The Experts below are selected from a list of 198 Experts worldwide ranked by ideXlab platform
Hirofumi Yamada - One of the best experts on this subject based on the ideXlab platform.
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twin probe atomic force microscopy with optical beam Deflection using vertically incident lasers by two beam splitter
Electronics and Communications in Japan, 2016Co-Authors: Kei Kobayashi, Kazumi Matsushige, Nobuo Satoh, Eika Tsunemi, Takashi Komatsubara, Seiji Higuchi, Hirofumi YamadaAbstract:We developed a twin-probe atomic force microscopy AFM system using Si cantilever-probes. The system utilizes the optical beam Deflection Method in order to detect the Deflection of each cantilever-probe mounted on each tube-type actuator. The cantilever-probes mounted on each actuator are able to realize independent control of the probe positions, which are attached to manual sliders. A sensitivity 90 fm/Hz or less is achieved for the displacement sensor activity for the two cantilever-probes. We succeeded in the simultaneous observation of a topographic image in the state in which they approached each other to within 40 µm.
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development of multi environment dual probe atomic force microscopy system using optical beam Deflection sensors with vertically incident laser beams
Review of Scientific Instruments, 2013Co-Authors: Eika Tsunemi, Kei Kobayashi, Kazumi Matsushige, Noriaki Oyabu, Masaharu Hirose, Yoshiko Takenaka, Hirofumi YamadaAbstract:We developed a dual-probe atomic force microscopy (DP-AFM) system with two cantilever probes that can be operated in various environments such as in air, vacuum, and liquid. The system employs the optical beam Deflection Method for measuring the Deflection of each cantilever mounted on a probe scanner. The cantilever probes mounted on the probe scanners are attached to inertia sliders, which allow independent control of the probe positions. We constructed three types of probe scanners (tube, shear-piezo, and tripod types) and characterized their performance. We demonstrated AFM imaging in ambient air, vacuum, and ultrapure water, and also performed electrical measurement and pick-up manipulation of a Au nanorod using the DP-AFM system.
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frequency modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam Deflection Method
Review of Scientific Instruments, 2005Co-Authors: Takeshi Fukuma, Kenjiro Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi YamadaAbstract:We have developed a frequency-modulation atomic force microscope (FM-AFM) with a wideband cantilever Deflection sensor using the heterodyne optical beam Deflection Method. The Method enhances the bandwidth of the Deflection measurement up to the maximum frequency for the laser power modulation, which can be as high as gigahertz order. The phase and frequency of the cantilever vibration at 5.24MHz are detected with a Deflection noise density of 100fm∕Hz. FM-AFM imaging is performed on a Au(111) surface with a high-frequency cantilever.
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dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam Deflection Method
Applied Physics Letters, 2004Co-Authors: Takeshi Fukuma, Kenjiro Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi YamadaAbstract:We have developed a dynamic force microscope (DFM) with a wideband cantilever Deflection sensor using heterodyne optical beam Deflection (HOBD) Method. The bandwidth of HOBD Method is limited only by the maximum frequency for laser power modulation, which can be as high as gigahertz order. This technique allows us to use high cantilever resonance frequencies for improving the sensitivity and time response of DFM. In this letter, basic principle and experimental setup of HOBD Method are described. Deflection measurement of a cantilever vibration at about 7MHz is demonstrated. Using this cantilever, DFM imaging with a relatively fast scanning speed is performed.
Takeshi Fukuma - One of the best experts on this subject based on the ideXlab platform.
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development of liquid environment frequency modulation atomic force microscope with low noise Deflection sensor for cantilevers of various dimensions
Review of Scientific Instruments, 2006Co-Authors: Takeshi Fukuma, Suzanne P JarvisAbstract:We have developed a liquid-environment frequency modulation atomic force microscope (FM-AFM) with a low noise Deflection sensor for a wide range of cantilevers with different dimensions. A simple yet accurate equation describing the theoretical limit of the optical beam Deflection Method in air and liquid is presented. Based on the equation, we have designed a low noise Deflection sensor. Replaceable microscope objective lenses are utilized for providing a high magnification optical view (resolution: <3μm) as well as for focusing a laser beam (laser spot size: ∼10μm). Even for a broad range of cantilevers with lengths from 35to125μm, the sensor provides Deflection noise densities of less than 11fm∕Hz in air and 16fm∕Hz in water. In particular, a cantilever with a length of 50μm gives the minimum Deflection noise density of 5.7fm∕Hz in air and 7.3fm∕Hz in water. True atomic resolution of the developed FM-AFM is demonstrated by imaging mica in water.
