Scanning Tunneling Microscope

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W. D. Schneider - One of the best experts on this subject based on the ideXlab platform.

  • Low-temperature ultra-high-vacuum Scanning Tunneling Microscope
    Ultramicroscopy, 1992
    Co-Authors: R. Gaisch, M. Tschudy, B. Reihl, R. R. Schlittler, J K Gimzewski, W. D. Schneider
    Abstract:

    We describe a new Scanning Tunneling Microscope designed specifically for use in an ultra-high-vacuum low-temperature environment. The concept is based on an instrument with interchangeable tip, probe, and a remotely manipulated STM head. The instrumental performance and initial images of a Au(110)(1×2) reconstructed surface obtained with atomic resolution at T ≈ 10 K are presented. © 1992.

Paul S. Weiss - One of the best experts on this subject based on the ideXlab platform.

  • Expanding the Capabilities of the Scanning Tunneling Microscope
    Scanning Probe Microscopy: Characterization Nanofabrication and Device Application of Functional Materials, 2020
    Co-Authors: Kevin F. Kelly, Zachary J. Donhauser, Brent A. Mantooth, Paul S. Weiss
    Abstract:

    Scanning probe Microscopes allow unprecedented views of surfaces and the site-specific interactions and dynamics of adsorbates. Our efforts to identify and to characterize atoms and molecules on surfaces and how it is that the Scanning Tunneling Microscope images these surfaces and adsorbates will be discussed. We have extended the capabilities of Scanning probe Microscopes in several ways; two in particular will be highlighted. In the first section, recent advances in tunable microwave frequency Scanning Tunneling microscopy (STM) allow dopant profiling at unprecedented resolution will be presented. We apply nonlinear tunable microwave frequency Scanning Tunneling microscopy and spectroscopy to profiling dopants at ultrahigh resolution in semiconductors that is sensitive to both dopant type and density. We are then able to use a spectroscopic imaging mode to map the dopant density at the atomic scale. In the second part of this chapter, advanced image processing techniques that extend the scientific capabilities of STM will be presented. A digital image tracking algorithm based on Fourier-transform crosscorrelation has been developed to correct for instrumental drift in Scanning Tunneling Microscope images. This tracking algorithm was used to monitor conductance changes associated with different conformations in conjugated switching molecules and to trace the diffusion of individual benzene molecules on silver.

  • A low temperature, ultrahigh vacuum, microwave-frequency-compatible Scanning Tunneling Microscope
    Review of Scientific Instruments, 1994
    Co-Authors: S. J. Stranick, M. M. Kamna, Paul S. Weiss
    Abstract:

    To expand the capabilities of the microwave frequency alternating current Scanning Tunneling Microscope to include the ability to study isolated adsorbates and highly reactive surfaces, we have developed a low temperature, ultrahigh vacuum alternating current Scanning Tunneling Microscope. In this alternating current Scanning Tunneling Microscope, we employ the reliable beetle‐style sample approach mechanism with a number of other components unique to a low temperature Scanning Tunneling Microscope. These include the sample transfer, delivery, retrieval, storage, sputtering, and heating systems. This alternating current Scanning Tunneling Microscope operates at 77 and 4 K.

  • A tunable microwave frequency alternating current Scanning Tunneling Microscope
    Review of Scientific Instruments, 1994
    Co-Authors: S. J. Stranick, Paul S. Weiss
    Abstract:

    By modulating the Scanning Tunneling Microscope junction bias voltage at microwave frequencies, imaging and spectroscopy of insulating surfaces have become possible. In order to explore the spectroscopic capabilities of this instrument, we have developed a tunable microwave frequency alternating current Scanning Tunneling Microscope. We combine the reliable beetle‐style sample approach with coaxial sample and tip contacts. This provides us with a stable microwave‐frequency‐compatible Scanning Tunneling Microscope. This alternating current Scanning Tunneling Microscope design is compatible with ultrahigh vacuum and low‐temperature operation.

