The Experts below are selected from a list of 36159 Experts worldwide ranked by ideXlab platform

François Hild - One of the best experts on this subject based on the ideXlab platform.

  • Integrated Digital Image Correlation applied to elastoplastic identification in a biaxial experiment
    Journal of Strain Analysis for Engineering Design, 2016
    Co-Authors: Morgan Bertin, Florent Mathieu, Hugo Leclerc, Stephane Roux, François Hild, Patrick Aimedieu
    Abstract:

    The identification of the parameters of several constitutive laws is performed with the integrated Digital Image Correlation (IDIC) technique in a biaxial experiment for a cruciform specimen made of stainless steel. The sought material parameters are assessed with the contribution of both reaction forces (from load sensors) and displacement fields (measured via Digital Image Correlation). For each constitutive law a global residual quantifying the model error is assessed.

  • Integrated Digital Image Correlation applied to elasto-plastic identification in a biaxial experiment
    Journal of Strain Analysis for Engineering Design, 2016
    Co-Authors: Morgan Bertin, Florent Mathieu, Hugo Leclerc, Stephane Roux, François Hild, Patrick Aimedieu
    Abstract:

    The identification of the parameters of several constitutive laws is performed with the integrated Digital Image Correlation (IDIC) technique in a biaxial experiment for a cruciform specimen made of stainless steel. The sought material parameters are assessed with the contribution of both reaction forces (from load sensors) and displacement fields (measured via Digital Image Correlation). For each constitutive law a global residual quantifying the model error is assessed.

  • Characterization of SEM speckle pattern marking and imaging distortion by Digital Image Correlation
    Measurement Science and Technology, 2014
    Co-Authors: Adrien Guery, Felix Latourte, François Hild, Stephane Roux
    Abstract:

    Surface patterning by e-beam lithography and SEM imaging distortions are studied via Digital Image Correlation. The global distortions from the reference pattern, which has been numerically generated, are first quantified from a Digital Image Correlation procedure between the (virtual) reference pattern and the actual SEM Image both in secondary and backscattered electron imaging modes. These distortions result from both patterning and imaging techniques. These two contributions can be separated (without resorting to an external caliper) based on Images of the same patterned surface acquired at different orientations. Patterning distortions are much smaller than those due to imaging on wide field Images.

  • characterization of sem speckle pattern marking and imaging distortion by Digital Image Correlation
    Measurement Science and Technology, 2014
    Co-Authors: Adrien Guery, Felix Latourte, François Hild, Stephane Roux
    Abstract:

    Surface patterning by e-beam lithography and scanning electron microscope (SEM) imaging distortions are studied via Digital Image Correlation. The global distortions from the reference pattern, which has been numerically generated, are first quantified from a Digital Image Correlation procedure between the (virtual) reference pattern and the actual SEM Image both in secondary and backscattered electron imaging modes. These distortions result from both patterning and imaging techniques. These two contributions can be separated (without resorting to an external caliper) based on the Images of the same patterned surface acquired at different orientations. Patterning distortions are much smaller than those due to imaging on wide field Images.

  • Mechanics-aided Digital Image Correlation
    Journal of Strain Analysis for Engineering Design, 2013
    Co-Authors: Zvonimir Tomičević, François Hild, Stephane Roux
    Abstract:

    By construction Digital Image Correlation is an ill-posed problem. To circumvent this di culty, the regularization is often performed implicitly through the kinematic basis chosen to express the sought displacement fields. Conversely, a priori information on the mechanical behavior of the studied material is often available. It is proposed to evaluate the gain to be expected from such a mechanical assistance, namely, the measured displacement not only satis es as best as possible the gray level conservation, but also mechanical admissibility.

Stephane Roux - One of the best experts on this subject based on the ideXlab platform.

  • Integrated Digital Image Correlation applied to elastoplastic identification in a biaxial experiment
    Journal of Strain Analysis for Engineering Design, 2016
    Co-Authors: Morgan Bertin, Florent Mathieu, Hugo Leclerc, Stephane Roux, François Hild, Patrick Aimedieu
    Abstract:

    The identification of the parameters of several constitutive laws is performed with the integrated Digital Image Correlation (IDIC) technique in a biaxial experiment for a cruciform specimen made of stainless steel. The sought material parameters are assessed with the contribution of both reaction forces (from load sensors) and displacement fields (measured via Digital Image Correlation). For each constitutive law a global residual quantifying the model error is assessed.

