Rectangular Array

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C A Ross - One of the best experts on this subject based on the ideXlab platform.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

Takeshi Kasama - One of the best experts on this subject based on the ideXlab platform.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

Prabeer Barpanda - One of the best experts on this subject based on the ideXlab platform.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

S B Newcomb - One of the best experts on this subject based on the ideXlab platform.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

Martha R Mccartney - One of the best experts on this subject based on the ideXlab platform.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

  • off axis electron holography of pseudo spin valve thin film magnetic elements
    2005
    Co-Authors: Takeshi Kasama, Prabeer Barpanda, Rafal E Duninborkowski, S B Newcomb, Martha R Mccartney, Fernando Castano, C A Ross
    Abstract:

    Magnetic remanent states in a Rectangular Array of 75×280-nm2NiFe∕Cu∕Co thin-film pseudo-spin-valve elements are studied using off-axis electron holography in the transmission electron microscope (TEM). An approach based on focused ion-beam milling is used to minimize damage to the magnetic properties of the elements during preparation for TEM examination in plan-view geometry. Experimental electron holographic phase images are used to measure the switching fields of the Co and NiFe layers in each of three adjacent elements separately, and comparisons with micromagnetic simulations are used to infer the true magnetic thicknesses and widths of the layers. Demagnetizing fields are included in the discussion of the results, and the possibility that the conclusions may be affected by the procedure used to analyze the holograms is discussed.

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