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Razvigor Ossikovski - One of the best experts on this subject based on the ideXlab platform.

  • Complete Mueller Matrix from a partial polarimetry experiment: the nine-element case
    Journal of the Optical Society of America. A Optics image science and vision, 2019
    Co-Authors: Oriol Arteaga, Razvigor Ossikovski
    Abstract:

    Conventional generalized ellipsometry instrumentation is capable of measuring 12 out of the 16 elements of the Mueller Matrix of the sample. The missing column (or row) of the experimental partial Mueller Matrix can be analytically determined under additional assumptions. We identify the conditions necessary for completing the partial Mueller Matrix to a full one. More specifically, such a completion is always possible if the sample is nondepolarizing; the fulfillment of additional conditions, such as the Mueller Matrix exhibiting symmetries or being of a special two-component structure, are necessary if the sample is depolarizing. We report both algebraic and numerical procedures for completing the partial 12-element Mueller Matrix in all tractable cases and validate them on experimental examples.

  • Complete Mueller Matrix from a partial polarimetry experiment: the 12-element case
    Journal of the Optical Society of America. A Optics Image Science and Vision, 2019
    Co-Authors: Oriol Arteaga, Razvigor Ossikovski
    Abstract:

    Conventional generalized ellipsometry instrumentation is capable of measuring 12 out of the 16 elements of the Mueller Matrix of the sample. The missing column (or row) of the experimental partial Mueller Matrix can be analytically determined under additional assumptions. We identify the conditions necessary for completing the partial Mueller Matrix to a full one. More specifically, such a completion is always possible if the sample is non-depolarizing; the fulfillment of additional conditions, such as the Mueller Matrix exhibiting symmetries or being of a special two-component structure, are necessary if the sample is depolarizing. We report both algebraic and numerical procedures for completing the partial 12-element Mueller Matrix in all tractable cases and validate them on experimental examples.

  • Differential Mueller Matrix of a depolarizing homogeneous medium and its relation to the Mueller Matrix logarithm.
    Journal of the Optical Society of America. A Optics image science and vision, 2015
    Co-Authors: Razvigor Ossikovski, Antonello De Martino
    Abstract:

    The different z-dependence and non-commutativity of the two components of the differential Mueller Matrix of a homogeneous depolarizing medium prevent its formal identification with the Mueller Matrix logarithm. By using a classic linear differential equation expansion, we advance a procedure for the extraction of the elementary polarization properties, in terms of mean values and variances-covariances, from the Mueller Matrix logarithm. The approximate solution, based on the immediate identification of the differential Matrix with the Matrix logarithm, turns out to remain satisfactory up to relatively high depolarization levels. Physically interpreted experimental examples from the literature illustrate the formal developments.

  • Differential and product Mueller Matrix decompositions: a formal comparison
    Optics Letters, 2012
    Co-Authors: Razvigor Ossikovski
    Abstract:

    It is shown that the Mueller Matrix logarithm and the Mueller Matrix roots decompositions used for the extraction of the elementary polarization properties of a depolarizing medium, although being computationally different, are formally equivalent, being both based upon the differential representation of a continuously depolarizing medium. The common set of six elementary polarization properties provided by these two decompositions is generally different from that obtained from the various product decompositions summarized by the G-polar decomposition whereby the depolarization phenomenon is treated as being concentrated, and not uniformly distributed, within the medium. However, if the medium is weakly depolarizing, the two sets of elementary properties coincide to the first order in the depolarization and tend to the set of properties of the nondepolarizing estimate of the measured Mueller Matrix obtained from its Cloude sum decomposition.

  • Anisotropy coefficients of a Mueller Matrix
    Journal of the Optical Society of America. A Optics Image Science and Vision, 2011
    Co-Authors: Oriol Arteaga, Enric Garcia-caurel, Razvigor Ossikovski
    Abstract:

    Anisotropy coefficients α, β, and γ that describe the type and the relative amount of the three kinds of anisotropy generally present in a Mueller Matrix are introduced. Their derivation, algebraic properties, and physical interpretation are discussed. In particular, they are shown to permit a geometrical representation for the anisotropy and polarizing characteristics of a Mueller Matrix. Illustrative experimental examples are provided.

Oriol Arteaga - One of the best experts on this subject based on the ideXlab platform.

