The Experts below are selected from a list of 267 Experts worldwide ranked by ideXlab platform
A.k. Hambaryan - One of the best experts on this subject based on the ideXlab platform.
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An application of scatterometer signal phase information for the determination of near sea surface wind speed and near surface air and water temperatures difference
IEEE 1999 International Geoscience and Remote Sensing Symposium. IGARSS'99 (Cat. No.99CH36293), 1Co-Authors: A.k. Arakelyan, A.k. HambaryanAbstract:A Radar Method for the determination of sea surface wind speed and the difference of near surface air and water temperatures is presented, from combined amplitude and phase characteristics of the reflected scatterometer signal.
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Radar Methods for atmospheric stratification condition unambiguous determination by synergy data of sea surface altimetric and scatterometric observations
IGARSS 2003. 2003 IEEE International Geoscience and Remote Sensing Symposium. Proceedings (IEEE Cat. No.03CH37477), 1Co-Authors: A.k. Arakelyan, A.k. HambaryanAbstract:The results of theoretical researches and numerical estimations of sea surface Radar backscattering coefficient temperature-wind dependencies are presented. A Radar Method for atmospheric stratification condition evaluation, based on a joint application of data of sea surface altimeter and scatterometer observations, is suggested.
Ali Pourkazemi - One of the best experts on this subject based on the ideXlab platform.
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Error Assessment and Mitigation Methods in Transient Radar Method.
Sensors, 2020Co-Authors: Ali Pourkazemi, Salar Tayebi, Johan H. StiensAbstract:Transient Radar Method (TRM) was recently proposed as a novel contact-free Method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction Method allows sub-wavelength thickness measurements around λ / 5 .
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transient Radar Method novel illumination and blind electromagnetic geometrical parameter extraction technique for multilayer structures
IEEE Transactions on Microwave Theory and Techniques, 2017Co-Authors: Ali Pourkazemi, Johan H. Stiens, Mathias Becquaert, Marijke VandewalAbstract:A novel technique enabling ultrafast nondestructive characterization of multilayer dielectric structures is proposed. Actual estimations indicate that the data acquisition performance of electronic measurement systems of today allow deep submillimeter depth resolution, almost independently of the frequency. For a 10 GHz signal, e.g., this corresponds to significant subwavelength depth resolution. By means of a novel blind analysis Method of the time-dependent reflected electromagnetic (EM) signal, detailed information on the geometrical and EM parameters such as the complex valued dielectric permittivity and magnetic susceptibility of each layer of the structure can be extracted. We validate the novel technique for different materials in the 10 GHz range and compare the results obtained with S-parameter measurements in the 9.5–10.5 GHz range using a vector network analyzer. We will discuss the impact of nonidealities on the accuracy of the retrieved parameters. The novel technique has the potential for deployment in a wide range of applications ranging from the piping industry, wind energy industry, automotive, biotechnology, food industry, pharmacy, and so on.
Johan H. Stiens - One of the best experts on this subject based on the ideXlab platform.
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Error Assessment and Mitigation Methods in Transient Radar Method.
Sensors, 2020Co-Authors: Ali Pourkazemi, Salar Tayebi, Johan H. StiensAbstract:Transient Radar Method (TRM) was recently proposed as a novel contact-free Method for the characterization of multilayer dielectric structures including the geometric details. In this paper, we discuss and quantify the intrinsic and systematic errors of TRM. Also, solutions for mitigating these problems are elaborated extensively. The proposed solution for error correction will be applied to quantify experimentally the thickness of several single-layer dielectric structures with thicknesses varying from larger to smaller than the wavelength. We will show how the error correction Method allows sub-wavelength thickness measurements around λ / 5 .
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transient Radar Method novel illumination and blind electromagnetic geometrical parameter extraction technique for multilayer structures
IEEE Transactions on Microwave Theory and Techniques, 2017Co-Authors: Ali Pourkazemi, Johan H. Stiens, Mathias Becquaert, Marijke VandewalAbstract:A novel technique enabling ultrafast nondestructive characterization of multilayer dielectric structures is proposed. Actual estimations indicate that the data acquisition performance of electronic measurement systems of today allow deep submillimeter depth resolution, almost independently of the frequency. For a 10 GHz signal, e.g., this corresponds to significant subwavelength depth resolution. By means of a novel blind analysis Method of the time-dependent reflected electromagnetic (EM) signal, detailed information on the geometrical and EM parameters such as the complex valued dielectric permittivity and magnetic susceptibility of each layer of the structure can be extracted. We validate the novel technique for different materials in the 10 GHz range and compare the results obtained with S-parameter measurements in the 9.5–10.5 GHz range using a vector network analyzer. We will discuss the impact of nonidealities on the accuracy of the retrieved parameters. The novel technique has the potential for deployment in a wide range of applications ranging from the piping industry, wind energy industry, automotive, biotechnology, food industry, pharmacy, and so on.
A.k. Arakelyan - One of the best experts on this subject based on the ideXlab platform.
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An application of scatterometer signal phase information for the determination of near sea surface wind speed and near surface air and water temperatures difference
IEEE 1999 International Geoscience and Remote Sensing Symposium. IGARSS'99 (Cat. No.99CH36293), 1Co-Authors: A.k. Arakelyan, A.k. HambaryanAbstract:A Radar Method for the determination of sea surface wind speed and the difference of near surface air and water temperatures is presented, from combined amplitude and phase characteristics of the reflected scatterometer signal.
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Radar Methods for atmospheric stratification condition unambiguous determination by synergy data of sea surface altimetric and scatterometric observations
IGARSS 2003. 2003 IEEE International Geoscience and Remote Sensing Symposium. Proceedings (IEEE Cat. No.03CH37477), 1Co-Authors: A.k. Arakelyan, A.k. HambaryanAbstract:The results of theoretical researches and numerical estimations of sea surface Radar backscattering coefficient temperature-wind dependencies are presented. A Radar Method for atmospheric stratification condition evaluation, based on a joint application of data of sea surface altimeter and scatterometer observations, is suggested.
Marijke Vandewal - One of the best experts on this subject based on the ideXlab platform.
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transient Radar Method novel illumination and blind electromagnetic geometrical parameter extraction technique for multilayer structures
IEEE Transactions on Microwave Theory and Techniques, 2017Co-Authors: Ali Pourkazemi, Johan H. Stiens, Mathias Becquaert, Marijke VandewalAbstract:A novel technique enabling ultrafast nondestructive characterization of multilayer dielectric structures is proposed. Actual estimations indicate that the data acquisition performance of electronic measurement systems of today allow deep submillimeter depth resolution, almost independently of the frequency. For a 10 GHz signal, e.g., this corresponds to significant subwavelength depth resolution. By means of a novel blind analysis Method of the time-dependent reflected electromagnetic (EM) signal, detailed information on the geometrical and EM parameters such as the complex valued dielectric permittivity and magnetic susceptibility of each layer of the structure can be extracted. We validate the novel technique for different materials in the 10 GHz range and compare the results obtained with S-parameter measurements in the 9.5–10.5 GHz range using a vector network analyzer. We will discuss the impact of nonidealities on the accuracy of the retrieved parameters. The novel technique has the potential for deployment in a wide range of applications ranging from the piping industry, wind energy industry, automotive, biotechnology, food industry, pharmacy, and so on.