Property Characterization

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Ronggui Yang - One of the best experts on this subject based on the ideXlab platform.

  • tutorial time domain thermoreflectance tdtr for thermal Property Characterization of bulk and thin film materials
    Journal of Applied Physics, 2018
    Co-Authors: Puqing Jiang, Xin Qian, Ronggui Yang
    Abstract:

    Measuring thermal properties of materials is not only of fundamental importance in understanding the transport processes of energy carriers (electrons and phonons in solids) but also of practical interest in developing novel materials with desired thermal properties for applications in energy conversion and storage, electronics, and photonic systems. Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces. This tutorial discusses the basics as well as the recent advances of the TDTR technique and its applications in the thermal Characterization of a variety of materials. The tutorial begins with the fundamentals of the TDTR technique, serving as a guideline for understanding the basic principles of this technique. Several variations of the TDTR technique that function similarly as the standard TDTR but with their own unique features are introduced, followed by introducing different advanced TDTR configurations that were developed to meet different measurement conditions. This tutorial closes with a summary that discusses the current limitations and proposes some directions for future development.Measuring thermal properties of materials is not only of fundamental importance in understanding the transport processes of energy carriers (electrons and phonons in solids) but also of practical interest in developing novel materials with desired thermal properties for applications in energy conversion and storage, electronics, and photonic systems. Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces. This tutorial discusses the basics as well as the recent advances of the TDTR technique and its applications in the thermal Characterization of a variety of materials. The tutorial begins with the fundamentals of the TDTR technique, serving as a guideline for understanding the basic principles of this technique. Several variations of the TDTR technique that function similarly as the standard TDTR but ...

Qingming Wang - One of the best experts on this subject based on the ideXlab platform.

  • fabrication and Characterization of thick film piezoelectric lead zirconate titanate ceramic resonators by tape casting
    IEEE Transactions on Ultrasonics Ferroelectrics and Frequency Control, 2012
    Co-Authors: Qingming Wang, Youliang Zhong, Ming Ou, Zhishui Jiang, Wei Tian
    Abstract:

    In this paper, thick-film piezoelectric lead zirconate titanate (PZT) ceramic resonators with thicknesses down to tens of micrometers have been fabricated by tape-casting processing. PZT ceramic resonators with composition near the morphotropic phase boundary and with different dopants added were prepared for piezoelectric transducer applications. Material Property Characterization for these thick-film PZT resonators is essential for device design and applications. For the Property Characterization, a recently developed normalized electrical impedance spectrum method was used to determine the electromechanical coefficient and the complex piezoelectric, elastic, and dielectric coefficients from the electrical measurement of resonators using thick films. In this work, nine PZT thick-film resonators have been fabricated and characterized, and two different types of resonators, namely thickness longitudinal and transverse modes, were used for material Property Characterization. The results were compared with those determined by the IEEE standard method, and they agreed well. It was found that depending on the PZT formulation and dopants, the relative permittivities e33T/e0 measured at 2 kHz for these thick-films are in the range of 1527 to 4829, piezoelectric stress constants (e33) in the range of 15 to 26 C/m2, piezoelectric strain constants (d31) in the range of -169 × 10-12 C/N to -314 × 10-12 C/N, electromechanical coupling coefficients (kt) in the range of 0.48 to 0.53, and k31 in the range of 0.35 to 0.38. The Characterization results shows tape-casting processing can be used to fabricate high-quality PZT thick-film resonators, and the extracted material constants can be used to for device design and application.

  • ferroelectric and electromechanical Property Characterization of single pb zrti o3 fiber resonator
    Journal of Applied Physics, 2010
    Co-Authors: Zhaoxian Xiong, Qingming Wang
    Abstract:

    Piezoelectric fibers and fiber composites have attracted much attention for anisotropic sensing and actuation applications in recent year. Complete Property Characterization for piezoelectric fibers is essential for material and device design and fabrication. In this work, ferroelectric and electromechanical properties of single piezoelectric Pb ( ZrTi ) O 3 (PZT) fiber were characterized by polarization–electric field hysteresis loop measurement using single PZT fiber/polymer 1–3 composite approach, and by direct measurement of the complex impedance spectrum of single PZT fiber resonator. A normalized electrical impedance spectrum method developed recently was used to determine the complex piezoelectric,elastic, and dielectric coefficients, mechanical quality factor and electromechanical coefficient from the complex electrical impedance-frequency spectrum measurement. The results were compared with those determined by the IEEE standard method for the pure length extensional resonator. The permittivity of PZT fiber was found larger than PZT bulk materials, which was attributed for the core-shell structure of the fibers.

Lixin Dong - One of the best experts on this subject based on the ideXlab platform.