  • Complete Mueller Matrix from a partial polarimetry experiment: the nine-element case
    Journal of the Optical Society of America. A Optics image science and vision, 2019
    Co-Authors: Oriol Arteaga, Razvigor Ossikovski
    Abstract:

    Conventional generalized ellipsometry instrumentation is capable of measuring 12 out of the 16 elements of the Mueller Matrix of the sample. The missing column (or row) of the experimental partial Mueller Matrix can be analytically determined under additional assumptions. We identify the conditions necessary for completing the partial Mueller Matrix to a full one. More specifically, such a completion is always possible if the sample is nondepolarizing; the fulfillment of additional conditions, such as the Mueller Matrix exhibiting symmetries or being of a special two-component structure, are necessary if the sample is depolarizing. We report both algebraic and numerical procedures for completing the partial 12-element Mueller Matrix in all tractable cases and validate them on experimental examples.

  • Complete Mueller Matrix from a partial polarimetry experiment: the 12-element case
    Journal of the Optical Society of America. A Optics Image Science and Vision, 2019
    Co-Authors: Oriol Arteaga, Razvigor Ossikovski
    Abstract:

    Conventional generalized ellipsometry instrumentation is capable of measuring 12 out of the 16 elements of the Mueller Matrix of the sample. The missing column (or row) of the experimental partial Mueller Matrix can be analytically determined under additional assumptions. We identify the conditions necessary for completing the partial Mueller Matrix to a full one. More specifically, such a completion is always possible if the sample is non-depolarizing; the fulfillment of additional conditions, such as the Mueller Matrix exhibiting symmetries or being of a special two-component structure, are necessary if the sample is depolarizing. We report both algebraic and numerical procedures for completing the partial 12-element Mueller Matrix in all tractable cases and validate them on experimental examples.

  • Beyond polarization microscopy: Mueller Matrix microscopy with frequency demodulation
    Polarization: Measurement Analysis and Remote Sensing XI, 2014
    Co-Authors: Oriol Arteaga, Ertan Kuntman
    Abstract:

    Mueller Matrix microscopy is the natural generalization of polarization microscopy. It provides images of the Mueller Matrix of a sample with micrometric resolution. In this work we describe a Mueller Matrix microscope that uses the dual rotating compensator technique to simultaneously determine all the elements of its transmission or reflection Mueller Matrix. The instrument uses two compensators that rotate at different frequencies and every Mueller Matrix element is determined by using a digital frequency demodulation technique that does the frequency-analysis of the time dependent intensity captured at every pixel of the CCD detector. Transmission and reflection measurements are illustrated with experimental examples.

  • Useful Mueller Matrix symmetries for ellipsometry
    Thin Solid Films, 2014
    Co-Authors: Oriol Arteaga
    Abstract:

    Abstract In this work we derive the five patterns of symmetry of a Mueller Matrix, a differential Mueller Matrix and a Jones Matrix that can appear in ellipsometry measurements. While a general nondepolarizing measurement depends on six parameters, we show that there are certain orientations of uniaxial, orthorhombic and monoclinic crystals that result in highly symmetric Muller matrices over all the spectral range, allowing a reduction of the number of independent parameters to less than six. The Matrix symmetries for media with optical activity are also examined.

  • Characterization of homogenous depolarizing media based on Mueller Matrix differential decomposition.
    Optics letters, 2013
    Co-Authors: Oriol Arteaga, Bart Kahr
    Abstract:

    In a depolarizing medium in which the optical properties are uniformly distributed, the logarithm of the Mueller Matrix can be used to calculate the differential Mueller Matrix. From the differential Mueller Matrix, the 10 optical properties of a homogeneous depolarizing medium are recovered. A modified calculation is introduced for media showing small time-irreversal depolarization events. The benefits of this method are illustrated in the determination of circular dichroism and circular birefringence of a nickel sulfate hexahydrate crystal from spectroscopic Mueller Matrix measurements.

Nathan Hagen - One of the best experts on this subject based on the ideXlab platform.

