The Experts below are selected from a list of 669 Experts worldwide ranked by ideXlab platform
Marian K Kazimierczuk - One of the best experts on this subject based on the ideXlab platform.
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voltage clamped class e amplifier with Zener Diode
IEEE Transactions on Circuits and Systems I-regular Papers, 2003Co-Authors: Tadashi Suetsugu, Marian K KazimierczukAbstract:A class-E amplifier with a clamped switch peak voltage by a Zener Diode is proposed and experimented. The effect of the Zener Diode on the switch voltage waveform, output power, and efficiency are examined. The experimental verification is presented using a prototype circuit.
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voltage clamped class e amplifier with a Zener Diode across the choke coil
International Symposium on Circuits and Systems, 2002Co-Authors: Tadashi Suetsugu, Marian K KazimierczukAbstract:A class E amplifier with a clamped switch peak voltage with a Zener Diode across the choke inductor is proposed and analyzed. Power loss in the Zener Diode is reduced to 2/3 of that in the amplifier with a Zener Diode across the switch. The effect of the Zener Diode on the switch voltage waveform, output power, and efficiency are examined and experimentally verified.
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voltage clamped class e amplifier with a Zener Diode across the switch
International Symposium on Circuits and Systems, 2002Co-Authors: Tadashi Suetsugu, Marian K KazimierczukAbstract:The class E amplifier with a clamped switch peak voltage using a Zener Diode is proposed and analyzed A higher output power is obtained when the maximum switch voltage is clamped. Design equations are derived for the output power and power losses. The effect of the Zener Diode on the switch voltage waveform, output power, and efficiency are examined. The experimental verification is presented using a prototype circuit.
Chwan-ying Lee - One of the best experts on this subject based on the ideXlab platform.
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SiC MOSFET with Integrated Zener Diode as an Asymmetric Bidirectional Voltage Clamp Between the Gate and Source for Overvoltage Protection
2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD), 2019Co-Authors: Fu-je Hsu, Kuo-ting Chu, Chien-chung Hung, Lurng-shehng Lee, Chwan-ying LeeAbstract:An integrated back-to-back SiC Zener Diode is proposed and designed as an asymmetric bidirectional voltage clamp between the gate and source to protect the gate oxide of SiC MOSFET from the overvoltage stress. The leakage current of integrated SiC Zener Diode is very low compared to conventional silicon poly Zener Diode used for the same purpose and close to that of gate oxide, even at high temperatures. The pulsed current test shows that the overvoltage can be clamped by the integrated Zener and the characteristics of Zener integrated MOSFET did not degrade or change after continuous switching.
J. Pohlman - One of the best experts on this subject based on the ideXlab platform.
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Punchthrough Diode as the transient voltage suppressor for low-voltage electronics
IEEE Transactions on Electron Devices, 1996Co-Authors: Ya-chin King, J. PohlmanAbstract:Protection devices for future low-voltage electronics are needed. Performances of a new punchthrough transient voltage suppressor (TVS) are analyzed with two-dimensional device simulation. Compared with the available low-voltage TVS constructed with a Zener Diode, the punchthrough Diode shows far superior leakage current and capacitance. These punchthrough TVS devices are satisfactory for applications not only at 3 V but even at 1 V.
T J Witt - One of the best experts on this subject based on the ideXlab platform.
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maintenance and dissemination of voltage standards by Zener Diode based instruments
IEE Proceedings: Science measurement and technology, 2002Co-Authors: T J WittAbstract:Although arrays of Josephson junctions are today's primary reference standards of voltage, they are used by only 30 to 40 national metrology institutes around the world and perhaps a comparable number of primary metrology laboratories. Nearly all traceable voltage measurements are linked to Josephson standards by chains containing electronic DC voltage standards referenced to Zener Diodes. These typically take the form of small, rather easily transportable instruments that provide outputs of 10 V and 1.018 V. The specified stability over a 1-year period of the 10 V outputs of the best Zener standards is quite good, of the order of one part in 106 of the nominal output voltage, and, by modelling temporal drift and correcting for environmental influences, output voltages can be predictable, over periods of several weeks or more, to within a few parts in 108. However, given that the demonstrated reproducibility of 10 V Josephson standards is of the order of a few parts in 1010 of the nominal output, an enormous increase in measurement uncertainty occurs in going from Josephson standards to Zeners. The various effects that limit the reproducibility of Zener standards, including drift, pressure, temperature and humidity effects and, ultimately, 1/f noise, are reviewed.
