The Experts below are selected from a list of 360 Experts worldwide ranked by ideXlab platform
Jeanjacques Fundenberger - One of the best experts on this subject based on the ideXlab platform.
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diffraction contrast dependence on sample thickness and Incident Energy in on axis transmission kikuchi diffraction in sem
Ultramicroscopy, 2017Co-Authors: Etienne Brodu, Emmanuel Bouzy, Jeanjacques FundenbergerAbstract:Automated orientation mapping in SEM, until now relying on EBSD solely, is currently being improved with the development of the TKD technique. As part of the development of TKD, we introduce a new, TEM-like geometric configuration, with a detector "on-axis" relative to the electron beam, while the detector was "off-axis" in its first form. This new technique produces a wide range of diffraction contrast (spots, lines, bands), varying with sample thickness, Incident Energy, atomic number and scattering angle. Some of the main trends are identified and discussed. In particular, a model based on the plasmon and phonon scattering is proposed to account for the disappearing of diffraction spots with thickness and Incident Energy. This work should help experimentalists determine which microscope and sample parameters to use in order to obtain a specific contrast. Finally, the strength and weakness of each diffraction feature for orientation mapping are also reviewed.
Etienne Brodu - One of the best experts on this subject based on the ideXlab platform.
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depth resolution dependence on sample thickness and Incident Energy in on axis transmission kikuchi diffraction in scanning electron microscope sem
Microscopy and Microanalysis, 2017Co-Authors: Etienne Brodu, Emmanuel BouzyAbstract:Transmission Kikuchi diffraction is an emerging technique aimed at producing orientation maps of the structure of materials with a nanometric lateral resolution. This study investigates experimentally the depth resolution of the on-axis configuration, via a twinned silicon bi-crystal sample specifically designed and fabricated. The measured depth resolution varies from 30 to 65 nm in the range 10-30 keV, with a close to linear dependence with Incident Energy and no dependence with the total sample thickness. The depth resolution is explained in terms of two mechanisms acting concomitantly: generation of Kikuchi diffraction all along the thickness of the sample, associated with continuous absorption on the way out. A model based on the electron mean free path is used to account for the dependence with Incident Energy of the depth resolution. In addition, based on the results in silicon, the use of the mean absorption coefficient is proposed to predict the depth resolution for any atomic number and Incident Energy.
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diffraction contrast dependence on sample thickness and Incident Energy in on axis transmission kikuchi diffraction in sem
Ultramicroscopy, 2017Co-Authors: Etienne Brodu, Emmanuel Bouzy, Jeanjacques FundenbergerAbstract:Automated orientation mapping in SEM, until now relying on EBSD solely, is currently being improved with the development of the TKD technique. As part of the development of TKD, we introduce a new, TEM-like geometric configuration, with a detector "on-axis" relative to the electron beam, while the detector was "off-axis" in its first form. This new technique produces a wide range of diffraction contrast (spots, lines, bands), varying with sample thickness, Incident Energy, atomic number and scattering angle. Some of the main trends are identified and discussed. In particular, a model based on the plasmon and phonon scattering is proposed to account for the disappearing of diffraction spots with thickness and Incident Energy. This work should help experimentalists determine which microscope and sample parameters to use in order to obtain a specific contrast. Finally, the strength and weakness of each diffraction feature for orientation mapping are also reviewed.
Emmanuel Bouzy - One of the best experts on this subject based on the ideXlab platform.
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depth resolution dependence on sample thickness and Incident Energy in on axis transmission kikuchi diffraction in scanning electron microscope sem
Microscopy and Microanalysis, 2017Co-Authors: Etienne Brodu, Emmanuel BouzyAbstract:Transmission Kikuchi diffraction is an emerging technique aimed at producing orientation maps of the structure of materials with a nanometric lateral resolution. This study investigates experimentally the depth resolution of the on-axis configuration, via a twinned silicon bi-crystal sample specifically designed and fabricated. The measured depth resolution varies from 30 to 65 nm in the range 10-30 keV, with a close to linear dependence with Incident Energy and no dependence with the total sample thickness. The depth resolution is explained in terms of two mechanisms acting concomitantly: generation of Kikuchi diffraction all along the thickness of the sample, associated with continuous absorption on the way out. A model based on the electron mean free path is used to account for the dependence with Incident Energy of the depth resolution. In addition, based on the results in silicon, the use of the mean absorption coefficient is proposed to predict the depth resolution for any atomic number and Incident Energy.
