from a conventional near-field (and/or photon-tunneling) scanning Optical Microscope, the probe is physically isolated from the scanning Microscope system; it is trapped and scanned on the sample surface by the radiation force of near-infrared laser beam. The distance between the probe and the sample surface is maintained to be constant (zero) during scanning. Another laser beam for microscopic imaging is incident on the sample surface in the condition of total internal reflection; the probe on the sample couples with the photons localized near the sample surface as the evanescent filed and scatters out. The scattered photons are collected through an Microscope objective lens, which is the same lens as the one used for focusing the infrared laser beam on the probe. A near-field image of the sample surface is formed, as the probe is laterally scanned on the sample. The experimental setup of the proposed Microscope is described and the image data obtained with the developed Microscope are shown for refractive samples and fluorescent samples with sub micrometer structure.
-
near field scanning Optical Microscope with a metallic probe tip
Optics Letters, 1994Co-Authors: Yasushi Inouye, Satoshi KawataAbstract:A near-field scanning Optical Microscope with a metallic probe tip was developed for detecting localized photons near the surface of the fine structure of a sample. In this Microscope a metallic probe is used for converting the evanescent photons localized near the sample surface to the propagating scattering light wave; the scattered light is detected in the far field with external condenser optics. During the measurement the probe tip vibrates normal to the surface with an amplitude of ~5 nm at 2.5 kHz, and the light intensity modulated with this frequency is lock-in detected. This operation permits the removal of stray-light noise contribution. Experimental results of the measurements of the exponential decay of the evanescent field produced by total internal reflection are given with and without the probe vibration. Image data of the surface profile of an Optical compact disk are also shown.
