The Experts below are selected from a list of 256263 Experts worldwide ranked by ideXlab platform
Albrecht Brandenburg - One of the best experts on this subject based on the ideXlab platform.
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Calibration of systems for quantitative Fluorescence Analysis of thin layers.
Optics express, 2019Co-Authors: Philipp Holz, Albrecht BrandenburgAbstract:Imaging Fluorescence Analysis is a powerful tool for the characterization of thin functional layers. Due to the development of new components such as cost-efficient and long life diode lasers and LEDs as well as sensitive cameras, the number of industrial in situ sensors based on Fluorescence Analysis technology increased rapidly in recent years. Of crucial importance for all these new sensors are efficient and robust methods for calibration. Although there are many examples for the calibration of laboratory setups for single specialized applications, there is no standardized method for the traceable device independent calibration of imaging Fluorescence systems. This paper presents the evaluation of five different methods for the calibration of systems for quantitative Fluorescence Analysis. Each method is applied for the calibration of an imaging Fluorescence laser scanner. In addition to characterizing the precision of the methods, the work analyzes the usability of the methods for different applications. The results show for the first time that a calibrated IR point sensor can be used for the auto calibration of high resolution imaging inline Fluorescence sensors. In addition, we present a novel method for the transfer of calibration data between Analysis systems with different optical setups by using a solid material Fluorescence standard.
G. Bernasconi - One of the best experts on this subject based on the ideXlab platform.
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Microscopic X-ray Fluorescence Analysis. Invited lecture
Journal of Analytical Atomic Spectrometry, 1994Co-Authors: Koen Janssens, Laszlo Vincze, J. Rubio, F. Adams, G. BernasconiAbstract:The status of microscopic X-ray Fluorescence Analysis with tube excitation and synchrotron radiation is reviewed in terms of the lateral resolution, minimum detection limits and elemental sensitivity that can be achieved. As illustrations, the utilization of two typical state-of-the-art instruments for the Analysis of geological material is described; one of the instruments is based on tube excitation, the other is installed at a synchrotron X-ray source. The analytical implications of the use of X-ray microprobes installed at a third generation storage ring, and in particular at the European Synchrotron Radiation Facility (ESRF), are discussed.
Jun Kawai - One of the best experts on this subject based on the ideXlab platform.
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Identification of steel by X-ray Fluorescence Analysis with a pyroelectric X-ray generator
Analytical and Bioanalytical Chemistry, 2004Co-Authors: Hiroyuki Ida, Jun KawaiAbstract:An application of X-ray Fluorescence Analysis with a pyroelectric X-ray generator is presented. Steel standard samples were identified by X-ray Fluorescence Analysis with this novel X-ray generator to check its capability for performing qualitative and quantitative Analysis as an X-ray source for X-ray Fluorescence spectrometers. Cr, Ni, V, Co, and W were detected in steel standard samples. V and Cr can be detected even when the content is below 1%. Although it is difficult to detect minor elements because of the low power of the excitation X-rays, it is possible to identify the analyzed samples on the basis of major elements at the percentage level. The pyroelectric X-ray generator is very suitable for portable X-ray Fluorescence spectrometers.
Philipp Holz - One of the best experts on this subject based on the ideXlab platform.
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Calibration of systems for quantitative Fluorescence Analysis of thin layers.
Optics express, 2019Co-Authors: Philipp Holz, Albrecht BrandenburgAbstract:Imaging Fluorescence Analysis is a powerful tool for the characterization of thin functional layers. Due to the development of new components such as cost-efficient and long life diode lasers and LEDs as well as sensitive cameras, the number of industrial in situ sensors based on Fluorescence Analysis technology increased rapidly in recent years. Of crucial importance for all these new sensors are efficient and robust methods for calibration. Although there are many examples for the calibration of laboratory setups for single specialized applications, there is no standardized method for the traceable device independent calibration of imaging Fluorescence systems. This paper presents the evaluation of five different methods for the calibration of systems for quantitative Fluorescence Analysis. Each method is applied for the calibration of an imaging Fluorescence laser scanner. In addition to characterizing the precision of the methods, the work analyzes the usability of the methods for different applications. The results show for the first time that a calibrated IR point sensor can be used for the auto calibration of high resolution imaging inline Fluorescence sensors. In addition, we present a novel method for the transfer of calibration data between Analysis systems with different optical setups by using a solid material Fluorescence standard.
Birgit Kanngießer - One of the best experts on this subject based on the ideXlab platform.
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Quantification procedures in micro X-ray Fluorescence Analysis☆
Spectrochimica Acta Part B: Atomic Spectroscopy, 2003Co-Authors: Birgit KanngießerAbstract:Abstract For the quantification in micro X-ray Fluorescence Analysis standardfree quantification procedures have become especially important. An introduction to the basic concepts of these quantification procedures is given, followed by a short survey of the procedures which are available now and what kind of experimental situations and analytical problems are addressed. The last point is extended by the description of an own development for the fundamental parameter method, which renders the inclusion of nonparallel beam geometries possible. Finally, open problems for the quantification procedures are discussed.