The Experts below are selected from a list of 189 Experts worldwide ranked by ideXlab platform

Shunsuke Ohtani - One of the best experts on this subject based on the ideXlab platform.

  • Electron Spectra from singlet and triplet states of produced by low-energy , Ne and Ar collisions
    Journal of Physics B: Atomic Molecular and Optical Physics, 1998
    Co-Authors: S Kitazawa, Toshinobu Takayanagi, Kazuyoshi Wakiya, K Tanabe, S Machida, Y Matsui, H Ida, K Iemura, Frederick Currell, Shunsuke Ohtani
    Abstract:

    Ejected Electrons from the singlet and triplet states of doubly excited and ions, produced by 25, 50, 75 and 100 keV and Ar collisions have been measured with high-resolution Electron spectroscopy. Only singlet states were observed when the target was He; in contrast, many triplet states were observed in and Ar collisions. Both singlet and triplet states contributed to the Electron Spectra in collisions, in particular, triplet states were conspicuous at low energy. Two theoretical methods, perturbation theory or Z expansion (MZ code) and multiconfigurational Hartree-Fock (Cowan code) were used for identification of ejected-Electron Spectra. The collision energy dependence of the Spectra is discussed.

T Amari - One of the best experts on this subject based on the ideXlab platform.

Eric Suraud - One of the best experts on this subject based on the ideXlab platform.

  • On the analysis of photo-Electron Spectra
    Annals of Physics, 2015
    Co-Authors: Cong-zhang Gao, Phuong Mai Dinh, Paul-gerhard Reinhard, Eric Suraud
    Abstract:

    We analyze Photo-Electron Spectra (PES) for a variety of excitation mechanisms from a simple mono-frequency laser pulse to involved combination of pulses as used, e.g., in attosecond experiments. In the case of simple pulses, the peaks in PES reflect the occupied single-particle levels in combination with the given laser frequency. This usual, simple rule may badly fail in the case of excitation pulses with mixed frequencies and if resonant modes of the system are significantly excited. We thus develop an extension of the usual rule to cover all possible excitation scenarios, including mixed frequencies in the attosecond regime. We find that the Spectral distributions of dipole, monopole and quadrupole power for the given excitation taken together and properly shifted by the single-particle energies provide a pertinent picture of the PES in all situations. This leads to the derivation of a generalized relation allowing to understand photo-Electron yields even in complex experimental setups.

Harry M. Meyer - One of the best experts on this subject based on the ideXlab platform.

  • Experimental secondary Electron Spectra under SEM conditions.
    Journal of Microscopy, 2004
    Co-Authors: David C. Joy, M. S. Prasad, Harry M. Meyer
    Abstract:

    Secondary Electron Spectra have been collected from both pure elements and from compounds examined under conditions approximating those found in a scanning Electron microscope. Despite the presence of substantial surface contamination these Spectra are found to be reproducible and characteristic of the underlying material. Typically the peak in such Spectra is found to be at an energy of about 5 eV, and 50% of the total secondary Electron emission falls within the range 0-12 eV. These data may be of value for the design of detectors for scanning microscopy and might have applications for microanalysis.

John T. L. Thong - One of the best experts on this subject based on the ideXlab platform.

  • Determination of secondary Electron Spectra from insulators
    Scanning, 2006
    Co-Authors: Y. C. Yong, John T. L. Thong
    Abstract:

    A new technique for the determination of secondary Electron (SE) Spectra of insulators in a scanning Electron microscope environment is presented. It is based on a capacitatively coupled charge measurement by subjecting the insulating film to a controlled pulsed Electron beam. With the use of a planar grid analyzer configuration, an algorithm is used to estimate the SE spectrum based on normalized values of the S-curve obtained. Secondary Electron Spectra from several insulating materials employed in integrated circuit manufacturing, including silicon nitride (Si3N4), AZ 1350J photoresist, and pyralin polyimide, have been measured.