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E A Schweikert - One of the best experts on this subject based on the ideXlab platform.
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Secondary Ion emissIon from kev energy atomic and polyatomic projectile impacts on sodium iodate
International Journal of Mass Spectrometry, 2000Co-Authors: M J Van Stipdonk, E A Schweikert, V Santiago, Charles C Chusuei, D W GoodmanAbstract:Sodium iodate and sodium iodide are inorganic solids in which iodine exists in different chemical environments. In sodium iodate, the iodine atom is bonded to oxygen to make the trigonal pyramidal IO3 anIon, which in turn is incorporated with sodium into an Ionic crystal. In sodium iodide, however, the iodide anIon and sodium catIon are Ionically bound in a crystal lattice. Nearly half of the Negative Secondary Ion yield generated from keV energy polyatomic Ion impacts on a sodium iodate surface is characteristic of Ion emissIon expected from sodium iodide (i.e. (NaI) nI 2 ), yet x-ray photoelectron spectroscopy data indicate that the solid material resulting from aliquots of aqueous sodium iodate dried on stainless steel contains no more than 2% sodium iodide. To determine how the number of atoms in the primary Ion influences the amount of iodide type Ion formatIon from sodium iodate, Secondary Ion yield measurements were performed using Cs, (CsI)Cs, and (CsI)2Cs projectiles incident at energies ranging from 10 to 25 keV. The experiments were run on an event-by-event basis at the level of single Ion impacts. The yields of iodate (composed of Na, I, and O) and iodide type Secondary Ions increase with the energy of the projectile and the number of constituent atoms. When compared on a per-incident atom basis, however, we found that the yields of Secondary Ions characteristic of iodate saturate at three total projectile atoms, but continue to increase nonlinearly for iodide species (i.e. the yield per impacting atom increases). (Int J Mass Spectrom 197 (2000) 149 ‐161) © 2000 Elsevier Science B.V.
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Secondary Ion yields produced by kev atomic and polyatomic Ion impacts on a self assembled monolayer surface
Rapid Communications in Mass Spectrometry, 1999Co-Authors: Ronny D Harris, Wendy S Baker, M J Van Stipdonk, Richard M Crooks, E A SchweikertAbstract:A suite of keV polyatomic or ‘cluster’ projectiles was used to bombard unoxidized and oxidized selfassembled monolayer surfaces. Negative Secondary Ion yields, collected at the limit of single Ion impacts, were measured and compared for both molecular and fragment Ions. In contrast to targets that are orders of magnitude thicker than the penetratIon range of the primary Ions, Secondary Ion yields from polyatomic projectile impacts on self-assembled monolayers show little to no enhancement when compared with monatomic projectiles at the same velocity. This unusual trend is most likely due to the structural arrangement and bonding characteristics of the monolayer molecules with the Au(111). Copyright # 1999 John Wiley & Sons, Ltd.
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Negative Secondary Ion emissIon from nabf4 comparison of atomic and polyatomic projectiles at different impact energies
Journal of Mass Spectrometry, 1999Co-Authors: M J Van Stipdonk, V Santiago, E A SchweikertAbstract:(CsI) n Cs + (n = 0-2) and C + 60 projectiles were used to bombard a sodium tetrafluoroborate (NaBF 4 ) target at energies ranging from 18 to 28 keV. The objective of these experiments was to monitor the emissIon of two series of Secondary Ions following atomic and polyatomic projectile impacts. One series is based on BF 4 - and its incorporatIon into larger polyatomic Ions that reflect the stoichiometry of the original solid. The other series is based on repeating (NaF) units, and presumably represents artifact Ions created by primary Ion impact induced recombinatIon/rearrangement reactIons. The relative yields of several Secondary Ions representing both types of Ion formatIon were measured as a functIon of the primary Ion velocity (velocity is proportIonal to the kinetic energy per mass unit). When normalized to the number of projectile constituents, the Secondary Ion yields follow distinct trends. The non-linear increase in the yield of (NaF)F- demonstrates greater sensitivity to the number of projectile constituents than intact, analytically useful Ions such as BF 4 - and (NaBF 4 )BF 4 - .
M J Van Stipdonk - One of the best experts on this subject based on the ideXlab platform.
