The Experts below are selected from a list of 221457 Experts worldwide ranked by ideXlab platform
Zhongping Chen - One of the best experts on this subject based on the ideXlab platform.
-
improved lateral resolution in optical coherence tomography by digital focusing using two dimensional numerical Diffraction Method
Optics Express, 2007Co-Authors: Lingfeng Yu, Jun Zhang, Jianping Su, Qiang Wang, Zhongping ChenAbstract:This paper proposes a non-iterative, two-dimensional numerical Method to alleviate the compromise between the lateral resolution and wide depth measurement range in optical coherence tomography (OCT). A two-dimensional scalar Diffraction model was developed to simulate the wave propagation process from out-of-focus scatterers within the short coherence gate of the OCT system. High-resolution details can be recovered from outside the depth-of-field region with minimum loss of lateral resolution. Experiments were performed to demonstrate the effectiveness of the proposed Method.
-
improved lateral resolution in optical coherence tomography by digital focusing using two dimensional numerical Diffraction Method
Optics Express, 2007Co-Authors: Bin Rao, Jun Zhang, Qiang Wang, Shuguang Guo, Zhongping ChenAbstract:This paper proposes a non-iterative, two-dimensional numerical Method to eliminate the compromise between the lateral resolution and wide depth measurement range in optical coherence tomography (OCT). A two-dimensional scalar Diffraction model was developed to simulate the wave propagation process from out-of-focus scatters within the short coherence gate of the OCT system. High-resolution details can be recovered from outside of the depth-of-focus region with minimum loss of lateral resolution. Experiments were performed to demonstrate the effectiveness of the proposed Method.
Qiang Wang - One of the best experts on this subject based on the ideXlab platform.
-
improved lateral resolution in optical coherence tomography by digital focusing using two dimensional numerical Diffraction Method
Optics Express, 2007Co-Authors: Lingfeng Yu, Jun Zhang, Jianping Su, Qiang Wang, Zhongping ChenAbstract:This paper proposes a non-iterative, two-dimensional numerical Method to alleviate the compromise between the lateral resolution and wide depth measurement range in optical coherence tomography (OCT). A two-dimensional scalar Diffraction model was developed to simulate the wave propagation process from out-of-focus scatterers within the short coherence gate of the OCT system. High-resolution details can be recovered from outside the depth-of-field region with minimum loss of lateral resolution. Experiments were performed to demonstrate the effectiveness of the proposed Method.
-
improved lateral resolution in optical coherence tomography by digital focusing using two dimensional numerical Diffraction Method
Optics Express, 2007Co-Authors: Bin Rao, Jun Zhang, Qiang Wang, Shuguang Guo, Zhongping ChenAbstract:This paper proposes a non-iterative, two-dimensional numerical Method to eliminate the compromise between the lateral resolution and wide depth measurement range in optical coherence tomography (OCT). A two-dimensional scalar Diffraction model was developed to simulate the wave propagation process from out-of-focus scatters within the short coherence gate of the OCT system. High-resolution details can be recovered from outside of the depth-of-focus region with minimum loss of lateral resolution. Experiments were performed to demonstrate the effectiveness of the proposed Method.
Jun Zhang - One of the best experts on this subject based on the ideXlab platform.
-
improved lateral resolution in optical coherence tomography by digital focusing using two dimensional numerical Diffraction Method
Optics Express, 2007Co-Authors: Lingfeng Yu, Jun Zhang, Jianping Su, Qiang Wang, Zhongping ChenAbstract:This paper proposes a non-iterative, two-dimensional numerical Method to alleviate the compromise between the lateral resolution and wide depth measurement range in optical coherence tomography (OCT). A two-dimensional scalar Diffraction model was developed to simulate the wave propagation process from out-of-focus scatterers within the short coherence gate of the OCT system. High-resolution details can be recovered from outside the depth-of-field region with minimum loss of lateral resolution. Experiments were performed to demonstrate the effectiveness of the proposed Method.
