The Experts below are selected from a list of 455991 Experts worldwide ranked by ideXlab platform
Gabriel M Rebeiz - One of the best experts on this subject based on the ideXlab platform.
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a 2 15 ghz accurate built in Self Test system for wideband phased arrays using Self correcting eight state i q mixers
IEEE Transactions on Microwave Theory and Techniques, 2016Co-Authors: Tumay Kanar, Samet Zihir, Gabriel M RebeizAbstract:A Built-in-Self-Test (BIST) system for wideband phase arrays channels is presented. The BIST is implemented using an on-chip in-phase/quadrature ( $I/Q$ ) receiver with an integrated ring oscillator that provides both the channel Test signal and the mixer local oscillator (LO). The BIST achieves wideband accuracy for relative phase and gain measurements at 2–15 GHz with a one-time Self-correction algorithm with eight LO phases. The sequential algorithm determines the $I/Q$ errors, such as dc offset, gain and phase imbalances from the $I/Q$ outputs resulting from different LO phase states. An rms power detector network is also implemented for absolute gain measurements. The BIST can operate at rates >1 MHz (less than 1- $\mu \text{s}$ sampling time) with signal-to-noise ratio greater than 50 dB and provides measurements that agree well with the vector network analyzer S-parameter data over a wide frequency range. To the best of our knowledge, this is the first implementation of high accuracy wideband BIST system for phased-array channels.
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a 76 84 ghz 16 element phased array receiver with a chip level built in Self Test system
IEEE Transactions on Microwave Theory and Techniques, 2013Co-Authors: Sang Young Kim, Ozgur Inac, Choulyoung Kim, Donghyup Shin, Gabriel M RebeizAbstract:This paper presents a 16-element phased-array receiver for 76-84-GHz applications with Built-in Self-Test (BIST) capabilities. The chip contains an in-phase/quadrature (I/Q) mixer suitable for automotive frequency-modulation continuous-wave radar applications, which is also used as part of the BIST system. The chip achieves 4-bit RF amplitude and phase control, an RF to IF gain of 30-35 dB at 77-84 GHz, I/Q balance of and at 76-84 GHz, and a system noise figure of 18 dB. The on-chip BIST covers the 76-84-GHz range and determines, without any calibration, the amplitude and phase of each channel, a normalized frequency response, and can measure the gain control using RF gain control. System-level considerations are discussed together with extensive results showing the effectiveness of the on-chip BIST as compared with standard S-parameter measurements.
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a 76 84 ghz 16 element phased array receiver with a chip level built in Self Test system
Radio Frequency Integrated Circuits Symposium, 2012Co-Authors: Sang Young Kim, Ozgur Inac, Choulyoung Kim, Gabriel M RebeizAbstract:A 16-element phased array receiver with Built-in-Self Test (BIST) is demonstrated at 76–84 GHz. The BIST technique employs a miniature capacitive coupler located at the input port of each phased-array channel, and uses the receiver I/Q down-converter to measure the amplitude and phase of each channel. This allows for measuring the response of individual channels if one channel is turned on at a time, and an on-chip array factor if several channels are turned on and the phase between them is varied. BIST measurements done at 76–84 GHz agree very well with S-parameter measurements with a matched load and an open circuit load at each port, and show that this technique can be used to greatly lower the Testing cost and improve the Self-calibration of mm-wave phased-array RFICs.
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a phased array rfic with built in Self Test capabilities
IEEE Transactions on Microwave Theory and Techniques, 2012Co-Authors: Ozgur Inac, Donghyup Shin, Gabriel M RebeizAbstract:An X-Band phased-array RF integrated circuit with Built-in Self-Test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Systematic effects introduced with BIST system are covered in detail and are calibrated out of measurements. The BIST can be done at a rate of 1 MHz with 55 dB signal-to-noise-ratio and allows for the measurement of an on-chip array factor. Measurements done with BIST system agree well with S-parameter data over all Test conditions. To our knowledge, this is the first implementation of an on-chip BIST with high accuracy.
G W Roberts - One of the best experts on this subject based on the ideXlab platform.
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on chip analog signal generation for mixed signal built in Self Test
IEEE Journal of Solid-state Circuits, 1999Co-Authors: Benoit Dufort, G W RobertsAbstract:A new method for generating analog signals with very low complexity and hardware requirements has recently been introduced. It consists of periodically reproducing short optimized bitstreams recorded from the output of a sigma-delta modulator. In this paper, various types of signals generated using the bitstream approach are discussed. Two different silicon implementations are presented, and their performance is analyzed through experimental results. Various ways in which the generators can be used are also demonstrated. Emphasis is placed on the simplicity of the design process and its compact implementation, which are crucial considerations when implementing a Built-in Self-Test strategy.
