The Experts below are selected from a list of 362652 Experts worldwide ranked by ideXlab platform
Mingxing Jin - One of the best experts on this subject based on the ideXlab platform.
-
influence of distance between Sample Surface and focal point on the expansion dynamics of laser induced silicon plasma under different Sample temperatures in air
Optik, 2020Co-Authors: Dan Zhang, Ying Wang, Anmin Chen, Yuanfei Jiang, Qiuyun Wang, Mingxing JinAbstract:Abstract In this paper, we explored the influence of distance between Sample Surface and focal point on the expansion dynamics of laser-induced plasma under different Sample temperatures in air. A Nd:YAG nanosecond pulse laser was used to ablate silicon and produce plasma plume. Using fast photography technology, we captured the images of the plasma plumes at different focusing positions and Sample temperatures. During the expansion of plasma plume, with the decrease of the distance between focal point and Sample Surface, the emission intensity of the plasma increased first, and then dropped. In addition, the increase in the Sample temperature could improve the expansion velocity of the plasma plume. Moreover, higher laser energy and Sample temperatures could enhance the emission intensity and increase the plasma lifetime.
-
influence of distance between Sample Surface and geometrical focal point on cn emission intensity from femtosecond laser induced pmma plasmas
Physics of Plasmas, 2019Co-Authors: Qiuyun Wang, Ying Wang, Anmin Chen, Dan Zhang, Yuanfei Jiang, Mingxing JinAbstract:In this study, a femtosecond laser is used to ablate polymethyl methacrylate and produce plasma with CN molecules to investigate the influence of the distance between the Sample Surface and geometrical focal point on CN emission intensity in air. The laser wavelength is 800 nm with a pulse width of 50 fs, and the laser energy ranges from 0.1 mJ to 1.5 mJ. It is determined that the spectral characteristics of the CN molecule depend on the distance between the Sample Surface and geometrical focal point, as well as the energy of the femtosecond laser. At the same energy, the spectral intensity of the CN molecule first increases, and then decreases with an increase in the distance. The position with the strongest spectral emission is not the geometrical focal point of the focusing lens, but away from the geometrical focal point. As the laser energy increases, the position with the strongest spectral emission moves toward the focusing lens. In addition, the vibration temperature and full width at half maximum (FWHM) are also calculated by fitting CN spectral data for specific distances and energies. The vibration temperature and FWHM of CN at the position with strongest emission are the lowest, and the vibration temperature and FWHM at the left side (close to the lens) of the strongest emission position are higher than those at the right side (away from the lens) of the strongest emission position.In this study, a femtosecond laser is used to ablate polymethyl methacrylate and produce plasma with CN molecules to investigate the influence of the distance between the Sample Surface and geometrical focal point on CN emission intensity in air. The laser wavelength is 800 nm with a pulse width of 50 fs, and the laser energy ranges from 0.1 mJ to 1.5 mJ. It is determined that the spectral characteristics of the CN molecule depend on the distance between the Sample Surface and geometrical focal point, as well as the energy of the femtosecond laser. At the same energy, the spectral intensity of the CN molecule first increases, and then decreases with an increase in the distance. The position with the strongest spectral emission is not the geometrical focal point of the focusing lens, but away from the geometrical focal point. As the laser energy increases, the position with the strongest spectral emission moves toward the focusing lens. In addition, the vibration temperature and full width at half maximum ...
-
Influence of distance between Sample Surface and focal point on spectral intensity of nanosecond laser-induced silicon plasma in air
AIP Publishing LLC, 2017Co-Authors: Ying Wang, Anmin Chen, Xiaowei Wang, Dan Zhang, Yuanfei Jiang, Mingxing JinAbstract:The influence of distance between Sample Surface and focal point on optical emission spectroscopy of laser-induced silicon plasma by a nanosecond Nd:YAG laser operating at the wavelength of 1064 nm was investigated in air. Our results show that the emission intensity of Si (I) 390.6 nm line and N (II) 399.5 nm line depends strongly on the distance between Sample Surface and focal point. When the Surface of ablated Sample is away from the focal point of focusing lens, the neutral atomic line (Si(I) signal to be measured) is much higher than the ionic line (interference signal N (II)). Therefore, we can improve the intensity of Si (I) signal to be measured, and reduce the intensity of interference signal N (II). The presented result is mainly based on the reduction of interaction between the plasma plume and the ambient air, leading to much weaker collisions
Yasuhiko Arakawa - One of the best experts on this subject based on the ideXlab platform.
