The Experts below are selected from a list of 300 Experts worldwide ranked by ideXlab platform

Shou-yi Chang - One of the best experts on this subject based on the ideXlab platform.

  • In-Situ Nanomechanical Testing in Electron Microscopes
    Handbook of Mechanics of Materials, 2019
    Co-Authors: Shou-yi Chang
    Abstract:

    Understanding the mechanical behavior of nanostructured and nanosized materials at the nanoscale is very important in improving their structural stability and operational reliability. This chapter introduces unique in-situ nanomechanical testing techniques in Electron Microscopes that assist in the precise positioning and direct characterization of nanoscale samples, while avoiding their aging or contamination by the environment. The first two short sections address the importance of mechanical behavior at the nanoscale and present some examples of conventional nanomechanical testing and ex-situ deformation observations. The third section introduces the instrument for in-situ nanomechanical testing in Electron Microscopes, the preparation of samples for testing, and some complimentary components of the tools. The final section presents some applications of the powerful techniques to achieve precise mechanical measurements and direct deformation/failure observations at the nanoscale of various materials of various dimensions.

C. Motz - One of the best experts on this subject based on the ideXlab platform.

  • Quantitative In Situ Mechanical Testing in Electron Microscopes
    2016
    Co-Authors: M. Legros, D. S. Gianola, C. Motz
    Abstract:

    about the surface (e.g., optical and SEM) but have some advantages with regard to temporal resolution over 3D probing tech-nologies, which can require long acquisi-tion times to enhance the signal quality. Figure 1 is a three-axis map of the main in situ tools used to investigate deforma-tion mechanisms. The first two axes are the strain resolution and the length scale, which rely on the size of the probe, the incoming wavelength, and the signal-to-noise ratios of the sensors and imaging devices. The third axis is the time resolu-tion, which, in part, is dependent on the detectors. The spatial resolution of optical in situ microscopy and Raman is limited by their wavelength and can be improved by looking at ensembles of small objects. X-ray in situ studies require a very intense and focused beam to investigate small deforming volumes in short amounts of time. Such experiments can only be per-formed at modern synchrotron sources offering high brightness and advanced detectors; the expense of these experi-ments precludes repeated tests.1,2 SEM and TEM are clearly well adapted for micron- and submicron-sized speci-mens. The lower time limit is often due to the speed of detectors or video frame rates. Recently, this limit has been extended to ultra-fast dynamic imaging by using laser-triggered beams and synchronous detec-tion. In the case of Electron microscopy, this very specific tool, for instance, is cur-rently employed to study fast chemical reaction phase transformations3 (for a review, see Reference 4) but will not be discussed here. In this article, we focus our attention on in situ Electron microscopy studies where the time intervals are o

  • quantitative in situ mechanical testing in Electron Microscopes
    Mrs Bulletin, 2010
    Co-Authors: M. Legros, D. S. Gianola, C. Motz
    Abstract:

    This article is devoted to recent progress in the area of in situ Electron microscopy (scanning and transmission) and will focus on quantitative aspects of these techniques as applied to the deformation of materials. Selected recent experiments are chosen to illustrate how these techniques have benefited from improvements ranging from sample preparation to digital image acquisition. Known for its ability to capture the underlying phenomena of plastic deformation as they occur, in situ Electron microscopy has evolved to a level where fully instrumented micro- and nanomechanical tests can be performed simultaneously.

M. Legros - One of the best experts on this subject based on the ideXlab platform.

  • Quantitative In Situ Mechanical Testing in Electron Microscopes
    2016
    Co-Authors: M. Legros, D. S. Gianola, C. Motz
    Abstract:

    about the surface (e.g., optical and SEM) but have some advantages with regard to temporal resolution over 3D probing tech-nologies, which can require long acquisi-tion times to enhance the signal quality. Figure 1 is a three-axis map of the main in situ tools used to investigate deforma-tion mechanisms. The first two axes are the strain resolution and the length scale, which rely on the size of the probe, the incoming wavelength, and the signal-to-noise ratios of the sensors and imaging devices. The third axis is the time resolu-tion, which, in part, is dependent on the detectors. The spatial resolution of optical in situ microscopy and Raman is limited by their wavelength and can be improved by looking at ensembles of small objects. X-ray in situ studies require a very intense and focused beam to investigate small deforming volumes in short amounts of time. Such experiments can only be per-formed at modern synchrotron sources offering high brightness and advanced detectors; the expense of these experi-ments precludes repeated tests.1,2 SEM and TEM are clearly well adapted for micron- and submicron-sized speci-mens. The lower time limit is often due to the speed of detectors or video frame rates. Recently, this limit has been extended to ultra-fast dynamic imaging by using laser-triggered beams and synchronous detec-tion. In the case of Electron microscopy, this very specific tool, for instance, is cur-rently employed to study fast chemical reaction phase transformations3 (for a review, see Reference 4) but will not be discussed here. In this article, we focus our attention on in situ Electron microscopy studies where the time intervals are o