  • Calibration methods for snapshot Mueller Matrix spectropolarimetry
    Optical Technology and Measurement for Industrial Applications 2020, 2020
    Co-Authors: Nathan Hagen
    Abstract:

    Snapshot Mueller Matrix spectropolarimetry expands on the methods of snapshot Stokes vector (channeled) spectropolarimetry to analyze the polarization properties of materials. While calibration methods for Stokes vector spectropolarimetry are now well-established, their Mueller Matrix counterparts are not in the existing literature. After surveying the Stokes vector methods, we show how to expand the calibration methods for the more difficult Mueller Matrix spectropolarimetry case and show preliminary measurements.

  • Snapshot imaging Mueller Matrix instrument
    Electro-Optical Remote Sensing Photonic Technologies and Applications VII; and Military Applications in Hyperspectral Imaging and High Spatial Resolut, 2013
    Co-Authors: Michael W. Kudenov, Nathan Hagen, Sushmit Mallik, Michael J. Escuti, Kazuhiko Oka, Eustace L. Dereniak
    Abstract:

    A novel way to measure the Mueller Matrix image enables a sample's diattenuation, retardance, and depolarization to be measured within a single camera integration period. Since the Mueller Matrix components are modulated onto coincident carrier frequencies, the described technique provides unique solutions to image registration problems for moving objects. In this paper, a snapshot imaging Mueller Matrix polarimeter is theoretically described, and preliminary results shows it to be a viable approach for use in surface characterization of moving objects.

  • Snapshot Mueller Matrix spectropolarimetry
    Polarization Science and Remote Sensing III, 2007
    Co-Authors: Nathan Hagen, Eustace L. Dereniak
    Abstract:

    We present a snapshot technique for performing spectrally-resolved Mueller Matrix polarimetry, based on channeled spectropolarimetry. After discussing the measurement theory in detail, we present a simulated measurement of a polymer achromatic retarder. Finally, we review some methods for modifying the technique to achieve improved performance.

  • Snapshot Mueller Matrix spectropolarimeter
    Optics letters, 2007
    Co-Authors: Nathan Hagen, Kazuhiko Oka, Eustace L. Dereniak
    Abstract:

    We present a new snapshot technique for performing spectrally resolved Mueller Matrix polarimetry. The basic approach is an extension of the channeled spectropolarimetry technique, employing frequency-domain interferometry to encode polarization information into modulation of the spectrum.

Eustace L. Dereniak - One of the best experts on this subject based on the ideXlab platform.

  • Snapshot imaging Mueller Matrix instrument
    Electro-Optical Remote Sensing Photonic Technologies and Applications VII; and Military Applications in Hyperspectral Imaging and High Spatial Resolut, 2013
    Co-Authors: Michael W. Kudenov, Nathan Hagen, Sushmit Mallik, Michael J. Escuti, Kazuhiko Oka, Eustace L. Dereniak
    Abstract:

    A novel way to measure the Mueller Matrix image enables a sample's diattenuation, retardance, and depolarization to be measured within a single camera integration period. Since the Mueller Matrix components are modulated onto coincident carrier frequencies, the described technique provides unique solutions to image registration problems for moving objects. In this paper, a snapshot imaging Mueller Matrix polarimeter is theoretically described, and preliminary results shows it to be a viable approach for use in surface characterization of moving objects.

  • Snapshot Mueller Matrix spectropolarimetry
    Polarization Science and Remote Sensing III, 2007
    Co-Authors: Nathan Hagen, Eustace L. Dereniak
    Abstract:

    We present a snapshot technique for performing spectrally-resolved Mueller Matrix polarimetry, based on channeled spectropolarimetry. After discussing the measurement theory in detail, we present a simulated measurement of a polymer achromatic retarder. Finally, we review some methods for modifying the technique to achieve improved performance.

  • Snapshot Mueller Matrix spectropolarimeter
    Optics letters, 2007
    Co-Authors: Nathan Hagen, Kazuhiko Oka, Eustace L. Dereniak
    Abstract:

    We present a new snapshot technique for performing spectrally resolved Mueller Matrix polarimetry. The basic approach is an extension of the channeled spectropolarimetry technique, employing frequency-domain interferometry to encode polarization information into modulation of the spectrum.

Chuanwei Zhang - One of the best experts on this subject based on the ideXlab platform.