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using power spectra and allan variances to characterise the noise of Zener Diode voltage standards
IEE Proceedings - Science Measurement and Technology, 2000Co-Authors: T J Witt, D ReymannAbstract:The differences between the voltage outputs of Zener-Diode based electronic voltage standards (Zeners) and standard cells, between Zeners and a Josephson array voltage standard (JAVS) and between pairs of Zeners are measured. The data are analysed as time series. They are serially correlated so that the use of the usual expression for the standard deviation of the mean. The experimental standard deviation divided by the square root of the number of measurements, to characterise the dispersion is not justified. Noise in Zeners is of a 1/f nature and is characterised by using the power spectral density and Allan variance, a statistic used in time and frequency metrology. The uncertainty in the measurements of the 10 V outputs of 13 Zeners is limited by 1/f noise to a 'floor' value ranging between two parts in 10/sup 9/ and eight parts in 10/sup 9/ of the nominal output value. Methods are proposed for estimating the Allan variance of a Zener using either a standard cell, a JAVS, or a small group of similar Zeners.
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pressure coefficients of some Zener Diode based electronic voltage standards
Conference on Precision Electromagnetic Measurements, 1998Co-Authors: T J WittAbstract:We present results of measurements of the pressure dependence of the 1.018 V and 10 V outputs of twenty electronic voltage standards. Seventeen Fluke 732B and three Fluke 732A instruments were studied, these being the types most often used with Josephson voltage standards and in international comparisons for which the smallest uncertainties are demanded. Fifteen of the 732B instruments have relative pressure coefficients near 1.9/spl times/10/sup -9//hPa for both outputs; the other two have negative coefficients, the absolute values of which are smaller by about a factor of ten. Small, but statistically significant, coefficients of both signs were found for the three Fluke 732A instruments. The pressure effects are highly reproducible and so they permit the use of corrections to eliminate errors which, in extreme cases, can attain relative values of nearly four parts in 10/sup 7/.
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measurements of the temperature dependence of the output voltages of some Zener Diode based voltage standards
IEE Proceedings - Science Measurement and Technology, 1998Co-Authors: T J WittAbstract:The author describes a test facility and procedures for determining the temperature coefficients of the 1.018 V and 10 V outputs of Fluke 732B electronic voltage standards based on temperature-regulated Zener Diodes. Of the fifteen instruments studied fourteen were found to have statistically significant temperature coefficients for the 1.018 V outputs with respect to ambient temperature: values range from -39/spl times/10/sup -9///spl deg/C to 41/spl times/10/sup -9///spl deg/C. For the 10 V outputs, ten of the fifteen have statistically significant temperature coefficients ranging from -15/spl times/10/sup -9///spl deg/C to 16/spl times/10/sup -9///spl deg/C. By applying small corrections for temperature dependence, based on coefficients describing the change in output voltage as a function of the resistance of the internal thermistor, errors in calibrating and comparing these standards can be reduced.
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low frequency spectral analysis of dc nanovoltmeters and voltage reference standards
Conference on Precision Electromagnetic Measurements, 1997Co-Authors: T J WittAbstract:Low-frequency spectral analysis was carried out with a personal computer. The method was used to determine the bandwidths of dc nanovoltmeters and provide clear interpretations of the filter and statistical functions in these instruments. Once characterized, nanovoltmeters were used to study the noise characteristics of standard cells and Zener-Diode reference standards. The spectra led to the discovery of a temperature dependence in the output voltage of some Zener standards.
Tadashi Suetsugu - One of the best experts on this subject based on the ideXlab platform.
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voltage clamped class e amplifier with Zener Diode
IEEE Transactions on Circuits and Systems I-regular Papers, 2003Co-Authors: Tadashi Suetsugu, Marian K KazimierczukAbstract:A class-E amplifier with a clamped switch peak voltage by a Zener Diode is proposed and experimented. The effect of the Zener Diode on the switch voltage waveform, output power, and efficiency are examined. The experimental verification is presented using a prototype circuit.
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voltage clamped class e amplifier with a Zener Diode across the choke coil
International Symposium on Circuits and Systems, 2002Co-Authors: Tadashi Suetsugu, Marian K KazimierczukAbstract:A class E amplifier with a clamped switch peak voltage with a Zener Diode across the choke inductor is proposed and analyzed. Power loss in the Zener Diode is reduced to 2/3 of that in the amplifier with a Zener Diode across the switch. The effect of the Zener Diode on the switch voltage waveform, output power, and efficiency are examined and experimentally verified.
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voltage clamped class e amplifier with a Zener Diode across the switch
International Symposium on Circuits and Systems, 2002Co-Authors: Tadashi Suetsugu, Marian K KazimierczukAbstract:The class E amplifier with a clamped switch peak voltage using a Zener Diode is proposed and analyzed A higher output power is obtained when the maximum switch voltage is clamped. Design equations are derived for the output power and power losses. The effect of the Zener Diode on the switch voltage waveform, output power, and efficiency are examined. The experimental verification is presented using a prototype circuit.