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reliable analog bandpass signal generation
International Symposium on Circuits and Systems, 1998Co-Authors: Benoit R Veillette, G W RobertsAbstract:A novel method for generating bandpass type signals is introduced. A phase function is turned into a jittery bandpass signal using a delta-sigma modulator and digital phase modulation. This signal can be used to verify the correct operation of a charge-pump phase-locked loop. After validation of this circuit, more complex communication signals such as GMSK may be generated for Test purposes. As all components are digital or may be Tested digitally, this scheme is amenable to Built-in Self-Test.
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a built in Self Test strategy for wireless communication systems
International Test Conference, 1995Co-Authors: Benoit R Veillette, G W RobertsAbstract:Wireless communication is a rapidly expanding field and considerable research effort is underway. Electronic system manufacturers are actively trying to incorporate all of the RF, IF and baseband functions on the fewest possible ICs so as to reduce system size and cost, and to improve overall system performance. Unfortunately, without a coherent Test strategy, any cost reduction gained by miniaturization will be offset by increased Testing costs. In this work we propose a Built-in Self-Test scheme for bandpass type systems such as those used in wireless communication devices. The scheme is centered around a high frequency oscillator based on bandpass delta-sigma modulation techniques and a digital extraction method. We will show through experiments that measures meaningful to the analog Test engineer such as signal-to-noise ratio, frequency response and intermodulation distortion are obtainable with this method.
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analog signal generation for built in Self Test of mixed signal integrated circuits
1995Co-Authors: G W Roberts, Albert K LuAbstract:Preface. 1. Introduction. 2. An Oversampling-Based Analog Oscillator. 3. Analog Multi-Tone Signal Generation. 4. An Oversampling-Based Function Generator. 5. Conclusion. A: Delta-Sigma Modulation. B: VHDL Description: Single-Tone Oscillator. C: Verilog Description: Single-Tone Oscillator. D: HSPICE Reconstruction Program. References. Index.
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an analog multi tone signal generator for built in Self Test applications
International Test Conference, 1994Co-Authors: Albert K Lu, G W RobertsAbstract:This paper presents the design of an analog oscillator capable of generating multi-tone signals by encoding the information in an oversampled delta-sigma modulated bit-stream. With the exception of an imprecise lowpass filter, the proposed design is completely digital allowing accurate control of the amplitude, frequency, and phase of all sinusoids making up the multi-tone signal. Simulations and FPGA experiments performed to date have verified the performance of the proposed design which is envisioned to open new directions in the mixed analog/digital Testing field.
Ozgur Inac - One of the best experts on this subject based on the ideXlab platform.
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a 76 84 ghz 16 element phased array receiver with a chip level built in Self Test system
IEEE Transactions on Microwave Theory and Techniques, 2013Co-Authors: Sang Young Kim, Ozgur Inac, Choulyoung Kim, Donghyup Shin, Gabriel M RebeizAbstract:This paper presents a 16-element phased-array receiver for 76-84-GHz applications with Built-in Self-Test (BIST) capabilities. The chip contains an in-phase/quadrature (I/Q) mixer suitable for automotive frequency-modulation continuous-wave radar applications, which is also used as part of the BIST system. The chip achieves 4-bit RF amplitude and phase control, an RF to IF gain of 30-35 dB at 77-84 GHz, I/Q balance of and at 76-84 GHz, and a system noise figure of 18 dB. The on-chip BIST covers the 76-84-GHz range and determines, without any calibration, the amplitude and phase of each channel, a normalized frequency response, and can measure the gain control using RF gain control. System-level considerations are discussed together with extensive results showing the effectiveness of the on-chip BIST as compared with standard S-parameter measurements.
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a 76 84 ghz 16 element phased array receiver with a chip level built in Self Test system
Radio Frequency Integrated Circuits Symposium, 2012Co-Authors: Sang Young Kim, Ozgur Inac, Choulyoung Kim, Gabriel M RebeizAbstract:A 16-element phased array receiver with Built-in-Self Test (BIST) is demonstrated at 76–84 GHz. The BIST technique employs a miniature capacitive coupler located at the input port of each phased-array channel, and uses the receiver I/Q down-converter to measure the amplitude and phase of each channel. This allows for measuring the response of individual channels if one channel is turned on at a time, and an on-chip array factor if several channels are turned on and the phase between them is varied. BIST measurements done at 76–84 GHz agree very well with S-parameter measurements with a matched load and an open circuit load at each port, and show that this technique can be used to greatly lower the Testing cost and improve the Self-calibration of mm-wave phased-array RFICs.
