The Experts below are selected from a list of 324 Experts worldwide ranked by ideXlab platform
N A Wakeham - One of the best experts on this subject based on the ideXlab platform.
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Thermal Fluctuation noise in mo au superconducting transition edge sensor microcalorimeters
Journal of Applied Physics, 2019Co-Authors: N A Wakeham, J S Adams, Simon R Bandler, S Beaumont, J A Chervenak, Aaron M Datesman, M E EckartAbstract:In many superconducting transition-edge sensor (TES) microcalorimeters, the measured electrical noise exceeds theoretical estimates based on a Thermal model of a single body Thermally connected to a heat bath. Here, we report on noise and complex impedance measurements of a range of designs of TESs made with a Mo/Au bilayer. We have fitted the measured data using a two-body model, where the x-ray absorber and the TES are connected by an internal Thermal conductance Gae. We find that the so-called excess noise measured in these devices is consistent with the noise generated from the internal Thermal Fluctuations between the x-ray absorber and the TES. Our fitted parameters are consistent with the origin of Gae being from the finite Thermal conductance of the TES itself. These results suggest that even in these relatively low resistance Mo/Au TESs, the internal Thermal conductance of the TES may add significant additional noise and could account for all the measured excess noise. Furthermore, we find that around regions of the superconducting transition with rapidly changing derivative of resistance with respect to temperature, an additional noise mechanism may dominate. These observations may lead to a greater understanding of TES devices and allow the design of TES microcalorimeters with improved performance.
I J Maasilta - One of the best experts on this subject based on the ideXlab platform.
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normal metal superconductor decoupling as a source of Thermal Fluctuation noise in transition edge sensors
Journal of Applied Physics, 2012Co-Authors: K M Kinnunen, M R J Palosaari, I J MaasiltaAbstract:We have studied the origin of excess noise in superconducting transition-edge sensors (TES) with several different detector designs. We show that most of the observed noise and complex impedance features can be explained by a Thermal model consisting of three bodies. We suggest that one of the Thermal blocks and the corresponding Thermal Fluctuation noise arise due to the high-frequency Thermal decoupling of the normal and superconducting phase regions inside the TES film. Our results are also consistent with the prediction that in thin bilayer proximitized superconductors, the jump in heat capacity at the critical temperature is smaller than the universal BCS theory result.
P A J De Korte - One of the best experts on this subject based on the ideXlab platform.
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Thermal Fluctuation noise in a voltage biased superconducting transition edge thermometer
Applied Physics Letters, 2000Co-Authors: H F C Hoevers, A C Bento, M P Bruijn, L Gottardi, M A N Korevaar, W A Mels, P A J De KorteAbstract:The current noise at the output of a microcalorimeter with a voltage biased superconducting transition edge thermometer is studied in detail. In addition to the two well-known noise sources: Thermal Fluctuation noise from the heat link to the bath and Johnson noise from the resistive thermometer, a third noise source strongly correlated with the steepness of the thermometer is required to fit the measured noise spectra. Thermal Fluctuation noise, originating in the thermometer itself, fully explains the additional noise. A simple model provides quantitative agreement between the observed and calculated noise spectra for all bias points in the superconducting transition.
M E Eckart - One of the best experts on this subject based on the ideXlab platform.
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Thermal Fluctuation noise in mo au superconducting transition edge sensor microcalorimeters
Journal of Applied Physics, 2019Co-Authors: N A Wakeham, J S Adams, Simon R Bandler, S Beaumont, J A Chervenak, Aaron M Datesman, M E EckartAbstract:In many superconducting transition-edge sensor (TES) microcalorimeters, the measured electrical noise exceeds theoretical estimates based on a Thermal model of a single body Thermally connected to a heat bath. Here, we report on noise and complex impedance measurements of a range of designs of TESs made with a Mo/Au bilayer. We have fitted the measured data using a two-body model, where the x-ray absorber and the TES are connected by an internal Thermal conductance Gae. We find that the so-called excess noise measured in these devices is consistent with the noise generated from the internal Thermal Fluctuations between the x-ray absorber and the TES. Our fitted parameters are consistent with the origin of Gae being from the finite Thermal conductance of the TES itself. These results suggest that even in these relatively low resistance Mo/Au TESs, the internal Thermal conductance of the TES may add significant additional noise and could account for all the measured excess noise. Furthermore, we find that around regions of the superconducting transition with rapidly changing derivative of resistance with respect to temperature, an additional noise mechanism may dominate. These observations may lead to a greater understanding of TES devices and allow the design of TES microcalorimeters with improved performance.
S Beaumont - One of the best experts on this subject based on the ideXlab platform.
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Thermal Fluctuation noise in mo au superconducting transition edge sensor microcalorimeters
Journal of Applied Physics, 2019Co-Authors: N A Wakeham, J S Adams, Simon R Bandler, S Beaumont, J A Chervenak, Aaron M Datesman, M E EckartAbstract:In many superconducting transition-edge sensor (TES) microcalorimeters, the measured electrical noise exceeds theoretical estimates based on a Thermal model of a single body Thermally connected to a heat bath. Here, we report on noise and complex impedance measurements of a range of designs of TESs made with a Mo/Au bilayer. We have fitted the measured data using a two-body model, where the x-ray absorber and the TES are connected by an internal Thermal conductance Gae. We find that the so-called excess noise measured in these devices is consistent with the noise generated from the internal Thermal Fluctuations between the x-ray absorber and the TES. Our fitted parameters are consistent with the origin of Gae being from the finite Thermal conductance of the TES itself. These results suggest that even in these relatively low resistance Mo/Au TESs, the internal Thermal conductance of the TES may add significant additional noise and could account for all the measured excess noise. Furthermore, we find that around regions of the superconducting transition with rapidly changing derivative of resistance with respect to temperature, an additional noise mechanism may dominate. These observations may lead to a greater understanding of TES devices and allow the design of TES microcalorimeters with improved performance.
