Gain-Bandwidth Product

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J C Campbell - One of the best experts on this subject based on the ideXlab platform.

Joe C. Campbell - One of the best experts on this subject based on the ideXlab platform.

  • Recent advances in telecommunications avalanche photodiodes
    Journal of Lightwave Technology, 2007
    Co-Authors: Joe C. Campbell
    Abstract:

    For high-bit-rate long-haul fiber optic communications, the avalanche photodiode (APD) is frequently the photodetector of choice owing to its internal gain, which provides a sensitivity margin relative to PIN photodiodes. APDs can achieve 5-10-dB better sensitivity than PINs, provided that the multiplication noise is low and the Gain-Bandwidth Product is sufficiently high. In the past decade, the performance of APDs for optical fiber communication systems has improved as a result of improvements in materials and the development of advanced device structures. This paper presents a brief review of APD fundamentals and describes some of the significant advances

  • Resonant-cavity InGaAs-InAlAs avalanche photodiodes with Gain-Bandwidth Product of 290 GHz
    IEEE Photonics Technology Letters, 1999
    Co-Authors: C. Lenox, H. Nie, Ping Yuan, Geoffrey S. Kinsey, Ben G. Streetman, A.l. Homles, Joe C. Campbell
    Abstract:

    We demonstrated a high-speed, resonant-cavity InGaAs-InAlAs separate absorption, charge, and multiplication avalanche photodiode (APD) operating at a wavelength of 1.55 /spl mu/m. Due to the resonant-cavity scheme, these APDs exhibit high external quantum efficiency (/spl sim/70%) and a high unity-gain bandwidth of 24 GHz. Utilizing the excellent noise characteristics of a thin InAlAs multiplication region (k/spl sim/0.18), we have also achieved a Gain-Bandwidth Product of 290 GHz. These bandwidth results are believed to be the highest reported values for APDs operating at 1.55 /spl mu/m.

  • Resonant-cavity separate absorption, charge and multiplication avalanche photodiodes with high-speed and high Gain-Bandwidth Product
    IEEE Photonics Technology Letters, 1998
    Co-Authors: H. Nie, K.a. Anselm, C. Lenox, Ping Yuan, Geoffrey S. Kinsey, Ben G. Streetman, Joe C. Campbell
    Abstract:

    Previously, it has been shown that resonant-cavity separate-absorption-and-multiplication (SAM) avalanche photodiodes (APD's) exhibit high-speed and high Gain-Bandwidth Products. In this letter, we describe a resonant-cavity SAM APD with an additional charge layer that provides better control of the electric field profile. These devices have achieved bandwidths as high as 33 GHz in the low-gain regime and a record Gain-Bandwidth Product of 290 GHz. We also describe the correlation between the Gain-Bandwidth Product and the doping level in the charge layer. With width dependent ionization coefficients, the current versus voltage (I-V) and Gain-Bandwidth simulations agree well with the measured results and indicate that even higher Gain-Bandwidth should be achievable with an optimized SACM APD structure.

Ning Duan - One of the best experts on this subject based on the ideXlab platform.

F C Hong - One of the best experts on this subject based on the ideXlab platform.

Ben G. Streetman - One of the best experts on this subject based on the ideXlab platform.

  • Resonant-cavity InGaAs-InAlAs avalanche photodiodes with Gain-Bandwidth Product of 290 GHz
    IEEE Photonics Technology Letters, 1999
    Co-Authors: C. Lenox, H. Nie, Ping Yuan, Geoffrey S. Kinsey, Ben G. Streetman, A.l. Homles, Joe C. Campbell
    Abstract:

    We demonstrated a high-speed, resonant-cavity InGaAs-InAlAs separate absorption, charge, and multiplication avalanche photodiode (APD) operating at a wavelength of 1.55 /spl mu/m. Due to the resonant-cavity scheme, these APDs exhibit high external quantum efficiency (/spl sim/70%) and a high unity-gain bandwidth of 24 GHz. Utilizing the excellent noise characteristics of a thin InAlAs multiplication region (k/spl sim/0.18), we have also achieved a Gain-Bandwidth Product of 290 GHz. These bandwidth results are believed to be the highest reported values for APDs operating at 1.55 /spl mu/m.

  • Resonant-cavity separate absorption, charge and multiplication avalanche photodiodes with high-speed and high Gain-Bandwidth Product
    IEEE Photonics Technology Letters, 1998
    Co-Authors: H. Nie, K.a. Anselm, C. Lenox, Ping Yuan, Geoffrey S. Kinsey, Ben G. Streetman, Joe C. Campbell
    Abstract:

    Previously, it has been shown that resonant-cavity separate-absorption-and-multiplication (SAM) avalanche photodiodes (APD's) exhibit high-speed and high Gain-Bandwidth Products. In this letter, we describe a resonant-cavity SAM APD with an additional charge layer that provides better control of the electric field profile. These devices have achieved bandwidths as high as 33 GHz in the low-gain regime and a record Gain-Bandwidth Product of 290 GHz. We also describe the correlation between the Gain-Bandwidth Product and the doping level in the charge layer. With width dependent ionization coefficients, the current versus voltage (I-V) and Gain-Bandwidth simulations agree well with the measured results and indicate that even higher Gain-Bandwidth should be achievable with an optimized SACM APD structure.

  • high speed resonant cavity separate absorption and multiplication avalanche photodiodes with 130 ghz gain bandwidth Product
    Applied Physics Letters, 1997
    Co-Authors: H. Nie, K.a. Anselm, Ben G. Streetman, S S Murtaza, J C Campbell
    Abstract:

    Previously it has been shown that resonant-cavity, separate absorption and multiplication (SAM) avalanche photodiodes (APDs) exhibit high peak external quantum efficiency (∼75%), low dark current, low bias voltage (<15 V), and low multiplication noise (0.2Gain-Bandwidth Product of 130 GHz have been achieved.

  • noise characteristics of thin multiplication region gaas avalanche photodiodes
    Applied Physics Letters, 1996
    Co-Authors: K.a. Anselm, Ben G. Streetman, J C Campbell
    Abstract:

    It is well known that the gain‐bandwidth Product of an avalanche photodiode can be increased by utilizing a thin multiplication region. Previously, measurements of the excess noise factor of InP/InGaAsP/InGaAs avalanche photodiodes with separate absorption and multiplication regions indicated that this approach could also be employed to reduce the multiplication noise. This letter presents a systematic study of the noise characteristics of GaAs homojunction avalanche photodiodes with different multiplication layer thicknesses. It is demonstrated that there is a definite ‘‘size effect’’ for multiplication regions less than approximately 0.5 μm. A good fit to the experimental data has been achieved using a discrete, nonlocalized model for the impact ionization process.