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frequency modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam Deflection Method
Review of Scientific Instruments, 2005Co-Authors: Takeshi Fukuma, Kenjiro Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi YamadaAbstract:We have developed a frequency-modulation atomic force microscope (FM-AFM) with a wideband cantilever Deflection sensor using the heterodyne optical beam Deflection Method. The Method enhances the bandwidth of the Deflection measurement up to the maximum frequency for the laser power modulation, which can be as high as gigahertz order. The phase and frequency of the cantilever vibration at 5.24MHz are detected with a Deflection noise density of 100fm∕Hz. FM-AFM imaging is performed on a Au(111) surface with a high-frequency cantilever.
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dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam Deflection Method
Applied Physics Letters, 2004Co-Authors: Takeshi Fukuma, Kenjiro Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi YamadaAbstract:We have developed a dynamic force microscope (DFM) with a wideband cantilever Deflection sensor using heterodyne optical beam Deflection (HOBD) Method. The bandwidth of HOBD Method is limited only by the maximum frequency for laser power modulation, which can be as high as gigahertz order. This technique allows us to use high cantilever resonance frequencies for improving the sensitivity and time response of DFM. In this letter, basic principle and experimental setup of HOBD Method are described. Deflection measurement of a cantilever vibration at about 7MHz is demonstrated. Using this cantilever, DFM imaging with a relatively fast scanning speed is performed.
Kazumi Matsushige - One of the best experts on this subject based on the ideXlab platform.
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twin probe atomic force microscopy with optical beam Deflection using vertically incident lasers by two beam splitter
Electronics and Communications in Japan, 2016Co-Authors: Kei Kobayashi, Kazumi Matsushige, Nobuo Satoh, Eika Tsunemi, Takashi Komatsubara, Seiji Higuchi, Hirofumi YamadaAbstract:We developed a twin-probe atomic force microscopy AFM system using Si cantilever-probes. The system utilizes the optical beam Deflection Method in order to detect the Deflection of each cantilever-probe mounted on each tube-type actuator. The cantilever-probes mounted on each actuator are able to realize independent control of the probe positions, which are attached to manual sliders. A sensitivity 90 fm/Hz or less is achieved for the displacement sensor activity for the two cantilever-probes. We succeeded in the simultaneous observation of a topographic image in the state in which they approached each other to within 40 µm.
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development of multi environment dual probe atomic force microscopy system using optical beam Deflection sensors with vertically incident laser beams
Review of Scientific Instruments, 2013Co-Authors: Eika Tsunemi, Kei Kobayashi, Kazumi Matsushige, Noriaki Oyabu, Masaharu Hirose, Yoshiko Takenaka, Hirofumi YamadaAbstract:We developed a dual-probe atomic force microscopy (DP-AFM) system with two cantilever probes that can be operated in various environments such as in air, vacuum, and liquid. The system employs the optical beam Deflection Method for measuring the Deflection of each cantilever mounted on a probe scanner. The cantilever probes mounted on the probe scanners are attached to inertia sliders, which allow independent control of the probe positions. We constructed three types of probe scanners (tube, shear-piezo, and tripod types) and characterized their performance. We demonstrated AFM imaging in ambient air, vacuum, and ultrapure water, and also performed electrical measurement and pick-up manipulation of a Au nanorod using the DP-AFM system.
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frequency modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam Deflection Method
Review of Scientific Instruments, 2005Co-Authors: Takeshi Fukuma, Kenjiro Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi YamadaAbstract:We have developed a frequency-modulation atomic force microscope (FM-AFM) with a wideband cantilever Deflection sensor using the heterodyne optical beam Deflection Method. The Method enhances the bandwidth of the Deflection measurement up to the maximum frequency for the laser power modulation, which can be as high as gigahertz order. The phase and frequency of the cantilever vibration at 5.24MHz are detected with a Deflection noise density of 100fm∕Hz. FM-AFM imaging is performed on a Au(111) surface with a high-frequency cantilever.
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dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam Deflection Method
Applied Physics Letters, 2004Co-Authors: Takeshi Fukuma, Kenjiro Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi YamadaAbstract:We have developed a dynamic force microscope (DFM) with a wideband cantilever Deflection sensor using heterodyne optical beam Deflection (HOBD) Method. The bandwidth of HOBD Method is limited only by the maximum frequency for laser power modulation, which can be as high as gigahertz order. This technique allows us to use high cantilever resonance frequencies for improving the sensitivity and time response of DFM. In this letter, basic principle and experimental setup of HOBD Method are described. Deflection measurement of a cantilever vibration at about 7MHz is demonstrated. Using this cantilever, DFM imaging with a relatively fast scanning speed is performed.
