The Experts below are selected from a list of 2106 Experts worldwide ranked by ideXlab platform
David A Muller - One of the best experts on this subject based on the ideXlab platform.
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a high speed area detector for novel imaging techniques in a scanning transmission electron microscope
Ultramicroscopy, 2009Co-Authors: Thomas A Caswell, Peter Ercius, Mark W Tate, Alper Ercan, Sol M Gruner, David A MullerAbstract:A scanning transmission electron microscope (STEM) produces a convergent beam electron diffraction pattern at each Position of a Raster scan with a focused electron beam, but recording this information poses major challenges for gathering and storing such large data sets in a timely manner and with sufficient dynamic range. To investigate the crystalline structure of materials, a 16x16 analog pixel array detector (PAD) is used to replace the traditional detectors and retain the diffraction information at every STEM Raster Position. The PAD, unlike a charge-coupled device (CCD) or photomultiplier tube (PMT), directly images 120-200keV electrons with relatively little radiation damage, exhibits no afterglow and limits crosstalk between adjacent pixels. Traditional STEM imaging modes can still be performed by the PAD with a 1.1kHz frame rate, which allows post-acquisition control over imaging conditions and enables novel imaging techniques based on the retained crystalline information. Techniques for rapid, semi-automatic crystal grain segmentation with sub-nanometer resolution are described using cross-correlation, sub-region integration, and other post-processing methods.
Thomas A Caswell - One of the best experts on this subject based on the ideXlab platform.
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a high speed area detector for novel imaging techniques in a scanning transmission electron microscope
Ultramicroscopy, 2009Co-Authors: Thomas A Caswell, Peter Ercius, Mark W Tate, Alper Ercan, Sol M Gruner, David A MullerAbstract:A scanning transmission electron microscope (STEM) produces a convergent beam electron diffraction pattern at each Position of a Raster scan with a focused electron beam, but recording this information poses major challenges for gathering and storing such large data sets in a timely manner and with sufficient dynamic range. To investigate the crystalline structure of materials, a 16x16 analog pixel array detector (PAD) is used to replace the traditional detectors and retain the diffraction information at every STEM Raster Position. The PAD, unlike a charge-coupled device (CCD) or photomultiplier tube (PMT), directly images 120-200keV electrons with relatively little radiation damage, exhibits no afterglow and limits crosstalk between adjacent pixels. Traditional STEM imaging modes can still be performed by the PAD with a 1.1kHz frame rate, which allows post-acquisition control over imaging conditions and enables novel imaging techniques based on the retained crystalline information. Techniques for rapid, semi-automatic crystal grain segmentation with sub-nanometer resolution are described using cross-correlation, sub-region integration, and other post-processing methods.
Peter Ercius - One of the best experts on this subject based on the ideXlab platform.
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a high speed area detector for novel imaging techniques in a scanning transmission electron microscope
Ultramicroscopy, 2009Co-Authors: Thomas A Caswell, Peter Ercius, Mark W Tate, Alper Ercan, Sol M Gruner, David A MullerAbstract:A scanning transmission electron microscope (STEM) produces a convergent beam electron diffraction pattern at each Position of a Raster scan with a focused electron beam, but recording this information poses major challenges for gathering and storing such large data sets in a timely manner and with sufficient dynamic range. To investigate the crystalline structure of materials, a 16x16 analog pixel array detector (PAD) is used to replace the traditional detectors and retain the diffraction information at every STEM Raster Position. The PAD, unlike a charge-coupled device (CCD) or photomultiplier tube (PMT), directly images 120-200keV electrons with relatively little radiation damage, exhibits no afterglow and limits crosstalk between adjacent pixels. Traditional STEM imaging modes can still be performed by the PAD with a 1.1kHz frame rate, which allows post-acquisition control over imaging conditions and enables novel imaging techniques based on the retained crystalline information. Techniques for rapid, semi-automatic crystal grain segmentation with sub-nanometer resolution are described using cross-correlation, sub-region integration, and other post-processing methods.
Mark W Tate - One of the best experts on this subject based on the ideXlab platform.
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a high speed area detector for novel imaging techniques in a scanning transmission electron microscope
Ultramicroscopy, 2009Co-Authors: Thomas A Caswell, Peter Ercius, Mark W Tate, Alper Ercan, Sol M Gruner, David A MullerAbstract:A scanning transmission electron microscope (STEM) produces a convergent beam electron diffraction pattern at each Position of a Raster scan with a focused electron beam, but recording this information poses major challenges for gathering and storing such large data sets in a timely manner and with sufficient dynamic range. To investigate the crystalline structure of materials, a 16x16 analog pixel array detector (PAD) is used to replace the traditional detectors and retain the diffraction information at every STEM Raster Position. The PAD, unlike a charge-coupled device (CCD) or photomultiplier tube (PMT), directly images 120-200keV electrons with relatively little radiation damage, exhibits no afterglow and limits crosstalk between adjacent pixels. Traditional STEM imaging modes can still be performed by the PAD with a 1.1kHz frame rate, which allows post-acquisition control over imaging conditions and enables novel imaging techniques based on the retained crystalline information. Techniques for rapid, semi-automatic crystal grain segmentation with sub-nanometer resolution are described using cross-correlation, sub-region integration, and other post-processing methods.
Alper Ercan - One of the best experts on this subject based on the ideXlab platform.
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a high speed area detector for novel imaging techniques in a scanning transmission electron microscope
Ultramicroscopy, 2009Co-Authors: Thomas A Caswell, Peter Ercius, Mark W Tate, Alper Ercan, Sol M Gruner, David A MullerAbstract:A scanning transmission electron microscope (STEM) produces a convergent beam electron diffraction pattern at each Position of a Raster scan with a focused electron beam, but recording this information poses major challenges for gathering and storing such large data sets in a timely manner and with sufficient dynamic range. To investigate the crystalline structure of materials, a 16x16 analog pixel array detector (PAD) is used to replace the traditional detectors and retain the diffraction information at every STEM Raster Position. The PAD, unlike a charge-coupled device (CCD) or photomultiplier tube (PMT), directly images 120-200keV electrons with relatively little radiation damage, exhibits no afterglow and limits crosstalk between adjacent pixels. Traditional STEM imaging modes can still be performed by the PAD with a 1.1kHz frame rate, which allows post-acquisition control over imaging conditions and enables novel imaging techniques based on the retained crystalline information. Techniques for rapid, semi-automatic crystal grain segmentation with sub-nanometer resolution are described using cross-correlation, sub-region integration, and other post-processing methods.
