The Experts below are selected from a list of 300 Experts worldwide ranked by ideXlab platform

Robert Van Engelen - One of the best experts on this subject based on the ideXlab platform.

  • experiences with tracking the effects of changing requirements on morphbank a web based bioinformatics application
    ACM Southeast Regional Conference, 2007
    Co-Authors: Subhajit Datta, Robert Van Engelen, David Gaitros, Neelima Jammigumpula
    Abstract:

    In this paper, we present a case study of applying the metrics Mutation Index, Component Set, Dependency Index [1] on Morphbank- a web based bioinformatics application - to track the effects of changing requirements on a software system and suggest design modifications to mitigate such impact. Morphbank is "an open web repository of biological images documenting specimen-based research in comparative anatomy, morphological phylogenetics, taxonomy and related fields focused on increasing our knowledge about biodiversity" [2]. This paper discusses the context of the case study, analyzes the results, highlights observations and learning, and mentions directions of future work.

  • effects of changing requirements a tracking mechanism for the analysis workflow
    ACM Symposium on Applied Computing, 2006
    Co-Authors: Subhajit Datta, Robert Van Engelen
    Abstract:

    Managing the effects of changing requirements remains one of the greatest challenges of enterprise software development. The iterative and incremental model provides an expedient framework for addressing such concerns. This paper presents a Set of metrics - Mutation Index, Component Set, Dependency Index - and a methodology to measure the effects of requirement changes in the analysis workflow from one iteration to another. Results from a sample case study are included to highlight a usage scenario. Future directions of our work based on this mechanism are also discussed.

  • SAC - Effects of changing requirements: a tracking mechanism for the analysis workflow
    Proceedings of the 2006 ACM symposium on Applied computing - SAC '06, 2006
    Co-Authors: Subhajit Datta, Robert Van Engelen
    Abstract:

    Managing the effects of changing requirements remains one of the greatest challenges of enterprise software development. The iterative and incremental model provides an expedient framework for addressing such concerns. This paper presents a Set of metrics - Mutation Index, Component Set, Dependency Index - and a methodology to measure the effects of requirement changes in the analysis workflow from one iteration to another. Results from a sample case study are included to highlight a usage scenario. Future directions of our work based on this mechanism are also discussed.

Subhajit Datta - One of the best experts on this subject based on the ideXlab platform.

  • experiences with tracking the effects of changing requirements on morphbank a web based bioinformatics application
    ACM Southeast Regional Conference, 2007
    Co-Authors: Subhajit Datta, Robert Van Engelen, David Gaitros, Neelima Jammigumpula
    Abstract:

    In this paper, we present a case study of applying the metrics Mutation Index, Component Set, Dependency Index [1] on Morphbank- a web based bioinformatics application - to track the effects of changing requirements on a software system and suggest design modifications to mitigate such impact. Morphbank is "an open web repository of biological images documenting specimen-based research in comparative anatomy, morphological phylogenetics, taxonomy and related fields focused on increasing our knowledge about biodiversity" [2]. This paper discusses the context of the case study, analyzes the results, highlights observations and learning, and mentions directions of future work.

  • effects of changing requirements a tracking mechanism for the analysis workflow
    ACM Symposium on Applied Computing, 2006
    Co-Authors: Subhajit Datta, Robert Van Engelen
    Abstract:

    Managing the effects of changing requirements remains one of the greatest challenges of enterprise software development. The iterative and incremental model provides an expedient framework for addressing such concerns. This paper presents a Set of metrics - Mutation Index, Component Set, Dependency Index - and a methodology to measure the effects of requirement changes in the analysis workflow from one iteration to another. Results from a sample case study are included to highlight a usage scenario. Future directions of our work based on this mechanism are also discussed.

  • SAC - Effects of changing requirements: a tracking mechanism for the analysis workflow
    Proceedings of the 2006 ACM symposium on Applied computing - SAC '06, 2006
    Co-Authors: Subhajit Datta, Robert Van Engelen
    Abstract:

    Managing the effects of changing requirements remains one of the greatest challenges of enterprise software development. The iterative and incremental model provides an expedient framework for addressing such concerns. This paper presents a Set of metrics - Mutation Index, Component Set, Dependency Index - and a methodology to measure the effects of requirement changes in the analysis workflow from one iteration to another. Results from a sample case study are included to highlight a usage scenario. Future directions of our work based on this mechanism are also discussed.

John Zukowski - One of the best experts on this subject based on the ideXlab platform.

  • John Zukowski’s Definitive Guide to Swing for Java 2
    2013
    Co-Authors: John Zukowski
    Abstract:

    From the Publisher: In this book, John Zukowski, bestselling author of the definitive "Java AWT Reference, " turns his attention to the Swing Component Set. Combination tutorial and reference, this groundbreaking book is the first to be based on the released version of The Swing Component Set. Serious Java programmers will need a comprehensive reference and will find it in this book.

