The Experts below are selected from a list of 16248 Experts worldwide ranked by ideXlab platform
P. Mark L. Sandercock - One of the best experts on this subject based on the ideXlab platform.
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Fire Investigation and ignitable liquid residue analysis—A review: 2001–2007
Forensic Science International, 2007Co-Authors: P. Mark L. SandercockAbstract:Next to natural disasters Fires cause some of the greatest losses to property and human life around the world. Arson, the deliberate setting of a Fire to destroy property or to take a human life, is one of the most difficult crimes to investigate because much of the evidence at the scene is destroyed by the Fire. Fortunately, the science of Fire Investigation is not static and more information to help investigators determine the origin and cause of a Fire through careful examination of the scene and laboratory analysis of Fire debris is published every year. This review article provides an overview of the scientific literature describing research and best practices in the fields of Fire scene Investigation as well as ignitable liquid residue analysis. This review is a compilation of articles published between late 2001 and early 2007. Conference proceedings for which full papers have not been published were intentionally excluded from this review. Some of the information contained in this review was presented at the 14th Interpol Forensic Science Symposium held in Lyon, France in October 2004.
Mark P L Sandercock - One of the best experts on this subject based on the ideXlab platform.
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Fire Investigation and ignitable liquid residue analysis a review 2001 2007
Forensic Science International, 2008Co-Authors: Mark P L SandercockAbstract:Next to natural disasters Fires cause some of the greatest losses to property and human life around the world. Arson, the deliberate setting of a Fire to destroy property or to take a human life, is one of the most difficult crimes to investigate because much of the evidence at the scene is destroyed by the Fire. Fortunately, the science of Fire Investigation is not static and more information to help investigators determine the origin and cause of a Fire through careful examination of the scene and laboratory analysis of Fire debris is published every year. This review article provides an overview of the scientific literature describing research and best practices in the fields of Fire scene Investigation as well as ignitable liquid residue analysis. This review is a compilation of articles published between late 2001 and early 2007. Conference proceedings for which full papers have not been published were intentionally excluded from this review. Some of the information contained in this review was presented at the 14th Interpol Forensic Science Symposium held in Lyon, France in October 2004.
H.y. Chen - One of the best experts on this subject based on the ideXlab platform.
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SIMS depth profiling analysis of electrical arc residues in Fire Investigation
Applied Surface Science, 2003Co-Authors: C.y. Chen, Yong-chien Ling, J.t. Wang, H.y. ChenAbstract:[[abstract]]SIMS was used to distinguish the primary and secondary electrical short circuit (ESC) arc beads. A Cs+ primary ion was used to detect the 12C-, 63Cu-, 18O- and 37Cl- secondary ions formed during 0-3 μm depth profiles. Thin surface layer enriched with C, Cl and O was observed in the primary arc beads, whereas a comparably thick layer of Cl was observed in the secondary arc beads at the 0-0.3 μm depth profile. Comparative study of real case samples with those of simulated samples indicates that SIMS can be used as a complementary technique for identification of the cause of Fire during Fire Investigation.[[fileno]]2010304010016[[department]]化學
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SIMS depth profiling analysis of electrical arc residues in Fire Investigation
Applied Surface Science, 2002Co-Authors: Chao Chen, Yong-chien Ling, J.t. Wang, H.y. ChenAbstract:Abstract SIMS was used to distinguish the primary and secondary electrical short circuit (ESC) arc beads. A Cs+ primary ion was used to detect the 12 C − , 63 Cu − , 18 O − and 37 Cl − secondary ions formed during 0–3 μm depth profiles. Thin surface layer enriched with C, Cl and O was observed in the primary arc beads, whereas a comparably thick layer of Cl was observed in the secondary arc beads at the 0–0.3 μm depth profile. Comparative study of real case samples with those of simulated samples indicates that SIMS can be used as a complementary technique for identification of the cause of Fire during Fire Investigation.
Yong-chien Ling - One of the best experts on this subject based on the ideXlab platform.
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SIMS depth profiling analysis of electrical arc residues in Fire Investigation
Applied Surface Science, 2003Co-Authors: C.y. Chen, Yong-chien Ling, J.t. Wang, H.y. ChenAbstract:[[abstract]]SIMS was used to distinguish the primary and secondary electrical short circuit (ESC) arc beads. A Cs+ primary ion was used to detect the 12C-, 63Cu-, 18O- and 37Cl- secondary ions formed during 0-3 μm depth profiles. Thin surface layer enriched with C, Cl and O was observed in the primary arc beads, whereas a comparably thick layer of Cl was observed in the secondary arc beads at the 0-0.3 μm depth profile. Comparative study of real case samples with those of simulated samples indicates that SIMS can be used as a complementary technique for identification of the cause of Fire during Fire Investigation.[[fileno]]2010304010016[[department]]化學
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SIMS depth profiling analysis of electrical arc residues in Fire Investigation
Applied Surface Science, 2002Co-Authors: Chao Chen, Yong-chien Ling, J.t. Wang, H.y. ChenAbstract:Abstract SIMS was used to distinguish the primary and secondary electrical short circuit (ESC) arc beads. A Cs+ primary ion was used to detect the 12 C − , 63 Cu − , 18 O − and 37 Cl − secondary ions formed during 0–3 μm depth profiles. Thin surface layer enriched with C, Cl and O was observed in the primary arc beads, whereas a comparably thick layer of Cl was observed in the secondary arc beads at the 0–0.3 μm depth profile. Comparative study of real case samples with those of simulated samples indicates that SIMS can be used as a complementary technique for identification of the cause of Fire during Fire Investigation.
J.t. Wang - One of the best experts on this subject based on the ideXlab platform.
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SIMS depth profiling analysis of electrical arc residues in Fire Investigation
Applied Surface Science, 2003Co-Authors: C.y. Chen, Yong-chien Ling, J.t. Wang, H.y. ChenAbstract:[[abstract]]SIMS was used to distinguish the primary and secondary electrical short circuit (ESC) arc beads. A Cs+ primary ion was used to detect the 12C-, 63Cu-, 18O- and 37Cl- secondary ions formed during 0-3 μm depth profiles. Thin surface layer enriched with C, Cl and O was observed in the primary arc beads, whereas a comparably thick layer of Cl was observed in the secondary arc beads at the 0-0.3 μm depth profile. Comparative study of real case samples with those of simulated samples indicates that SIMS can be used as a complementary technique for identification of the cause of Fire during Fire Investigation.[[fileno]]2010304010016[[department]]化學
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SIMS depth profiling analysis of electrical arc residues in Fire Investigation
Applied Surface Science, 2002Co-Authors: Chao Chen, Yong-chien Ling, J.t. Wang, H.y. ChenAbstract:Abstract SIMS was used to distinguish the primary and secondary electrical short circuit (ESC) arc beads. A Cs+ primary ion was used to detect the 12 C − , 63 Cu − , 18 O − and 37 Cl − secondary ions formed during 0–3 μm depth profiles. Thin surface layer enriched with C, Cl and O was observed in the primary arc beads, whereas a comparably thick layer of Cl was observed in the secondary arc beads at the 0–0.3 μm depth profile. Comparative study of real case samples with those of simulated samples indicates that SIMS can be used as a complementary technique for identification of the cause of Fire during Fire Investigation.