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a phased array rfic with built in Self Test capabilities
IEEE Transactions on Microwave Theory and Techniques, 2012Co-Authors: Ozgur Inac, Donghyup Shin, Gabriel M RebeizAbstract:An X-Band phased-array RF integrated circuit with Built-in Self-Test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Systematic effects introduced with BIST system are covered in detail and are calibrated out of measurements. The BIST can be done at a rate of 1 MHz with 55 dB signal-to-noise-ratio and allows for the measurement of an on-chip array factor. Measurements done with BIST system agree well with S-parameter data over all Test conditions. To our knowledge, this is the first implementation of an on-chip BIST with high accuracy.
Sang Young Kim - One of the best experts on this subject based on the ideXlab platform.
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a 76 84 ghz 16 element phased array receiver with a chip level built in Self Test system
IEEE Transactions on Microwave Theory and Techniques, 2013Co-Authors: Sang Young Kim, Ozgur Inac, Choulyoung Kim, Donghyup Shin, Gabriel M RebeizAbstract:This paper presents a 16-element phased-array receiver for 76-84-GHz applications with Built-in Self-Test (BIST) capabilities. The chip contains an in-phase/quadrature (I/Q) mixer suitable for automotive frequency-modulation continuous-wave radar applications, which is also used as part of the BIST system. The chip achieves 4-bit RF amplitude and phase control, an RF to IF gain of 30-35 dB at 77-84 GHz, I/Q balance of and at 76-84 GHz, and a system noise figure of 18 dB. The on-chip BIST covers the 76-84-GHz range and determines, without any calibration, the amplitude and phase of each channel, a normalized frequency response, and can measure the gain control using RF gain control. System-level considerations are discussed together with extensive results showing the effectiveness of the on-chip BIST as compared with standard S-parameter measurements.
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a 76 84 ghz 16 element phased array receiver with a chip level built in Self Test system
Radio Frequency Integrated Circuits Symposium, 2012Co-Authors: Sang Young Kim, Ozgur Inac, Choulyoung Kim, Gabriel M RebeizAbstract:A 16-element phased array receiver with Built-in-Self Test (BIST) is demonstrated at 76–84 GHz. The BIST technique employs a miniature capacitive coupler located at the input port of each phased-array channel, and uses the receiver I/Q down-converter to measure the amplitude and phase of each channel. This allows for measuring the response of individual channels if one channel is turned on at a time, and an on-chip array factor if several channels are turned on and the phase between them is varied. BIST measurements done at 76–84 GHz agree very well with S-parameter measurements with a matched load and an open circuit load at each port, and show that this technique can be used to greatly lower the Testing cost and improve the Self-calibration of mm-wave phased-array RFICs.
Donghyup Shin - One of the best experts on this subject based on the ideXlab platform.
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a 76 84 ghz 16 element phased array receiver with a chip level built in Self Test system
IEEE Transactions on Microwave Theory and Techniques, 2013Co-Authors: Sang Young Kim, Ozgur Inac, Choulyoung Kim, Donghyup Shin, Gabriel M RebeizAbstract:This paper presents a 16-element phased-array receiver for 76-84-GHz applications with Built-in Self-Test (BIST) capabilities. The chip contains an in-phase/quadrature (I/Q) mixer suitable for automotive frequency-modulation continuous-wave radar applications, which is also used as part of the BIST system. The chip achieves 4-bit RF amplitude and phase control, an RF to IF gain of 30-35 dB at 77-84 GHz, I/Q balance of and at 76-84 GHz, and a system noise figure of 18 dB. The on-chip BIST covers the 76-84-GHz range and determines, without any calibration, the amplitude and phase of each channel, a normalized frequency response, and can measure the gain control using RF gain control. System-level considerations are discussed together with extensive results showing the effectiveness of the on-chip BIST as compared with standard S-parameter measurements.
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a phased array rfic with built in Self Test capabilities
IEEE Transactions on Microwave Theory and Techniques, 2012Co-Authors: Ozgur Inac, Donghyup Shin, Gabriel M RebeizAbstract:An X-Band phased-array RF integrated circuit with Built-in Self-Test (BIST) capabilities is presented. The BIST is accomplished using a miniature capacitive coupler at the input of each channel and an on-chip I/Q vector receiver. Systematic effects introduced with BIST system are covered in detail and are calibrated out of measurements. The BIST can be done at a rate of 1 MHz with 55 dB signal-to-noise-ratio and allows for the measurement of an on-chip array factor. Measurements done with BIST system agree well with S-parameter data over all Test conditions. To our knowledge, this is the first implementation of an on-chip BIST with high accuracy.