  • imaging xe with a low temperature Scanning Tunneling Microscope
    Physical Review Letters, 1991
    Co-Authors: D. M. Eigler, Paul S. Weiss, E K Schweizer, N D Lang
    Abstract:

    We have obtained images of individual Xe atoms absorbed on a Ni(110) surface using a low-temperature Scanning Tunneling Microscope (STM). The atom-on-jellium model has been used to calculate the apparent height of a Xe atom as imaged with the STM and the result is found to be in good agreement with experiment. We conclude that the Xe 6s resonance, although lying close to the vacuum level, is the origin of the Fermi-level local state density which renders Xe «visible» in the STM

R. Gaisch - One of the best experts on this subject based on the ideXlab platform.

  • Low-temperature ultra-high-vacuum Scanning Tunneling Microscope
    Ultramicroscopy, 1992
    Co-Authors: R. Gaisch, M. Tschudy, B. Reihl, R. R. Schlittler, J K Gimzewski, W. D. Schneider
    Abstract:

    We describe a new Scanning Tunneling Microscope designed specifically for use in an ultra-high-vacuum low-temperature environment. The concept is based on an instrument with interchangeable tip, probe, and a remotely manipulated STM head. The instrumental performance and initial images of a Au(110)(1×2) reconstructed surface obtained with atomic resolution at T ≈ 10 K are presented. © 1992.

Jun Ichi Kusano - One of the best experts on this subject based on the ideXlab platform.

  • tailoring a high transmission fiber probe for photon Scanning Tunneling Microscope
    Applied Physics Letters, 1996
    Co-Authors: Toshiharu Saiki, S Mononobe, Nobuo Saito, Motoichi Ohtsu, Jun Ichi Kusano
    Abstract:

    Transmission efficiency of a fiber probe used in photon Scanning Tunneling Microscope is evaluated as a function of aperture diameter. The apertured probe has been fabricated by chemical etching technique and metal coating. By comparing two types of probes with different cone angles, we determine the most influential factor in the transmission property of the metal‐cladding tapered waveguide. A long tip with high efficiency is developed by a multistep etching method so as to be suitable during actual Scanning operation. Photoluminescence imaging of lateral p‐n junctions on the GaAs substrate is demonstrated in the illumination‐collection hybrid mode operation of photon Scanning Tunneling Microscope.

  • Tailoring a high‐transmission fiber probe for photon Scanning Tunneling Microscope
    Applied Physics Letters, 1996
    Co-Authors: Toshiharu Saiki, S Mononobe, Nobuo Saito, Motoichi Ohtsu, Jun Ichi Kusano
    Abstract:

    Transmission efficiency of a fiber probe used in photon Scanning Tunneling Microscope is evaluated as a function of aperture diameter. The apertured probe has been fabricated by chemical etching technique and metal coating. By comparing two types of probes with different cone angles, we determine the most influential factor in the transmission property of the metal‐cladding tapered waveguide. A long tip with high efficiency is developed by a multistep etching method so as to be suitable during actual Scanning operation. Photoluminescence imaging of lateral p‐n junctions on the GaAs substrate is demonstrated in the illumination‐collection hybrid mode operation of photon Scanning Tunneling Microscope.Transmission efficiency of a fiber probe used in photon Scanning Tunneling Microscope is evaluated as a function of aperture diameter. The apertured probe has been fabricated by chemical etching technique and metal coating. By comparing two types of probes with different cone angles, we determine the most influential factor in the transmission property of the metal‐cladding tapered waveguide. A long tip with high efficiency is developed by a multistep etching method so as to be suitable during actual Scanning operation. Photoluminescence imaging of lateral p‐n junctions on the GaAs substrate is demonstrated in the illumination‐collection hybrid mode operation of photon Scanning Tunneling Microscope.

N D Lang - One of the best experts on this subject based on the ideXlab platform.

  • imaging xe with a low temperature Scanning Tunneling Microscope
    Physical Review Letters, 1991
    Co-Authors: D. M. Eigler, Paul S. Weiss, E K Schweizer, N D Lang
    Abstract:

    We have obtained images of individual Xe atoms absorbed on a Ni(110) surface using a low-temperature Scanning Tunneling Microscope (STM). The atom-on-jellium model has been used to calculate the apparent height of a Xe atom as imaged with the STM and the result is found to be in good agreement with experiment. We conclude that the Xe 6s resonance, although lying close to the vacuum level, is the origin of the Fermi-level local state density which renders Xe «visible» in the STM

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