The Experts below are selected from a list of 312 Experts worldwide ranked by ideXlab platform

Wolfgang Fritzsche - One of the best experts on this subject based on the ideXlab platform.

  • High Precision Attachment of silver nanoparticles on AFM tips by dielectrophoresis
    Analytical and Bioanalytical Chemistry, 2016
    Co-Authors: Christian Leiterer, Erik Wünsche, Prabha Singh, Jens Albert, Johann M. Köhler, Volker Deckert, Wolfgang Fritzsche
    Abstract:

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron Precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application. Graphical abstract Silver nanoparticles attached to AFM tips using dielectrophoresis. Comparing nanoparticles attached using 1 kHz (left) to 1 MHz (right), SEM and optical (inset) images

  • high Precision Attachment of silver nanoparticles on afm tips by dielectrophoresis
    Analytical and Bioanalytical Chemistry, 2016
    Co-Authors: Christian Leiterer, Erik Wünsche, Prabha Singh, Jens Albert, Johann M. Köhler, Volker Deckert, Wolfgang Fritzsche
    Abstract:

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron Precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application.

Volker Deckert - One of the best experts on this subject based on the ideXlab platform.

  • High Precision Attachment of silver nanoparticles on AFM tips by dielectrophoresis
    Analytical and Bioanalytical Chemistry, 2016
    Co-Authors: Christian Leiterer, Erik Wünsche, Prabha Singh, Jens Albert, Johann M. Köhler, Volker Deckert, Wolfgang Fritzsche
    Abstract:

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron Precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application. Graphical abstract Silver nanoparticles attached to AFM tips using dielectrophoresis. Comparing nanoparticles attached using 1 kHz (left) to 1 MHz (right), SEM and optical (inset) images

  • high Precision Attachment of silver nanoparticles on afm tips by dielectrophoresis
    Analytical and Bioanalytical Chemistry, 2016
    Co-Authors: Christian Leiterer, Erik Wünsche, Prabha Singh, Jens Albert, Johann M. Köhler, Volker Deckert, Wolfgang Fritzsche
    Abstract:

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron Precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application.

Prabha Singh - One of the best experts on this subject based on the ideXlab platform.

  • High Precision Attachment of silver nanoparticles on AFM tips by dielectrophoresis
    Analytical and Bioanalytical Chemistry, 2016
    Co-Authors: Christian Leiterer, Erik Wünsche, Prabha Singh, Jens Albert, Johann M. Köhler, Volker Deckert, Wolfgang Fritzsche
    Abstract:

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron Precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application. Graphical abstract Silver nanoparticles attached to AFM tips using dielectrophoresis. Comparing nanoparticles attached using 1 kHz (left) to 1 MHz (right), SEM and optical (inset) images

  • high Precision Attachment of silver nanoparticles on afm tips by dielectrophoresis
    Analytical and Bioanalytical Chemistry, 2016
    Co-Authors: Christian Leiterer, Erik Wünsche, Prabha Singh, Jens Albert, Johann M. Köhler, Volker Deckert, Wolfgang Fritzsche
    Abstract:

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron Precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application.

Christian Leiterer - One of the best experts on this subject based on the ideXlab platform.

  • High Precision Attachment of silver nanoparticles on AFM tips by dielectrophoresis
    Analytical and Bioanalytical Chemistry, 2016
    Co-Authors: Christian Leiterer, Erik Wünsche, Prabha Singh, Jens Albert, Johann M. Köhler, Volker Deckert, Wolfgang Fritzsche
    Abstract:

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron Precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application. Graphical abstract Silver nanoparticles attached to AFM tips using dielectrophoresis. Comparing nanoparticles attached using 1 kHz (left) to 1 MHz (right), SEM and optical (inset) images

  • high Precision Attachment of silver nanoparticles on afm tips by dielectrophoresis
    Analytical and Bioanalytical Chemistry, 2016
    Co-Authors: Christian Leiterer, Erik Wünsche, Prabha Singh, Jens Albert, Johann M. Köhler, Volker Deckert, Wolfgang Fritzsche
    Abstract:

    AFM tips are modified with silver nanoparticles using an AC electrical field. The used technique works with sub-micron Precision and also does not require chemical modification of the tip. Based on the electrical parameters applied in the process, particle density and particle position on the apex of the tip can be adjusted. The feasibility of the method is proven by subsequent tip-enhanced Raman spectroscopy (TERS) measurements using the fabricated tips as a measurement probe. Since this modification process itself does not require any lithographic processing, the technique can be easily adapted to modify AFM tips with a variety of nanostructures with pre-defined properties, while being parallelizable for a potential commercial application.

Mou Yuezha - One of the best experts on this subject based on the ideXlab platform.

  • the study of force system intruding of two different Precision Attachment denture in unilateral load of stress
    Chinese Journal of Prosthodontics, 2008
    Co-Authors: Mou Yuezha
    Abstract:

    Objective:To analyze the force system of different Precision Attachment in mandible distal-extension edentulous by the finite-element model.Methods:With spiral CT machine scanning,three-dimensional finite element model of the mandible with bilateral distal-extension edentulous of adult female volunteers and Attachment system were established.stress analysis was then performed.Results:The effects of the Attachment of ASC-52 reduced in abutment when the molar was forced 200N.when the molar was forced 200N,the effect of the Attachment ASC-52 reduced than revax system.when the premolar was forced 200N,the effect on Attachment reduce either liable or lingual.When the double molars were forced 200N,the stress intruding is added in mandible and abutment.Conclusions:The labial effect of abutment is smaller than lingual in the Attachment of revax system and the Attachment of ASC-52.The affection of the Attachment of ASC-52 reduce in the abutment when the molars are forced.