  • Event Handling with the Swing Component Set
    John Zukowski’s Definitive Guide to Swing for Java 2, 1999
    Co-Authors: John Zukowski
    Abstract:

    in chapter 1, you were provided with a brief overview of everything that’s covered in this book. In this chapter, we start to look at the details of one specific part of that “everything”: event handling. When working with the Swing Component Set, you have the option of continuing to use the delegation-based event-handling mechanism introduced with JDK 1.1 and JavaBeans. In addition, the Swing Component Set offers several additional ways to respond to userinitiated actions (as well as to programmatic events). In this chapter, we’ll explore all these event-handling response mechanisms.

  • Advanced Swing Containers
    John Zukowski’s Definitive Guide to Swing for Java 2, 1999
    Co-Authors: John Zukowski
    Abstract:

    chapter 10 explored the layout managers available within the Swing Component Set. In this chapter, we’ll look at some of the containers that rely on these layout managers, and others that work without a layout manager.

  • Basic Text Components
    John Zukowski’s Definitive Guide to Swing for Java 2, 1999
    Co-Authors: John Zukowski
    Abstract:

    Chapter 13 explored the data selection controls within the Swing Component Set. In this chapter, we’ll look at the basic capabilities of the Swing text Components. (The more-advanced text Component capabilities are covered in Chapter 15.)

  • Swing Layout Managers
    John Zukowski’s Definitive Guide to Swing for Java 2, 1999
    Co-Authors: John Zukowski
    Abstract:

    in chapter 9, you learned about the various pop-up and chooser classes available from the Swing Component Set. In this chapter, you’ll learn about the four Swing layout managers: BoxLayout and OverlayLayout, which are implementations of LayoutManager2, and ScrollPaneLayout and ViewportLayout, which are implementations of LayoutManager.

Jishun Kuang - One of the best experts on this subject based on the ideXlab platform.

  • HPCC/SmartCity/DSS - A Pseudo-Random Transform Decomposition Method for Improving the Coding Compression Ratio of Test Data
    2019 IEEE 21st International Conference on High Performance Computing and Communications; IEEE 17th International Conference on Smart City; IEEE 5th I, 2019
    Co-Authors: Minghe Zhang, Jishun Kuang, Jing Huang
    Abstract:

    To improve the coding compression ratio of test data, this paper proposes a pseudo-random transform decomposition method for preprocessing test data. The method decomposes the test Set (composed of test data) into a primary Component Set (PCS) and a residual Component Set (RCS) by a pseudo-random transform, and they are the same size as the decomposed test Set. The RCS is easier to encode and store in the automatic test equipment than the original test Set, while the PCS is compressed using on-chip linear feedback shift register coding. Experimental results show that the total average compression ratio using code-based schemes can be improved by 13.34%, and the average compression ratio of variable length input Huffman coding is as high as 78.08%. During testing, the on-chip test pattern generator that restores the original test patterns of the test Set has the characteristics of a simple structure and affordable hardware overhead.

  • A Pseudo-Random Transform Decomposition Method for Improving the Coding Compression Ratio of Test Data
    2019 IEEE 21st International Conference on High Performance Computing and Communications; IEEE 17th International Conference on Smart City; IEEE 5th I, 2019
    Co-Authors: Minghe Zhang, Jishun Kuang, Jing Huang
    Abstract:

    To improve the coding compression ratio of test data, this paper proposes a pseudo-random transform decomposition method for preprocessing test data. The method decomposes the test Set (composed of test data) into a primary Component Set (PCS) and a residual Component Set (RCS) by a pseudo-random transform, and they are the same size as the decomposed test Set. The RCS is easier to encode and store in the automatic test equipment than the original test Set, while the PCS is compressed using on-chip linear feedback shift register coding. Experimental results show that the total average compression ratio using code-based schemes can be improved by 13.34%, and the average compression ratio of variable length input Huffman coding is as high as 78.08%. During testing, the on-chip test pattern generator that restores the original test patterns of the test Set has the characteristics of a simple structure and affordable hardware overhead.

