The Experts below are selected from a list of 315 Experts worldwide ranked by ideXlab platform
H. Mizuno - One of the best experts on this subject based on the ideXlab platform.
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In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
IEEE Journal of Solid-State Circuits, 2007Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in Situ Measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply
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In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in-Situ Measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supply
Y. Kanno - One of the best experts on this subject based on the ideXlab platform.
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In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
IEEE Journal of Solid-State Circuits, 2007Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in Situ Measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply
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In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in-Situ Measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supply
S. Komatsu - One of the best experts on this subject based on the ideXlab platform.
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In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
IEEE Journal of Solid-State Circuits, 2007Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in Situ Measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply
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In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in-Situ Measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supply
K. Hirose - One of the best experts on this subject based on the ideXlab platform.
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In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
IEEE Journal of Solid-State Circuits, 2007Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in Situ Measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply
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In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in-Situ Measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supply
Yoshiji Yasu - One of the best experts on this subject based on the ideXlab platform.
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In-Situ Measurement of Supply-Noise Maps With Millivolt Accuracy and Nanosecond-Order Time Resolution
IEEE Journal of Solid-State Circuits, 2007Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in Situ Measurement scheme for generating supply-noise maps, which can be conducted while running applications in product-level LSIs, was developed. The design of the on-chip voltage sampling probe is based on a simple ring oscillator, which converts local supply difference between VDD and VSS to oscillation-frequency deviation. High Measurement accuracy is achieved by off-chip digital signal processing and calibration. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G-cellular-phone processor. It will thus help in designing power-supply networks and in visually verifying the quality of a power supply
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In-Situ Measurement of Supply-Noise Maps with Millivolt Accuracy and Nanosecond-Order Time Resolution
2006 Symposium on VLSI Circuits 2006. Digest of Technical Papers., 2006Co-Authors: Y. Kanno, T. Irita, R. Mori, S. Komatsu, K. Hirose, Y Kondoh, Yoshiji Yasu, H. MizunoAbstract:An in-Situ Measurement scheme for supply-noise maps under running applications in product-level LSIs was developed. This scheme was used to successfully measure 69-mV local supply noise with 5-ns time resolution in a 3G cellular phone processor. It will thus help in designing power-supply networks and visibly verifying the quality of a power supply