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Secondary Ion emissIon from kev energy atomic and polyatomic projectile impacts on sodium iodate
International Journal of Mass Spectrometry, 2000Co-Authors: M J Van Stipdonk, E A Schweikert, V Santiago, Charles C Chusuei, D W GoodmanAbstract:Sodium iodate and sodium iodide are inorganic solids in which iodine exists in different chemical environments. In sodium iodate, the iodine atom is bonded to oxygen to make the trigonal pyramidal IO3 anIon, which in turn is incorporated with sodium into an Ionic crystal. In sodium iodide, however, the iodide anIon and sodium catIon are Ionically bound in a crystal lattice. Nearly half of the Negative Secondary Ion yield generated from keV energy polyatomic Ion impacts on a sodium iodate surface is characteristic of Ion emissIon expected from sodium iodide (i.e. (NaI) nI 2 ), yet x-ray photoelectron spectroscopy data indicate that the solid material resulting from aliquots of aqueous sodium iodate dried on stainless steel contains no more than 2% sodium iodide. To determine how the number of atoms in the primary Ion influences the amount of iodide type Ion formatIon from sodium iodate, Secondary Ion yield measurements were performed using Cs, (CsI)Cs, and (CsI)2Cs projectiles incident at energies ranging from 10 to 25 keV. The experiments were run on an event-by-event basis at the level of single Ion impacts. The yields of iodate (composed of Na, I, and O) and iodide type Secondary Ions increase with the energy of the projectile and the number of constituent atoms. When compared on a per-incident atom basis, however, we found that the yields of Secondary Ions characteristic of iodate saturate at three total projectile atoms, but continue to increase nonlinearly for iodide species (i.e. the yield per impacting atom increases). (Int J Mass Spectrom 197 (2000) 149 ‐161) © 2000 Elsevier Science B.V.
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Secondary Ion yields produced by kev atomic and polyatomic Ion impacts on a self assembled monolayer surface
Rapid Communications in Mass Spectrometry, 1999Co-Authors: Ronny D Harris, Wendy S Baker, M J Van Stipdonk, Richard M Crooks, E A SchweikertAbstract:A suite of keV polyatomic or ‘cluster’ projectiles was used to bombard unoxidized and oxidized selfassembled monolayer surfaces. Negative Secondary Ion yields, collected at the limit of single Ion impacts, were measured and compared for both molecular and fragment Ions. In contrast to targets that are orders of magnitude thicker than the penetratIon range of the primary Ions, Secondary Ion yields from polyatomic projectile impacts on self-assembled monolayers show little to no enhancement when compared with monatomic projectiles at the same velocity. This unusual trend is most likely due to the structural arrangement and bonding characteristics of the monolayer molecules with the Au(111). Copyright # 1999 John Wiley & Sons, Ltd.
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Negative Secondary Ion emissIon from nabf4 comparison of atomic and polyatomic projectiles at different impact energies
Journal of Mass Spectrometry, 1999Co-Authors: M J Van Stipdonk, V Santiago, E A SchweikertAbstract:(CsI) n Cs + (n = 0-2) and C + 60 projectiles were used to bombard a sodium tetrafluoroborate (NaBF 4 ) target at energies ranging from 18 to 28 keV. The objective of these experiments was to monitor the emissIon of two series of Secondary Ions following atomic and polyatomic projectile impacts. One series is based on BF 4 - and its incorporatIon into larger polyatomic Ions that reflect the stoichiometry of the original solid. The other series is based on repeating (NaF) units, and presumably represents artifact Ions created by primary Ion impact induced recombinatIon/rearrangement reactIons. The relative yields of several Secondary Ions representing both types of Ion formatIon were measured as a functIon of the primary Ion velocity (velocity is proportIonal to the kinetic energy per mass unit). When normalized to the number of projectile constituents, the Secondary Ion yields follow distinct trends. The non-linear increase in the yield of (NaF)F- demonstrates greater sensitivity to the number of projectile constituents than intact, analytically useful Ions such as BF 4 - and (NaBF 4 )BF 4 - .
A Itoh - One of the best experts on this subject based on the ideXlab platform.
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positive and Negative cluster Ions from liquid ethanol by fast Ion bombardment
Journal of Chemical Physics, 2010Co-Authors: Masahiro Kaneda, M Shimizu, T Hayakawa, Y Iriki, H Tsuchida, A ItohAbstract:Secondary Ion mass spectra have been measured for the first time for a liquid ethanol target bombarded by 2.0 MeV He+ Ions. Positive and Negative Ion spectra exhibit evidently a series of cluster Ions of the forms [(EtOH)nH]+ and [(EtOH)n−H]−, respectively, in additIon to light fragment Ions from intact parent molecules. It was found that these cluster Ions are produced only from liquid phase ethanol. Both positive and Negative Secondary Ion spectra show similar cluster size distributIons with almost the same decay slope. We also present for the first time the cluster Ion distributIon emitted from the liquid at different liquid temperatures.