-
classification of reflection high energy electron diffraction pattern using machine learning
Crystal Growth & Design, 2020Co-Authors: Jinkwan Kwoen, Yasuhiko ArakawaAbstract:Reflection high-energy electron diffraction (RHEED) has wide application because it allows in situ observation of the Sample Surface behavior during molecular beam epitaxy growth. In particular, th...
Boris Mizaikoff - One of the best experts on this subject based on the ideXlab platform.
-
combined scanning electrochemical atomic force microscopy for tapping mode imaging
Applied Physics Letters, 2003Co-Authors: Angelika Kueng, Christine Kranz, Boris Mizaikoff, Alois Lugstein, Emmerich BertagnolliAbstract:With the integration of submicro- and nanoelectrodes into atomic force microscopy(AFM) tips using microfabrication techniques, an elegant approach combining scanning electrochemicalmicroscopy (SECM) with atomic force microscopy has recently been demonstrated. Simultaneous imaging of topography and electrochemistry at a Sample Surface in AFM tapping mode with integrated SECM–AFM cantilevers oscillated at or near their resonance frequency is shown. In contrast to contact mode AFM imaging frictional forces at the Sample Surface are minimized. Hence, topographical and electrochemicalinformation of soft Surfaces (e.g., biological species) can be obtained.
-
integrating micro and nanoelectrodes into atomic force microscopy cantilevers using focused ion beam techniques
Applied Physics Letters, 2002Co-Authors: Alois Lugstein, Angelika Kueng, Christine Kranz, Emmerich Bertagnolli, Boris MizaikoffAbstract:This paper concerns a scanning probe capable of simultaneously measuring topography and local electrochemistry at a Sample Surface. Our approach ensures the distance regulation of the electrode by maintaining a fixed working distance between the probe and the Sample Surface independent from the electrochemical response. This is achieved by integrating micro- and nanoelectrodes into atomic force microscopy tips using focused ion beam techniques. The feasibility and functionality of the fully featured tip is demonstrated by a simultaneous topographical and electrochemical measurement of a porous polymer membrane as model Surface.
Emmerich Bertagnolli - One of the best experts on this subject based on the ideXlab platform.
-
combined scanning electrochemical atomic force microscopy for tapping mode imaging
Applied Physics Letters, 2003Co-Authors: Angelika Kueng, Christine Kranz, Boris Mizaikoff, Alois Lugstein, Emmerich BertagnolliAbstract:With the integration of submicro- and nanoelectrodes into atomic force microscopy(AFM) tips using microfabrication techniques, an elegant approach combining scanning electrochemicalmicroscopy (SECM) with atomic force microscopy has recently been demonstrated. Simultaneous imaging of topography and electrochemistry at a Sample Surface in AFM tapping mode with integrated SECM–AFM cantilevers oscillated at or near their resonance frequency is shown. In contrast to contact mode AFM imaging frictional forces at the Sample Surface are minimized. Hence, topographical and electrochemicalinformation of soft Surfaces (e.g., biological species) can be obtained.
-
integrating micro and nanoelectrodes into atomic force microscopy cantilevers using focused ion beam techniques
Applied Physics Letters, 2002Co-Authors: Alois Lugstein, Angelika Kueng, Christine Kranz, Emmerich Bertagnolli, Boris MizaikoffAbstract:This paper concerns a scanning probe capable of simultaneously measuring topography and local electrochemistry at a Sample Surface. Our approach ensures the distance regulation of the electrode by maintaining a fixed working distance between the probe and the Sample Surface independent from the electrochemical response. This is achieved by integrating micro- and nanoelectrodes into atomic force microscopy tips using focused ion beam techniques. The feasibility and functionality of the fully featured tip is demonstrated by a simultaneous topographical and electrochemical measurement of a porous polymer membrane as model Surface.
Jinkwan Kwoen - One of the best experts on this subject based on the ideXlab platform.
-
classification of reflection high energy electron diffraction pattern using machine learning
Crystal Growth & Design, 2020Co-Authors: Jinkwan Kwoen, Yasuhiko ArakawaAbstract:Reflection high-energy electron diffraction (RHEED) has wide application because it allows in situ observation of the Sample Surface behavior during molecular beam epitaxy growth. In particular, th...
