The Experts below are selected from a list of 48 Experts worldwide ranked by ideXlab platform
Valery I. Klyatskin - One of the best experts on this subject based on the ideXlab platform.
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Analysis of wave statistical behavior in a random layered medium for different boundary conditions
Optics in Atmospheric Propagation and Random Phenomena, 1994Co-Authors: Michael A. Guzev, Valery I. Klyatskin, Gennadii V. PopovAbstract:The problem of the oblique incidence of a wave on the half-space of layered randomly inhomogeneous medium without absorption is considered. We analyse the influence of boundary conditions on probability distribution of the reflection coefficient phase, and statistical behaviour of the Wavefield Intensity moments inside the medium.
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Influence of boundary conditions on wave localization characteristics in layered randomly inhomogeneous medium
Characterization and Propagation of Sources and Backgrounds, 1994Co-Authors: Michael A. Guzev, Valery I. Klyatskin, Gennadii V. PopovAbstract:We consider the problem of the oblique incidence of a wave on the half-space of layered randomly inhomogeneous medium without absorption and analyze the influence of boundary conditions on probability distribution of the reflection coefficient phase and statistical behavior of the Wavefield Intensity moments inside the medium.
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Influence of boundary conditions on statistical characteristics of the Wavefield in a layered randomly inhomogeneous medium
Waves in Random Media, 1993Co-Authors: Michael A. Guzev, Valery I. KlyatskinAbstract:Abstract We consider the problem of the oblique incidence of a wave on the half-space of a layered randomly inhomogeneous medium without absorption and analyse the influence of boundary conditions on the probability distribution of the reflection coefficient phase, and the statistical behaviour of the Wavefield Intensity moments inside the medium.
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Plane waves in a layered weakly dissipative randomly inhomogeneous medium
Waves in Random Media, 1991Co-Authors: Michael A. Guzev, Valery I. KlyatskinAbstract:Abstract In the framework of the embedding method the authors consider the stationary and non-stationary problem of a plane-wave incident on a randomly inhomogeneous medium. For the stationary problem there are three regions of sufficiently different behaviour of the Wavefield Intensity moments inside a weakly dissipative medium. For the non-stationary problem they succeeded in calculating the average Intensity at t→+∞ by means of analytical prolongation of the stationary problem solution with respect to the absorption parameter. The time asymptotic of the averaged Intensity on the boundary slab is also obtained for a finite-thickness slab.
Michael A. Guzev - One of the best experts on this subject based on the ideXlab platform.
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Analysis of wave statistical behavior in a random layered medium for different boundary conditions
Optics in Atmospheric Propagation and Random Phenomena, 1994Co-Authors: Michael A. Guzev, Valery I. Klyatskin, Gennadii V. PopovAbstract:The problem of the oblique incidence of a wave on the half-space of layered randomly inhomogeneous medium without absorption is considered. We analyse the influence of boundary conditions on probability distribution of the reflection coefficient phase, and statistical behaviour of the Wavefield Intensity moments inside the medium.
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Influence of boundary conditions on wave localization characteristics in layered randomly inhomogeneous medium
Characterization and Propagation of Sources and Backgrounds, 1994Co-Authors: Michael A. Guzev, Valery I. Klyatskin, Gennadii V. PopovAbstract:We consider the problem of the oblique incidence of a wave on the half-space of layered randomly inhomogeneous medium without absorption and analyze the influence of boundary conditions on probability distribution of the reflection coefficient phase and statistical behavior of the Wavefield Intensity moments inside the medium.
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Influence of boundary conditions on statistical characteristics of the Wavefield in a layered randomly inhomogeneous medium
Waves in Random Media, 1993Co-Authors: Michael A. Guzev, Valery I. KlyatskinAbstract:Abstract We consider the problem of the oblique incidence of a wave on the half-space of a layered randomly inhomogeneous medium without absorption and analyse the influence of boundary conditions on the probability distribution of the reflection coefficient phase, and the statistical behaviour of the Wavefield Intensity moments inside the medium.
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Plane waves in a layered weakly dissipative randomly inhomogeneous medium
Waves in Random Media, 1991Co-Authors: Michael A. Guzev, Valery I. KlyatskinAbstract:Abstract In the framework of the embedding method the authors consider the stationary and non-stationary problem of a plane-wave incident on a randomly inhomogeneous medium. For the stationary problem there are three regions of sufficiently different behaviour of the Wavefield Intensity moments inside a weakly dissipative medium. For the non-stationary problem they succeeded in calculating the average Intensity at t→+∞ by means of analytical prolongation of the stationary problem solution with respect to the absorption parameter. The time asymptotic of the averaged Intensity on the boundary slab is also obtained for a finite-thickness slab.
C Cusatis - One of the best experts on this subject based on the ideXlab platform.
