The Experts below are selected from a list of 16437 Experts worldwide ranked by ideXlab platform
Dylan F Williams - One of the best experts on this subject based on the ideXlab platform.
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A method for improving high-insertion-loss measurements with a Vector Network Analyzer
2017 89th ARFTG Microwave Measurement Conference (ARFTG), 2017Co-Authors: Jeffrey A. Jargon, Dylan F WilliamsAbstract:We present a method for improving high-insertion-loss measurements with a calibrated Vector Network Analyzer (VNA) requiring only two additional pieces of hardware. By utilizing an amplifier and an attenuator, and measuring wave-parameters rather than scattering-parameters, we are able to increase the dynamic range of our measurements while decreasing uncertainties due to the noise floor of the VNA. We compare the results of our technique to standard methods for insertion-loss values up to 110 dB.
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500 ghz 750 ghz rectangular waveguide Vector Network Analyzer calibrations
IEEE Transactions on Terahertz Science and Technology, 2011Co-Authors: Dylan F WilliamsAbstract:We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art WM-380 (WR 1.5) rectangular-waveguide Vector-Network-Analyzer measurements over the frequency range 500-750 GHz. We use the analysis to assess thru-reflect-line, thru-short-match, and thru-short-radiating-open calibrations. The comparison shows that thru-short-match and thru-short-radiating-open calibrations outperform thru-reflect-line calibrations, and that this is true even when multiple lines and optimal averaging are used to improve the thru-reflect-line calibrations.
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rectangular waveguide Vector Network Analyzer calibrations with imperfect test ports
ARFTG Microwave Measurement Conference, 2010Co-Authors: Dylan F WilliamsAbstract:We present a strategy for correcting for imperfect interfaces between the test ports of a Vector Network Analyzer, the calibration standards and the devices under test. This corrects for the inconsistencies in calibrations introduced by use of flush thrus and flat shorts as calibration standards. The approach is based on equivalent standard definitions that are easy to implement in conventional Network Analyzers. We present analytic formulas for these definitions and demonstrate them in WR-90 rectangular waveguide.
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covariance based Vector Network Analyzer uncertainty analysis for time and frequency domain measurements
IEEE Transactions on Microwave Theory and Techniques, 2010Co-Authors: Arkadiusz Lewandowski, Dylan F Williams, Paul D Hale, Jack C M Wang, Andrew DienstfreyAbstract:We develop a covariance-matrix-based uncertainty analysis for Vector-Network-Analyzer (VNA) scattering-parameter measurements. The covariance matrix not only captures all of the measurement uncertainties of the scattering-parameter measurements, but also the statistical correlations between them. This allows the uncertainties of VNA scattering-parameter measurements to be propagated into the uncertainties of other quantities derived from scattering parameters, including temporal waveforms and circuit model parameters.
Jochen Schröder - One of the best experts on this subject based on the ideXlab platform.
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Reconfigurable SDM optical Vector Network Analyzer
OFC 2014, 2014Co-Authors: Joel Carpenter, Benjamin J. Eggleton, Jochen SchröderAbstract:We present a spatially-diverse optical Vector Network Analyzer which is capable of measuring some or all of the mode transfer matrix of a system in an arbitrary mode basis using single or multiple sweeps.
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OFC - Reconfigurable SDM Optical Vector Network Analyzer
Optical Fiber Communication Conference, 2014Co-Authors: Joel Carpenter, Benjamin J. Eggleton, Jochen SchröderAbstract:We present a spatially-diverse optical Vector Network Analyzer which is capable of measuring some or all of the mode transfer matrix of a system in an arbitrary mode basis using single or multiple sweeps.
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reconfigurable spatially diverse optical Vector Network Analyzer
Optics Express, 2014Co-Authors: Joel Carpenter, Benjamin J. Eggleton, Jochen SchröderAbstract:We present a spatially-diverse optical Vector Network Analyzer which is capable of measuring the partial or complete mode transfer matrix of a system as a function of wavelength in an arbitrary mode basis using single or multiple sweeps.
Arkadiusz Lewandowski - One of the best experts on this subject based on the ideXlab platform.
