The Experts below are selected from a list of 4536 Experts worldwide ranked by ideXlab platform
E Sanchezsinencio - One of the best experts on this subject based on the ideXlab platform.
-
built in self Test of rf transceiver socs from signal chain to rf synthesizers
Radio Frequency Integrated Circuits Symposium, 2007Co-Authors: Alberto Valdesgarcia, Waleed Khalil, Bertan Bakkaloglu, J Silvamartinez, E SanchezsinencioAbstract:Built-in self Test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF Test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive External Test Equipment. The presented Test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
Alberto Valdesgarcia - One of the best experts on this subject based on the ideXlab platform.
-
built in self Test of rf transceiver socs from signal chain to rf synthesizers
Radio Frequency Integrated Circuits Symposium, 2007Co-Authors: Alberto Valdesgarcia, Waleed Khalil, Bertan Bakkaloglu, J Silvamartinez, E SanchezsinencioAbstract:Built-in self Test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF Test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive External Test Equipment. The presented Test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
Tinus Stander - One of the best experts on this subject based on the ideXlab platform.
-
Built-in Oscillation-Based Testing of RF Amplifier Gain using Differential Power Detection
2019 IEEE Radio and Antenna Days of the Indian Ocean (RADIO), 2019Co-Authors: Maxwell Ballot, Tinus StanderAbstract:Oscillation-based built-in self-Testing requires in-circuit frequency and power detection without External Test Equipment, which is a challenge at radio frequencies. We propose the use of differential power detection either side of a frequency selective feedback loop to effect oscillation frequency variation detection. The approach is demonstrated using simulated results of a 2.4 GHz low-noise amplifier, and is shown to detect gain variation using both oscillation frequency and output power discrimination.
Waleed Khalil - One of the best experts on this subject based on the ideXlab platform.
-
built in self Test of rf transceiver socs from signal chain to rf synthesizers
Radio Frequency Integrated Circuits Symposium, 2007Co-Authors: Alberto Valdesgarcia, Waleed Khalil, Bertan Bakkaloglu, J Silvamartinez, E SanchezsinencioAbstract:Built-in self Test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF Test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive External Test Equipment. The presented Test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
Bertan Bakkaloglu - One of the best experts on this subject based on the ideXlab platform.
-
built in self Test of rf transceiver socs from signal chain to rf synthesizers
Radio Frequency Integrated Circuits Symposium, 2007Co-Authors: Alberto Valdesgarcia, Waleed Khalil, Bertan Bakkaloglu, J Silvamartinez, E SanchezsinencioAbstract:Built-in self Test techniques for local oscillator phase noise, RF front-end circuits, baseband building blocks and transceiver loop-back are described. CMOS implementation of integrated RF Test components, including RF detectors and phase discriminators are introduced. These devices eliminate the need for expensive External Test Equipment. The presented Test strategies can also be used at wafer-level for fault diagnosis, localization and yield estimation. Silicon characterization results verifying most of these techniques are provided.