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diffraction contrast dependence on sample thickness and Incident Energy in on axis transmission kikuchi diffraction in sem
Ultramicroscopy, 2017Co-Authors: Etienne Brodu, Emmanuel Bouzy, Jeanjacques FundenbergerAbstract:Automated orientation mapping in SEM, until now relying on EBSD solely, is currently being improved with the development of the TKD technique. As part of the development of TKD, we introduce a new, TEM-like geometric configuration, with a detector "on-axis" relative to the electron beam, while the detector was "off-axis" in its first form. This new technique produces a wide range of diffraction contrast (spots, lines, bands), varying with sample thickness, Incident Energy, atomic number and scattering angle. Some of the main trends are identified and discussed. In particular, a model based on the plasmon and phonon scattering is proposed to account for the disappearing of diffraction spots with thickness and Incident Energy. This work should help experimentalists determine which microscope and sample parameters to use in order to obtain a specific contrast. Finally, the strength and weakness of each diffraction feature for orientation mapping are also reviewed.
Barbara J Garrison - One of the best experts on this subject based on the ideXlab platform.
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sputtering yields for c60 and au3 bombardment of water ice as a function of Incident kinetic Energy
Analytical Chemistry, 2007Co-Authors: Michael F Russo, Christopher Szakal, Joseph Kozole, Nicholas Winograd, Barbara J GarrisonAbstract:The total sputtering yields for water ice due to kiloelectronvolt cluster bombardment have been measured and compared to the predictions made by the mesoscale Energy deposition footprint (MEDF) model. For C60 bombardment, the experimental yield varies almost linearly from 820 water molecule equivalents at an Incident kinetic Energy of 10 keV to 10 100 water molecule equivalents at a kinetic Energy of 120 keV. For Au3 bombardment, the experimental yield varies almost linearly from 630 water molecule equivalents at an Incident Energy of 10 keV and rises to 1200 water molecule equivalents at 25 keV. The MEDF model is used to calculate relative yield trends with respect to Incident Energy using short-time molecular dynamics simulations. The results of these calculations indicate that the model can effectively predict the yield trends observed for these two clusters in experiments, although there is a consistent overestimate of the predicted induced C60 yield. It is hypothesized that this overestimate can be e...
Michael F Russo - One of the best experts on this subject based on the ideXlab platform.
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sputtering yields for c60 and au3 bombardment of water ice as a function of Incident kinetic Energy
Analytical Chemistry, 2007Co-Authors: Michael F Russo, Christopher Szakal, Joseph Kozole, Nicholas Winograd, Barbara J GarrisonAbstract:The total sputtering yields for water ice due to kiloelectronvolt cluster bombardment have been measured and compared to the predictions made by the mesoscale Energy deposition footprint (MEDF) model. For C60 bombardment, the experimental yield varies almost linearly from 820 water molecule equivalents at an Incident kinetic Energy of 10 keV to 10 100 water molecule equivalents at a kinetic Energy of 120 keV. For Au3 bombardment, the experimental yield varies almost linearly from 630 water molecule equivalents at an Incident Energy of 10 keV and rises to 1200 water molecule equivalents at 25 keV. The MEDF model is used to calculate relative yield trends with respect to Incident Energy using short-time molecular dynamics simulations. The results of these calculations indicate that the model can effectively predict the yield trends observed for these two clusters in experiments, although there is a consistent overestimate of the predicted induced C60 yield. It is hypothesized that this overestimate can be e...