Kei Kobayashi - One of the best experts on this subject based on the ideXlab platform.
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twin probe atomic force microscopy with optical beam Deflection using vertically incident lasers by two beam splitter
Electronics and Communications in Japan, 2016Co-Authors: Kei Kobayashi, Kazumi Matsushige, Nobuo Satoh, Eika Tsunemi, Takashi Komatsubara, Seiji Higuchi, Hirofumi YamadaAbstract:We developed a twin-probe atomic force microscopy AFM system using Si cantilever-probes. The system utilizes the optical beam Deflection Method in order to detect the Deflection of each cantilever-probe mounted on each tube-type actuator. The cantilever-probes mounted on each actuator are able to realize independent control of the probe positions, which are attached to manual sliders. A sensitivity 90 fm/Hz or less is achieved for the displacement sensor activity for the two cantilever-probes. We succeeded in the simultaneous observation of a topographic image in the state in which they approached each other to within 40 µm.
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development of multi environment dual probe atomic force microscopy system using optical beam Deflection sensors with vertically incident laser beams
Review of Scientific Instruments, 2013Co-Authors: Eika Tsunemi, Kei Kobayashi, Kazumi Matsushige, Noriaki Oyabu, Masaharu Hirose, Yoshiko Takenaka, Hirofumi YamadaAbstract:We developed a dual-probe atomic force microscopy (DP-AFM) system with two cantilever probes that can be operated in various environments such as in air, vacuum, and liquid. The system employs the optical beam Deflection Method for measuring the Deflection of each cantilever mounted on a probe scanner. The cantilever probes mounted on the probe scanners are attached to inertia sliders, which allow independent control of the probe positions. We constructed three types of probe scanners (tube, shear-piezo, and tripod types) and characterized their performance. We demonstrated AFM imaging in ambient air, vacuum, and ultrapure water, and also performed electrical measurement and pick-up manipulation of a Au nanorod using the DP-AFM system.
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frequency modulation atomic force microscopy at high cantilever resonance frequencies using the heterodyne optical beam Deflection Method
Review of Scientific Instruments, 2005Co-Authors: Takeshi Fukuma, Kenjiro Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi YamadaAbstract:We have developed a frequency-modulation atomic force microscope (FM-AFM) with a wideband cantilever Deflection sensor using the heterodyne optical beam Deflection Method. The Method enhances the bandwidth of the Deflection measurement up to the maximum frequency for the laser power modulation, which can be as high as gigahertz order. The phase and frequency of the cantilever vibration at 5.24MHz are detected with a Deflection noise density of 100fm∕Hz. FM-AFM imaging is performed on a Au(111) surface with a high-frequency cantilever.
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dynamic force microscopy at high cantilever resonance frequencies using heterodyne optical beam Deflection Method
Applied Physics Letters, 2004Co-Authors: Takeshi Fukuma, Kenjiro Kimura, Kei Kobayashi, Kazumi Matsushige, Hirofumi YamadaAbstract:We have developed a dynamic force microscope (DFM) with a wideband cantilever Deflection sensor using heterodyne optical beam Deflection (HOBD) Method. The bandwidth of HOBD Method is limited only by the maximum frequency for laser power modulation, which can be as high as gigahertz order. This technique allows us to use high cantilever resonance frequencies for improving the sensitivity and time response of DFM. In this letter, basic principle and experimental setup of HOBD Method are described. Deflection measurement of a cantilever vibration at about 7MHz is demonstrated. Using this cantilever, DFM imaging with a relatively fast scanning speed is performed.
Jan Greve - One of the best experts on this subject based on the ideXlab platform.
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a detailed analysis of the optical beam Deflection technique for use in atomic force microscopy
Journal of Applied Physics, 1992Co-Authors: Constant A J Putman, Bart G De Grooth, Niek F Van Hulst, Jan GreveAbstract:A Michelson interferometer and an optical beam Deflection configuration (both shot noise and diffraction limited) are compared for application in an atomic force microscope. The comparison shows that the optical beam Deflection Method and the interferometer have essentially the same sensitivity. This remarkable result is explained by indicating the physical equivalence of both Methods. Furthermore, various configurations using optical beam Deflection are discussed. All the setups are capable of detecting the cantilever displacements with atomic resolution in a 10 kHz bandwidth.