-
improved lateral resolution in optical coherence tomography by digital focusing using two dimensional numerical Diffraction Method
Optics Express, 2007Co-Authors: Bin Rao, Jun Zhang, Qiang Wang, Shuguang Guo, Zhongping ChenAbstract:This paper proposes a non-iterative, two-dimensional numerical Method to eliminate the compromise between the lateral resolution and wide depth measurement range in optical coherence tomography (OCT). A two-dimensional scalar Diffraction model was developed to simulate the wave propagation process from out-of-focus scatters within the short coherence gate of the OCT system. High-resolution details can be recovered from outside of the depth-of-focus region with minimum loss of lateral resolution. Experiments were performed to demonstrate the effectiveness of the proposed Method.
Haruyuki Inui - One of the best experts on this subject based on the ideXlab platform.
-
Structural
2015Co-Authors: Haruyuki Inui, Akihiro Fujii, Katsushi Tanaka, Hiroki Sakamoto, Acta Crystallographica Section B, Akihiro A Fujii, Katsushi Tanaka B Hiroki, Kazuo IshizukacAbstract:New electron Diffraction Method to identify the chirality of enantiomorphic crystal
-
Enantiomorph identification of crystals belonging to the point groups of 622 and 6 by convergent-beam electron Diffraction Method
Intermetallics, 2007Co-Authors: Akihiro Fujii, Katsushi Tanaka, Hiroki Sakamoto, Satoshi Fujio, Haruyuki InuiAbstract:Abstract A CBED Method proposed by the present authors for chiral identification of enantiomorphic crystals has been successfully applied to crystals with the point groups of 622 and 6. The intensity asymmetry of ZOLZ and/or FOLZ reflections of the Bijvoet pairs is utilized for enantiomorph identification and such intensity asymmetry is noted regardless of beam convergence angle but the extent to which the asymmetry is noted depends on crystal thickness and accelerating voltage. The crystal thickness should be smaller than the extinction distance of relevant reflections that constitute ‘umweganregung’ in multiple scattering, which is responsible for the intensity asymmetry. As a result, the maximum crystal thickness, below which the asymmetric intensity distribution of Bijvoet reflections is evident, increases as the accelerating voltage is increased. When the crystal thickness is small, however, the intensity asymmetry is more pronounced as the accelerating voltage is decreased due to the increased propensity of multiple scattering.
-
New electron Diffraction Method to identify the chirality of enantiomorphic crystals
Acta Crystallographica Section B Structural Science, 2003Co-Authors: Haruyuki Inui, Akihiro Fujii, Katsushi Tanaka, Hiroki Sakamoto, Kazuo IshizukaAbstract:A new CBED (convergent-beam electron Diffraction) Method is proposed for the identification of the chirality of enantiomorphic crystals, in which asymmetry in the intensity of the reflections of Bijvoet pairs in an experimental symmetrical zone-axis CBED pattern is compared with that of a computer-simulated CBED pattern. The intensity difference for reflections of these Bijvoet pairs results from multiple scattering (dynamical nature of electron Diffraction) among relevant Bijvoet pairs of reflections, each pair of which has identical amplitude and different phase angles. Therefore, the crystal thickness where chiral identification is made with the present Method is limited by the extinction distance of Bijvoet pairs of reflections relevant to multiple scattering to produce the intensity asymmetry, which is usually of the order of a few tens of nanometers. With the present Method, a single CBED pattern is sufficient and chiral identification can be made for all the possible enantiomorphic crystals that are allowed to exist in crystallography.
Lingfeng Yu - One of the best experts on this subject based on the ideXlab platform.
-
improved lateral resolution in optical coherence tomography by digital focusing using two dimensional numerical Diffraction Method
Optics Express, 2007Co-Authors: Lingfeng Yu, Jun Zhang, Jianping Su, Qiang Wang, Zhongping ChenAbstract:This paper proposes a non-iterative, two-dimensional numerical Method to alleviate the compromise between the lateral resolution and wide depth measurement range in optical coherence tomography (OCT). A two-dimensional scalar Diffraction model was developed to simulate the wave propagation process from out-of-focus scatterers within the short coherence gate of the OCT system. High-resolution details can be recovered from outside the depth-of-field region with minimum loss of lateral resolution. Experiments were performed to demonstrate the effectiveness of the proposed Method.