The Experts below are selected from a list of 226290 Experts worldwide ranked by ideXlab platform

Peter D. Nellist - One of the best experts on this subject based on the ideXlab platform.

  • optical sectioning and confocal imaging and analysis in the transmission Electron Microscope
    Annual Review of Materials Research, 2012
    Co-Authors: Peter D. Nellist, Peng Wang
    Abstract:

    Aberration correction in the transmission Electron Microscope has led to a reduction in the depth of focus for imaging. The depth of focus in a state-of-the-art scanning transmission Electron Microscope system, which is currently just a few nanometers, creates an opportunity to explore the three-dimensional structure of a sample by focusing on specific layers, an approach known as optical sectioning. In this article, we review the performance of optical sectioning in the scanning transmission Electron Microscope. Limitations in the simple optical sectioning approach are used to motivate discussion of confocal Electron microscopy. Three imaging modes in scanning confocal Electron microscopy have been investigated both theoretically and experimentally, and are reviewed here. The method of implementing a confocal arrangement in a Microscope is discussed, along with its comparative performance with other methods for three-dimensional imaging and analysis. Finally, current and future potential applications are...

  • nanoscale energy filtered scanning confocal Electron microscopy using a double aberration corrected transmission Electron Microscope
    Physical Review Letters, 2010
    Co-Authors: Peng Wang, G. Behan, Angus I Kirkland, Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, M Shimojo, Peter D. Nellist
    Abstract:

    We demonstrate that a transmission Electron Microscope fitted with two spherical-aberration correctors can be operated as an energy-filtered scanning confocal Electron Microscope. A method for establishing this mode is described and initial results showing 3D chemical mapping with nanoscale sensitivity to height and thickness changes in a carbon film are presented. Importantly, uncorrected chromatic aberration does not limit the depth resolution of this technique and moreover performs an energy-filtering role, which is explained in terms of a combined depth and energy-loss response function.

  • Confocal operation of a transmission Electron Microscope with two aberration correctors
    Applied Physics Letters, 2006
    Co-Authors: Peter D. Nellist, G. Behan, Angus I Kirkland, Christopher J. Hetherington
    Abstract:

    The authors demonstrate that confocal imaging trajectories can be established in a transmission Electron Microscope fitted with two spherical aberration correctors. An atomic-scale Electron beam, focused by aberration-corrected illumination optics, is directly imaged by a second aberration-corrected system. The initial experiment described indicates how aberration-corrected scanning confocal Electron microscopy will allow three-dimensional imaging and analysis of materials with atomic lateral resolution and with a depth resolution of a few nanometers. The depth resolution in the confocal mode is shown to be robust to the uncorrected chromatic aberration of the lenses, unlike depth sectioning using a single lens.

Stephan Uhlemann - One of the best experts on this subject based on the ideXlab platform.

  • advancing the hexapole cs corrector for the scanning transmission Electron Microscope
    Microscopy and Microanalysis, 2006
    Co-Authors: Heiko Muller, Stephan Uhlemann, Peter Hartel, M Haider
    Abstract:

    Aberration correctors using hexapole fields have proven useful to correct for the spherical aberration in Electron microscopy. We investigate the limits of the present design for the hexapole corrector with respect to minimum probe size for the scanning transmission Electron Microscope and discuss several ways in which the design could be improved by rather small and incremental design changes for the next generation of advanced probe-forming systems equipped with a gun monochromator.

  • a spherical aberration corrected 200 kv transmission Electron Microscope
    Ultramicroscopy, 1998
    Co-Authors: Max Haider, Stephan Uhlemann, Harald Rose, Eugen Schwan, B Kabius, Knut Urban
    Abstract:

    Abstract A hexapole corrector system was constructed for compensation of the spherical aberration of the objective lens of a transmission Electron Microscope. Implementing this system on a commercial 200 kV instrument with a field emission gun the spherical aberration correction was demonstrated and an improvement of the point resolution from 0.24 nm to better than 0.14 nm was realized. Applying the new instrument to structure studies on Si/CoSi 2 interfaces it was demonstrated that an outstanding additional advantage of aberration correction is the substantially reduced contrast delocalization in high-resolution images.