Ronny D Harris - One of the best experts on this subject based on the ideXlab platform.
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Secondary Ion yields produced by kev atomic and polyatomic Ion impacts on a self assembled monolayer surface
Rapid Communications in Mass Spectrometry, 1999Co-Authors: Ronny D Harris, Wendy S Baker, M J Van Stipdonk, Richard M Crooks, E A SchweikertAbstract:A suite of keV polyatomic or ‘cluster’ projectiles was used to bombard unoxidized and oxidized selfassembled monolayer surfaces. Negative Secondary Ion yields, collected at the limit of single Ion impacts, were measured and compared for both molecular and fragment Ions. In contrast to targets that are orders of magnitude thicker than the penetratIon range of the primary Ions, Secondary Ion yields from polyatomic projectile impacts on self-assembled monolayers show little to no enhancement when compared with monatomic projectiles at the same velocity. This unusual trend is most likely due to the structural arrangement and bonding characteristics of the monolayer molecules with the Au(111). Copyright # 1999 John Wiley & Sons, Ltd.
V Santiago - One of the best experts on this subject based on the ideXlab platform.
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Secondary Ion emissIon from kev energy atomic and polyatomic projectile impacts on sodium iodate
International Journal of Mass Spectrometry, 2000Co-Authors: M J Van Stipdonk, E A Schweikert, V Santiago, Charles C Chusuei, D W GoodmanAbstract:Sodium iodate and sodium iodide are inorganic solids in which iodine exists in different chemical environments. In sodium iodate, the iodine atom is bonded to oxygen to make the trigonal pyramidal IO3 anIon, which in turn is incorporated with sodium into an Ionic crystal. In sodium iodide, however, the iodide anIon and sodium catIon are Ionically bound in a crystal lattice. Nearly half of the Negative Secondary Ion yield generated from keV energy polyatomic Ion impacts on a sodium iodate surface is characteristic of Ion emissIon expected from sodium iodide (i.e. (NaI) nI 2 ), yet x-ray photoelectron spectroscopy data indicate that the solid material resulting from aliquots of aqueous sodium iodate dried on stainless steel contains no more than 2% sodium iodide. To determine how the number of atoms in the primary Ion influences the amount of iodide type Ion formatIon from sodium iodate, Secondary Ion yield measurements were performed using Cs, (CsI)Cs, and (CsI)2Cs projectiles incident at energies ranging from 10 to 25 keV. The experiments were run on an event-by-event basis at the level of single Ion impacts. The yields of iodate (composed of Na, I, and O) and iodide type Secondary Ions increase with the energy of the projectile and the number of constituent atoms. When compared on a per-incident atom basis, however, we found that the yields of Secondary Ions characteristic of iodate saturate at three total projectile atoms, but continue to increase nonlinearly for iodide species (i.e. the yield per impacting atom increases). (Int J Mass Spectrom 197 (2000) 149 ‐161) © 2000 Elsevier Science B.V.
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Negative Secondary Ion emissIon from nabf4 comparison of atomic and polyatomic projectiles at different impact energies
Journal of Mass Spectrometry, 1999Co-Authors: M J Van Stipdonk, V Santiago, E A SchweikertAbstract:(CsI) n Cs + (n = 0-2) and C + 60 projectiles were used to bombard a sodium tetrafluoroborate (NaBF 4 ) target at energies ranging from 18 to 28 keV. The objective of these experiments was to monitor the emissIon of two series of Secondary Ions following atomic and polyatomic projectile impacts. One series is based on BF 4 - and its incorporatIon into larger polyatomic Ions that reflect the stoichiometry of the original solid. The other series is based on repeating (NaF) units, and presumably represents artifact Ions created by primary Ion impact induced recombinatIon/rearrangement reactIons. The relative yields of several Secondary Ions representing both types of Ion formatIon were measured as a functIon of the primary Ion velocity (velocity is proportIonal to the kinetic energy per mass unit). When normalized to the number of projectile constituents, the Secondary Ion yields follow distinct trends. The non-linear increase in the yield of (NaF)F- demonstrates greater sensitivity to the number of projectile constituents than intact, analytically useful Ions such as BF 4 - and (NaBF 4 )BF 4 - .