  • Improve the compression ratios for code-based test vector compressions by decomposing
    2015 20th IEEE European Test Symposium (ETS), 2015
    Co-Authors: Jishun Kuang, Liang Zhang, Yingbo Zhou
    Abstract:

    Code-based test vector compressions are the most capable of testing current SOCs consisted of a large number of IP cores because they do not need the structure information of the cores. However, the compression ratios of this kind of compression approaches are often lower than that of other compression methods, such as linear-decompression-based schemes and broadcast-scan-based schemes. In this paper, we propose a novel method that can greatly improve the compression ratios for code-based test vector compression techniques with affordable overheads. The method decomposes an original test Set to a prominent Component Set and a residue Set using Hadamard transform. The prominent Component Set can be generated easily by an additional on-chip TPG, whereas the residue Set can be compressed efficiently. When testing is conducted, the compressed residue is transmitted from the tester to the CUT and decompressed by a decompressor. At the same time, the prominent Component Set is produced by the on-chip TPG, and then composed with the residue to restore the original test Set that is at last applied to the CUT. The experimental results for seven different code-based methods on some largest ISCAS'89 circuits show that the total average compression ratio rises from 60.76% to 77.74%. The compression ratio will be further improved to 85.39% if a fault simulation tool can be used. Primary results on some ITC'99 circuitries are also provided.

  • ETS - Improve the compression ratios for code-based test vector compressions by decomposing
    2015 20th IEEE European Test Symposium (ETS), 2015
    Co-Authors: Jishun Kuang, Liang Zhang, Yingbo Zhou
    Abstract:

    Code-based test vector compressions are the most capable of testing current SOCs consisted of a large number of IP cores because they do not need the structure information of the cores. However, the compression ratios of this kind of compression approaches are often lower than that of other compression methods, such as linear-decompression-based schemes and broadcast-scan-based schemes. In this paper, we propose a novel method that can greatly improve the compression ratios for code-based test vector compression techniques with affordable overheads. The method decomposes an original test Set to a prominent Component Set and a residue Set using Hadamard transform. The prominent Component Set can be generated easily by an additional on-chip TPG, whereas the residue Set can be compressed efficiently. When testing is conducted, the compressed residue is transmitted from the tester to the CUT and decompressed by a decompressor. At the same time, the prominent Component Set is produced by the on-chip TPG, and then composed with the residue to restore the original test Set that is at last applied to the CUT. The experimental results for seven different code-based methods on some largest ISCAS'89 circuits show that the total average compression ratio rises from 60.76% to 77.74%. The compression ratio will be further improved to 85.39% if a fault simulation tool can be used. Primary results on some ITC'99 circuitries are also provided.

Yingbo Zhou - One of the best experts on this subject based on the ideXlab platform.

  • Improve the compression ratios for code-based test vector compressions by decomposing
    2015 20th IEEE European Test Symposium (ETS), 2015
    Co-Authors: Jishun Kuang, Liang Zhang, Yingbo Zhou
    Abstract:

    Code-based test vector compressions are the most capable of testing current SOCs consisted of a large number of IP cores because they do not need the structure information of the cores. However, the compression ratios of this kind of compression approaches are often lower than that of other compression methods, such as linear-decompression-based schemes and broadcast-scan-based schemes. In this paper, we propose a novel method that can greatly improve the compression ratios for code-based test vector compression techniques with affordable overheads. The method decomposes an original test Set to a prominent Component Set and a residue Set using Hadamard transform. The prominent Component Set can be generated easily by an additional on-chip TPG, whereas the residue Set can be compressed efficiently. When testing is conducted, the compressed residue is transmitted from the tester to the CUT and decompressed by a decompressor. At the same time, the prominent Component Set is produced by the on-chip TPG, and then composed with the residue to restore the original test Set that is at last applied to the CUT. The experimental results for seven different code-based methods on some largest ISCAS'89 circuits show that the total average compression ratio rises from 60.76% to 77.74%. The compression ratio will be further improved to 85.39% if a fault simulation tool can be used. Primary results on some ITC'99 circuitries are also provided.

  • ETS - Improve the compression ratios for code-based test vector compressions by decomposing
    2015 20th IEEE European Test Symposium (ETS), 2015
    Co-Authors: Jishun Kuang, Liang Zhang, Yingbo Zhou
    Abstract:

    Code-based test vector compressions are the most capable of testing current SOCs consisted of a large number of IP cores because they do not need the structure information of the cores. However, the compression ratios of this kind of compression approaches are often lower than that of other compression methods, such as linear-decompression-based schemes and broadcast-scan-based schemes. In this paper, we propose a novel method that can greatly improve the compression ratios for code-based test vector compression techniques with affordable overheads. The method decomposes an original test Set to a prominent Component Set and a residue Set using Hadamard transform. The prominent Component Set can be generated easily by an additional on-chip TPG, whereas the residue Set can be compressed efficiently. When testing is conducted, the compressed residue is transmitted from the tester to the CUT and decompressed by a decompressor. At the same time, the prominent Component Set is produced by the on-chip TPG, and then composed with the residue to restore the original test Set that is at last applied to the CUT. The experimental results for seven different code-based methods on some largest ISCAS'89 circuits show that the total average compression ratio rises from 60.76% to 77.74%. The compression ratio will be further improved to 85.39% if a fault simulation tool can be used. Primary results on some ITC'99 circuitries are also provided.