The Experts below are selected from a list of 36 Experts worldwide ranked by ideXlab platform

David G Castner - One of the best experts on this subject based on the ideXlab platform.

  • time of flight secondary ion mass spectrometry Techniques and applications for the Characterization of biomaterial Surfaces
    Biomaterials, 2003
    Co-Authors: Anna M. Belu, Daniel J Graham, David G Castner
    Abstract:

    The Surface of a biomaterial plays a critical role in the success of an implant. Much effort is currently being focused on controlling the chemistry at biomaterial Surfaces to ensure favorable results in vivo. The successful tailoring of the Surface chemistry will require a detailed Surface Characterization to verify that the desired changes have been made. This will include the ability to determine the composition, structure, orientation, and spatial distribution, of the molecules and chemical structures on the Surface. TOF-SIMS is a powerful Surface Characterization Technique that is able to address these requirements through both spectral analysis and direct chemical state imaging. The flexibility of the TOF-SIMS Technique, and the wealth of data produced have generated much interest in its use for biomaterial Characterization. This review discusses the strengths, weaknesses, and challenges of static TOF-SIMS for biomaterial Surface Characterization. First the basic principles of TOF-SIMS are introduced, giving an overview of the Technique. Next, sample type, and other sample considerations are discussed. Then data interpretation is overviewed using examples from both spectral and imaging data. Finally, quantitative SIMS analysis is discussed and an outlook for TOF-SIMS analysis of biomaterials will be given.

Anna M. Belu - One of the best experts on this subject based on the ideXlab platform.

  • time of flight secondary ion mass spectrometry Techniques and applications for the Characterization of biomaterial Surfaces
    Biomaterials, 2003
    Co-Authors: Anna M. Belu, Daniel J Graham, David G Castner
    Abstract:

    The Surface of a biomaterial plays a critical role in the success of an implant. Much effort is currently being focused on controlling the chemistry at biomaterial Surfaces to ensure favorable results in vivo. The successful tailoring of the Surface chemistry will require a detailed Surface Characterization to verify that the desired changes have been made. This will include the ability to determine the composition, structure, orientation, and spatial distribution, of the molecules and chemical structures on the Surface. TOF-SIMS is a powerful Surface Characterization Technique that is able to address these requirements through both spectral analysis and direct chemical state imaging. The flexibility of the TOF-SIMS Technique, and the wealth of data produced have generated much interest in its use for biomaterial Characterization. This review discusses the strengths, weaknesses, and challenges of static TOF-SIMS for biomaterial Surface Characterization. First the basic principles of TOF-SIMS are introduced, giving an overview of the Technique. Next, sample type, and other sample considerations are discussed. Then data interpretation is overviewed using examples from both spectral and imaging data. Finally, quantitative SIMS analysis is discussed and an outlook for TOF-SIMS analysis of biomaterials will be given.

Daniel J Graham - One of the best experts on this subject based on the ideXlab platform.

  • time of flight secondary ion mass spectrometry Techniques and applications for the Characterization of biomaterial Surfaces
    Biomaterials, 2003
    Co-Authors: Anna M. Belu, Daniel J Graham, David G Castner
    Abstract:

    The Surface of a biomaterial plays a critical role in the success of an implant. Much effort is currently being focused on controlling the chemistry at biomaterial Surfaces to ensure favorable results in vivo. The successful tailoring of the Surface chemistry will require a detailed Surface Characterization to verify that the desired changes have been made. This will include the ability to determine the composition, structure, orientation, and spatial distribution, of the molecules and chemical structures on the Surface. TOF-SIMS is a powerful Surface Characterization Technique that is able to address these requirements through both spectral analysis and direct chemical state imaging. The flexibility of the TOF-SIMS Technique, and the wealth of data produced have generated much interest in its use for biomaterial Characterization. This review discusses the strengths, weaknesses, and challenges of static TOF-SIMS for biomaterial Surface Characterization. First the basic principles of TOF-SIMS are introduced, giving an overview of the Technique. Next, sample type, and other sample considerations are discussed. Then data interpretation is overviewed using examples from both spectral and imaging data. Finally, quantitative SIMS analysis is discussed and an outlook for TOF-SIMS analysis of biomaterials will be given.

N O Fuentes - One of the best experts on this subject based on the ideXlab platform.

  • a new Surface Characterization Technique rimaps rotated image with maximum average power spectrum
    Journal of Microscopy, 2002
    Co-Authors: N O Fuentes, E A Favret
    Abstract:

    Summary This work introduces a new imaging Technique, Rotated Image with Maximum Average Power Spectrum (RIMAPS), for use in determining orientation and characteristics of Surface topography. It consists of computing the maximum value of the averaged power spectrum, given by one step of the two-dimensional Fourier transform, for each angle of rotation of a digitized image. The basic measurement science of this Technique is described and different cases are studied. The Characterization of simple geometrical figures explains the meaning of peaks and their angular positions given by RIMAPS analysis. A known Surface pattern made on a sample of pure copper, mechanically ground, is used to study reproducibility, dependence on image quality and topography scale relative to pixel size and magnification. Samples of pure zinc, mechanically ground and chemically etched, were used to show the main features of RIMAPS analysis when characterizing a more complicated pattern on a real Surface. All the studies performed under different conditions for observation and acquisition of images give strong evidence of the stability and robustness of RIMAPS as a Technique for the Characterization of topography.

  • Surface Characterization of materials using the rimaps Technique
    2002
    Co-Authors: N O Fuentes
    Abstract:

    RIMAPS (Rotated Image with Maximum Average Power Spectrum) is a new Surface Characterization Technique independent of the class of microscopy and conditions used for observation as long as they remain constant. This Technique combines rotation of digitized images and Fourier transform to obtain the maximum value of any average power spectrum from each angular position. The peaks appearing in the resulting plots indicate Surface pattern orientation and its characteristic topographic form. In this paper, metallic Surfaces are studied to illustrate the main characteristics of this Technique. In all cases, RIMAPS spectra constitute the fingerprints of the patterns.

Kenneth T Stanton - One of the best experts on this subject based on the ideXlab platform.

  • hyperspectral imaging with unsupervised pattern recognition a novel Surface Characterization Technique for thermal control coatings
    Materials Letters, 2019
    Co-Authors: R A Ruane, Kevin A J Doherty, Ronan M Dorrepaal, Barry Twomey, Aoife Gowen, Joe Flanagan, Daithi De Faoite, Kenneth T Stanton
    Abstract:

    Abstract This study investigates the novel application of hyperspectral imaging Techniques to SolarBlack, a thermal control coating developed for the European Space Agency. A range of hyperspectral imaging Techniques are presented as a novel method of Surface Characterization for thermal control coatings, and potentially a wide range of other materials. Spatially resolved Fourier-transform infrared imaging and visible/near-infrared imaging in combination with principal component analysis of the SolarBlack thermal control coating confirmed the presence of periodic variations in reflectance and thermal emittance. This periodicity is due to the rastering nature of the coating process.