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detection of the standing x ray Wavefield Intensity inside a thin crystal using back diffraction topography and imaging
Journal of Applied Crystallography, 2009Co-Authors: M G Honnicke, C CusatisAbstract:The standing X-ray wavefield into a single-crystal bulk is characterized by acombination of the diffracted–reflected h-beams and the diffracted–transmittedo-beam. For different angular positions on the total reflection region, thestanding X-ray wavefield has its maximum from the region between the atomicplanes (low photoelectric absorption) to the region on the atomic planes (highphotoelectricabsorption).Historically,the evidencefor sucha characteristichascome from experiments such as anomalous transmission (Borrmann effect,originally detected in Laue geometry) and fluorescent measurements with asingle crystal under diffraction conditions. In the present work, such acharacteristic is demonstrated by the direct measurement of the standingX-raywavefieldIntensityintoa50 mm-thicksingle-crystalCCDdetector(Si800)set in back-diffraction geometry.1. IntroductionIn general, single crystals under diffraction conditions presentdynamical diffraction effects, i.e. the interaction between thediffracted–reflected h-beams and the diffracted–transmittedo-beam may be detected. Such an interaction is characterizedby a standing wavefield near to the surface (evanescentwavefield) and into the crystal bulk. For different angularpositions on the total reflection region, the standing wavefieldhas its maximum from the region between the atomic planes(low absorption) to the region on the atomic planes (highabsorption). The standing wavefield is evidenced, but notdirectly detected, by experiments such as anomalous trans-mission (Borrman, 1955; Authier, 2001) and secondary fluor-escent emission (Batterman, 1962) under single-crystaldiffraction conditions. The X-ray standing wave technique isalso used to characterize single-crystal materials (Authier,2001).Self-detection of X-ray diffraction is achieved by measuringadecreaseinthephotocurrent orinthephotocountingwhenasingle-crystal detector is set in the diffraction condition(Zheludeva, 1985; Holy´ et al., 1985; Jach et al., 1988). Thiseffect has been used for angular control of synchrotronmonochromators (Jach, 1990; Hall et al., 2004), in determiningthe energy resolution of graded SiGe monochromators (Erkoet al., 2001), and as a method for detecting X-ray diffraction atangles around and exactly equal to /2 (back-diffraction)(Ho¨nnicke et al., 2004). Also, self-detection imaging with thediffraction of a single-crystal CCD detector, at diffractionangles far from /2, has been reported (Ho¨nnicke & Cusatis,2005; Mitschke et al., 2005).In X-ray back-diffraction geometry (Caticha & Caticha-Ellis, 1982; Cusatis et al., 1996) the diffracted h-beam overlapstheincidentbeam.Insuchageometry,thewidthsofthesingle-crystal rocking curves are much larger ( 10
Gennadii V. Popov - One of the best experts on this subject based on the ideXlab platform.
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Analysis of wave statistical behavior in a random layered medium for different boundary conditions
Optics in Atmospheric Propagation and Random Phenomena, 1994Co-Authors: Michael A. Guzev, Valery I. Klyatskin, Gennadii V. PopovAbstract:The problem of the oblique incidence of a wave on the half-space of layered randomly inhomogeneous medium without absorption is considered. We analyse the influence of boundary conditions on probability distribution of the reflection coefficient phase, and statistical behaviour of the Wavefield Intensity moments inside the medium.
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Influence of boundary conditions on wave localization characteristics in layered randomly inhomogeneous medium
Characterization and Propagation of Sources and Backgrounds, 1994Co-Authors: Michael A. Guzev, Valery I. Klyatskin, Gennadii V. PopovAbstract:We consider the problem of the oblique incidence of a wave on the half-space of layered randomly inhomogeneous medium without absorption and analyze the influence of boundary conditions on probability distribution of the reflection coefficient phase and statistical behavior of the Wavefield Intensity moments inside the medium.
M G Honnicke - One of the best experts on this subject based on the ideXlab platform.
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detection of the standing x ray Wavefield Intensity inside a thin crystal using back diffraction topography and imaging
Journal of Applied Crystallography, 2009Co-Authors: M G Honnicke, C CusatisAbstract:The standing X-ray wavefield into a single-crystal bulk is characterized by acombination of the diffracted–reflected h-beams and the diffracted–transmittedo-beam. For different angular positions on the total reflection region, thestanding X-ray wavefield has its maximum from the region between the atomicplanes (low photoelectric absorption) to the region on the atomic planes (highphotoelectricabsorption).Historically,the evidencefor sucha characteristichascome from experiments such as anomalous transmission (Borrmann effect,originally detected in Laue geometry) and fluorescent measurements with asingle crystal under diffraction conditions. In the present work, such acharacteristic is demonstrated by the direct measurement of the standingX-raywavefieldIntensityintoa50 mm-thicksingle-crystalCCDdetector(Si800)set in back-diffraction geometry.1. IntroductionIn general, single crystals under diffraction conditions presentdynamical diffraction effects, i.e. the interaction between thediffracted–reflected h-beams and the diffracted–transmittedo-beam may be detected. Such an interaction is characterizedby a standing wavefield near to the surface (evanescentwavefield) and into the crystal bulk. For different angularpositions on the total reflection region, the standing wavefieldhas its maximum from the region between the atomic planes(low absorption) to the region on the atomic planes (highabsorption). The standing wavefield is evidenced, but notdirectly detected, by experiments such as anomalous trans-mission (Borrman, 1955; Authier, 2001) and secondary fluor-escent emission (Batterman, 1962) under single-crystaldiffraction conditions. The X-ray standing wave technique isalso used to characterize single-crystal materials (Authier,2001).Self-detection of X-ray diffraction is achieved by measuringadecreaseinthephotocurrent orinthephotocountingwhenasingle-crystal detector is set in the diffraction condition(Zheludeva, 1985; Holy´ et al., 1985; Jach et al., 1988). Thiseffect has been used for angular control of synchrotronmonochromators (Jach, 1990; Hall et al., 2004), in determiningthe energy resolution of graded SiGe monochromators (Erkoet al., 2001), and as a method for detecting X-ray diffraction atangles around and exactly equal to /2 (back-diffraction)(Ho¨nnicke et al., 2004). Also, self-detection imaging with thediffraction of a single-crystal CCD detector, at diffractionangles far from /2, has been reported (Ho¨nnicke & Cusatis,2005; Mitschke et al., 2005).In X-ray back-diffraction geometry (Caticha & Caticha-Ellis, 1982; Cusatis et al., 1996) the diffracted h-beam overlapstheincidentbeam.Insuchageometry,thewidthsofthesingle-crystal rocking curves are much larger ( 10
