Damping Factor

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The Experts below are selected from a list of 297 Experts worldwide ranked by ideXlab platform

Yuanzhang Sun - One of the best experts on this subject based on the ideXlab platform.

Ming-dou Ker - One of the best experts on this subject based on the ideXlab platform.

  • Transient-Induced Latchup Dependence on Power-Pin Damping Frequency and Damping Factor in CMOS Integrated Circuits
    IEEE Transactions on Electron Devices, 2007
    Co-Authors: Sheng-fu Hsu, Ming-dou Ker
    Abstract:

    The bipolar (underdamped sinusoidal) transient noise on power pins of CMOS integrated circuits (ICs) can trigger latchup in CMOS ICs under system-level electrostatic-discharge test. Two dominant parameters of bipolar transient noise-Damping frequency and Damping Factor-strongly depend on system shielding, board-level noise filter, chip-/board-level layout, etc. The transient-induced-latchup (TLU) dependence on power-pin Damping frequency and Damping Factor was characterized by device simulation and verified by experimental measurement. From the simulation results, bipolar-trigger waveforms with Damping frequencies of several tens of megahertz can trigger the TLU most easily. However, TLU is less sensitive to the bipolar-trigger waveforms with an excessively large Damping Factor or an excessively low/high Damping frequency. The simulation results have been experimentally verified with the silicon-controlled-rectifier (SCR) test structures that are fabricated in a 0.25-mum CMOS technology.

  • Dependences of Damping frequency and Damping Factor of bi-polar trigger waveforms on transient-induced latchup
    2005
    Co-Authors: Sheng-fu Hsu, Ming-dou Ker
    Abstract:

    The dependences of Damping frequency and Damping Factor of bi-polar trigger waveforms on transient-induced latchup (TLU) were characterized by device simulation and verified by experimental measurement. From the simulation results, the bi-polar trigger waveform with Damping frequency of several tens of megahertz can trigger on TLU most easily. But, TLU is less sensitive to bi-polar trigger waveforms with an excessively large Damping Factor, an excessively high Damping frequency, or an excessively low Damping frequency. The simulation results have been experimentally verified with the silicon controlled rectifier (SCR) test structures fabricated in a 0.25-mum CMOS technology.

Bo Yang - One of the best experts on this subject based on the ideXlab platform.

Boris Murmann - One of the best experts on this subject based on the ideXlab platform.

  • the design of fast settling three stage amplifiers using the open loop Damping Factor as a design parameter
    IEEE Transactions on Circuits and Systems I-regular Papers, 2010
    Co-Authors: Ray Nguyen, Boris Murmann
    Abstract:

    This paper presents an open-loop design method for fast-settling three-stage class-A amplifiers. Specifically, using the open-loop Damping Factor as a design parameter, the presented method delivers robust settling performance of a third-order system in the presence of process and component variation. As an illustration of the proposed approach, we show Spice simulation results of a nested-Miller-compensated three-stage-amplifier designed in 0.35-μm CMOS technology. The design achieves a 1% and 0.1% dynamic-error settling times of 6.4 ns and 13.7 ns, respectively, at a gain-bandwidth product of 55 MHz and a dynamic range of 80 dB, while consuming 5.4 mW from a 3-V supply.

Sheng-fu Hsu - One of the best experts on this subject based on the ideXlab platform.

  • Transient-Induced Latchup Dependence on Power-Pin Damping Frequency and Damping Factor in CMOS Integrated Circuits
    IEEE Transactions on Electron Devices, 2007
    Co-Authors: Sheng-fu Hsu, Ming-dou Ker
    Abstract:

    The bipolar (underdamped sinusoidal) transient noise on power pins of CMOS integrated circuits (ICs) can trigger latchup in CMOS ICs under system-level electrostatic-discharge test. Two dominant parameters of bipolar transient noise-Damping frequency and Damping Factor-strongly depend on system shielding, board-level noise filter, chip-/board-level layout, etc. The transient-induced-latchup (TLU) dependence on power-pin Damping frequency and Damping Factor was characterized by device simulation and verified by experimental measurement. From the simulation results, bipolar-trigger waveforms with Damping frequencies of several tens of megahertz can trigger the TLU most easily. However, TLU is less sensitive to the bipolar-trigger waveforms with an excessively large Damping Factor or an excessively low/high Damping frequency. The simulation results have been experimentally verified with the silicon-controlled-rectifier (SCR) test structures that are fabricated in a 0.25-mum CMOS technology.

  • Dependences of Damping frequency and Damping Factor of bi-polar trigger waveforms on transient-induced latchup
    2005
    Co-Authors: Sheng-fu Hsu, Ming-dou Ker
    Abstract:

    The dependences of Damping frequency and Damping Factor of bi-polar trigger waveforms on transient-induced latchup (TLU) were characterized by device simulation and verified by experimental measurement. From the simulation results, the bi-polar trigger waveform with Damping frequency of several tens of megahertz can trigger on TLU most easily. But, TLU is less sensitive to bi-polar trigger waveforms with an excessively large Damping Factor, an excessively high Damping frequency, or an excessively low Damping frequency. The simulation results have been experimentally verified with the silicon controlled rectifier (SCR) test structures fabricated in a 0.25-mum CMOS technology.