  • Depolarization artifacts in dual rotating-compensator Mueller Matrix ellipsometry
    Journal of Optics, 2016
    Co-Authors: Chuanwei Zhang, Hao Jiang, Xiuguo Chen, Shiyuan Liu
    Abstract:

    Noticeable depolarization effects are observed in the measurement of the air using an in-house developed dual rotating-compensator Mueller Matrix ellipsometer. We demonstrate that these depolarization effects are essentially artifacts and mainly induced when the compensator with wavelength-dependent optical properties is integrated with the finite bandwidth detector. We define a general formula to represent the actual Mueller Matrix of the compensator by taking into account the depolarization artifacts. After incorporating this formula into the system model, a correction method is further proposed, and consequently, improved accuracy can be achieved in the Mueller Matrix measurement.

  • Mueller Matrix imaging ellipsometry for nanostructure metrology
    Optics express, 2015
    Co-Authors: Shiyuan Liu, Du Weichao, Xiuguo Chen, Hao Jiang, Chuanwei Zhang
    Abstract:

    In order to achieve effective process control, fast, inexpensive, nondestructive and reliable nanometer scale feature measurements are extremely useful in high-volume nanomanufacturing. Among the possible techniques, optical scatterometry is relatively ideal due to its high throughput, low cost, and minimal sample damage. However, this technique is inherently limited by the illumination spot size of the instrument and the low efficiency in construction of a map of the sample over a wide area. Aiming at these issues, we introduce conventional imaging techniques to optical scatterometry and combine them with Mueller Matrix ellipsometry based scatterometry, which is expected to be a powerful tool for the measurement of nanostructures in future high-volume nanomanufacturing, and propose to apply Mueller Matrix imaging ellipsometry (MMIE) for nanostructure metrology. Two kinds of nanostructures were measured using an in-house developed Mueller Matrix imaging ellipsometer in this work. The experimental results demonstrate that we can achieve Mueller Matrix measurement and analysis for nanostructures with pixel-sized illumination spots by using MMIE. We can also efficiently construct parameter maps of the nanostructures over a wide area with pixel-sized lateral resolution by performing parallel ellipsometric analysis for all the pixels of interest.

  • Correction of depolarization effect in Mueller Matrix ellipsometry with polar decomposition method
    Modeling Aspects in Optical Metrology V, 2015
    Co-Authors: Chuanwei Zhang, Hao Jiang, Xiuguo Chen, Shiyuan Liu
    Abstract:

    Mueller Matrix ellipsometry has been demonstrated as a powerful tool for nanostructure metrology in high-volume manufacturing. Many factors may induce depolarization effect in the Mueller Matrix measurement, and consequently, may lead to accuracy loss in the nanostructure metrology. In this paper, we propose to apply a Mueller Matrix decomposition method for the Mueller Matrix measurement to separate the depolarization effect caused by the MME system. The method is based on the polar decomposition by decomposing the measured depolarizing Mueller Matrix into a sequence of three matrices corresponding to a diattenuator followed by a retarder and a depolarizer. Since the depolarization effects will be only reflected in the depolarizer Matrix, the other two matrices are used to extract the structure parameters of the measured sample. Experiments performed on a one-dimensional silicon grating structure with an in-house developed MME layout have demonstrated that the proposed method achieves a higher accuracy in the nanostructure metrology.

  • Mueller Matrix polarimeter with imperfect compensators: calibration and correction
    Classical Optics 2014, 2014
    Co-Authors: Chuanwei Zhang, Xiuguo Chen, Shiyuan Liu
    Abstract:

    We propose a method to calibrate the depolarization parameters of the imperfect compensators in dual-rotating compensator Mueller Matrix polarimeters, and deduce a set of correction equations for the Mueller Matrix calculation.

  • zernike representation of angle resolved Mueller Matrix for dimensional analysis of nanoscale structures
    Nano Micro Engineered and Molecular Systems, 2011
    Co-Authors: Xiuguo Chen, Shiyuan Liu, Chuanwei Zhang
    Abstract:

    The angle-resolved Mueller Matrix polarimetry has been recently introduced for dimensional metrology of nanoscale structures. Due to the redundant information contained in the measured Mueller Matrix, it is difficult to find the implicit relationship between the geometrical parameters of the structure and the elements of the Mueller Matrix. In this paper, a novel method based on Zernike representation is proposed to simplify the analysis of the angle-resolved Mueller Matrix. The simulation results have demonstrated that the Zernike coefficients can be applied as useful metrics for dimensional analysis of nanoscale structures.