  • Integrated Digital Image Correlation applied to elasto-plastic identification in a biaxial experiment
    Journal of Strain Analysis for Engineering Design, 2016
    Co-Authors: Morgan Bertin, Florent Mathieu, Hugo Leclerc, Stephane Roux, François Hild, Patrick Aimedieu
    Abstract:

    The identification of the parameters of several constitutive laws is performed with the integrated Digital Image Correlation (IDIC) technique in a biaxial experiment for a cruciform specimen made of stainless steel. The sought material parameters are assessed with the contribution of both reaction forces (from load sensors) and displacement fields (measured via Digital Image Correlation). For each constitutive law a global residual quantifying the model error is assessed.

  • Characterization of SEM speckle pattern marking and imaging distortion by Digital Image Correlation
    Measurement Science and Technology, 2014
    Co-Authors: Adrien Guery, Felix Latourte, François Hild, Stephane Roux
    Abstract:

    Surface patterning by e-beam lithography and SEM imaging distortions are studied via Digital Image Correlation. The global distortions from the reference pattern, which has been numerically generated, are first quantified from a Digital Image Correlation procedure between the (virtual) reference pattern and the actual SEM Image both in secondary and backscattered electron imaging modes. These distortions result from both patterning and imaging techniques. These two contributions can be separated (without resorting to an external caliper) based on Images of the same patterned surface acquired at different orientations. Patterning distortions are much smaller than those due to imaging on wide field Images.

  • characterization of sem speckle pattern marking and imaging distortion by Digital Image Correlation
    Measurement Science and Technology, 2014
    Co-Authors: Adrien Guery, Felix Latourte, François Hild, Stephane Roux
    Abstract:

    Surface patterning by e-beam lithography and scanning electron microscope (SEM) imaging distortions are studied via Digital Image Correlation. The global distortions from the reference pattern, which has been numerically generated, are first quantified from a Digital Image Correlation procedure between the (virtual) reference pattern and the actual SEM Image both in secondary and backscattered electron imaging modes. These distortions result from both patterning and imaging techniques. These two contributions can be separated (without resorting to an external caliper) based on the Images of the same patterned surface acquired at different orientations. Patterning distortions are much smaller than those due to imaging on wide field Images.

  • Mechanics-aided Digital Image Correlation
    Journal of Strain Analysis for Engineering Design, 2013
    Co-Authors: Zvonimir Tomičević, François Hild, Stephane Roux
    Abstract:

    By construction Digital Image Correlation is an ill-posed problem. To circumvent this di culty, the regularization is often performed implicitly through the kinematic basis chosen to express the sought displacement fields. Conversely, a priori information on the mechanical behavior of the studied material is often available. It is proposed to evaluate the gain to be expected from such a mechanical assistance, namely, the measured displacement not only satis es as best as possible the gray level conservation, but also mechanical admissibility.

Adrien Guery - One of the best experts on this subject based on the ideXlab platform.

  • Characterization of SEM speckle pattern marking and imaging distortion by Digital Image Correlation
    Measurement Science and Technology, 2014
    Co-Authors: Adrien Guery, Felix Latourte, François Hild, Stephane Roux
    Abstract:

    Surface patterning by e-beam lithography and SEM imaging distortions are studied via Digital Image Correlation. The global distortions from the reference pattern, which has been numerically generated, are first quantified from a Digital Image Correlation procedure between the (virtual) reference pattern and the actual SEM Image both in secondary and backscattered electron imaging modes. These distortions result from both patterning and imaging techniques. These two contributions can be separated (without resorting to an external caliper) based on Images of the same patterned surface acquired at different orientations. Patterning distortions are much smaller than those due to imaging on wide field Images.

  • characterization of sem speckle pattern marking and imaging distortion by Digital Image Correlation
    Measurement Science and Technology, 2014
    Co-Authors: Adrien Guery, Felix Latourte, François Hild, Stephane Roux
    Abstract:

    Surface patterning by e-beam lithography and scanning electron microscope (SEM) imaging distortions are studied via Digital Image Correlation. The global distortions from the reference pattern, which has been numerically generated, are first quantified from a Digital Image Correlation procedure between the (virtual) reference pattern and the actual SEM Image both in secondary and backscattered electron imaging modes. These distortions result from both patterning and imaging techniques. These two contributions can be separated (without resorting to an external caliper) based on the Images of the same patterned surface acquired at different orientations. Patterning distortions are much smaller than those due to imaging on wide field Images.

Gilles Besnard - One of the best experts on this subject based on the ideXlab platform.