  • quantitative in situ mechanical testing in Electron Microscopes
    Mrs Bulletin, 2010
    Co-Authors: M. Legros, D. S. Gianola, C. Motz
    Abstract:

    This article is devoted to recent progress in the area of in situ Electron microscopy (scanning and transmission) and will focus on quantitative aspects of these techniques as applied to the deformation of materials. Selected recent experiments are chosen to illustrate how these techniques have benefited from improvements ranging from sample preparation to digital image acquisition. Known for its ability to capture the underlying phenomena of plastic deformation as they occur, in situ Electron microscopy has evolved to a level where fully instrumented micro- and nanomechanical tests can be performed simultaneously.

Huajun Fang - One of the best experts on this subject based on the ideXlab platform.

  • a multiscale material testing system for in situ optical and Electron Microscopes and its application
    Sensors, 2017
    Co-Authors: Zhiguo Cui, Huajun Fang
    Abstract:

    We report a novel material testing system (MTS) that uses hierarchical designs for in-situ mechanical characterization of multiscale materials. This MTS is adaptable for use in optical Microscopes (OMs) and scanning Electron Microscopes (SEMs). The system consists of a microscale material testing module (m-MTM) and a nanoscale material testing module (n-MTM). The MTS can measure mechanical properties of materials with characteristic lengths ranging from millimeters to tens of nanometers, while load capacity can vary from several hundred micronewtons to several nanonewtons. The m-MTM is integrated using piezoelectric motors and piezoelectric stacks/tubes to form coarse and fine testing modules, with specimen length from millimeters to several micrometers, and displacement distances of 12 mm with 0.2 µm resolution for coarse level and 8 µm with 1 nm resolution for fine level. The n-MTM is fabricated using microelectromechanical system technology to form active and passive components and realizes material testing for specimen lengths ranging from several hundred micrometers to tens of nanometers. The system's capabilities are demonstrated by in-situ OM and SEM testing of the system's performance and mechanical properties measurements of carbon fibers and metallic microwires. In-situ multiscale deformation tests of Bacillus subtilis filaments are also presented.

D. S. Gianola - One of the best experts on this subject based on the ideXlab platform.

  • Quantitative In Situ Mechanical Testing in Electron Microscopes
    2016
    Co-Authors: M. Legros, D. S. Gianola, C. Motz
    Abstract:

    about the surface (e.g., optical and SEM) but have some advantages with regard to temporal resolution over 3D probing tech-nologies, which can require long acquisi-tion times to enhance the signal quality. Figure 1 is a three-axis map of the main in situ tools used to investigate deforma-tion mechanisms. The first two axes are the strain resolution and the length scale, which rely on the size of the probe, the incoming wavelength, and the signal-to-noise ratios of the sensors and imaging devices. The third axis is the time resolu-tion, which, in part, is dependent on the detectors. The spatial resolution of optical in situ microscopy and Raman is limited by their wavelength and can be improved by looking at ensembles of small objects. X-ray in situ studies require a very intense and focused beam to investigate small deforming volumes in short amounts of time. Such experiments can only be per-formed at modern synchrotron sources offering high brightness and advanced detectors; the expense of these experi-ments precludes repeated tests.1,2 SEM and TEM are clearly well adapted for micron- and submicron-sized speci-mens. The lower time limit is often due to the speed of detectors or video frame rates. Recently, this limit has been extended to ultra-fast dynamic imaging by using laser-triggered beams and synchronous detec-tion. In the case of Electron microscopy, this very specific tool, for instance, is cur-rently employed to study fast chemical reaction phase transformations3 (for a review, see Reference 4) but will not be discussed here. In this article, we focus our attention on in situ Electron microscopy studies where the time intervals are o

  • quantitative in situ mechanical testing in Electron Microscopes
    Mrs Bulletin, 2010
    Co-Authors: M. Legros, D. S. Gianola, C. Motz
    Abstract:

    This article is devoted to recent progress in the area of in situ Electron microscopy (scanning and transmission) and will focus on quantitative aspects of these techniques as applied to the deformation of materials. Selected recent experiments are chosen to illustrate how these techniques have benefited from improvements ranging from sample preparation to digital image acquisition. Known for its ability to capture the underlying phenomena of plastic deformation as they occur, in situ Electron microscopy has evolved to a level where fully instrumented micro- and nanomechanical tests can be performed simultaneously.