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Wideband extraction of soil dielectric spectrum from Vector-Network-Analyzer measurements
2017 IEEE MTT-S International Microwave Workshop Series on Advanced Materials and Processes for RF and THz Applications (IMWS-AMP), 2017Co-Authors: Arkadiusz Lewandowski, Agnieszka Szyplowska, Marcin Kafarski, Andrzej Wilczek, Justyna Szerement, Pawel Barmuta, Wojciech SkieruchaAbstract:We present a methodology for soil relative-dielectric-permittivity characterization in the 0.001-3 GHz frequency range. Our approach relies on a Vector-Network-Analyzer scatteringparameter measurement of a soil sample placed into a 1 5/8” coaxial transmission line. In order to calibrate the Vector-Network-Analyzer we use a new calibration technique which combines the multiline through-reflect-line and through-reflect-match schemes, and therefore overcomes the inherent low-frequency limitation of the multiline through-reflect-line approach. We determine the relative dielectric permittivity from sample scattering-parameters by use of a new multi-frequency extraction algorithm which overcomes the low-frequency inaccuracies of non-iterative approaches. Experimental results for soil samples with different moisture content and salinity confirm the validity of our methodology.
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Electronic calibration unit for DC-8 GHz Vector-Network-Analyzer measurements
2016 21st International Conference on Microwave Radar and Wireless Communications (MIKON), 2016Co-Authors: Michał Abramowicz, Arkadiusz LewandowskiAbstract:We present design and realization of a Vector-Network-Analyzer (VNA) electronic-calibration unit operating from DC to 8 GHz. Calibration standards are implemented on a printed circuit board and are connected to the VNA ports through a set of micro-electro-mechanical-system (MEMS) switches. We verify our unit by comparing corrected measurements of verification items obtained after calibrating the VNA with our electronic unit and with mechanical devices. The results show a very good agreement.
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Offset-short Vector-Network-Analyzer calibration with simultaneous modeling of calibration standards
84th ARFTG Microwave Measurement Conference, 2014Co-Authors: Arkadiusz Lewandowski, Wojciech Wiatr, Paweł BarmutaAbstract:We present an improved offset-short Vector-Network-Analyzer calibration method which allows to identify broadband equivalent-circuit models of the offset-short standards and an imperfect thru connection. Our approach is based on the multi-frequency formulation of the Vector-Network-Analyzer calibration problem in which parameters of the models are identified simultaneously with the Vector-Network-Analyzer calibration coefficients at all frequencies. Thus, the impact of the constraints imposed by the models is also reflected in the calibration coefficients. We illustrate our approach with experimental results for an offset-short calibration in coaxial 3.5 mm connector. These results demonstrate that our method reduces the impact of measurement errors, and extends the bandwidth of the calibration.
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Calibration of a 220–325 GHz Vector-Network-Analyzer with multiple rectangular-waveguide sections
18-th INTERNATIONAL CONFERENCE ON MICROWAVES RADAR AND WIRELESS COMMUNICATIONS, 2010Co-Authors: Arkadiusz Lewandowski, Wojciech WiatrAbstract:We study the performance of the multiline through-reflect-line method in the calibration of a 220-325 GHz Vector-Network-Analyzer with WR-03 rectangular-waveguide test-ports. The calibration method is based on multiple uniform-waveguide sections with unknown propagation constant and different lengths, a reflect standard which is assumed to be identical on both Vector-Network-Analyzer ports but otherwise unknown, and a direct thru connection of the test ports. Experimental verification demonstrates that the multiline through-reflect-line technique yields repeatable and physically meaningful results.
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covariance based Vector Network Analyzer uncertainty analysis for time and frequency domain measurements
IEEE Transactions on Microwave Theory and Techniques, 2010Co-Authors: Arkadiusz Lewandowski, Dylan F Williams, Paul D Hale, Jack C M Wang, Andrew DienstfreyAbstract:We develop a covariance-matrix-based uncertainty analysis for Vector-Network-Analyzer (VNA) scattering-parameter measurements. The covariance matrix not only captures all of the measurement uncertainties of the scattering-parameter measurements, but also the statistical correlations between them. This allows the uncertainties of VNA scattering-parameter measurements to be propagated into the uncertainties of other quantities derived from scattering parameters, including temporal waveforms and circuit model parameters.
Joel Carpenter - One of the best experts on this subject based on the ideXlab platform.
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Reconfigurable SDM optical Vector Network Analyzer
OFC 2014, 2014Co-Authors: Joel Carpenter, Benjamin J. Eggleton, Jochen SchröderAbstract:We present a spatially-diverse optical Vector Network Analyzer which is capable of measuring some or all of the mode transfer matrix of a system in an arbitrary mode basis using single or multiple sweeps.
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OFC - Reconfigurable SDM Optical Vector Network Analyzer
Optical Fiber Communication Conference, 2014Co-Authors: Joel Carpenter, Benjamin J. Eggleton, Jochen SchröderAbstract:We present a spatially-diverse optical Vector Network Analyzer which is capable of measuring some or all of the mode transfer matrix of a system in an arbitrary mode basis using single or multiple sweeps.