  • IROS - Multipoint sliding probe methods for in situ electrical transport Property Characterization of individual nanostructures
    2011 IEEE RSJ International Conference on Intelligent Robots and Systems, 2011
    Co-Authors: Zheng Fan, Xinyong Tao, Lixin Dong
    Abstract:

    Sliding probe methods are designed for the in situ electrical Property Characterization of individual one-dimensional (1D) nanostructures by eliminating the contact resistance between the fixed-end support and the specimen. The key to achieve a high resolution is to keep a constant resistance between the other end of the specimen contacting to the sliding probe. To achieve this objective, we have developed several important techniques including multipoint continuous sliding, flexible probes, and specimen-shape adapting based on nanorobotic manipulation inside a transmission electron microscope (TEM). With a copper-nanowire-tipped probe, we have shown that a flexible probe facilitates the contact force control. The adapting of the shape of a probe tip is significant for keeping a constant contact area between the probe and the specimen. This can be implemented by using a soft probe or a tip with a shape resembling the profile of the specimen. Here we show that by flowing copper from a nanotube probe against the specimen, it is possible to make a well adapted shape of the tip to the specimen after the copper cooled down. By avoiding stick-slip motion and controlling the contact force and area, it will be possible to keep a constant contact resistance between the sliding probe and the specimen, hence significantly improve the measurement resolution. Sliding probe methods are an in situ technique characterized by higher resolution and simplicity in setup as compared with conventional two- and four-terminal methods, respectively. Furthermore, it is superior for local Property Characterization, which is of particular interest for hetero-structured nanomaterials and defect detection.

  • In situ electrical Property Characterization of individual nanostructures using a sliding probe inside a transmission electron microscope
    2010 IEEE Nanotechnology Materials and Devices Conference, 2010
    Co-Authors: Zheng Fan, Xinyong Tao, Yingchao Yang, Zhang Wenkui, Hui Huang, Yongping Gan, Lixin Dong
    Abstract:

    A sliding probe technique has been developed for the in situ electrical Property Characterization of individual nanostructures inside a transmission electron microscope (TEM) using a nanomanipulator. Experimental investigation into the transport measurement of copper-filled carbon nanotubes, carbide nanowires, and carbon microfiber has shown the effectiveness of this method. Comparing with conventional 4-point methods, the proposed setup is simple and agile and it can be readily combined with TEM-based imaging and analysis. Comparing with conventional 2-point methods, the sliding probe method are characterized by (1) the contact resistance can be partially eliminated and (2) sectional measurement using this method is particularly adaptable to non-uniform structures or hetero-structures.

Puqing Jiang - One of the best experts on this subject based on the ideXlab platform.

  • tutorial time domain thermoreflectance tdtr for thermal Property Characterization of bulk and thin film materials
    Journal of Applied Physics, 2018
    Co-Authors: Puqing Jiang, Xin Qian, Ronggui Yang
    Abstract:

    Measuring thermal properties of materials is not only of fundamental importance in understanding the transport processes of energy carriers (electrons and phonons in solids) but also of practical interest in developing novel materials with desired thermal properties for applications in energy conversion and storage, electronics, and photonic systems. Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces. This tutorial discusses the basics as well as the recent advances of the TDTR technique and its applications in the thermal Characterization of a variety of materials. The tutorial begins with the fundamentals of the TDTR technique, serving as a guideline for understanding the basic principles of this technique. Several variations of the TDTR technique that function similarly as the standard TDTR but with their own unique features are introduced, followed by introducing different advanced TDTR configurations that were developed to meet different measurement conditions. This tutorial closes with a summary that discusses the current limitations and proposes some directions for future development.Measuring thermal properties of materials is not only of fundamental importance in understanding the transport processes of energy carriers (electrons and phonons in solids) but also of practical interest in developing novel materials with desired thermal properties for applications in energy conversion and storage, electronics, and photonic systems. Over the past two decades, ultrafast laser-based time-domain thermoreflectance (TDTR) has emerged and evolved as a reliable, powerful, and versatile technique to measure the thermal properties of a wide range of bulk and thin film materials and their interfaces. This tutorial discusses the basics as well as the recent advances of the TDTR technique and its applications in the thermal Characterization of a variety of materials. The tutorial begins with the fundamentals of the TDTR technique, serving as a guideline for understanding the basic principles of this technique. Several variations of the TDTR technique that function similarly as the standard TDTR but ...

Eran Socher - One of the best experts on this subject based on the ideXlab platform.

  • electromagnetic Property Characterization of biological tissues at d band
    IEEE Transactions on Terahertz Science and Technology, 2018
    Co-Authors: Gregory Shimonov, Arnon Koren, Galit Sivek, Eran Socher
    Abstract:

    This paper presents, for the first time, measured complex dielectric and magnetic properties of liquid and solid biological tissues taken from human arteries in the frequency range 110–170 GHz. The complex permittivity and permeability are extracted from scattering parameters of a waveguide capsule loaded with biological tissue. The estimation of the dielectric properties was done by the Nicholson–Ross–Weir conversion process. A D-band waveguide setup for measuring with temperature stabilization at 37 °C was developed and is described herein. Results show large differences between dielectric properties of blood (10.7 + j2.9), adipose tissue (2.5 + j0.3), calcified tissue (3.2 + j0.84), and fibrous tissue (8.8 + j3.3). While calcified tissues and adipose tissues show relative permeability higher than 1 (1.8 − 1.4 + j0.2), fibrous tissues show μ r of 1 + j0.4 and blood proves to be diamagnetic with 0.7 + j0.5. The measured blood refractive index follows the frequency trend of the Cole–Cole model extrapolated data of previously measured blood at lower frequencies.