  • Residual wave aberrations in the first spherical aberration corrected transmission Electron Microscope
    Ultramicroscopy, 1998
    Co-Authors: Stephan Uhlemann, Maximilian Haider
    Abstract:

    Here we demonstrate the optical properties of a spherical aberration corrected transmission Electron Microscope by means of beam tilt series. The high-resolution capabilities are characterized by the measured residual wave aberrations up to the fifth order. Limits for the wave aberration coefficients are determined. We compare the phase-contrast transfer function of the corrected versus the uncorrected objective lens with the help of diffractograms. The information limit and the improvement of the point resolution is discussed.

Peng Wang - One of the best experts on this subject based on the ideXlab platform.

  • optical sectioning and confocal imaging and analysis in the transmission Electron Microscope
    Annual Review of Materials Research, 2012
    Co-Authors: Peter D. Nellist, Peng Wang
    Abstract:

    Aberration correction in the transmission Electron Microscope has led to a reduction in the depth of focus for imaging. The depth of focus in a state-of-the-art scanning transmission Electron Microscope system, which is currently just a few nanometers, creates an opportunity to explore the three-dimensional structure of a sample by focusing on specific layers, an approach known as optical sectioning. In this article, we review the performance of optical sectioning in the scanning transmission Electron Microscope. Limitations in the simple optical sectioning approach are used to motivate discussion of confocal Electron microscopy. Three imaging modes in scanning confocal Electron microscopy have been investigated both theoretically and experimentally, and are reviewed here. The method of implementing a confocal arrangement in a Microscope is discussed, along with its comparative performance with other methods for three-dimensional imaging and analysis. Finally, current and future potential applications are...

  • nanoscale energy filtered scanning confocal Electron microscopy using a double aberration corrected transmission Electron Microscope
    Physical Review Letters, 2010
    Co-Authors: Peng Wang, G. Behan, Angus I Kirkland, Masaki Takeguchi, Ayako Hashimoto, Kazutaka Mitsuishi, M Shimojo, Peter D. Nellist
    Abstract:

    We demonstrate that a transmission Electron Microscope fitted with two spherical-aberration correctors can be operated as an energy-filtered scanning confocal Electron Microscope. A method for establishing this mode is described and initial results showing 3D chemical mapping with nanoscale sensitivity to height and thickness changes in a carbon film are presented. Importantly, uncorrected chromatic aberration does not limit the depth resolution of this technique and moreover performs an energy-filtering role, which is explained in terms of a combined depth and energy-loss response function.

Maximilian Haider - One of the best experts on this subject based on the ideXlab platform.

Marco Jähnisch - One of the best experts on this subject based on the ideXlab platform.

  • microrobot system for automatic nanohandling inside a scanning Electron Microscope
    IEEE-ASME Transactions on Mechatronics, 2007
    Co-Authors: Sergej Fatikow, Thomas Wich, T. Sievers, H. Hulsen, Marco Jähnisch
    Abstract:

    In this paper, current research work on the development of an automated nano handling station in a scanning Electron Microscope (SEM) is presented. An experimental setup is described, in which two mobile microrobots cooperate in the vacuum chamber of an SEM. The robots are positioned by a closed-loop controller with sensor data, which is provided by three charge-coupled device cameras and the SEM. Continuous pose estimation is carried out by processing noisy SEM images in real time. To enable the automation of complex tasks, a client-server control system that can integrate various microrobots and sensors is introduced. Finally, the overall system is evaluated by automatic handling of transmission Electron Microscope lamellae.

  • Microrobot system for automatic nanohandling inside a scanning Electron Microscope
    Proceedings 2006 IEEE International Conference on Robotics and Automation 2006. ICRA 2006., 2006
    Co-Authors: Sergej Fatikow, Thomas Wich, T. Sievers, H. H.lsen, Marco Jähnisch
    Abstract:

    Current research work on the development of an automated nanohandling cell in a scanning Electron Microscope (SEM) is presented. An experimental setup is shown, in which two micro robots cooperate in the vacuum chamber of an SEM. A client-server control system that can integrate various microrobots and sensors has been developed and evaluated by automatic handling of TEM (transmission Electron Microscope) lamellae. The robots are controlled in a closed-loop way by using images from several CCD cameras and from the SEM. Algorithms for real-time processing of noisy SEM images have been implemented and tested. Finally, the experiment on automatic handling of TEM lamellae inside an SEM is described