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reconfigurable spatially diverse optical Vector Network Analyzer
Optics Express, 2014Co-Authors: Joel Carpenter, Benjamin J. Eggleton, Jochen SchröderAbstract:We present a spatially-diverse optical Vector Network Analyzer which is capable of measuring the partial or complete mode transfer matrix of a system as a function of wavelength in an arbitrary mode basis using single or multiple sweeps.
Z. Skvor - One of the best experts on this subject based on the ideXlab platform.
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Seven State PTP for Vector Network Analyzer
2005Co-Authors: V. Zavodny, K. Hoffmann, Z. SkvorAbstract:A new, seven-state switched perturbation two- port (PTP) for Vector reflection measurement based on scalar measurement only was designed and realized in microstrip structure using PIN diodes. The structure was experimentally tested by means of Vector measurements of different impedances in frequency band with relative bandwidth of 2.5 octaves. Good agreement with data ob- tained using a precise Vector Network Analyzer was achieved. The new calibration method for the PTP was designed and tested on real measured data.
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7 state PTP for Vector Network Analyzer
65th ARFTG Conference Digest 2005. Spring 2005, 2005Co-Authors: V. Zavodny, K. Hoffmann, Z. SkvorAbstract:A new, 7 state switched perturbation two-port (PTP) for Vector measurement based on scalar measurement only was designed and realized in microstrip structure using PIN diodes. The structure was experimentally tested by means of Vector measurements of different impedances in frequency band with relative bandwidth of 2.5 octave. Good agreement with data obtained using a precise Vector Network Analyzer was achieved.
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A now concept of PTP Vector Network Analyzer
64th ARFTG Microwave Measurements Conference Fall 2004., 2004Co-Authors: V. Zavodny, K. Hoffmann, Z. SkvorAbstract:A new concept for Vector Network Analyzers design based on a perturbation two-port (PTP) is presented. The approach uses redundant states of the PTP. The best states of the PTP for a certain place in Smith chart and frequency are chosen to determine a reflection coefficient with minimum uncertainty. Four criteria for the selection are designed. The criteria were tested on measured parameters of different states of the PTP. Significant improvements in PTP bandwidth and uncertainty of measured data were achieved. Summary Six-port Vector Network Analyzers (VNA) are well known for decades, [1]. Similar concept using only a scalar Network Analyzer and a PTP was designed in [2], where only a basic principle was designed and experimentally verified using a PTP with properties far from optimum. No recommendations for the structure of the PTP were given. Some suggestions for an optimum three state PTP can be found in [3], yet the states of the PTP are unpractical for a realization and are suitable only in a narrow frequency bandwidth. The main demand in the PTP design is to realize optimum states valid on the whole Smith chart in wide frequency band. These demands can be hardly satisfied with any minimum 3-states PTP. The solution is a new concept of the PTP Vector Network Analyzer based on redundant multi-state PTP. It releases the demands on PTP so that they must be satisfied only in a part of Smith chart. The concept can be summarized into three key steps. • over-determination of measured data using more than three minimum states of the PTP • approximate determination of measured reflection coefficient in Smith chart using proper three PTP states • state the measured reflection coefficient more precisely applying the best PTP states determined in given frequency in corresponding part of Smith chart by proper test criteria The purpose of this paper is to present proper criteria for the PTP state selection and a new circuit solution for individual states of the 7-state PTP. Theory A typical arrangement of the new PTP Vector Network Analyzer with seven switched PTP states is presented in Fig.1. P m 1 PTP 7 PTP 2 PTP 1
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A novel Vector Network Analyzer
1998 IEEE MTT-S International Microwave Symposium Digest (Cat. No.98CH36192), 1998Co-Authors: K. Hoffmann, Z. SkvorAbstract:A calibration procedure for perturbation two-port Vector Network Analyzer is presented. It consists of a variable perturbation two-port placed between a device under test and a scalar Network Analyzer. A measured Vector reflection coefficient is determined on the basis of amplitude only readings. A full correction of systematic errors is possible. The new principle was experimentally confirmed in the frequency band up to 14 GHz.
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Calibration of the PTP Vector Network Analyzer
12th International Conference on Microwaves and Radar. MIKON-98. Conference Proceedings (IEEE Cat. No.98EX195), 1998Co-Authors: K. Hoffmann, Z. SkvorAbstract:A calibration procedure for perturbation two-port Vector Network Analyzer (PTP VNA) is presented. PTP VNA consists of a variable perturbation two-port (PTP) placed between a device under test (DUT) and a scalar Network Analyzer (SNA). A Vector reflection coefficient of the DUT is determined on the basis of amplitude only measurements. A full correction of SNA systematic errors is possible. In principle it may be used up to millimetre and submillimetre frequency bands.
