The Experts below are selected from a list of 192 Experts worldwide ranked by ideXlab platform
Kenji Sakurai - One of the best experts on this subject based on the ideXlab platform.
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Review on Grazing Incidence X-ray spectrometry and reflectometry
Spectrochimica acta Part B: Atomic spectroscopy, 1999Co-Authors: Krassimir N. Stoev, Kenji SakuraiAbstract:Grazing Incidence X-ray techniques are now widely used for surface and thin film analysis. The present article overviews the recent advancement since 1993 of the Grazing Incidence X-ray spectrometry and reflectometry in both theoretical and experimental aspects. Every current topic related to the total reflection X-ray fluorescence spectrometry (TXRF) is described in detail through the introduction of numerous published works on the application in the various fields of the science and industrial technologies. Recent rapid growth in diffuse scattering at Grazing Incidence as well as in specular reflection is another important scope. The combined measurements of different Grazing Incidence X-ray techniques might be a future trend for realizing further advanced analysis of the surface and interfaces of materials.
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Review on Grazing Incidence X-ray spectrometry and reflectometry ☆
Spectrochimica Acta Part B: Atomic Spectroscopy, 1999Co-Authors: Krassimir N. Stoev, Kenji SakuraiAbstract:Grazing Incidence X-ray techniques are now widely used for surface and thin film analysis. The present article overviews the recent advancement since 1993 of the Grazing Incidence X-ray spectrometry and reflectometry in both theoretical and experimental aspects. Every current topic related to the total reflection X-ray fluorescence spectrometry (TXRF) is described in detail through the introduction of numerous published works on the application in the various fields of the science and industrial technologies. Recent rapid growth in diffuse scattering at Grazing Incidence as well as in specular reflection is another important scope. The combined measurements of different Grazing Incidence X-ray techniques might be a future trend for realizing further advanced analysis of the surface and interfaces of materials.
Krassimir N. Stoev - One of the best experts on this subject based on the ideXlab platform.
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Review on Grazing Incidence X-ray spectrometry and reflectometry
Spectrochimica acta Part B: Atomic spectroscopy, 1999Co-Authors: Krassimir N. Stoev, Kenji SakuraiAbstract:Grazing Incidence X-ray techniques are now widely used for surface and thin film analysis. The present article overviews the recent advancement since 1993 of the Grazing Incidence X-ray spectrometry and reflectometry in both theoretical and experimental aspects. Every current topic related to the total reflection X-ray fluorescence spectrometry (TXRF) is described in detail through the introduction of numerous published works on the application in the various fields of the science and industrial technologies. Recent rapid growth in diffuse scattering at Grazing Incidence as well as in specular reflection is another important scope. The combined measurements of different Grazing Incidence X-ray techniques might be a future trend for realizing further advanced analysis of the surface and interfaces of materials.
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Review on Grazing Incidence X-ray spectrometry and reflectometry ☆
Spectrochimica Acta Part B: Atomic Spectroscopy, 1999Co-Authors: Krassimir N. Stoev, Kenji SakuraiAbstract:Grazing Incidence X-ray techniques are now widely used for surface and thin film analysis. The present article overviews the recent advancement since 1993 of the Grazing Incidence X-ray spectrometry and reflectometry in both theoretical and experimental aspects. Every current topic related to the total reflection X-ray fluorescence spectrometry (TXRF) is described in detail through the introduction of numerous published works on the application in the various fields of the science and industrial technologies. Recent rapid growth in diffuse scattering at Grazing Incidence as well as in specular reflection is another important scope. The combined measurements of different Grazing Incidence X-ray techniques might be a future trend for realizing further advanced analysis of the surface and interfaces of materials.
Yu A Basov - One of the best experts on this subject based on the ideXlab platform.
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Zone plates for x-ray optics at Grazing Incidence angles
Journal of Physics D: Applied Physics, 1996Co-Authors: I.a. Schelokov, Yu A BasovAbstract:The results of calculations on the optical properties of zone plates at Grazing Incidence angles are presented. In terms of the diffraction theory, the diffraction integrals for the Fresnel zone geometries are shown to be similar at normal and Grazing Incidence angles in the Fresnel approximation. One-dimensional and two-dimensional cases are discussed.
F. E. Zocchi - One of the best experts on this subject based on the ideXlab platform.
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Roughness scattering in X-ray Grazing-Incidence telescopes
Astronomy & Astrophysics, 2009Co-Authors: F. E. ZocchiAbstract:In the framework of the scalar theory of diffraction, we determine the rms width of the angle spread function degraded by surface roughness in reflective Grazing-Incidence optics of cylindrical symmetry for X-ray astronomy. Our derivation does not rely on the small roughness approximation, is thus valid for arbitrary roughness values, and takes into full consideration the cylindrical symmetry of the mirrors. The dependence of the rms beam width on both the Grazing-Incidence angles and the radiation wavelength is studied for both single and double reflection optics, the latter being more relevant to X-ray telescopes. When the small roughness approximation is applicable, we also derive an expression for the angle spread function of the optical system in the presence of roughness scattering that provides the correct expression for the rms beam width.
Andreas Hütten - One of the best experts on this subject based on the ideXlab platform.
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Self organization of magnetic nanoparticles: A polarized Grazing Incidence small angle neutron scattering and Grazing Incidence small angle x-ray scattering study
Journal of Applied Physics, 2011Co-Authors: Katharina Theis-bröhl, D. Mishra, Boris P. Toperverg, Hartmut Zabel, Britta Vogel, Anna Regtmeier, Andreas HüttenAbstract:Cobalt and magnetite nanoparticles were studied with small-angle x-ray and neutron scattering methods under Grazing Incidence for analyzing their structural and magnetic correlation on silicon substrates. The Co nanoparticles are in the ferromagnetic state while the iron oxide nanoparticles are superparamagnetic at room temperature. After spin-coating the iron oxide particles with a diameter of 20 nm and a very narrow size distribution of only 6% show very nice self-ordering on silicon substrates with nearly perfect six-fold symmetry as can be derived from scanning electron microscopy (SEM) images and from Grazing Incidence small angle x-ray scattering results. In contrast the dropcasted cobalt nanoparticles show a much higher roughness and less ordering. The corresponding SEM images and Grazing Incidence small angle neutron scattering maps with polarization of the incident beam reveal less pronounced structural and magnetic correlation.