  • Analysis of Image series through global Digital Image Correlation
    Journal of Strain Analysis for Engineering Design, 2012
    Co-Authors: Gilles Besnard, Hugo Leclerc, Stephane Roux, François Hild, Nicolas Swiergiel
    Abstract:

    Most often, Digital Image Correlation is used to analyse a sequence of Images. Exploitation of an expected temporal regularity in the displacement fields can be used to enhance the performances of a Digital Image Correlation analysis, either in terms of spatial resolution, or in terms of uncertainty. A general theoretical framework is presented, tested on artificial and experimental Image series.

  • A space-time approach in Digital Image Correlation: Movie-DIC
    Optics and Lasers in Engineering, 2011
    Co-Authors: Gilles Besnard, Sandra Guerard, Stephane Roux, François Hild
    Abstract:

    A new method is proposed to estimate arbitrary velocity fields from a time series of Images acquired by a single camera. This approach, here focused on a single spatial plus a time dimension, is specialized to the decomposition of the velocity field over rectangular shaped (finite-element) bilinear shape functions. It is therefore assumed that the velocity field is essentially aligned along one direction. The use of a time sequence over which the velocity is assumed to have a smooth temporal change allows one to use elements whose spatial extension is much smaller than in traditional Digital Image Correlation based on successive Image pairs. This method is first qualified by using synthetic numerical test cases, and then applied to a dynamic tensile test performed on a tantalum specimen. Improvements with respect to classical Digital Image Correlation techniques are observed in terms of spatial resolution.

  • A space–time approach in Digital Image Correlation: Movie-DIC
    Optics and Lasers in Engineering, 2010
    Co-Authors: Gilles Besnard, Sandra Guerard, Stephane Roux, François Hild
    Abstract:

    A new method is proposed to estimate arbitrary velocity fields from a time series of Images acquired by a single camera. This approach, here focused on a single spatial plus a time dimension, is specialized to the decomposition of the velocity field over rectangular shaped (finite-element) bilinear shape functions. It is therefore assumed that the velocity field is essentially aligned along one direction. The use of a time sequence over which the velocity is assumed to have a smooth temporal change allows one to use elements whose spatial extension is much smaller than in traditional Digital Image Correlation based on successive Image pairs. This method is first qualified by using synthetic numerical test cases, and then applied to a dynamic tensile test performed on a tantalum specimen. Improvements with respect to classical Digital Image Correlation techniques are observed in terms of spatial resolution.

  • Experimental investigation of localized phenomena using Digital Image Correlation
    Philosophical Magazine, 2009
    Co-Authors: Julien Réthoré, Guillaume Vivier, Gilles Besnard, François Hild, Stephane Roux
    Abstract:

    The present paper is dedicated to the use of enriched discretization schemes in the context of Digital Image Correlation. The aim is to capture and evaluate strong or weak discontinuities of a displacement field directly from Digital Images. An analysis of different enrichment performances is provided. Two examples of strain localization illustrate the discussion.

Felix Latourte - One of the best experts on this subject based on the ideXlab platform.

  • Characterization of SEM speckle pattern marking and imaging distortion by Digital Image Correlation
    Measurement Science and Technology, 2014
    Co-Authors: Adrien Guery, Felix Latourte, François Hild, Stephane Roux
    Abstract:

    Surface patterning by e-beam lithography and SEM imaging distortions are studied via Digital Image Correlation. The global distortions from the reference pattern, which has been numerically generated, are first quantified from a Digital Image Correlation procedure between the (virtual) reference pattern and the actual SEM Image both in secondary and backscattered electron imaging modes. These distortions result from both patterning and imaging techniques. These two contributions can be separated (without resorting to an external caliper) based on Images of the same patterned surface acquired at different orientations. Patterning distortions are much smaller than those due to imaging on wide field Images.

  • characterization of sem speckle pattern marking and imaging distortion by Digital Image Correlation
    Measurement Science and Technology, 2014
    Co-Authors: Adrien Guery, Felix Latourte, François Hild, Stephane Roux
    Abstract:

    Surface patterning by e-beam lithography and scanning electron microscope (SEM) imaging distortions are studied via Digital Image Correlation. The global distortions from the reference pattern, which has been numerically generated, are first quantified from a Digital Image Correlation procedure between the (virtual) reference pattern and the actual SEM Image both in secondary and backscattered electron imaging modes. These distortions result from both patterning and imaging techniques. These two contributions can be separated (without resorting to an external caliper) based on the Images of the same patterned surface acquired at different orientations. Patterning distortions are much smaller than those due to imaging on wide field Images.